id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
ajst-24974	Liu, Yang	Study of SOI-MOS Self-heating Effect Suppression Method in CMOS Process	2024	4	.pdf	application/pdf	3005	131	43	The self-heating effect not only causes the degradation of device performance, but also may result in device failure. Analysis of the Self-heating Effect of SOI- MOS Devices SOI-MOS devices show excellent performance in high- frequency, low-power applications, but their self-heating effect adversely affects device performance.	cache/ajst-24974.pdf	txt/ajst-24974.txt