id	sid	tid	token	lemma	pos
ajst-2174	1	1	academic	academic	ADJ
ajst-2174	1	2	journal	journal	NOUN
ajst-2174	1	3	of	of	ADP
ajst-2174	1	4	science	science	NOUN
ajst-2174	1	5	and	and	CCONJ
ajst-2174	1	6	technology	technology	NOUN
ajst-2174	1	7	issn	issn	NOUN
ajst-2174	1	8	:	:	PUNCT
ajst-2174	1	9	2771	2771	NUM
ajst-2174	1	10	-	-	SYM
ajst-2174	1	11	3032	3032	NUM
ajst-2174	1	12	|	|	NOUN
ajst-2174	1	13	vol	vol	NOUN
ajst-2174	1	14	.	.	PROPN
ajst-2174	2	1	3	3	NUM
ajst-2174	2	2	,	,	PUNCT
ajst-2174	2	3	no	no	INTJ
ajst-2174	2	4	.	.	NOUN
ajst-2174	2	5	2	2	NUM
ajst-2174	2	6	,	,	PUNCT
ajst-2174	2	7	2022	2022	NUM
ajst-2174	2	8	203	203	NUM
ajst-2174	2	9	research	research	NOUN
ajst-2174	2	10	on	on	ADP
ajst-2174	2	11	low	low	ADJ
ajst-2174	2	12	power	power	NOUN
ajst-2174	2	13	bist	bist	NOUN
ajst-2174	2	14	based	base	VERB
ajst-2174	2	15	on	on	ADP
ajst-2174	2	16	lfsr	lfsr	PROPN
ajst-2174	2	17	reseeding	reseed	VERB
ajst-2174	2	18	zuo	zuo	PROPN
ajst-2174	2	19	peng	peng	PROPN
ajst-2174	2	20	college	college	PROPN
ajst-2174	2	21	of	of	ADP
ajst-2174	2	22	electronic	electronic	ADJ
ajst-2174	2	23	engineering	engineering	NOUN
ajst-2174	2	24	,	,	PUNCT
ajst-2174	2	25	chengdu	chengdu	PROPN
ajst-2174	2	26	university	university	PROPN
ajst-2174	2	27	of	of	ADP
ajst-2174	2	28	information	information	NOUN
ajst-2174	2	29	technology	technology	PROPN
ajst-2174	2	30	,	,	PUNCT
ajst-2174	2	31	chengdu	chengdu	PROPN
ajst-2174	2	32	610225	610225	NUM
ajst-2174	2	33	,	,	PUNCT
ajst-2174	2	34	sichuan	sichuan	PROPN
ajst-2174	2	35	,	,	PUNCT
ajst-2174	2	36	china	china	PROPN
ajst-2174	2	37	abstract	abstract	PROPN
ajst-2174	2	38	:	:	PUNCT
ajst-2174	2	39	with	with	ADP
ajst-2174	2	40	the	the	DET
ajst-2174	2	41	increasing	increase	VERB
ajst-2174	2	42	scale	scale	NOUN
ajst-2174	2	43	and	and	CCONJ
ajst-2174	2	44	complexity	complexity	NOUN
ajst-2174	2	45	of	of	ADP
ajst-2174	2	46	the	the	DET
ajst-2174	2	47	internal	internal	ADJ
ajst-2174	2	48	circuit	circuit	NOUN
ajst-2174	2	49	,	,	PUNCT
ajst-2174	2	50	the	the	DET
ajst-2174	2	51	function	function	NOUN
ajst-2174	2	52	of	of	ADP
ajst-2174	2	53	the	the	DET
ajst-2174	2	54	chip	chip	NOUN
ajst-2174	2	55	is	be	AUX
ajst-2174	2	56	more	more	ADV
ajst-2174	2	57	powerful	powerful	ADJ
ajst-2174	2	58	,	,	PUNCT
ajst-2174	2	59	but	but	CCONJ
ajst-2174	2	60	it	it	PRON
ajst-2174	2	61	will	will	AUX
ajst-2174	2	62	bring	bring	VERB
ajst-2174	2	63	serious	serious	ADJ
ajst-2174	2	64	problems	problem	NOUN
ajst-2174	2	65	to	to	ADP
ajst-2174	2	66	the	the	DET
ajst-2174	2	67	test	test	NOUN
ajst-2174	2	68	of	of	ADP
ajst-2174	2	69	the	the	DET
ajst-2174	2	70	chip	chip	NOUN
ajst-2174	2	71	.	.	PUNCT
ajst-2174	3	1	the	the	DET
ajst-2174	3	2	internal	internal	ADJ
ajst-2174	3	3	power	power	NOUN
ajst-2174	3	4	consumption	consumption	NOUN
ajst-2174	3	5	of	of	ADP
ajst-2174	3	6	the	the	DET
ajst-2174	3	7	chip	chip	NOUN
ajst-2174	3	8	in	in	ADP
ajst-2174	3	9	the	the	DET
ajst-2174	3	10	test	test	NOUN
ajst-2174	3	11	mode	mode	NOUN
ajst-2174	3	12	is	be	AUX
ajst-2174	3	13	much	much	ADV
ajst-2174	3	14	higher	high	ADJ
ajst-2174	3	15	than	than	ADP
ajst-2174	3	16	that	that	PRON
ajst-2174	3	17	in	in	ADP
ajst-2174	3	18	the	the	DET
ajst-2174	3	19	normal	normal	ADJ
ajst-2174	3	20	working	working	NOUN
ajst-2174	3	21	mode	mode	NOUN
ajst-2174	3	22	,	,	PUNCT
ajst-2174	3	23	especially	especially	ADV
ajst-2174	3	24	in	in	ADP
ajst-2174	3	25	the	the	DET
ajst-2174	3	26	process	process	NOUN
ajst-2174	3	27	of	of	ADP
ajst-2174	3	28	built	build	VERB
ajst-2174	3	29	-	-	PUNCT
ajst-2174	3	30	in	in	ADP
ajst-2174	3	31	self	self	NOUN
ajst-2174	3	32	-	-	PUNCT
ajst-2174	3	33	test	test	NOUN
ajst-2174	3	34	,	,	PUNCT
ajst-2174	3	35	the	the	DET
ajst-2174	3	36	excessive	excessive	ADJ
ajst-2174	3	37	power	power	NOUN
ajst-2174	3	38	consumption	consumption	NOUN
ajst-2174	3	39	will	will	AUX
ajst-2174	3	40	damage	damage	VERB
ajst-2174	3	41	the	the	DET
ajst-2174	3	42	circuit	circuit	NOUN
ajst-2174	3	43	under	under	ADP
ajst-2174	3	44	test	test	NOUN
ajst-2174	3	45	and	and	CCONJ
ajst-2174	3	46	lead	lead	VERB
ajst-2174	3	47	to	to	ADP
ajst-2174	3	48	the	the	DET
ajst-2174	3	49	failure	failure	NOUN
ajst-2174	3	50	of	of	ADP
ajst-2174	3	51	the	the	DET
ajst-2174	3	52	chip	chip	NOUN
ajst-2174	3	53	.	.	PUNCT
ajst-2174	4	1	the	the	DET
ajst-2174	4	2	low	low	ADJ
ajst-2174	4	3	power	power	NOUN
ajst-2174	4	4	test	test	NOUN
ajst-2174	4	5	vector	vector	NOUN
ajst-2174	4	6	generation	generation	NOUN
ajst-2174	4	7	technology	technology	NOUN
ajst-2174	4	8	reduces	reduce	VERB
ajst-2174	4	9	the	the	DET
ajst-2174	4	10	test	test	NOUN
ajst-2174	4	11	power	power	NOUN
ajst-2174	4	12	by	by	ADP
ajst-2174	4	13	preprocessing	preprocesse	VERB
ajst-2174	4	14	the	the	DET
ajst-2174	4	15	test	test	NOUN
ajst-2174	4	16	vector	vector	NOUN
ajst-2174	4	17	set	set	NOUN
ajst-2174	4	18	.	.	PUNCT
ajst-2174	5	1	however	however	ADV
ajst-2174	5	2	,	,	PUNCT
ajst-2174	5	3	the	the	DET
ajst-2174	5	4	modification	modification	NOUN
ajst-2174	5	5	of	of	ADP
ajst-2174	5	6	the	the	DET
ajst-2174	5	7	test	test	NOUN
ajst-2174	5	8	vector	vector	NOUN
ajst-2174	5	9	set	set	NOUN
ajst-2174	5	10	results	result	NOUN
ajst-2174	5	11	in	in	ADP
ajst-2174	5	12	the	the	DET
ajst-2174	5	13	low	low	ADJ
ajst-2174	5	14	failure	failure	NOUN
ajst-2174	5	15	coverage	coverage	NOUN
ajst-2174	5	16	in	in	ADP
ajst-2174	5	17	the	the	DET
ajst-2174	5	18	test	test	NOUN
ajst-2174	5	19	process	process	NOUN
ajst-2174	5	20	.	.	PUNCT
ajst-2174	6	1	lfsr	lfsr	PROPN
ajst-2174	6	2	replaying	replay	VERB
ajst-2174	6	3	technology	technology	NOUN
ajst-2174	6	4	is	be	AUX
ajst-2174	6	5	a	a	DET
ajst-2174	6	6	common	common	ADJ
ajst-2174	6	7	method	method	NOUN
ajst-2174	6	8	of	of	ADP
ajst-2174	6	9	generating	generate	VERB
ajst-2174	6	10	test	test	NOUN
ajst-2174	6	11	vectors	vector	NOUN
ajst-2174	6	12	in	in	ADP
ajst-2174	6	13	built	build	VERB
ajst-2174	6	14	-	-	PUNCT
ajst-2174	6	15	in	in	ADP
ajst-2174	6	16	self	self	NOUN
ajst-2174	6	17	-	-	PUNCT
ajst-2174	6	18	test	test	NOUN
ajst-2174	6	19	.	.	PUNCT
ajst-2174	7	1	it	it	PRON
ajst-2174	7	2	can	can	AUX
ajst-2174	7	3	improve	improve	VERB
ajst-2174	7	4	the	the	DET
ajst-2174	7	5	coverage	coverage	NOUN
ajst-2174	7	6	of	of	ADP
ajst-2174	7	7	test	test	NOUN
ajst-2174	7	8	faults	fault	NOUN
ajst-2174	7	9	by	by	ADP
ajst-2174	7	10	loading	load	VERB
ajst-2174	7	11	test	test	NOUN
ajst-2174	7	12	vector	vector	NOUN
ajst-2174	7	13	seeds	seed	NOUN
ajst-2174	7	14	into	into	ADP
ajst-2174	7	15	linear	linear	ADJ
ajst-2174	7	16	feedback	feedback	NOUN
ajst-2174	7	17	shift	shift	NOUN
ajst-2174	7	18	register	register	NOUN
ajst-2174	7	19	.	.	PUNCT
ajst-2174	8	1	however	however	ADV
ajst-2174	8	2	,	,	PUNCT
ajst-2174	8	3	while	while	SCONJ
ajst-2174	8	4	improving	improve	VERB
ajst-2174	8	5	the	the	DET
ajst-2174	8	6	fault	fault	NOUN
ajst-2174	8	7	coverage	coverage	NOUN
ajst-2174	8	8	,	,	PUNCT
ajst-2174	8	9	the	the	DET
ajst-2174	8	10	technology	technology	NOUN
ajst-2174	8	11	will	will	AUX
ajst-2174	8	12	generate	generate	VERB
ajst-2174	8	13	high	high	ADJ
ajst-2174	8	14	test	test	NOUN
ajst-2174	8	15	power	power	NOUN
ajst-2174	8	16	consumption	consumption	NOUN
ajst-2174	8	17	in	in	ADP
ajst-2174	8	18	the	the	DET
ajst-2174	8	19	circuit	circuit	NOUN
ajst-2174	8	20	under	under	ADP
ajst-2174	8	21	test	test	NOUN
ajst-2174	8	22	.	.	PUNCT
ajst-2174	9	1	in	in	ADP
ajst-2174	9	2	design	design	NOUN
ajst-2174	9	3	for	for	ADP
ajst-2174	9	4	testability	testability	NOUN
ajst-2174	9	5	(	(	PUNCT
ajst-2174	9	6	dft	dft	PROPN
ajst-2174	9	7	)	)	PUNCT
ajst-2174	9	8	,	,	PUNCT
ajst-2174	9	9	it	it	PRON
ajst-2174	9	10	is	be	AUX
ajst-2174	9	11	a	a	DET
ajst-2174	9	12	hot	hot	ADJ
ajst-2174	9	13	topic	topic	NOUN
ajst-2174	9	14	to	to	PART
ajst-2174	9	15	generate	generate	VERB
ajst-2174	9	16	low	low	ADJ
ajst-2174	9	17	-	-	PUNCT
ajst-2174	9	18	power	power	NOUN
ajst-2174	9	19	test	test	NOUN
ajst-2174	9	20	vectors	vector	NOUN
ajst-2174	9	21	by	by	ADP
ajst-2174	9	22	combining	combine	VERB
ajst-2174	9	23	lfsr	lfsr	PROPN
ajst-2174	9	24	reseeding	reseed	VERB
ajst-2174	9	25	technology	technology	NOUN
ajst-2174	9	26	with	with	ADP
ajst-2174	9	27	low	low	ADJ
ajst-2174	9	28	-	-	PUNCT
ajst-2174	9	29	power	power	NOUN
ajst-2174	9	30	test	test	NOUN
ajst-2174	9	31	vector	vector	NOUN
ajst-2174	9	32	generation	generation	NOUN
ajst-2174	9	33	technology	technology	NOUN
ajst-2174	9	34	.	.	PUNCT
ajst-2174	10	1	aiming	aim	VERB
ajst-2174	10	2	at	at	ADP
ajst-2174	10	3	the	the	DET
ajst-2174	10	4	problem	problem	NOUN
ajst-2174	10	5	of	of	ADP
ajst-2174	10	6	high	high	ADJ
ajst-2174	10	7	power	power	NOUN
ajst-2174	10	8	consumption	consumption	NOUN
ajst-2174	10	9	caused	cause	VERB
ajst-2174	10	10	by	by	ADP
ajst-2174	10	11	test	test	NOUN
ajst-2174	10	12	vectors	vector	NOUN
ajst-2174	10	13	in	in	ADP
ajst-2174	10	14	built	build	VERB
ajst-2174	10	15	-	-	PUNCT
ajst-2174	10	16	in	in	ADP
ajst-2174	10	17	self	self	NOUN
ajst-2174	10	18	-	-	PUNCT
ajst-2174	10	19	test	test	NOUN
ajst-2174	10	20	,	,	PUNCT
ajst-2174	10	21	this	this	DET
ajst-2174	10	22	paper	paper	NOUN
ajst-2174	10	23	proposes	propose	VERB
ajst-2174	10	24	a	a	DET
ajst-2174	10	25	low	low	ADJ
ajst-2174	10	26	power	power	NOUN
ajst-2174	10	27	test	test	NOUN
ajst-2174	10	28	vector	vector	NOUN
ajst-2174	10	29	generation	generation	NOUN
ajst-2174	10	30	method	method	NOUN
ajst-2174	10	31	based	base	VERB
ajst-2174	10	32	on	on	ADP
ajst-2174	10	33	lfsr	lfsr	PROPN
ajst-2174	10	34	reseeding	reseeding	PROPN
ajst-2174	10	35	.	.	PUNCT
ajst-2174	11	1	on	on	ADP
ajst-2174	11	2	the	the	DET
ajst-2174	11	3	basis	basis	NOUN
ajst-2174	11	4	of	of	ADP
ajst-2174	11	5	studying	study	VERB
ajst-2174	11	6	the	the	DET
ajst-2174	11	7	influence	influence	NOUN
ajst-2174	11	8	of	of	ADP
ajst-2174	11	9	test	test	NOUN
ajst-2174	11	10	vector	vector	NOUN
ajst-2174	11	11	on	on	ADP
ajst-2174	11	12	dynamic	dynamic	ADJ
ajst-2174	11	13	test	test	NOUN
ajst-2174	11	14	power	power	NOUN
ajst-2174	11	15	consumption	consumption	NOUN
ajst-2174	11	16	,	,	PUNCT
ajst-2174	11	17	the	the	DET
ajst-2174	11	18	linear	linear	ADJ
ajst-2174	11	19	correlation	correlation	NOUN
ajst-2174	11	20	between	between	ADP
ajst-2174	11	21	test	test	NOUN
ajst-2174	11	22	vector	vector	NOUN
ajst-2174	11	23	seed	seed	NOUN
ajst-2174	11	24	and	and	CCONJ
