id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
ajst-2174	Peng, Zuo	Research on Low Power BIST Based on LFSR Reseeding	2022	6	.pdf	application/pdf	3546	162	55	On the basis of studying the influence of test vector on dynamic test power consumption, the linear correlation between test vector seed and test vector is analyzed deeply. [10] B. Zhou, Y. Ye, X. C. Wu, et al. Reduction of test power and data volume in BIST scheme based on scan slice overlapping[C].	cache/ajst-2174.pdf	txt/ajst-2174.txt