ajst-2174	11	25	test	test	NOUN
ajst-2174	11	26	vector	vector	NOUN
ajst-2174	11	27	is	be	AUX
ajst-2174	11	28	analyzed	analyze	VERB
ajst-2174	11	29	deeply	deeply	ADV
ajst-2174	11	30	.	.	PUNCT
ajst-2174	12	1	a	a	DET
ajst-2174	12	2	model	model	NOUN
ajst-2174	12	3	of	of	ADP
ajst-2174	12	4	dynamic	dynamic	ADJ
ajst-2174	12	5	test	test	NOUN
ajst-2174	12	6	power	power	NOUN
ajst-2174	12	7	consumption	consumption	NOUN
ajst-2174	12	8	optimization	optimization	NOUN
ajst-2174	12	9	based	base	VERB
ajst-2174	12	10	on	on	ADP
ajst-2174	12	11	hamming	ham	VERB
ajst-2174	12	12	distance	distance	NOUN
ajst-2174	12	13	sorting	sort	VERB
ajst-2174	12	14	test	test	NOUN
ajst-2174	12	15	vector	vector	NOUN
ajst-2174	12	16	seed	seed	NOUN
ajst-2174	12	17	is	be	AUX
ajst-2174	12	18	proposed	propose	VERB
ajst-2174	12	19	to	to	PART
ajst-2174	12	20	realize	realize	VERB
ajst-2174	12	21	the	the	DET
ajst-2174	12	22	design	design	NOUN
ajst-2174	12	23	of	of	ADP
ajst-2174	12	24	lowpower	lowpower	NOUN
ajst-2174	12	25	test	test	NOUN
ajst-2174	12	26	vector	vector	NOUN
ajst-2174	12	27	seed	seed	NOUN
ajst-2174	12	28	generation	generation	NOUN
ajst-2174	12	29	algorithm	algorithm	NOUN
ajst-2174	12	30	.	.	PUNCT
ajst-2174	13	1	combined	combine	VERB
ajst-2174	13	2	with	with	ADP
ajst-2174	13	3	lfsr	lfsr	PROPN
ajst-2174	13	4	reseeding	reseeding	NOUN
ajst-2174	13	5	technology	technology	NOUN
ajst-2174	13	6	,	,	PUNCT
ajst-2174	13	7	a	a	DET
ajst-2174	13	8	low	low	ADJ
ajst-2174	13	9	-	-	PUNCT
ajst-2174	13	10	power	power	NOUN
ajst-2174	13	11	test	test	NOUN
ajst-2174	13	12	vector	vector	NOUN
ajst-2174	13	13	generator	generator	NOUN
ajst-2174	13	14	based	base	VERB
ajst-2174	13	15	on	on	ADP
ajst-2174	13	16	test	test	NOUN
ajst-2174	13	17	vector	vector	NOUN
ajst-2174	13	18	seed	seed	NOUN
ajst-2174	13	19	sorting	sorting	NOUN
ajst-2174	13	20	is	be	AUX
ajst-2174	13	21	designed	design	VERB
ajst-2174	13	22	.	.	PUNCT
ajst-2174	14	1	the	the	DET
ajst-2174	14	2	simulation	simulation	NOUN
ajst-2174	14	3	design	design	NOUN
ajst-2174	14	4	of	of	ADP
ajst-2174	14	5	test	test	NOUN
ajst-2174	14	6	vector	vector	NOUN
ajst-2174	14	7	generator	generator	NOUN
ajst-2174	14	8	is	be	AUX
ajst-2174	14	9	based	base	VERB
ajst-2174	14	10	on	on	ADP
ajst-2174	14	11	iscas85	iscas85	NOUN
ajst-2174	14	12	and	and	CCONJ
ajst-2174	14	13	iscas89	iscas89	ADJ
ajst-2174	14	14	.	.	PUNCT
ajst-2174	15	1	the	the	DET
ajst-2174	15	2	experimental	experimental	ADJ
ajst-2174	15	3	results	result	NOUN
ajst-2174	15	4	show	show	VERB
ajst-2174	15	5	that	that	SCONJ
ajst-2174	15	6	the	the	DET
ajst-2174	15	7	total	total	ADJ
ajst-2174	15	8	number	number	NOUN
ajst-2174	15	9	of	of	ADP
ajst-2174	15	10	test	test	NOUN
ajst-2174	15	11	vector	vector	NOUN
ajst-2174	15	12	seed	seed	NOUN
ajst-2174	15	13	storage	storage	NOUN
ajst-2174	15	14	bits	bit	NOUN
ajst-2174	15	15	is	be	AUX
ajst-2174	15	16	reduced	reduce	VERB
ajst-2174	15	17	by	by	ADP
ajst-2174	15	18	64.39	64.39	NUM
ajst-2174	15	19	%	%	NOUN
ajst-2174	15	20	,	,	PUNCT
ajst-2174	15	21	the	the	DET
ajst-2174	15	22	average	average	ADJ
ajst-2174	15	23	fault	fault	NOUN
ajst-2174	15	24	coverage	coverage	NOUN
ajst-2174	15	25	is	be	AUX
ajst-2174	15	26	97.42	97.42	NUM
ajst-2174	15	27	%	%	NOUN
ajst-2174	15	28	,	,	PUNCT
ajst-2174	15	29	the	the	DET
ajst-2174	15	30	average	average	ADJ
ajst-2174	15	31	area	area	NOUN
ajst-2174	15	32	overhead	overhead	ADV
ajst-2174	15	33	is	be	AUX
ajst-2174	15	34	4.32	4.32	NUM
ajst-2174	15	35	%	%	NOUN
ajst-2174	15	36	,	,	PUNCT
ajst-2174	15	37	and	and	CCONJ
ajst-2174	15	38	the	the	DET
ajst-2174	15	39	dynamic	dynamic	ADJ
ajst-2174	15	40	test	test	NOUN
ajst-2174	15	41	power	power	NOUN
ajst-2174	15	42	consumption	consumption	NOUN
ajst-2174	15	43	is	be	AUX
ajst-2174	15	44	reduced	reduce	VERB
ajst-2174	15	45	by	by	ADP
ajst-2174	15	46	44.21	44.21	NUM
ajst-2174	15	47	%	%	NOUN
ajst-2174	15	48	.	.	PUNCT
ajst-2174	16	1	compared	compare	VERB
ajst-2174	16	2	with	with	ADP
ajst-2174	16	3	other	other	ADJ
ajst-2174	16	4	schemes	scheme	NOUN
ajst-2174	16	5	,	,	PUNCT
ajst-2174	16	6	the	the	DET
ajst-2174	16	7	proposed	propose	VERB
ajst-2174	16	8	low	low	ADJ
ajst-2174	16	9	-	-	PUNCT
ajst-2174	16	10	power	power	NOUN
ajst-2174	16	11	test	test	NOUN
ajst-2174	16	12	vector	vector	NOUN
ajst-2174	16	13	generation	generation	NOUN
ajst-2174	16	14	technology	technology	NOUN
ajst-2174	16	15	based	base	VERB
ajst-2174	16	16	on	on	ADP
ajst-2174	16	17	lfsr	lfsr	PROPN
ajst-2174	16	18	reseeding	reseeding	NOUN
ajst-2174	16	19	has	have	VERB
ajst-2174	16	20	some	some	DET
ajst-2174	16	21	comprehensive	comprehensive	ADJ
ajst-2174	16	22	advantages	advantage	NOUN
ajst-2174	16	23	in	in	ADP
ajst-2174	16	24	reducing	reduce	VERB
ajst-2174	16	25	the	the	DET
ajst-2174	16	26	number	number	NOUN
ajst-2174	16	27	of	of	ADP
ajst-2174	16	28	seed	seed	NOUN
ajst-2174	16	29	storage	storage	NOUN
ajst-2174	16	30	bits	bit	NOUN
ajst-2174	16	31	,	,	PUNCT
ajst-2174	16	32	improving	improve	VERB
ajst-2174	16	33	fault	fault	NOUN
ajst-2174	16	34	coverage	coverage	NOUN
ajst-2174	16	35	,	,	PUNCT
ajst-2174	16	36	reducing	reduce	VERB
ajst-2174	16	37	circuit	circuit	NOUN
ajst-2174	16	38	area	area	NOUN
ajst-2174	16	39	overhead	overhead	ADV
ajst-2174	16	40	and	and	CCONJ
ajst-2174	16	41	reducing	reduce	VERB
ajst-2174	16	42	power	power	NOUN
ajst-2174	16	43	consumption	consumption	NOUN
ajst-2174	16	44	.	.	PUNCT
ajst-2174	17	1	keywords	keyword	NOUN
ajst-2174	17	2	:	:	PUNCT
ajst-2174	17	3	test	test	NOUN
ajst-2174	17	4	vector	vector	NOUN
ajst-2174	17	5	seed	seed	NOUN
ajst-2174	17	6	reordering	reordering	NOUN
ajst-2174	17	7	,	,	PUNCT
ajst-2174	17	8	lfsr	lfsr	PROPN
ajst-2174	17	9	reseeding	reseeding	NOUN
ajst-2174	17	10	technology	technology	NOUN
ajst-2174	17	11	,	,	PUNCT
ajst-2174	17	12	test	test	NOUN
ajst-2174	17	13	vector	vector	NOUN
ajst-2174	17	14	generation	generation	NOUN
ajst-2174	17	15	,	,	PUNCT
ajst-2174	17	16	low	low	ADJ
ajst-2174	17	17	power	power	NOUN
ajst-2174	17	18	consumption	consumption	NOUN
ajst-2174	17	19	,	,	PUNCT
ajst-2174	17	20	bist	bist	NOUN
ajst-2174	17	21	,	,	PUNCT
ajst-2174	17	22	test	test	NOUN
ajst-2174	17	23	response	response	NOUN
ajst-2174	17	24	analysis	analysis	NOUN
ajst-2174	17	25	.	.	PUNCT
ajst-2174	18	1	1	1	X
ajst-2174	18	2	.	.	X
ajst-2174	18	3	introduction	introduction	NOUN
ajst-2174	18	4	the	the	DET
ajst-2174	18	5	development	development	NOUN
ajst-2174	18	6	of	of	ADP
ajst-2174	18	7	chip	chip	NOUN
ajst-2174	18	8	is	be	AUX
ajst-2174	18	9	inseparable	inseparable	ADJ
ajst-2174	18	10	from	from	ADP
ajst-2174	18	11	the	the	DET
ajst-2174	18	12	progress	progress	NOUN
ajst-2174	18	13	of	of	ADP
ajst-2174	18	14	integrated	integrated	ADJ
ajst-2174	18	15	circuit	circuit	NOUN
ajst-2174	18	16	technology	technology	NOUN
ajst-2174	18	17	.	.	PUNCT
ajst-2174	19	1	now	now	ADV
ajst-2174	19	2	the	the	DET
ajst-2174	19	3	integrated	integrate	VERB
ajst-2174	19	4	circuit	circuit	NOUN
ajst-2174	19	5	has	have	AUX
ajst-2174	19	6	entered	enter	VERB
ajst-2174	19	7	the	the	DET
ajst-2174	19	8	stage	stage	NOUN
ajst-2174	19	9	of	of	ADP
ajst-2174	19	10	very	very	ADV
ajst-2174	19	11	large	large	ADJ
ajst-2174	19	12	scale	scale	NOUN
ajst-2174	19	13	integrated	integrate	VERB
ajst-2174	19	14	circuit	circuit	NOUN
ajst-2174	19	15	(	(	PUNCT
ajst-2174	19	16	visl	visl	PROPN
ajst-2174	19	17	)	)	PUNCT
ajst-2174	19	18	.	.	PUNCT
ajst-2174	20	1	from	from	ADP
ajst-2174	20	2	the	the	DET
ajst-2174	20	3	180	180	NUM
ajst-2174	20	4	nm	nm	NOUN
ajst-2174	20	5	process	process	NOUN
ajst-2174	20	6	of	of	ADP
ajst-2174	20	7	the	the	DET
ajst-2174	20	8	pentium	pentium	ADJ
ajst-2174	20	9	4	4	NUM
ajst-2174	20	10	processor	processor	NOUN
ajst-2174	20	11	to	to	ADP
ajst-2174	20	12	the	the	DET
ajst-2174	20	13	7	7	NUM
ajst-2174	20	14	nm	nm	NOUN
ajst-2174	20	15	chip	chip	NOUN
ajst-2174	20	16	process	process	NOUN
ajst-2174	20	17	that	that	PRON
ajst-2174	20	18	intel	intel	PROPN
ajst-2174	20	19	is	be	AUX
ajst-2174	20	20	breaking	break	VERB
ajst-2174	20	21	through	through	ADP
ajst-2174	20	22	,	,	PUNCT
ajst-2174	20	23	the	the	DET
ajst-2174	20	24	exponential	exponential	ADJ
ajst-2174	20	25	growth	growth	NOUN
ajst-2174	20	26	of	of	ADP
ajst-2174	20	27	semiconductor	semiconductor	NOUN
ajst-2174	20	28	processes	process	NOUN
ajst-2174	20	29	confirms	confirm	VERB
ajst-2174	20	30	gordon	gordon	PROPN
ajst-2174	20	31	moore	moore	PROPN
ajst-2174	20	32	's	's	PART
ajst-2174	20	33	prediction	prediction	NOUN
ajst-2174	20	34	of	of	ADP
ajst-2174	20	35	moore	moore	PROPN
ajst-2174	20	36	's	's	PART
ajst-2174	20	37	law	law	NOUN
ajst-2174	20	38	.	.	PUNCT
ajst-2174	21	1	the	the	DET
ajst-2174	21	2	research	research	NOUN
ajst-2174	21	3	and	and	CCONJ
ajst-2174	21	4	development	development	NOUN
ajst-2174	21	5	of	of	ADP
ajst-2174	21	6	high	high	ADJ
ajst-2174	21	7	performance	performance	NOUN
ajst-2174	21	8	chip	chip	NOUN
ajst-2174	21	9	provides	provide	VERB
ajst-2174	21	10	powerful	powerful	ADJ
ajst-2174	21	11	power	power	NOUN
ajst-2174	21	12	and	and	CCONJ
ajst-2174	21	13	technological	technological	ADJ
ajst-2174	21	14	guarantee	guarantee	NOUN
ajst-2174	21	15	for	for	ADP
ajst-2174	21	16	the	the	DET
ajst-2174	21	17	development	development	NOUN
ajst-2174	21	18	of	of	ADP
ajst-2174	21	19	social	social	ADJ
ajst-2174	21	20	science	science	NOUN
ajst-2174	21	21	and	and	CCONJ
ajst-2174	21	22	technology	technology	NOUN
ajst-2174	21	23	.	.	PUNCT
ajst-2174	22	1	the	the	DET
ajst-2174	22	2	chip	chip	NOUN
ajst-2174	22	3	has	have	AUX
ajst-2174	22	4	also	also	ADV
ajst-2174	22	5	begun	begin	VERB
ajst-2174	22	6	to	to	PART
ajst-2174	22	7	enter	enter	VERB
ajst-2174	22	8	the	the	DET
ajst-2174	22	9	era	era	NOUN
ajst-2174	22	10	of	of	ADP
ajst-2174	22	11	system	system	NOUN
ajst-2174	22	12	-	-	PUNCT
ajst-2174	22	13	on	on	ADP
ajst-2174	22	14	-	-	PUNCT
ajst-2174	22	15	chip	chip	NOUN
ajst-2174	22	16	.	.	PUNCT
ajst-2174	23	1	system	system	NOUN
ajst-2174	23	2	-	-	PUNCT
ajst-2174	23	3	on	on	ADP
ajst-2174	23	4	-	-	PUNCT
ajst-2174	23	5	chip	chip	NOUN
ajst-2174	23	6	(	(	PUNCT
ajst-2174	23	7	soc	soc	NOUN
ajst-2174	23	8	)	)	PUNCT
ajst-2174	23	9	refers	refer	VERB
ajst-2174	23	10	to	to	ADP
ajst-2174	23	11	the	the	DET
ajst-2174	23	12	integration	integration	NOUN
ajst-2174	23	13	of	of	ADP
ajst-2174	23	14	microcontroller	microcontroller	NOUN
ajst-2174	23	15	,	,	PUNCT
ajst-2174	23	16	analog	analog	NOUN
ajst-2174	23	17	circuit	circuit	NOUN
ajst-2174	23	18	,	,	PUNCT
ajst-2174	23	19	digital	digital	ADJ
ajst-2174	23	20	circuit	circuit	NOUN
ajst-2174	23	21	,	,	PUNCT
ajst-2174	23	22	memory	memory	NOUN
ajst-2174	23	23	circuit	circuit	NOUN
ajst-2174	23	24	and	and	CCONJ
ajst-2174	23	25	peripheral	peripheral	ADJ
ajst-2174	23	26	interface	interface	NOUN
ajst-2174	23	27	circuit	circuit	NOUN
ajst-2174	23	28	in	in	ADP
ajst-2174	23	29	the	the	DET
ajst-2174	23	30	system	system	NOUN
ajst-2174	23	31	on	on	ADP
ajst-2174	23	32	chip	chip	NOUN
ajst-2174	23	33	.	.	PUNCT
ajst-2174	24	1	by	by	ADP
ajst-2174	24	2	means	mean	NOUN
ajst-2174	24	3	of	of	ADP
ajst-2174	24	4	integrating	integrate	VERB
ajst-2174	24	5	and	and	CCONJ
ajst-2174	24	6	reusing	reuse	VERB
ajst-2174	24	7	ip	ip	ADJ
ajst-2174	24	8	kernel	kernel	NOUN
ajst-2174	24	9	,	,	PUNCT
ajst-2174	24	10	the	the	DET
ajst-2174	24	11	design	design	NOUN
ajst-2174	24	12	cycle	cycle	NOUN
ajst-2174	24	13	of	of	ADP
ajst-2174	24	14	chip	chip	NOUN
ajst-2174	24	15	products	product	NOUN
ajst-2174	24	16	is	be	AUX
ajst-2174	24	17	shortened	shorten	VERB
ajst-2174	24	18	,	,	PUNCT
ajst-2174	24	19	so	so	SCONJ
ajst-2174	24	20	that	that	SCONJ
ajst-2174	24	21	the	the	DET
ajst-2174	24	22	chip	chip	NOUN
ajst-2174	24	23	can	can	AUX
ajst-2174	24	24	enter	enter	VERB
ajst-2174	24	25	the	the	DET
ajst-2174	24	26	consumer	consumer	NOUN
ajst-2174	24	27	electronics	electronic	NOUN
ajst-2174	24	28	market	market	NOUN
ajst-2174	24	29	faster	fast	ADV
ajst-2174	24	30	.	.	PUNCT
ajst-2174	25	1	the	the	DET
ajst-2174	25	2	increase	increase	NOUN
ajst-2174	25	3	of	of	ADP
ajst-2174	25	4	circuit	circuit	NOUN
ajst-2174	25	5	size	size	NOUN
ajst-2174	25	6	brings	bring	VERB
ajst-2174	25	7	the	the	DET
ajst-2174	25	8	increase	increase	NOUN
ajst-2174	25	9	of	of	ADP
ajst-2174	25	10	test	test	NOUN
ajst-2174	25	11	vectors	vector	NOUN
ajst-2174	25	12	,	,	PUNCT
ajst-2174	25	13	and	and	CCONJ
ajst-2174	25	14	when	when	SCONJ
ajst-2174	25	15	the	the	DET
ajst-2174	25	16	test	test	NOUN
ajst-2174	25	17	vectors	vector	NOUN
ajst-2174	25	18	with	with	ADP
ajst-2174	25	19	low	low	ADJ
ajst-2174	25	20	correlation	correlation	NOUN
ajst-2174	25	21	are	be	AUX
ajst-2174	25	22	loaded	load	VERB
ajst-2174	25	23	into	into	ADP
ajst-2174	25	24	the	the	DET
ajst-2174	25	25	circuit	circuit	NOUN
ajst-2174	25	26	under	under	ADP
ajst-2174	25	27	test	test	NOUN
ajst-2174	25	28	,	,	PUNCT
ajst-2174	25	29	the	the	DET
ajst-2174	25	30	power	power	NOUN
ajst-2174	25	31	consumption	consumption	NOUN
ajst-2174	25	32	will	will	AUX
ajst-2174	25	33	increase	increase	VERB
ajst-2174	25	34	.	.	PUNCT
ajst-2174	26	1	at	at	ADP
ajst-2174	26	2	the	the	DET
ajst-2174	26	3	same	same	ADJ
ajst-2174	26	4	time	time	NOUN
ajst-2174	26	5	,	,	PUNCT
ajst-2174	26	6	in	in	ADP
ajst-2174	26	7	order	order	NOUN
ajst-2174	26	8	to	to	PART
ajst-2174	26	9	avoid	avoid	VERB
ajst-2174	26	10	the	the	DET
ajst-2174	26	11	excessive	excessive	ADJ
ajst-2174	26	12	dependence	dependence	NOUN
ajst-2174	26	13	of	of	ADP
ajst-2174	26	14	automatic	automatic	ADJ
ajst-2174	26	15	test	test	NOUN
ajst-2174	26	16	equipment	equipment	NOUN
ajst-2174	26	17	(	(	PUNCT
ajst-2174	26	18	ate	ate	NOUN
ajst-2174	26	19	)	)	PUNCT
ajst-2174	26	20	for	for	ADP
ajst-2174	26	21	chip	chip	NOUN
ajst-2174	26	22	testing	testing	NOUN
ajst-2174	26	23	,	,	PUNCT
ajst-2174	26	24	the	the	DET
ajst-2174	26	25	technology	technology	NOUN
ajst-2174	26	26	of	of	ADP
ajst-2174	26	27	built	build	VERB
ajst-2174	26	28	in	in	ADP
ajst-2174	26	29	self	self	NOUN
ajst-2174	26	30	test	test	NOUN
ajst-2174	26	31	(	(	PUNCT
ajst-2174	26	32	bist	bist	NOUN
ajst-2174	26	33	)	)	PUNCT
ajst-2174	26	34	is	be	AUX
ajst-2174	26	35	gradually	gradually	ADV
ajst-2174	26	36	developed	develop	VERB
ajst-2174	26	37	.	.	PUNCT
ajst-2174	27	1	built	build	VERB
ajst-2174	27	2	in	in	ADP
ajst-2174	27	3	self	self	NOUN
ajst-2174	27	4	test	test	NOUN
ajst-2174	27	5	(	(	PUNCT
ajst-2174	27	6	bist	bist	NOUN
ajst-2174	27	7	)	)	PUNCT
ajst-2174	27	8	is	be	AUX
ajst-2174	27	9	a	a	DET
ajst-2174	27	10	kind	kind	NOUN
ajst-2174	27	11	of	of	ADP
ajst-2174	27	12	test	test	NOUN
ajst-2174	27	13	vector	vector	NOUN
ajst-2174	27	14	that	that	PRON
ajst-2174	27	15	can	can	AUX
ajst-2174	27	16	be	be	AUX
ajst-2174	27	17	generated	generate	VERB
ajst-2174	27	18	.	.	PUNCT
ajst-2174	28	1	input	input	NOUN
ajst-2174	28	2	to	to	ADP
ajst-2174	28	3	the	the	DET
ajst-2174	28	4	circuit	circuit	NOUN
ajst-2174	28	5	under	under	ADP
ajst-2174	28	6	test	test	NOUN
ajst-2174	28	7	(	(	PUNCT
ajst-2174	28	8	cut	cut	PROPN
ajst-2174	28	9	)	)	PUNCT
ajst-2174	28	10	,	,	PUNCT
ajst-2174	28	11	collect	collect	VERB
ajst-2174	28	12	the	the	DET
ajst-2174	28	13	input	input	NOUN
ajst-2174	28	14	response	response	NOUN
ajst-2174	28	15	,	,	PUNCT
ajst-2174	28	16	and	and	CCONJ
ajst-2174	28	17	verify	verify	VERB
ajst-2174	28	18	the	the	DET
ajst-2174	28	19	correct	correct	ADJ
ajst-2174	28	20	hardware	hardware	NOUN
ajst-2174	28	21	circuit	circuit	NOUN
ajst-2174	28	22	structure	structure	NOUN
ajst-2174	28	23	of	of	ADP
ajst-2174	28	24	the	the	DET
ajst-2174	28	25	output	output	NOUN
ajst-2174	28	26	result	result	NOUN
ajst-2174	28	27	.	.	PUNCT
ajst-2174	29	1	bist	bist	PROPN
ajst-2174	29	2	also	also	ADV
ajst-2174	29	3	has	have	VERB
ajst-2174	29	4	many	many	ADJ
ajst-2174	29	5	advantages	advantage	NOUN
ajst-2174	29	6	:	:	PUNCT
ajst-2174	29	7	reduced	reduce	VERB
ajst-2174	29	8	testing	testing	NOUN
ajst-2174	29	9	costs	cost	NOUN
ajst-2174	29	10	,	,	PUNCT
ajst-2174	29	11	improved	improve	VERB
ajst-2174	29	12	error	error	NOUN
ajst-2174	29	13	coverage	coverage	NOUN
ajst-2174	29	14	,	,	PUNCT
ajst-2174	29	15	reduced	reduce	VERB
ajst-2174	29	16	testing	testing	NOUN
ajst-2174	29	17	time	time	NOUN
ajst-2174	29	18	,	,	PUNCT
ajst-2174	29	19	the	the	DET
ajst-2174	29	20	ability	ability	NOUN
ajst-2174	29	21	to	to	PART
ajst-2174	29	22	test	test	VERB
ajst-2174	29	23	independently	independently	ADV
ajst-2174	29	24	,	,	PUNCT
ajst-2174	29	25	etc	etc	X
ajst-2174	29	26	.	.	X
ajst-2174	29	27	bist	bist	NOUN
ajst-2174	29	28	is	be	AUX
ajst-2174	29	29	an	an	DET
ajst-2174	29	30	effective	effective	ADJ
ajst-2174	29	31	method	method	NOUN
ajst-2174	29	32	to	to	PART
ajst-2174	29	33	solve	solve	VERB
ajst-2174	29	34	the	the	DET
ajst-2174	29	35	system	system	NOUN
ajst-2174	29	36	on	on	ADP
ajst-2174	29	37	chip	chip	NOUN
ajst-2174	29	38	(	(	PUNCT
ajst-2174	29	39	soc	soc	NOUN
ajst-2174	29	40	)	)	PUNCT
ajst-2174	29	41	test	test	NOUN
ajst-2174	29	42	problem	problem	NOUN
ajst-2174	29	43	,	,	PUNCT
ajst-2174	29	44	which	which	PRON
ajst-2174	29	45	has	have	AUX
ajst-2174	29	46	become	become	VERB
ajst-2174	29	47	a	a	DET
ajst-2174	29	48	new	new	ADJ
ajst-2174	29	49	research	research	NOUN
ajst-2174	29	50	hotspot	hotspot	NOUN
ajst-2174	29	51	in	in	ADP
ajst-2174	29	52	the	the	DET
ajst-2174	29	53	field	field	NOUN
ajst-2174	29	54	of	of	ADP
ajst-2174	29	55	circuit	circuit	NOUN
ajst-2174	29	56	test	test	NOUN
ajst-2174	29	57	technology	technology	NOUN
ajst-2174	29	58	.	.	PUNCT
ajst-2174	30	1	2	2	X
ajst-2174	30	2	.	.	X
ajst-2174	30	3	methodology	methodology	NOUN
ajst-2174	30	4	2.1	2.1	NUM
ajst-2174	30	5	.	.	PUNCT
ajst-2174	31	1	overall	overall	ADJ
ajst-2174	31	2	framework	framework	NOUN
ajst-2174	31	3	of	of	ADP
ajst-2174	31	4	built	build	VERB
ajst-2174	31	5	-	-	PUNCT
ajst-2174	31	6	in	in	ADP
ajst-2174	31	7	self	self	NOUN
ajst-2174	31	8	test	test	NOUN
ajst-2174	31	9	figure	figure	NOUN
ajst-2174	31	10	1	1	NUM
ajst-2174	31	11	.	.	PUNCT
ajst-2174	31	12	diagram	diagram	NOUN
ajst-2174	31	13	of	of	ADP
ajst-2174	31	14	the	the	DET
ajst-2174	31	15	bist	bist	ADJ
ajst-2174	31	16	structure	structure	NOUN
ajst-2174	31	17	as	as	SCONJ
ajst-2174	31	18	shown	show	VERB
ajst-2174	31	19	in	in	ADP
ajst-2174	31	20	figure	figure	NOUN
ajst-2174	31	21	1	1	NUM
ajst-2174	31	22	,	,	PUNCT
ajst-2174	31	23	there	there	PRON
ajst-2174	31	24	are	be	VERB
ajst-2174	31	25	three	three	NUM
ajst-2174	31	26	main	main	ADJ
ajst-2174	31	27	modules	module	NOUN
ajst-2174	31	28	around	around	ADP
ajst-2174	31	29	the	the	DET
ajst-2174	31	30	circuit	circuit	NOUN
ajst-2174	31	31	under	under	ADP
ajst-2174	31	32	test	test	NOUN
ajst-2174	31	33	(	(	PUNCT
ajst-2174	31	34	cut	cut	PROPN
ajst-2174	31	35	)	)	PUNCT
ajst-2174	31	36	:	:	PUNCT
ajst-2174	32	1	1.test	1.test	NUM
ajst-2174	32	2	vector	vector	NOUN
ajst-2174	32	3	generator	generator	NOUN
ajst-2174	32	4	(	(	PUNCT
ajst-2174	32	5	tpg	tpg	NOUN
ajst-2174	32	6	):	):	PUNCT
ajst-2174	32	7	test	test	NOUN
ajst-2174	32	8	generation	generation	NOUN
ajst-2174	32	9	and	and	CCONJ
ajst-2174	32	10	application	application	NOUN
ajst-2174	32	11	module	module	NOUN
ajst-2174	32	12	.	.	PUNCT
ajst-2174	33	1	during	during	ADP
ajst-2174	33	2	the	the	DET
ajst-2174	33	3	built	build	VERB
ajst-2174	33	4	-	-	PUNCT
ajst-2174	33	5	in	in	ADP
ajst-2174	33	6	self	self	NOUN
ajst-2174	33	7	-	-	PUNCT
ajst-2174	33	8	test	test	NOUN
ajst-2174	33	9	,	,	PUNCT
ajst-2174	33	10	the	the	DET
ajst-2174	33	11	test	test	NOUN
ajst-2174	33	12	vector	vector	NOUN
ajst-2174	33	13	generator	generator	NOUN
ajst-2174	33	14	connected	connect	VERB
ajst-2174	33	15	to	to	ADP
ajst-2174	33	16	the	the	DET
ajst-2174	33	17	circuit	circuit	NOUN
ajst-2174	33	18	under	under	ADP
ajst-2174	33	19	test	test	NOUN
ajst-2174	33	20	outputs	outputs	PROPN
ajst-2174	33	21	test	test	NOUN
ajst-2174	33	22	vectors	vector	NOUN
ajst-2174	33	23	to	to	PART
ajst-2174	33	24	provide	provide	VERB
ajst-2174	33	25	test	test	NOUN
ajst-2174	33	26	vectors	vector	NOUN
ajst-2174	33	27	for	for	ADP
ajst-2174	33	28	the	the	DET
ajst-2174	33	29	circuit	circuit	NOUN
ajst-2174	33	30	under	under	ADP
ajst-2174	33	31	test	test	NOUN
ajst-2174	33	32	.	.	PUNCT
ajst-2174	34	1	the	the	DET
ajst-2174	34	2	generation	generation	NOUN
ajst-2174	34	3	of	of	ADP
ajst-2174	34	4	the	the	DET
ajst-2174	34	5	test	test	NOUN
ajst-2174	34	6	vector	vector	NOUN
ajst-2174	34	7	is	be	AUX
ajst-2174	34	8	the	the	DET
ajst-2174	34	9	process	process	NOUN
ajst-2174	34	10	of	of	ADP
ajst-2174	34	11	detecting	detect	VERB
ajst-2174	34	12	the	the	DET
ajst-2174	34	13	fault	fault	NOUN
ajst-2174	34	14	with	with	ADP
ajst-2174	34	15	the	the	DET
ajst-2174	34	16	test	test	NOUN
ajst-2174	34	17	vector	vector	NOUN
ajst-2174	34	18	inside	inside	ADP
ajst-2174	34	19	the	the	DET
ajst-2174	34	20	circuit	circuit	NOUN
ajst-2174	34	21	according	accord	VERB
ajst-2174	34	22	to	to	ADP
ajst-2174	34	23	the	the	DET
ajst-2174	34	24	given	give	VERB
ajst-2174	34	25	fault	fault	NOUN
ajst-2174	34	26	of	of	ADP
ajst-2174	34	27	the	the	DET
ajst-2174	34	28	circuit	circuit	NOUN
ajst-2174	34	29	under	under	ADP
ajst-2174	34	30	test	test	NOUN
ajst-2174	34	31	.	.	PUNCT
ajst-2174	35	1	there	there	PRON
ajst-2174	35	2	are	be	VERB
ajst-2174	35	3	two	two	NUM
ajst-2174	35	4	issues	issue	NOUN
ajst-2174	35	5	to	to	ADP
ajst-2174	35	6	204	204	NUM
ajst-2174	35	7	ensure	ensure	VERB
ajst-2174	35	8	:	:	PUNCT
ajst-2174	35	9	one	one	NUM
ajst-2174	35	10	is	be	AUX
ajst-2174	35	11	to	to	PART
ajst-2174	35	12	ensure	ensure	VERB
ajst-2174	35	13	that	that	SCONJ
ajst-2174	35	14	the	the	DET
ajst-2174	35	15	fault	fault	NOUN
ajst-2174	35	16	can	can	AUX
ajst-2174	35	17	be	be	AUX
ajst-2174	35	18	reproduced	reproduce	VERB
ajst-2174	35	19	inside	inside	ADP
ajst-2174	35	20	the	the	DET
ajst-2174	35	21	circuit	circuit	NOUN
ajst-2174	35	22	under	under	ADP
ajst-2174	35	23	test	test	NOUN
ajst-2174	35	24	,	,	PUNCT
ajst-2174	35	25	and	and	CCONJ
ajst-2174	35	26	the	the	DET
ajst-2174	35	27	other	other	ADJ
ajst-2174	35	28	is	be	AUX
ajst-2174	35	29	to	to	PART
ajst-2174	35	30	propagate	propagate	VERB
ajst-2174	35	31	the	the	DET
ajst-2174	35	32	fault	fault	NOUN
ajst-2174	35	33	to	to	ADP
ajst-2174	35	34	the	the	DET
ajst-2174	35	35	output	output	NOUN
ajst-2174	35	36	of	of	ADP
ajst-2174	35	37	the	the	DET
ajst-2174	35	38	circuit	circuit	NOUN
ajst-2174	35	39	under	under	ADP
ajst-2174	35	40	test	test	NOUN
ajst-2174	35	41	,	,	PUNCT
ajst-2174	35	42	that	that	ADV
ajst-2174	35	43	is	is	ADV
ajst-2174	35	44	,	,	PUNCT
ajst-2174	35	45	to	to	PART
ajst-2174	35	46	make	make	VERB
ajst-2174	35	47	the	the	DET
ajst-2174	35	48	source	source	NOUN
ajst-2174	35	49	of	of	ADP
ajst-2174	35	50	the	the	DET
ajst-2174	35	51	fault	fault	NOUN
ajst-2174	35	52	in	in	ADP
ajst-2174	35	53	the	the	DET
ajst-2174	35	54	circuit	circuit	NOUN
ajst-2174	35	55	can	can	AUX
ajst-2174	35	56	be	be	AUX
ajst-2174	35	57	effectively	effectively	ADV
ajst-2174	35	58	presented	present	VERB
ajst-2174	35	59	.	.	PUNCT
ajst-2174	36	1	in	in	ADP
ajst-2174	36	2	the	the	DET
ajst-2174	36	3	process	process	NOUN
ajst-2174	36	4	of	of	ADP
ajst-2174	36	5	chip	chip	NOUN
ajst-2174	36	6	testability	testability	NOUN
ajst-2174	36	7	design	design	NOUN
ajst-2174	36	8	,	,	PUNCT
ajst-2174	36	9	the	the	DET
ajst-2174	36	10	test	test	NOUN
ajst-2174	36	11	vector	vector	NOUN
ajst-2174	36	12	generator	generator	NOUN
ajst-2174	36	13	is	be	AUX
ajst-2174	36	14	the	the	DET
ajst-2174	36	15	main	main	ADJ
ajst-2174	36	16	hardware	hardware	NOUN
ajst-2174	36	17	circuit	circuit	NOUN
ajst-2174	36	18	module	module	NOUN
ajst-2174	36	19	,	,	PUNCT
ajst-2174	36	20	the	the	DET
ajst-2174	36	21	main	main	ADJ
ajst-2174	36	22	research	research	NOUN
ajst-2174	36	23	content	content	NOUN
ajst-2174	36	24	of	of	ADP
ajst-2174	36	25	this	this	DET
ajst-2174	36	26	paper	paper	NOUN
ajst-2174	36	27	is	be	AUX
ajst-2174	36	28	this	this	DET
ajst-2174	36	29	module	module	NOUN
ajst-2174	36	30	.	.	PUNCT
ajst-2174	37	1	2	2	X
ajst-2174	37	2	.	.	X
ajst-2174	37	3	output	output	NOUN
ajst-2174	37	4	response	response	NOUN
ajst-2174	37	5	analyzer	analyzer	NOUN
ajst-2174	37	6	(	(	PUNCT
ajst-2174	37	7	ora	ora	INTJ
ajst-2174	37	8	):	):	PUNCT
ajst-2174	37	9	a	a	DET
ajst-2174	37	10	test	test	NOUN
ajst-2174	37	11	response	response	NOUN
ajst-2174	37	12	capture	capture	NOUN
ajst-2174	37	13	/	/	SYM
ajst-2174	37	14	qualification	qualification	NOUN
ajst-2174	37	15	module	module	NOUN
ajst-2174	37	16	that	that	PRON
ajst-2174	37	17	captures	capture	VERB
ajst-2174	37	18	,	,	PUNCT
ajst-2174	37	19	compresses	compress	VERB
ajst-2174	37	20	and	and	CCONJ
ajst-2174	37	21	analyzes	analyze	VERB
ajst-2174	37	22	test	test	NOUN
ajst-2174	37	23	responses	response	NOUN
ajst-2174	37	24	to	to	PART
ajst-2174	37	25	determine	determine	VERB
ajst-2174	37	26	the	the	DET
ajst-2174	37	27	correctness	correctness	NOUN
ajst-2174	37	28	of	of	ADP
ajst-2174	37	29	the	the	DET
ajst-2174	37	30	circuit	circuit	NOUN
ajst-2174	37	31	under	under	ADP
ajst-2174	37	32	test	test	NOUN
ajst-2174	37	33	.	.	PUNCT
ajst-2174	38	1	3	3	X
ajst-2174	38	2	.	.	NUM
ajst-2174	38	3	built	build	VERB
ajst-2174	38	4	-	-	PUNCT
ajst-2174	38	5	in	in	ADP
ajst-2174	38	6	self	self	NOUN
ajst-2174	38	7	-	-	PUNCT
ajst-2174	38	8	test	test	NOUN
ajst-2174	38	9	control	control	NOUN
ajst-2174	38	10	unit	unit	NOUN
ajst-2174	38	11	(	(	PUNCT
ajst-2174	38	12	bcu	bcu	PROPN
ajst-2174	38	13	):	):	PUNCT
ajst-2174	38	14	it	it	PRON
ajst-2174	38	15	is	be	AUX
ajst-2174	38	16	the	the	DET
ajst-2174	38	17	central	central	ADJ
ajst-2174	38	18	processing	processing	NOUN
ajst-2174	38	19	unit	unit	NOUN
ajst-2174	38	20	of	of	ADP
ajst-2174	38	21	all	all	DET
ajst-2174	38	22	bist	bist	ADJ
ajst-2174	38	23	operations	operation	NOUN
ajst-2174	38	24	,	,	PUNCT
ajst-2174	38	25	controls	control	VERB
ajst-2174	38	26	self	self	NOUN
ajst-2174	38	27	-	-	PUNCT
ajst-2174	38	28	test	test	NOUN
ajst-2174	38	29	scheduling	scheduling	NOUN
ajst-2174	38	30	and	and	CCONJ
ajst-2174	38	31	determines	determine	VERB
ajst-2174	38	32	the	the	DET
ajst-2174	38	33	working	work	VERB
ajst-2174	38	34	mode	mode	NOUN
ajst-2174	38	35	of	of	ADP
ajst-2174	38	36	the	the	DET
ajst-2174	38	37	above	above	ADJ
ajst-2174	38	38	two	two	NUM
ajst-2174	38	39	modules	module	NOUN
ajst-2174	38	40	,	,	PUNCT
ajst-2174	38	41	controls	control	VERB
ajst-2174	38	42	tpg	tpg	PROPN
ajst-2174	38	43	to	to	PART
ajst-2174	38	44	generate	generate	VERB
ajst-2174	38	45	test	test	NOUN
ajst-2174	38	46	data	datum	NOUN
ajst-2174	38	47	and	and	CCONJ
ajst-2174	38	48	input	input	VERB
ajst-2174	38	49	it	it	PRON
ajst-2174	38	50	to	to	ADP
ajst-2174	38	51	the	the	DET
ajst-2174	38	52	circuit	circuit	NOUN
ajst-2174	38	53	under	under	ADP
ajst-2174	38	54	test	test	NOUN
ajst-2174	38	55	,	,	PUNCT
ajst-2174	38	56	and	and	CCONJ
ajst-2174	38	57	then	then	ADV
ajst-2174	38	58	sends	send	VERB
ajst-2174	38	59	the	the	DET
ajst-2174	38	60	response	response	NOUN
ajst-2174	38	61	to	to	ADP
ajst-2174	38	62	tae	tae	PROPN
ajst-2174	38	63	et	et	PROPN
ajst-2174	38	64	al	al	PROPN
ajst-2174	38	65	.	.	PUNCT
ajst-2174	38	66	by	by	ADP
ajst-2174	38	67	accessing	access	VERB
ajst-2174	38	68	the	the	DET
ajst-2174	38	69	bist	bist	ADJ
ajst-2174	38	70	controller	controller	NOUN
ajst-2174	38	71	,	,	PUNCT
ajst-2174	38	72	the	the	DET
ajst-2174	38	73	test	test	NOUN
ajst-2174	38	74	results	result	NOUN
ajst-2174	38	75	can	can	AUX
ajst-2174	38	76	be	be	AUX
ajst-2174	38	77	read	read	VERB
ajst-2174	38	78	out	out	ADP
ajst-2174	38	79	to	to	PART
ajst-2174	38	80	complete	complete	VERB
ajst-2174	38	81	the	the	DET
ajst-2174	38	82	test	test	NOUN
ajst-2174	38	83	of	of	ADP
ajst-2174	38	84	the	the	DET
ajst-2174	38	85	circuit	circuit	NOUN
ajst-2174	38	86	under	under	ADP
ajst-2174	38	87	test	test	NOUN
ajst-2174	38	88	.	.	PUNCT
ajst-2174	39	1	built	build	VERB
ajst-2174	39	2	-	-	PUNCT
ajst-2174	39	3	in	in	ADP
ajst-2174	39	4	self	self	NOUN
ajst-2174	39	5	-	-	PUNCT
ajst-2174	39	6	test	test	NOUN
ajst-2174	39	7	total	total	ADJ
ajst-2174	39	8	state	state	NOUN
ajst-2174	39	9	transition	transition	NOUN
ajst-2174	39	10	:	:	PUNCT
ajst-2174	39	11	in	in	ADP
ajst-2174	39	12	the	the	DET
ajst-2174	39	13	process	process	NOUN
ajst-2174	39	14	of	of	ADP
ajst-2174	39	15	chip	chip	NOUN
ajst-2174	39	16	built	build	VERB
ajst-2174	39	17	-	-	PUNCT
ajst-2174	39	18	in	in	ADP
ajst-2174	39	19	self	self	NOUN
ajst-2174	39	20	-	-	PUNCT
ajst-2174	39	21	test	test	NOUN
ajst-2174	39	22	,	,	PUNCT
ajst-2174	39	23	it	it	PRON
ajst-2174	39	24	includes	include	VERB
ajst-2174	39	25	s0	s0	PROPN
ajst-2174	39	26	,	,	PUNCT
ajst-2174	39	27	s1	s1	NOUN
ajst-2174	39	28	,	,	PUNCT
ajst-2174	39	29	s2	s2	PROPN
ajst-2174	39	30	,	,	PUNCT
ajst-2174	39	31	s3	s3	PROPN
ajst-2174	39	32	,	,	PUNCT
ajst-2174	39	33	s4	s4	PROPN
ajst-2174	39	34	,	,	PUNCT
ajst-2174	39	35	s5	s5	PROPN
ajst-2174	39	36	,	,	PUNCT
ajst-2174	39	37	a	a	DET
ajst-2174	39	38	total	total	NOUN
ajst-2174	39	39	of	of	ADP
ajst-2174	39	40	6	6	NUM
ajst-2174	39	41	states	state	NOUN
ajst-2174	39	42	.	.	PUNCT
ajst-2174	40	1	s0	s0	NOUN
ajst-2174	40	2	:	:	PUNCT
ajst-2174	40	3	initial	initial	ADJ
ajst-2174	40	4	test	test	NOUN
ajst-2174	40	5	state	state	NOUN
ajst-2174	40	6	;	;	PUNCT
ajst-2174	40	7	s1	s1	NOUN
ajst-2174	40	8	:	:	PUNCT
ajst-2174	40	9	seed	seed	NOUN
ajst-2174	40	10	generation	generation	NOUN
ajst-2174	40	11	state	state	NOUN
ajst-2174	40	12	;	;	PUNCT
ajst-2174	40	13	s2	s2	NOUN
ajst-2174	40	14	:	:	PUNCT
ajst-2174	40	15	vector	vector	NOUN
ajst-2174	40	16	expansion	expansion	NOUN
ajst-2174	40	17	state	state	NOUN
ajst-2174	40	18	;	;	PUNCT
ajst-2174	40	19	s3	s3	PROPN
ajst-2174	40	20	:	:	PUNCT
ajst-2174	40	21	scan	scan	ADJ
ajst-2174	40	22	loading	loading	NOUN
ajst-2174	40	23	state	state	NOUN
ajst-2174	40	24	;	;	PUNCT
ajst-2174	40	25	s4	s4	PROPN
ajst-2174	40	26	:	:	PUNCT
ajst-2174	40	27	circuit	circuit	NOUN
ajst-2174	40	28	test	test	NOUN
ajst-2174	40	29	state	state	NOUN
ajst-2174	40	30	;	;	PUNCT
ajst-2174	40	31	s5	s5	NOUN
ajst-2174	40	32	:	:	PUNCT
ajst-2174	40	33	response	response	VERB
ajst-2174	40	34	analysis	analysis	NOUN
ajst-2174	40	35	state	state	NOUN
ajst-2174	40	36	.	.	PUNCT
ajst-2174	41	1	when	when	SCONJ
ajst-2174	41	2	the	the	DET
ajst-2174	41	3	seeding	seeding	NOUN
ajst-2174	41	4	of	of	ADP
ajst-2174	41	5	a	a	DET
ajst-2174	41	6	test	test	NOUN
ajst-2174	41	7	vector	vector	NOUN
ajst-2174	41	8	is	be	AUX
ajst-2174	41	9	completed	complete	VERB
ajst-2174	41	10	,	,	PUNCT
ajst-2174	41	11	it	it	PRON
ajst-2174	41	12	returns	return	VERB
ajst-2174	41	13	to	to	ADP
ajst-2174	41	14	the	the	DET
ajst-2174	41	15	s0	s0	PROPN
ajst-2174	41	16	state	state	NOUN
ajst-2174	41	17	.	.	PUNCT
ajst-2174	42	1	2.2	2.2	NUM
ajst-2174	42	2	.	.	PUNCT
ajst-2174	43	1	test	test	NOUN
ajst-2174	43	2	vector	vector	NOUN
ajst-2174	43	3	generation	generation	NOUN
ajst-2174	43	4	figure	figure	NOUN
ajst-2174	43	5	2	2	NUM
ajst-2174	43	6	.	.	PUNCT
ajst-2174	43	7	test	test	NOUN
ajst-2174	43	8	vector	vector	NOUN
ajst-2174	43	9	generator	generator	NOUN
ajst-2174	43	10	(	(	PUNCT
ajst-2174	43	11	tpg	tpg	NOUN
ajst-2174	43	12	)	)	PUNCT
ajst-2174	43	13	structure	structure	NOUN
ajst-2174	43	14	diagram	diagram	NOUN
ajst-2174	43	15	1	1	NUM
ajst-2174	43	16	.	.	PUNCT
ajst-2174	44	1	structure	structure	NOUN
ajst-2174	44	2	of	of	ADP
ajst-2174	44	3	test	test	NOUN
ajst-2174	44	4	vector	vector	NOUN
ajst-2174	44	5	generator	generator	NOUN
ajst-2174	44	6	(	(	PUNCT
ajst-2174	44	7	tpg	tpg	NOUN
ajst-2174	44	8	):	):	PUNCT
ajst-2174	44	9	workflow	workflow	NOUN
ajst-2174	44	10	:	:	PUNCT
ajst-2174	44	11	there	there	PRON
ajst-2174	44	12	is	be	VERB
ajst-2174	44	13	no	no	DET
ajst-2174	44	14	need	need	NOUN
ajst-2174	44	15	to	to	PART
ajst-2174	44	16	change	change	VERB
ajst-2174	44	17	the	the	DET
ajst-2174	44	18	test	test	NOUN
ajst-2174	44	19	vector	vector	NOUN
ajst-2174	44	20	seed	seed	NOUN
ajst-2174	44	21	during	during	ADP
ajst-2174	44	22	the	the	DET
ajst-2174	44	23	chip	chip	NOUN
ajst-2174	44	24	testing	testing	NOUN
ajst-2174	44	25	process	process	NOUN
ajst-2174	44	26	,	,	PUNCT
ajst-2174	44	27	only	only	ADV
ajst-2174	44	28	the	the	DET
ajst-2174	44	29	test	test	NOUN
ajst-2174	44	30	data	datum	NOUN
ajst-2174	44	31	needs	need	VERB
ajst-2174	44	32	to	to	PART
ajst-2174	44	33	be	be	AUX
ajst-2174	44	34	stored	store	VERB
ajst-2174	44	35	in	in	ADP
ajst-2174	44	36	read	read	NOUN
ajst-2174	44	37	only	only	ADV
ajst-2174	44	38	memory	memory	NOUN
ajst-2174	44	39	(	(	PUNCT
ajst-2174	44	40	rom	rom	NOUN
ajst-2174	44	41	)	)	PUNCT
ajst-2174	44	42	,	,	PUNCT
ajst-2174	44	43	which	which	PRON
ajst-2174	44	44	has	have	VERB
ajst-2174	44	45	the	the	DET
ajst-2174	44	46	advantages	advantage	NOUN
ajst-2174	44	47	of	of	ADP
ajst-2174	44	48	stable	stable	ADJ
ajst-2174	44	49	data	datum	NOUN
ajst-2174	44	50	storage	storage	NOUN
ajst-2174	44	51	and	and	CCONJ
ajst-2174	44	52	no	no	DET
ajst-2174	44	53	loss	loss	NOUN
ajst-2174	44	54	of	of	ADP
ajst-2174	44	55	power	power	NOUN
ajst-2174	44	56	-	-	PUNCT
ajst-2174	44	57	down	down	ADP
ajst-2174	44	58	information	information	NOUN
ajst-2174	44	59	.	.	PUNCT
ajst-2174	45	1	here	here	ADV
ajst-2174	45	2	,	,	PUNCT
ajst-2174	45	3	the	the	DET
ajst-2174	45	4	ip	ip	NOUN
ajst-2174	45	5	core	core	NOUN
ajst-2174	45	6	inside	inside	ADP
ajst-2174	45	7	quartus	quartus	PROPN
ajst-2174	45	8	is	be	AUX
ajst-2174	45	9	used	use	VERB
ajst-2174	45	10	to	to	PART
ajst-2174	45	11	generate	generate	VERB
ajst-2174	45	12	a	a	DET
ajst-2174	45	13	rom	rom	NOUN
ajst-2174	45	14	memory	memory	NOUN
ajst-2174	45	15	whose	whose	DET
ajst-2174	45	16	depth	depth	NOUN
ajst-2174	45	17	is	be	AUX
ajst-2174	45	18	the	the	DET
ajst-2174	45	19	total	total	ADJ
ajst-2174	45	20	number	number	NOUN
ajst-2174	45	21	of	of	ADP
ajst-2174	45	22	test	test	NOUN
ajst-2174	45	23	vector	vector	NOUN
ajst-2174	45	24	seeds	seed	NOUN
ajst-2174	45	25	and	and	CCONJ
ajst-2174	45	26	the	the	DET
ajst-2174	45	27	bit	bit	NOUN
ajst-2174	45	28	width	width	NOUN
ajst-2174	45	29	is	be	AUX
ajst-2174	45	30	the	the	DET
ajst-2174	45	31	test	test	NOUN
ajst-2174	45	32	seed	seed	NOUN
ajst-2174	45	33	bit	bit	NOUN
ajst-2174	45	34	width	width	ADJ
ajst-2174	45	35	.	.	PUNCT
ajst-2174	46	1	after	after	SCONJ
ajst-2174	46	2	the	the	DET
ajst-2174	46	3	rom	rom	NOUN
ajst-2174	46	4	is	be	AUX
ajst-2174	46	5	generated	generate	VERB
ajst-2174	46	6	,	,	PUNCT
ajst-2174	46	7	the	the	DET
ajst-2174	46	8	mif	mif	PROPN
ajst-2174	46	9	file	file	NOUN
ajst-2174	46	10	is	be	AUX
ajst-2174	46	11	initially	initially	ADV
ajst-2174	46	12	generated	generate	VERB
ajst-2174	46	13	,	,	PUNCT
ajst-2174	46	14	and	and	CCONJ
ajst-2174	46	15	the	the	DET
ajst-2174	46	16	encoded	encode	VERB
ajst-2174	46	17	test	test	NOUN
ajst-2174	46	18	vector	vector	NOUN
ajst-2174	46	19	seeds	seed	NOUN
ajst-2174	46	20	are	be	AUX
ajst-2174	46	21	written	write	VERB
ajst-2174	46	22	in	in	ADP
ajst-2174	46	23	the	the	DET
ajst-2174	46	24	mif	mif	PROPN
ajst-2174	46	25	file	file	NOUN
ajst-2174	46	26	in	in	ADP
ajst-2174	46	27	sequence	sequence	NOUN
ajst-2174	46	28	.	.	PUNCT
ajst-2174	47	1	when	when	SCONJ
ajst-2174	47	2	the	the	DET
ajst-2174	47	3	chip	chip	NOUN
ajst-2174	47	4	performs	perform	VERB
ajst-2174	47	5	the	the	DET
ajst-2174	47	6	built	build	VERB
ajst-2174	47	7	-	-	PUNCT
ajst-2174	47	8	in	in	ADP
ajst-2174	47	9	self	self	NOUN
ajst-2174	47	10	-	-	PUNCT
ajst-2174	47	11	test	test	NOUN
ajst-2174	47	12	,	,	PUNCT
ajst-2174	47	13	the	the	DET
ajst-2174	47	14	read	read	ADJ
ajst-2174	47	15	pointer	pointer	NOUN
ajst-2174	47	16	of	of	ADP
ajst-2174	47	17	the	the	DET
ajst-2174	47	18	rom	rom	PROPN
ajst-2174	47	19	test	test	NOUN
ajst-2174	47	20	vector	vector	NOUN
ajst-2174	47	21	seed	seed	NOUN
ajst-2174	47	22	is	be	AUX
ajst-2174	47	23	in	in	ADP
ajst-2174	47	24	the	the	DET
ajst-2174	47	25	form	form	NOUN
ajst-2174	47	26	of	of	ADP
ajst-2174	47	27	binary	binary	PROPN
ajst-2174	47	28	code	code	PROPN
ajst-2174	47	29	,	,	PUNCT
ajst-2174	47	30	and	and	CCONJ
ajst-2174	47	31	the	the	DET
ajst-2174	47	32	number	number	NOUN
ajst-2174	47	33	of	of	ADP
ajst-2174	47	34	calls	call	NOUN
ajst-2174	47	35	of	of	ADP
ajst-2174	47	36	the	the	DET
ajst-2174	47	37	read	read	NOUN
ajst-2174	47	38	pointer	pointer	NOUN
ajst-2174	47	39	is	be	AUX
ajst-2174	47	40	counted	count	VERB
ajst-2174	47	41	by	by	ADP
ajst-2174	47	42	a	a	DET
ajst-2174	47	43	counter	counter	NOUN
ajst-2174	47	44	.	.	PUNCT
ajst-2174	48	1	when	when	SCONJ
ajst-2174	48	2	the	the	DET
ajst-2174	48	3	count	count	NOUN
ajst-2174	48	4	of	of	ADP
ajst-2174	48	5	the	the	DET
ajst-2174	48	6	test	test	NOUN
ajst-2174	48	7	vector	vector	NOUN
ajst-2174	48	8	seed	seed	NOUN
ajst-2174	48	9	counter	counter	NOUN
ajst-2174	48	10	is	be	AUX
ajst-2174	48	11	the	the	DET
ajst-2174	48	12	number	number	NOUN
ajst-2174	48	13	of	of	ADP
ajst-2174	48	14	test	test	NOUN
ajst-2174	48	15	vector	vector	NOUN
ajst-2174	48	16	seeds	seed	NOUN
ajst-2174	48	17	,	,	PUNCT
ajst-2174	48	18	then	then	ADV
ajst-2174	48	19	it	it	PRON
ajst-2174	48	20	is	be	AUX
ajst-2174	48	21	judged	judge	VERB
ajst-2174	48	22	that	that	SCONJ
ajst-2174	48	23	the	the	DET
ajst-2174	48	24	test	test	NOUN
ajst-2174	48	25	vector	vector	NOUN
ajst-2174	48	26	seeds	seed	NOUN
ajst-2174	48	27	in	in	ADP
ajst-2174	48	28	the	the	DET
ajst-2174	48	29	rom	rom	NOUN
ajst-2174	48	30	have	have	AUX
ajst-2174	48	31	all	all	PRON
ajst-2174	48	32	been	be	AUX
ajst-2174	48	33	read	read	VERB
ajst-2174	48	34	once	once	ADV
ajst-2174	48	35	.	.	PUNCT
ajst-2174	49	1	with	with	ADP
ajst-2174	49	2	the	the	DET
ajst-2174	49	3	clock	clock	NOUN
ajst-2174	49	4	cycle	cycle	NOUN
ajst-2174	49	5	of	of	ADP
ajst-2174	49	6	the	the	DET
ajst-2174	49	7	chip	chip	NOUN
ajst-2174	49	8	test	test	NOUN
ajst-2174	49	9	,	,	PUNCT
ajst-2174	49	10	under	under	ADP
ajst-2174	49	11	the	the	DET
ajst-2174	49	12	action	action	NOUN
ajst-2174	49	13	of	of	ADP
ajst-2174	49	14	the	the	DET
ajst-2174	49	15	control	control	NOUN
ajst-2174	49	16	signal	signal	NOUN
ajst-2174	49	17	of	of	ADP
ajst-2174	49	18	the	the	DET
ajst-2174	49	19	rom	rom	PROPN
ajst-2174	49	20	controller	controller	NOUN
ajst-2174	49	21	,	,	PUNCT
ajst-2174	49	22	it	it	PRON
ajst-2174	49	23	is	be	AUX
ajst-2174	49	24	called	call	VERB
ajst-2174	49	25	in	in	ADP
ajst-2174	49	26	the	the	DET
ajst-2174	49	27	specified	specified	ADJ
ajst-2174	49	28	order	order	NOUN
ajst-2174	49	29	and	and	CCONJ
ajst-2174	49	30	input	input	NOUN
ajst-2174	49	31	to	to	ADP
ajst-2174	49	32	the	the	DET
ajst-2174	49	33	lfsr	lfsr	PROPN
ajst-2174	49	34	.	.	PUNCT
ajst-2174	50	1	move	move	VERB
ajst-2174	50	2	each	each	DET
ajst-2174	50	3	bit	bit	NOUN
ajst-2174	50	4	of	of	ADP
ajst-2174	50	5	the	the	DET
ajst-2174	50	6	test	test	NOUN
ajst-2174	50	7	vector	vector	NOUN
ajst-2174	50	8	unrolled	unroll	VERB
ajst-2174	50	9	in	in	ADP
ajst-2174	50	10	the	the	DET
ajst-2174	50	11	lfsr	lfsr	PROPN
ajst-2174	50	12	into	into	ADP
ajst-2174	50	13	the	the	DET
ajst-2174	50	14	scan	scan	PROPN
ajst-2174	50	15	chain	chain	NOUN
ajst-2174	50	16	until	until	ADP
ajst-2174	50	17	the	the	DET
ajst-2174	50	18	test	test	NOUN
ajst-2174	50	19	vector	vector	NOUN
ajst-2174	50	20	bit	bit	NOUN
ajst-2174	50	21	counter	counter	NOUN
ajst-2174	50	22	counts	count	NOUN
ajst-2174	50	23	to	to	ADP
ajst-2174	50	24	the	the	DET
ajst-2174	50	25	number	number	NOUN
ajst-2174	50	26	of	of	ADP
ajst-2174	50	27	test	test	NOUN
ajst-2174	50	28	vector	vector	NOUN
ajst-2174	50	29	bits	bit	NOUN
ajst-2174	50	30	,	,	PUNCT
ajst-2174	50	31	load	load	VERB
ajst-2174	50	32	the	the	DET
ajst-2174	50	33	complete	complete	ADJ
ajst-2174	50	34	test	test	NOUN
ajst-2174	50	35	vector	vector	NOUN
ajst-2174	50	36	into	into	ADP
ajst-2174	50	37	the	the	DET
ajst-2174	50	38	circuit	circuit	NOUN
ajst-2174	50	39	under	under	ADP
ajst-2174	50	40	test	test	NOUN
ajst-2174	50	41	,	,	PUNCT
ajst-2174	50	42	and	and	CCONJ
ajst-2174	50	43	then	then	ADV
ajst-2174	50	44	test	test	VERB
ajst-2174	50	45	it	it	PRON
ajst-2174	50	46	.	.	PUNCT
ajst-2174	51	1	when	when	SCONJ
ajst-2174	51	2	the	the	DET
ajst-2174	51	3	vector	vector	NOUN
ajst-2174	51	4	generation	generation	NOUN
ajst-2174	51	5	controller	controller	NOUN
ajst-2174	51	6	detects	detect	VERB
ajst-2174	51	7	the	the	DET
ajst-2174	51	8	feedback	feedback	NOUN
ajst-2174	51	9	signal	signal	NOUN
ajst-2174	51	10	in	in	ADP
ajst-2174	51	11	the	the	DET
ajst-2174	51	12	scan	scan	ADJ
ajst-2174	51	13	chain	chain	NOUN
ajst-2174	51	14	,	,	PUNCT
ajst-2174	51	15	that	that	ADV
ajst-2174	51	16	is	is	ADV
ajst-2174	51	17	,	,	PUNCT
ajst-2174	51	18	there	there	PRON
ajst-2174	51	19	is	be	VERB
ajst-2174	51	20	no	no	DET
ajst-2174	51	21	test	test	NOUN
ajst-2174	51	22	vector	vector	NOUN
ajst-2174	51	23	in	in	ADP
ajst-2174	51	24	the	the	DET
ajst-2174	51	25	scan	scan	PROPN
ajst-2174	51	26	chain	chain	NOUN
ajst-2174	51	27	,	,	PUNCT
ajst-2174	51	28	the	the	DET
ajst-2174	51	29	working	working	NOUN
ajst-2174	51	30	signal	signal	NOUN
ajst-2174	51	31	is	be	AUX
ajst-2174	51	32	enabled	enable	VERB
ajst-2174	51	33	for	for	ADP
ajst-2174	51	34	the	the	DET
ajst-2174	51	35	lfsr	lfsr	PROPN
ajst-2174	51	36	,	,	PUNCT
ajst-2174	51	37	and	and	CCONJ
ajst-2174	51	38	each	each	DET
ajst-2174	51	39	bit	bit	NOUN
ajst-2174	51	40	of	of	ADP
ajst-2174	51	41	the	the	DET
ajst-2174	51	42	next	next	ADJ
ajst-2174	51	43	test	test	NOUN
ajst-2174	51	44	seed	seed	NOUN
ajst-2174	51	45	is	be	AUX
ajst-2174	51	46	loaded	load	VERB
ajst-2174	51	47	into	into	ADP
ajst-2174	51	48	the	the	DET
ajst-2174	51	49	scan	scan	NOUN
ajst-2174	51	50	in	in	ADP
ajst-2174	51	51	turn	turn	NOUN
ajst-2174	51	52	.	.	PUNCT
ajst-2174	52	1	when	when	SCONJ
ajst-2174	52	2	the	the	DET
ajst-2174	52	3	test	test	NOUN
ajst-2174	52	4	vector	vector	NOUN
ajst-2174	52	5	seed	seed	NOUN
ajst-2174	52	6	counter	counter	NOUN
ajst-2174	52	7	reaches	reach	VERB
ajst-2174	52	8	the	the	DET
ajst-2174	52	9	maximum	maximum	ADJ
ajst-2174	52	10	value	value	NOUN
ajst-2174	52	11	of	of	ADP
ajst-2174	52	12	the	the	DET
ajst-2174	52	13	test	test	NOUN
ajst-2174	52	14	seed	seed	NOUN
ajst-2174	52	15	set	set	NOUN
ajst-2174	52	16	,	,	PUNCT
ajst-2174	52	17	it	it	PRON
ajst-2174	52	18	means	mean	VERB
ajst-2174	52	19	that	that	SCONJ
ajst-2174	52	20	all	all	DET
ajst-2174	52	21	the	the	DET
ajst-2174	52	22	test	test	NOUN
ajst-2174	52	23	vector	vector	NOUN
ajst-2174	52	24	seeds	seed	NOUN
ajst-2174	52	25	in	in	ADP
ajst-2174	52	26	the	the	DET
ajst-2174	52	27	rom	rom	NOUN
ajst-2174	52	28	have	have	AUX
ajst-2174	52	29	been	be	AUX
ajst-2174	52	30	sown	sow	VERB
ajst-2174	52	31	once	once	ADV
ajst-2174	52	32	,	,	PUNCT
ajst-2174	52	33	and	and	CCONJ
ajst-2174	52	34	wait	wait	VERB
ajst-2174	52	35	for	for	ADP
ajst-2174	52	36	the	the	DET
ajst-2174	52	37	second	second	ADJ
ajst-2174	52	38	external	external	ADJ
ajst-2174	52	39	work	work	NOUN
ajst-2174	52	40	enable	enable	ADJ
ajst-2174	52	41	signal	signal	NOUN
ajst-2174	52	42	.	.	PUNCT
ajst-2174	53	1	2	2	X
ajst-2174	53	2	.	.	X
ajst-2174	53	3	select	select	VERB
ajst-2174	53	4	the	the	DET
ajst-2174	53	5	generation	generation	NOUN
ajst-2174	53	6	method	method	NOUN
ajst-2174	53	7	of	of	ADP
ajst-2174	53	8	the	the	DET
ajst-2174	53	9	bist	bist	ADJ
ajst-2174	53	10	test	test	NOUN
ajst-2174	53	11	vector	vector	NOUN
ajst-2174	53	12	:	:	PUNCT
ajst-2174	53	13	traditional	traditional	ADJ
ajst-2174	53	14	test	test	NOUN
ajst-2174	53	15	vector	vector	NOUN
ajst-2174	53	16	generation	generation	NOUN
ajst-2174	53	17	techniques	technique	NOUN
ajst-2174	53	18	mainly	mainly	ADV
ajst-2174	53	19	include	include	VERB
ajst-2174	53	20	exhaustive	exhaustive	ADJ
ajst-2174	53	21	testing	testing	NOUN
ajst-2174	53	22	,	,	PUNCT
ajst-2174	53	23	deterministic	deterministic	ADJ
ajst-2174	53	24	testing	testing	NOUN
ajst-2174	53	25	and	and	CCONJ
ajst-2174	53	26	pseudorandom	pseudorandom	PROPN
ajst-2174	53	27	testing	testing	NOUN
ajst-2174	53	28	.	.	PUNCT
ajst-2174	54	1	the	the	DET
ajst-2174	54	2	test	test	NOUN
ajst-2174	54	3	vectors	vector	NOUN
ajst-2174	54	4	generated	generate	VERB
ajst-2174	54	5	by	by	ADP
ajst-2174	54	6	the	the	DET
ajst-2174	54	7	exhaustive	exhaustive	ADJ
ajst-2174	54	8	test	test	NOUN
ajst-2174	54	9	and	and	CCONJ
ajst-2174	54	10	the	the	DET
ajst-2174	54	11	deterministic	deterministic	ADJ
ajst-2174	54	12	test	test	NOUN
ajst-2174	54	13	can	can	AUX
ajst-2174	54	14	be	be	AUX
ajst-2174	54	15	stored	store	VERB
ajst-2174	54	16	in	in	ADP
ajst-2174	54	17	the	the	DET
ajst-2174	54	18	rom	rom	NOUN
ajst-2174	54	19	directly	directly	ADV
ajst-2174	54	20	as	as	ADP
ajst-2174	54	21	the	the	DET
ajst-2174	54	22	test	test	NOUN
ajst-2174	54	23	vector	vector	NOUN
ajst-2174	54	24	generation	generation	NOUN
ajst-2174	54	25	module	module	NOUN
ajst-2174	54	26	of	of	ADP
ajst-2174	54	27	the	the	DET
ajst-2174	54	28	bist	bist	NOUN
ajst-2174	54	29	.	.	PUNCT
ajst-2174	55	1	at	at	ADP
ajst-2174	55	2	present	present	ADJ
ajst-2174	55	3	,	,	PUNCT
ajst-2174	55	4	the	the	DET
ajst-2174	55	5	deterministic	deterministic	ADJ
ajst-2174	55	6	test	test	NOUN
ajst-2174	55	7	generally	generally	ADV
ajst-2174	55	8	uses	use	VERB
ajst-2174	55	9	the	the	DET
ajst-2174	55	10	automatic	automatic	ADJ
ajst-2174	55	11	test	test	NOUN
ajst-2174	55	12	vector	vector	NOUN
ajst-2174	55	13	generation	generation	NOUN
ajst-2174	55	14	tool	tool	NOUN
ajst-2174	55	15	atpg	atpg	NOUN
ajst-2174	55	16	to	to	PART
ajst-2174	55	17	generate	generate	VERB
ajst-2174	55	18	the	the	DET
ajst-2174	55	19	deterministic	deterministic	ADJ
ajst-2174	55	20	test	test	NOUN
ajst-2174	55	21	vector	vector	NOUN
ajst-2174	55	22	set	set	NOUN
ajst-2174	55	23	.	.	PUNCT
ajst-2174	56	1	pseudo	pseudo	NOUN
ajst-2174	56	2	-	-	ADJ
ajst-2174	56	3	random	random	ADJ
ajst-2174	56	4	test	test	NOUN
ajst-2174	56	5	sequences	sequence	NOUN
ajst-2174	56	6	can	can	AUX
ajst-2174	56	7	be	be	AUX
ajst-2174	56	8	generated	generate	VERB
ajst-2174	56	9	using	use	VERB
ajst-2174	56	10	lfsr	lfsr	PROPN
ajst-2174	56	11	,	,	PUNCT
ajst-2174	56	12	which	which	PRON
ajst-2174	56	13	uses	use	VERB
ajst-2174	56	14	very	very	ADV
ajst-2174	56	15	little	little	ADJ
ajst-2174	56	16	hardware	hardware	NOUN
ajst-2174	56	17	and	and	CCONJ
ajst-2174	56	18	is	be	AUX
ajst-2174	56	19	highly	highly	ADV
ajst-2174	56	20	cost	cost	NOUN
ajst-2174	56	21	-	-	PUNCT
ajst-2174	56	22	effective	effective	ADJ
ajst-2174	56	23	.	.	PUNCT
ajst-2174	57	1	however	however	ADV
ajst-2174	57	2	,	,	PUNCT
ajst-2174	57	3	due	due	ADP
ajst-2174	57	4	to	to	ADP
ajst-2174	57	5	the	the	DET
ajst-2174	57	6	existence	existence	NOUN
ajst-2174	57	7	of	of	ADP
ajst-2174	57	8	antirandom	antirandom	NOUN
ajst-2174	57	9	circuit	circuit	NOUN
ajst-2174	57	10	faults	fault	NOUN
ajst-2174	57	11	during	during	ADP
ajst-2174	57	12	actual	actual	ADJ
ajst-2174	57	13	testing	testing	NOUN
ajst-2174	57	14	,	,	PUNCT
ajst-2174	57	15	it	it	PRON
ajst-2174	57	16	is	be	AUX
ajst-2174	57	17	difficult	difficult	ADJ
ajst-2174	57	18	for	for	SCONJ
ajst-2174	57	19	pseudo	pseudo	NOUN
ajst-2174	57	20	-	-	ADJ
ajst-2174	57	21	random	random	ADJ
ajst-2174	57	22	test	test	NOUN
ajst-2174	57	23	vectors	vector	NOUN
ajst-2174	57	24	to	to	PART
ajst-2174	57	25	detect	detect	VERB
ajst-2174	57	26	anti	anti	ADJ
ajst-2174	57	27	-	-	ADJ
ajst-2174	57	28	random	random	ADJ
ajst-2174	57	29	faults	fault	NOUN
ajst-2174	57	30	.	.	PUNCT
ajst-2174	58	1	therefore	therefore	ADV
ajst-2174	58	2	,	,	PUNCT
ajst-2174	58	3	only	only	ADV
ajst-2174	58	4	relying	rely	VERB
ajst-2174	58	5	on	on	ADP
ajst-2174	58	6	pseudo	pseudo	ADJ
ajst-2174	58	7	-	-	ADJ
ajst-2174	58	8	random	random	ADJ
ajst-2174	58	9	testing	testing	NOUN
ajst-2174	58	10	can	can	AUX
ajst-2174	58	11	not	not	PART
ajst-2174	58	12	complete	complete	VERB
ajst-2174	58	13	the	the	DET
ajst-2174	58	14	fault	fault	NOUN
ajst-2174	58	15	detection	detection	NOUN
ajst-2174	58	16	of	of	ADP
ajst-2174	58	17	the	the	DET
ajst-2174	58	18	test	test	NOUN
ajst-2174	58	19	circuit	circuit	NOUN
ajst-2174	58	20	.	.	PUNCT
ajst-2174	59	1	deterministic	deterministic	ADJ
ajst-2174	59	2	vectors	vector	NOUN
ajst-2174	59	3	need	need	VERB
ajst-2174	59	4	to	to	PART
ajst-2174	59	5	be	be	AUX
ajst-2174	59	6	generated	generate	VERB
ajst-2174	59	7	during	during	ADP
ajst-2174	59	8	built	build	VERB
ajst-2174	59	9	-	-	PUNCT
ajst-2174	59	10	in	in	ADP
ajst-2174	59	11	self	self	NOUN
ajst-2174	59	12	-	-	PUNCT
ajst-2174	59	13	test	test	NOUN
ajst-2174	59	14	to	to	PART
ajst-2174	59	15	achieve	achieve	VERB
ajst-2174	59	16	high	high	ADJ
ajst-2174	59	17	test	test	NOUN
ajst-2174	59	18	fault	fault	NOUN
ajst-2174	59	19	coverage	coverage	NOUN
ajst-2174	59	20	.	.	PUNCT
ajst-2174	60	1	the	the	DET
ajst-2174	60	2	vector	vector	NOUN
ajst-2174	60	3	generation	generation	NOUN
ajst-2174	60	4	method	method	NOUN
ajst-2174	60	5	used	use	VERB
ajst-2174	60	6	in	in	ADP
ajst-2174	60	7	this	this	DET
ajst-2174	60	8	paper	paper	NOUN
ajst-2174	60	9	is	be	AUX
ajst-2174	60	10	the	the	DET
ajst-2174	60	11	deterministic	deterministic	ADJ
ajst-2174	60	12	test	test	NOUN
ajst-2174	60	13	vector	vector	NOUN
ajst-2174	60	14	generation	generation	NOUN
ajst-2174	60	15	method	method	NOUN
ajst-2174	60	16	,	,	PUNCT
ajst-2174	60	17	and	and	CCONJ
ajst-2174	60	18	the	the	DET
ajst-2174	60	19	test	test	NOUN
ajst-2174	60	20	vector	vector	NOUN
ajst-2174	60	21	set	set	NOUN
ajst-2174	60	22	used	use	VERB
ajst-2174	60	23	is	be	AUX
ajst-2174	60	24	the	the	DET
ajst-2174	60	25	deterministic	deterministic	ADJ
ajst-2174	60	26	test	test	NOUN
ajst-2174	60	27	vector	vector	NOUN
ajst-2174	60	28	set	set	NOUN
ajst-2174	60	29	generated	generate	VERB
ajst-2174	60	30	by	by	ADP
ajst-2174	60	31	atpg	atpg	PROPN
ajst-2174	60	32	.	.	PUNCT
ajst-2174	61	1	3	3	X
ajst-2174	61	2	.	.	X
ajst-2174	61	3	realize	realize	VERB
ajst-2174	61	4	the	the	DET
ajst-2174	61	5	generation	generation	NOUN
ajst-2174	61	6	of	of	ADP
ajst-2174	61	7	low	low	ADJ
ajst-2174	61	8	-	-	PUNCT
ajst-2174	61	9	power	power	NOUN
ajst-2174	61	10	test	test	NOUN
ajst-2174	61	11	vector	vector	NOUN
ajst-2174	61	12	seeds	seed	NOUN
ajst-2174	61	13	:	:	PUNCT
ajst-2174	61	14	the	the	DET
ajst-2174	61	15	power	power	NOUN
ajst-2174	61	16	consumption	consumption	NOUN
ajst-2174	61	17	of	of	ADP
ajst-2174	61	18	cmos	cmos	ADJ
ajst-2174	61	19	circuits	circuit	NOUN
ajst-2174	61	20	comes	come	VERB
ajst-2174	61	21	from	from	ADP
ajst-2174	61	22	three	three	NUM
ajst-2174	61	23	aspects	aspect	NOUN
ajst-2174	61	24	:	:	PUNCT
ajst-2174	61	25	leakage	leakage	NOUN
ajst-2174	61	26	current	current	ADJ
ajst-2174	61	27	power	power	NOUN
ajst-2174	61	28	consumption	consumption	NOUN
ajst-2174	61	29	,	,	PUNCT
ajst-2174	61	30	dc	dc	PROPN
ajst-2174	61	31	shortcircuit	shortcircuit	PROPN
ajst-2174	61	32	current	current	ADJ
ajst-2174	61	33	power	power	NOUN
ajst-2174	61	34	consumption	consumption	NOUN
ajst-2174	61	35	,	,	PUNCT
ajst-2174	61	36	and	and	CCONJ
ajst-2174	61	37	dynamic	dynamic	ADJ
ajst-2174	61	38	switching	switching	NOUN
ajst-2174	61	39	power	power	NOUN
ajst-2174	61	40	consumption	consumption	NOUN
ajst-2174	61	41	.	.	PUNCT
ajst-2174	62	1	leakage	leakage	NOUN
ajst-2174	62	2	current	current	ADJ
ajst-2174	62	3	power	power	NOUN
ajst-2174	62	4	consumption	consumption	NOUN
ajst-2174	62	5	is	be	AUX
ajst-2174	62	6	largely	largely	ADV
ajst-2174	62	7	determined	determine	VERB
ajst-2174	62	8	by	by	ADP
ajst-2174	62	9	the	the	DET
ajst-2174	62	10	manufacturing	manufacturing	NOUN
ajst-2174	62	11	process	process	NOUN
ajst-2174	62	12	in	in	ADP
ajst-2174	62	13	which	which	PRON
ajst-2174	62	14	the	the	DET
ajst-2174	62	15	chip	chip	NOUN
ajst-2174	62	16	is	be	AUX
ajst-2174	62	17	produced	produce	VERB
ajst-2174	62	18	.	.	PUNCT
ajst-2174	63	1	the	the	DET
ajst-2174	63	2	dc	dc	PROPN
ajst-2174	63	3	short	short	ADJ
ajst-2174	63	4	-	-	PUNCT
ajst-2174	63	5	circuit	circuit	NOUN
ajst-2174	63	6	power	power	NOUN
ajst-2174	63	7	consumption	consumption	NOUN
ajst-2174	63	8	can	can	AUX
ajst-2174	63	9	be	be	AUX
ajst-2174	63	10	solved	solve	VERB
ajst-2174	63	11	from	from	ADP
ajst-2174	63	12	the	the	DET
ajst-2174	63	13	device	device	NOUN
ajst-2174	63	14	characteristics	characteristic	NOUN
ajst-2174	63	15	.	.	PUNCT
ajst-2174	64	1	dynamic	dynamic	ADJ
ajst-2174	64	2	switching	switching	NOUN
ajst-2174	64	3	power	power	NOUN
ajst-2174	64	4	consumption	consumption	NOUN
ajst-2174	64	5	is	be	AUX
ajst-2174	64	6	the	the	DET
ajst-2174	64	7	main	main	ADJ
ajst-2174	64	8	component	component	NOUN
ajst-2174	64	9	of	of	ADP
ajst-2174	64	10	chip	chip	NOUN
ajst-2174	64	11	power	power	NOUN
ajst-2174	64	12	consumption	consumption	NOUN
ajst-2174	64	13	,	,	PUNCT
ajst-2174	64	14	and	and	CCONJ
ajst-2174	64	15	the	the	DET
ajst-2174	64	16	dynamic	dynamic	ADJ
ajst-2174	64	17	power	power	NOUN
ajst-2174	64	18	consumption	consumption	NOUN
ajst-2174	64	19	of	of	ADP
ajst-2174	64	20	circuit	circuit	NOUN
ajst-2174	64	21	nodes	node	NOUN
ajst-2174	64	22	mainly	mainly	ADV
ajst-2174	64	23	depends	depend	VERB
ajst-2174	64	24	on	on	ADP
ajst-2174	64	25	the	the	DET
ajst-2174	64	26	switching	switch	VERB
ajst-2174	64	27	activity	activity	NOUN
ajst-2174	64	28	factor	factor	NOUN
ajst-2174	64	29	wsa	wsa	PROPN
ajst-2174	64	30	.	.	PROPN
ajst-2174	65	1	wsa	wsa	PROPN
ajst-2174	65	2	is	be	AUX
ajst-2174	65	3	mainly	mainly	ADV
ajst-2174	65	4	affected	affect	VERB
ajst-2174	65	5	by	by	ADP
ajst-2174	65	6	the	the	DET
ajst-2174	65	7	number	number	NOUN
ajst-2174	65	8	of	of	ADP
ajst-2174	65	9	transitions	transition	NOUN
ajst-2174	65	10	of	of	ADP
ajst-2174	65	11	the	the	DET
ajst-2174	65	12	circuit	circuit	NOUN
ajst-2174	65	13	nodes	nod	VERB
ajst-2174	65	14	.	.	PUNCT
ajst-2174	66	1	reducing	reduce	VERB
ajst-2174	66	2	the	the	DET
ajst-2174	66	3	number	number	NOUN
ajst-2174	66	4	of	of	ADP
ajst-2174	66	5	high	high	ADJ
ajst-2174	66	6	-	-	PUNCT
ajst-2174	66	7	low	low	ADJ
ajst-2174	66	8	205	205	NUM
ajst-2174	66	9	transitions	transition	NOUN
ajst-2174	66	10	of	of	ADP
ajst-2174	66	11	the	the	DET
ajst-2174	66	12	internal	internal	ADJ
ajst-2174	66	13	nodes	node	NOUN
ajst-2174	66	14	of	of	ADP
ajst-2174	66	15	the	the	DET
ajst-2174	66	16	circuit	circuit	NOUN
ajst-2174	66	17	under	under	ADP
ajst-2174	66	18	test	test	NOUN
ajst-2174	66	19	can	can	AUX
ajst-2174	66	20	effectively	effectively	ADV
ajst-2174	66	21	reduce	reduce	VERB
ajst-2174	66	22	the	the	DET
ajst-2174	66	23	test	test	NOUN
ajst-2174	66	24	power	power	NOUN
ajst-2174	66	25	consumption	consumption	NOUN
ajst-2174	66	26	.	.	PUNCT
ajst-2174	67	1	the	the	DET
ajst-2174	67	2	internal	internal	ADJ
ajst-2174	67	3	data	datum	NOUN
ajst-2174	67	4	of	of	ADP
ajst-2174	67	5	the	the	DET
ajst-2174	67	6	chip	chip	NOUN
ajst-2174	67	7	is	be	AUX
ajst-2174	67	8	related	relate	VERB
ajst-2174	67	9	when	when	SCONJ
ajst-2174	67	10	it	it	PRON
ajst-2174	67	11	is	be	AUX
ajst-2174	67	12	working	work	VERB
ajst-2174	67	13	normally	normally	ADV
ajst-2174	67	14	,	,	PUNCT
ajst-2174	67	15	so	so	CCONJ
ajst-2174	67	16	the	the	DET
ajst-2174	67	17	power	power	NOUN
ajst-2174	67	18	consumption	consumption	NOUN
ajst-2174	67	19	of	of	ADP
ajst-2174	67	20	the	the	DET
ajst-2174	67	21	chip	chip	NOUN
ajst-2174	67	22	is	be	AUX
ajst-2174	67	23	not	not	PART
ajst-2174	67	24	very	very	ADV
ajst-2174	67	25	high	high	ADJ
ajst-2174	67	26	when	when	SCONJ
ajst-2174	67	27	it	it	PRON
ajst-2174	67	28	is	be	AUX
ajst-2174	67	29	working	work	VERB
ajst-2174	67	30	normally	normally	ADV
ajst-2174	67	31	.	.	PUNCT
ajst-2174	68	1	however	however	ADV
ajst-2174	68	2	,	,	PUNCT
ajst-2174	68	3	the	the	DET
ajst-2174	68	4	test	test	NOUN
ajst-2174	68	5	vectors	vector	NOUN
ajst-2174	68	6	used	use	VERB
ajst-2174	68	7	for	for	ADP
ajst-2174	68	8	the	the	DET
ajst-2174	68	9	built	build	VERB
ajst-2174	68	10	-	-	PUNCT
ajst-2174	68	11	in	in	ADP
ajst-2174	68	12	self	self	NOUN
ajst-2174	68	13	-	-	PUNCT
ajst-2174	68	14	test	test	NOUN
ajst-2174	68	15	of	of	ADP
ajst-2174	68	16	the	the	DET
ajst-2174	68	17	chip	chip	NOUN
ajst-2174	68	18	are	be	AUX
ajst-2174	68	19	generated	generate	VERB
ajst-2174	68	20	by	by	ADP
ajst-2174	68	21	atpg	atpg	PROPN
ajst-2174	68	22	and	and	CCONJ
ajst-2174	68	23	have	have	VERB
ajst-2174	68	24	extremely	extremely	ADV
ajst-2174	68	25	low	low	ADJ
ajst-2174	68	26	correlation	correlation	NOUN
ajst-2174	68	27	,	,	PUNCT
ajst-2174	68	28	which	which	PRON
ajst-2174	68	29	will	will	AUX
ajst-2174	68	30	lead	lead	VERB
ajst-2174	68	31	to	to	ADP
ajst-2174	68	32	frequent	frequent	ADJ
ajst-2174	68	33	switching	switching	NOUN
ajst-2174	68	34	of	of	ADP
ajst-2174	68	35	the	the	DET
ajst-2174	68	36	internal	internal	ADJ
ajst-2174	68	37	nodes	node	NOUN
ajst-2174	68	38	of	of	ADP
ajst-2174	68	39	the	the	DET
ajst-2174	68	40	circuit	circuit	NOUN
ajst-2174	68	41	during	during	ADP
ajst-2174	68	42	the	the	DET
ajst-2174	68	43	test	test	NOUN
ajst-2174	68	44	,	,	PUNCT
ajst-2174	68	45	and	and	CCONJ
ajst-2174	68	46	exceed	exceed	VERB
ajst-2174	68	47	the	the	DET
ajst-2174	68	48	normal	normal	ADJ
ajst-2174	68	49	working	working	NOUN
ajst-2174	68	50	mode	mode	NOUN
ajst-2174	68	51	.	.	PUNCT
ajst-2174	69	1	therefore	therefore	ADV
ajst-2174	69	2	,	,	PUNCT
ajst-2174	69	3	the	the	DET
ajst-2174	69	4	test	test	NOUN
ajst-2174	69	5	vectors	vector	NOUN
ajst-2174	69	6	are	be	AUX
ajst-2174	69	7	sorted	sort	VERB
ajst-2174	69	8	according	accord	VERB
ajst-2174	69	9	to	to	ADP
ajst-2174	69	10	the	the	DET
ajst-2174	69	11	hamming	hamming	NOUN
ajst-2174	69	12	distance	distance	NOUN
ajst-2174	69	13	,	,	PUNCT
ajst-2174	69	14	and	and	CCONJ
ajst-2174	69	15	the	the	DET
ajst-2174	69	16	loading	loading	NOUN
ajst-2174	69	17	order	order	NOUN
ajst-2174	69	18	between	between	ADP
ajst-2174	69	19	the	the	DET
ajst-2174	69	20	vectors	vector	NOUN
ajst-2174	69	21	is	be	AUX
ajst-2174	69	22	changed	change	VERB
ajst-2174	69	23	to	to	PART
ajst-2174	69	24	minimize	minimize	VERB
ajst-2174	69	25	the	the	DET
ajst-2174	69	26	number	number	NOUN
ajst-2174	69	27	of	of	ADP
ajst-2174	69	28	internal	internal	ADJ
ajst-2174	69	29	flips	flip	NOUN
ajst-2174	69	30	of	of	ADP
ajst-2174	69	31	the	the	DET
ajst-2174	69	32	circuit	circuit	NOUN
ajst-2174	69	33	under	under	ADP
ajst-2174	69	34	test	test	NOUN
ajst-2174	69	35	,	,	PUNCT
ajst-2174	69	36	thereby	thereby	ADV
ajst-2174	69	37	optimizing	optimize	VERB
ajst-2174	69	38	the	the	DET
ajst-2174	69	39	test	test	NOUN
ajst-2174	69	40	power	power	NOUN
ajst-2174	69	41	consumption	consumption	NOUN
ajst-2174	69	42	.	.	PUNCT
ajst-2174	70	1	main	main	ADJ
ajst-2174	70	2	idea	idea	NOUN
ajst-2174	70	3	:	:	PUNCT
ajst-2174	70	4	combines	combine	VERB
ajst-2174	70	5	lfsr	lfsr	X
ajst-2174	70	6	reseeding	reseeding	NOUN
ajst-2174	70	7	technique	technique	NOUN
ajst-2174	70	8	and	and	CCONJ
ajst-2174	70	9	low	low	ADJ
ajst-2174	70	10	power	power	NOUN
ajst-2174	70	11	test	test	NOUN
ajst-2174	70	12	pattern	pattern	NOUN
ajst-2174	70	13	generation	generation	NOUN
ajst-2174	70	14	technique	technique	NOUN
ajst-2174	70	15	.	.	PUNCT
ajst-2174	71	1	first	first	ADV
ajst-2174	71	2	,	,	PUNCT
ajst-2174	71	3	use	use	VERB
ajst-2174	71	4	lfsr	lfsr	PROPN
ajst-2174	71	5	to	to	PART
ajst-2174	71	6	encode	encode	VERB
ajst-2174	71	7	the	the	DET
ajst-2174	71	8	original	original	ADJ
ajst-2174	71	9	test	test	NOUN
ajst-2174	71	10	vector	vector	NOUN
ajst-2174	71	11	into	into	ADP
ajst-2174	71	12	a	a	DET
ajst-2174	71	13	vector	vector	NOUN
ajst-2174	71	14	seed	seed	NOUN
ajst-2174	71	15	set	set	NOUN
ajst-2174	71	16	,	,	PUNCT
ajst-2174	71	17	and	and	CCONJ
ajst-2174	71	18	then	then	ADV
ajst-2174	71	19	use	use	VERB
ajst-2174	71	20	the	the	DET
ajst-2174	71	21	low	low	ADJ
ajst-2174	71	22	-	-	PUNCT
ajst-2174	71	23	power	power	NOUN
ajst-2174	71	24	test	test	NOUN
ajst-2174	71	25	vector	vector	NOUN
ajst-2174	71	26	generation	generation	NOUN
ajst-2174	71	27	technology	technology	NOUN
ajst-2174	71	28	to	to	PART
ajst-2174	71	29	encode	encode	VERB
ajst-2174	71	30	the	the	DET
ajst-2174	71	31	vector	vector	NOUN
ajst-2174	71	32	seed	seed	NOUN
ajst-2174	71	33	set	set	VERB
ajst-2174	71	34	into	into	ADP
ajst-2174	71	35	a	a	DET
ajst-2174	71	36	low	low	ADJ
ajst-2174	71	37	-	-	PUNCT
ajst-2174	71	38	power	power	NOUN
ajst-2174	71	39	test	test	NOUN
ajst-2174	71	40	vector	vector	NOUN
ajst-2174	71	41	seed	seed	NOUN
ajst-2174	71	42	set	set	NOUN
ajst-2174	71	43	,	,	PUNCT
ajst-2174	71	44	and	and	CCONJ
ajst-2174	71	45	finally	finally	ADV
ajst-2174	71	46	store	store	VERB
ajst-2174	71	47	the	the	DET
ajst-2174	71	48	low	low	ADJ
ajst-2174	71	49	-	-	PUNCT
ajst-2174	71	50	power	power	NOUN
ajst-2174	71	51	test	test	NOUN
ajst-2174	71	52	vector	vector	NOUN
ajst-2174	71	53	seed	seed	NOUN
ajst-2174	71	54	set	set	VERB
ajst-2174	71	55	in	in	ADP
ajst-2174	71	56	rom	rom	PROPN
ajst-2174	71	57	.	.	PUNCT
ajst-2174	72	1	(	(	PUNCT
ajst-2174	72	2	sort	sort	VERB
ajst-2174	72	3	the	the	DET
ajst-2174	72	4	vector	vector	NOUN
ajst-2174	72	5	seeds	seed	NOUN
ajst-2174	72	6	based	base	VERB
ajst-2174	72	7	on	on	ADP
ajst-2174	72	8	the	the	DET
ajst-2174	72	9	hamming	hamming	NOUN
ajst-2174	72	10	distance	distance	NOUN
ajst-2174	72	11	,	,	PUNCT
ajst-2174	72	12	the	the	DET
ajst-2174	72	13	algorithm	algorithm	NOUN
ajst-2174	72	14	is	be	AUX
ajst-2174	72	15	shown	show	VERB
ajst-2174	72	16	in	in	ADP
ajst-2174	72	17	figure	figure	NOUN
ajst-2174	72	18	3	3	NUM
ajst-2174	72	19	below	below	ADV
ajst-2174	72	20	)	)	PUNCT
ajst-2174	72	21	.	.	PUNCT
ajst-2174	73	1	during	during	ADP
ajst-2174	73	2	testing	testing	NOUN
ajst-2174	73	3	,	,	PUNCT
ajst-2174	73	4	the	the	DET
ajst-2174	73	5	test	test	NOUN
ajst-2174	73	6	vector	vector	NOUN
ajst-2174	73	7	seeds	seed	NOUN
ajst-2174	73	8	are	be	AUX
ajst-2174	73	9	expanded	expand	VERB
ajst-2174	73	10	into	into	ADP
ajst-2174	73	11	low	low	ADJ
ajst-2174	73	12	-	-	PUNCT
ajst-2174	73	13	power	power	NOUN
ajst-2174	73	14	test	test	NOUN
ajst-2174	73	15	vectors	vector	NOUN
ajst-2174	73	16	and	and	CCONJ
ajst-2174	73	17	loaded	load	VERB
ajst-2174	73	18	into	into	ADP
ajst-2174	73	19	the	the	DET
ajst-2174	73	20	circuit	circuit	NOUN
ajst-2174	73	21	under	under	ADP
ajst-2174	73	22	test	test	NOUN
ajst-2174	73	23	,	,	PUNCT
ajst-2174	73	24	and	and	CCONJ
ajst-2174	73	25	the	the	DET
ajst-2174	73	26	test	test	NOUN
ajst-2174	73	27	fault	fault	NOUN
ajst-2174	73	28	coverage	coverage	NOUN
ajst-2174	73	29	is	be	AUX
ajst-2174	73	30	improved	improve	VERB
ajst-2174	73	31	by	by	ADP
ajst-2174	73	32	repeated	repeat	VERB
ajst-2174	73	33	seeding	seeding	NOUN
ajst-2174	73	34	of	of	ADP
ajst-2174	73	35	the	the	DET
ajst-2174	73	36	test	test	NOUN
ajst-2174	73	37	vector	vector	NOUN
ajst-2174	73	38	seeds	seed	NOUN
ajst-2174	73	39	,	,	PUNCT
ajst-2174	73	40	which	which	PRON
ajst-2174	73	41	not	not	PART
ajst-2174	73	42	only	only	ADV
ajst-2174	73	43	ensures	ensure	VERB
ajst-2174	73	44	high	high	ADJ
ajst-2174	73	45	fault	fault	NOUN
ajst-2174	73	46	coverage	coverage	NOUN
ajst-2174	73	47	of	of	ADP
ajst-2174	73	48	chip	chip	NOUN
ajst-2174	73	49	detection	detection	NOUN
ajst-2174	73	50	,	,	PUNCT
ajst-2174	73	51	but	but	CCONJ
ajst-2174	73	52	also	also	ADV
ajst-2174	73	53	reduces	reduce	VERB
ajst-2174	73	54	the	the	DET
ajst-2174	73	55	dynamic	dynamic	ADJ
ajst-2174	73	56	power	power	NOUN
ajst-2174	73	57	consumption	consumption	NOUN
ajst-2174	73	58	in	in	ADP
ajst-2174	73	59	the	the	DET
ajst-2174	73	60	test	test	NOUN
ajst-2174	73	61	.	.	PUNCT
ajst-2174	74	1	figure	figure	NOUN
ajst-2174	74	2	.	.	PUNCT
ajst-2174	75	1	3	3	NUM
ajst-2174	75	2	advantages	advantage	NOUN
ajst-2174	75	3	of	of	ADP
ajst-2174	75	4	low	low	ADJ
ajst-2174	75	5	power	power	NOUN
ajst-2174	75	6	lfsr	lfsr	PROPN
ajst-2174	75	7	reseeding	reseed	VERB
ajst-2174	75	8	technology	technology	NOUN
ajst-2174	75	9	:	:	PUNCT
ajst-2174	75	10	all	all	DET
ajst-2174	75	11	test	test	NOUN
ajst-2174	75	12	vector	vector	NOUN
ajst-2174	75	13	sets	set	NOUN
ajst-2174	75	14	can	can	AUX
ajst-2174	75	15	be	be	AUX
ajst-2174	75	16	encoded	encode	VERB
ajst-2174	75	17	to	to	PART
ajst-2174	75	18	meet	meet	VERB
ajst-2174	75	19	the	the	DET
ajst-2174	75	20	requirements	requirement	NOUN
ajst-2174	75	21	of	of	ADP
ajst-2174	75	22	low	low	ADJ
ajst-2174	75	23	-	-	PUNCT
ajst-2174	75	24	power	power	NOUN
ajst-2174	75	25	test	test	NOUN
ajst-2174	75	26	vector	vector	NOUN
ajst-2174	75	27	seed	seed	NOUN
ajst-2174	75	28	sorting	sorting	NOUN
ajst-2174	75	29	;	;	PUNCT
ajst-2174	75	30	the	the	DET
ajst-2174	75	31	low	low	ADJ
ajst-2174	75	32	-	-	PUNCT
ajst-2174	75	33	power	power	NOUN
ajst-2174	75	34	test	test	NOUN
ajst-2174	75	35	vector	vector	NOUN
ajst-2174	75	36	generator	generator	NOUN
ajst-2174	75	37	based	base	VERB
ajst-2174	75	38	on	on	ADP
ajst-2174	75	39	the	the	DET
ajst-2174	75	40	lfsr	lfsr	PROPN
ajst-2174	75	41	test	test	NOUN
ajst-2174	75	42	vector	vector	NOUN
ajst-2174	75	43	reseeding	reseeding	NOUN
ajst-2174	75	44	technology	technology	NOUN
ajst-2174	75	45	only	only	ADV
ajst-2174	75	46	needs	need	VERB
ajst-2174	75	47	to	to	PART
ajst-2174	75	48	decode	decode	VERB
ajst-2174	75	49	the	the	DET
ajst-2174	75	50	controller	controller	NOUN
ajst-2174	75	51	logic	logic	NOUN
ajst-2174	75	52	to	to	PART
ajst-2174	75	53	control	control	VERB
ajst-2174	75	54	the	the	DET
ajst-2174	75	55	xor	xor	PROPN
ajst-2174	75	56	network	network	NOUN
ajst-2174	75	57	to	to	PART
ajst-2174	75	58	select	select	VERB
ajst-2174	75	59	the	the	DET
ajst-2174	75	60	lfsr	lfsr	PROPN
ajst-2174	75	61	structure	structure	NOUN
ajst-2174	75	62	,	,	PUNCT
ajst-2174	75	63	the	the	DET
ajst-2174	75	64	required	require	VERB
ajst-2174	75	65	hardware	hardware	NOUN
ajst-2174	75	66	structure	structure	NOUN
ajst-2174	75	67	is	be	AUX
ajst-2174	75	68	simple	simple	ADJ
ajst-2174	75	69	,	,	PUNCT
ajst-2174	75	70	and	and	CCONJ
ajst-2174	75	71	the	the	DET
ajst-2174	75	72	control	control	NOUN
ajst-2174	75	73	logic	logic	NOUN
ajst-2174	75	74	is	be	AUX
ajst-2174	75	75	easy	easy	ADJ
ajst-2174	75	76	to	to	PART
ajst-2174	75	77	implement	implement	VERB
ajst-2174	75	78	;	;	PUNCT
ajst-2174	75	79	during	during	ADP
ajst-2174	75	80	the	the	DET
ajst-2174	75	81	test	test	NOUN
ajst-2174	75	82	process	process	NOUN
ajst-2174	75	83	,	,	PUNCT
ajst-2174	75	84	the	the	DET
ajst-2174	75	85	low	low	ADJ
ajst-2174	75	86	-	-	PUNCT
ajst-2174	75	87	power	power	NOUN
ajst-2174	75	88	test	test	NOUN
ajst-2174	75	89	vector	vector	NOUN
ajst-2174	75	90	is	be	AUX
ajst-2174	75	91	repeatedly	repeatedly	ADV
ajst-2174	75	92	seeded	seed	VERB
ajst-2174	75	93	to	to	ADP
ajst-2174	75	94	the	the	DET
ajst-2174	75	95	circuit	circuit	NOUN
ajst-2174	75	96	under	under	ADP
ajst-2174	75	97	test	test	NOUN
ajst-2174	75	98	through	through	ADP
ajst-2174	75	99	lfsr	lfsr	PROPN
ajst-2174	75	100	,	,	PUNCT
ajst-2174	75	101	which	which	PRON
ajst-2174	75	102	reduces	reduce	VERB
ajst-2174	75	103	the	the	DET
ajst-2174	75	104	test	test	NOUN
ajst-2174	75	105	power	power	NOUN
ajst-2174	75	106	consumption	consumption	NOUN
ajst-2174	75	107	while	while	SCONJ
ajst-2174	75	108	improving	improve	VERB
ajst-2174	75	109	the	the	DET
ajst-2174	75	110	fault	fault	NOUN
ajst-2174	75	111	coverage	coverage	NOUN
ajst-2174	75	112	rate	rate	NOUN
ajst-2174	75	113	,	,	PUNCT
ajst-2174	75	114	and	and	CCONJ
ajst-2174	75	115	balances	balance	VERB
ajst-2174	75	116	the	the	DET
ajst-2174	75	117	test	test	NOUN
ajst-2174	75	118	power	power	NOUN
ajst-2174	75	119	consumption	consumption	NOUN
ajst-2174	75	120	and	and	CCONJ
ajst-2174	75	121	the	the	DET
ajst-2174	75	122	test	test	NOUN
ajst-2174	75	123	fault	fault	NOUN
ajst-2174	75	124	coverage	coverage	NOUN
ajst-2174	75	125	rate	rate	NOUN
ajst-2174	75	126	.	.	PUNCT
ajst-2174	76	1	2.3	2.3	NUM
ajst-2174	76	2	.	.	PUNCT
ajst-2174	77	1	test	test	NOUN
ajst-2174	77	2	response	response	NOUN
ajst-2174	77	3	analysis	analysis	NOUN
ajst-2174	77	4	test	test	NOUN
ajst-2174	77	5	response	response	NOUN
ajst-2174	77	6	analysis	analysis	NOUN
ajst-2174	77	7	generally	generally	ADV
ajst-2174	77	8	includes	include	VERB
ajst-2174	77	9	rom	rom	NOUN
ajst-2174	77	10	storagebased	storagebase	VERB
ajst-2174	77	11	deterministic	deterministic	ADJ
ajst-2174	77	12	testing	testing	NOUN
ajst-2174	77	13	and	and	CCONJ
ajst-2174	77	14	response	response	NOUN
ajst-2174	77	15	compression	compression	NOUN
ajst-2174	77	16	methods	method	NOUN
ajst-2174	77	17	.	.	PUNCT
ajst-2174	78	1	since	since	SCONJ
ajst-2174	78	2	each	each	DET
ajst-2174	78	3	expected	expect	VERB
ajst-2174	78	4	test	test	NOUN
ajst-2174	78	5	response	response	NOUN
ajst-2174	78	6	result	result	NOUN
ajst-2174	78	7	needs	need	VERB
ajst-2174	78	8	to	to	PART
ajst-2174	78	9	be	be	AUX
ajst-2174	78	10	stored	store	VERB
ajst-2174	78	11	in	in	ADP
ajst-2174	78	12	the	the	DET
ajst-2174	78	13	rom	rom	NOUN
ajst-2174	78	14	memory	memory	NOUN
ajst-2174	78	15	,	,	PUNCT
ajst-2174	78	16	the	the	DET
ajst-2174	78	17	silicon	silicon	NOUN
ajst-2174	78	18	chip	chip	NOUN
ajst-2174	78	19	overhead	overhead	NOUN
ajst-2174	78	20	is	be	AUX
ajst-2174	78	21	increased	increase	VERB
ajst-2174	78	22	to	to	ADP
ajst-2174	78	23	a	a	DET
ajst-2174	78	24	large	large	ADJ
ajst-2174	78	25	extent	extent	NOUN
ajst-2174	78	26	.	.	PUNCT
ajst-2174	79	1	in	in	ADP
ajst-2174	79	2	order	order	NOUN
ajst-2174	79	3	to	to	PART
ajst-2174	79	4	reduce	reduce	VERB
ajst-2174	79	5	the	the	DET
ajst-2174	79	6	test	test	NOUN
ajst-2174	79	7	cost	cost	NOUN
ajst-2174	79	8	and	and	CCONJ
ajst-2174	79	9	time	time	NOUN
ajst-2174	79	10	,	,	PUNCT
ajst-2174	79	11	test	test	NOUN
ajst-2174	79	12	compression	compression	NOUN
ajst-2174	79	13	is	be	AUX
ajst-2174	79	14	introduced	introduce	VERB
ajst-2174	79	15	.	.	PUNCT
ajst-2174	80	1	feature	feature	NOUN
ajst-2174	80	2	analysis	analysis	NOUN
ajst-2174	80	3	is	be	AUX
ajst-2174	80	4	a	a	DET
ajst-2174	80	5	compression	compression	NOUN
ajst-2174	80	6	technique	technique	NOUN
ajst-2174	80	7	based	base	VERB
ajst-2174	80	8	on	on	ADP
ajst-2174	80	9	lfsr	lfsr	PROPN
ajst-2174	80	10	.	.	PUNCT
ajst-2174	81	1	the	the	DET
ajst-2174	81	2	characteristic	characteristic	ADJ
ajst-2174	81	3	analysis	analysis	NOUN
ajst-2174	81	4	method	method	NOUN
ajst-2174	81	5	to	to	PART
ajst-2174	81	6	realize	realize	VERB
ajst-2174	81	7	the	the	DET
ajst-2174	81	8	test	test	NOUN
ajst-2174	81	9	response	response	NOUN
ajst-2174	81	10	compression	compression	NOUN
ajst-2174	81	11	has	have	VERB
ajst-2174	81	12	the	the	DET
ajst-2174	81	13	advantages	advantage	NOUN
ajst-2174	81	14	of	of	ADP
ajst-2174	81	15	small	small	ADJ
ajst-2174	81	16	aliasing	aliasing	NOUN
ajst-2174	81	17	probability	probability	NOUN
ajst-2174	81	18	and	and	CCONJ
ajst-2174	81	19	independent	independent	ADJ
ajst-2174	81	20	from	from	ADP
ajst-2174	81	21	the	the	DET
ajst-2174	81	22	output	output	NOUN
ajst-2174	81	23	response	response	NOUN
ajst-2174	81	24	,	,	PUNCT
ajst-2174	81	25	simple	simple	ADJ
ajst-2174	81	26	structure	structure	NOUN
ajst-2174	81	27	design	design	NOUN
ajst-2174	81	28	,	,	PUNCT
ajst-2174	81	29	low	low	ADJ
ajst-2174	81	30	hardware	hardware	NOUN
ajst-2174	81	31	cost	cost	NOUN
ajst-2174	81	32	,	,	PUNCT
ajst-2174	81	33	and	and	CCONJ
ajst-2174	81	34	can	can	AUX
ajst-2174	81	35	carry	carry	VERB
ajst-2174	81	36	out	out	ADP
ajst-2174	81	37	multi	multi	ADJ
ajst-2174	81	38	-	-	ADJ
ajst-2174	81	39	output	output	ADJ
ajst-2174	81	40	analysis	analysis	NOUN
ajst-2174	81	41	at	at	ADP
ajst-2174	81	42	the	the	DET
ajst-2174	81	43	same	same	ADJ
ajst-2174	81	44	time	time	NOUN
ajst-2174	81	45	,	,	PUNCT
ajst-2174	81	46	which	which	PRON
ajst-2174	81	47	has	have	VERB
ajst-2174	81	48	great	great	ADJ
ajst-2174	81	49	advantages	advantage	NOUN
ajst-2174	81	50	over	over	ADP
ajst-2174	81	51	other	other	ADJ
ajst-2174	81	52	methods	method	NOUN
ajst-2174	81	53	.	.	PUNCT
ajst-2174	82	1	the	the	DET
ajst-2174	82	2	compression	compression	NOUN
ajst-2174	82	3	-	-	PUNCT
ajst-2174	82	4	based	base	VERB
ajst-2174	82	5	testing	testing	NOUN
ajst-2174	82	6	process	process	NOUN
ajst-2174	82	7	first	first	ADV
ajst-2174	82	8	obtains	obtain	VERB
ajst-2174	82	9	the	the	DET
ajst-2174	82	10	correct	correct	ADJ
ajst-2174	82	11	compression	compression	NOUN
ajst-2174	82	12	response	response	NOUN
ajst-2174	82	13	through	through	ADP
ajst-2174	82	14	a	a	DET
ajst-2174	82	15	fault	fault	NOUN
ajst-2174	82	16	-	-	PUNCT
ajst-2174	82	17	free	free	ADJ
ajst-2174	82	18	good	good	PROPN
ajst-2174	82	19	board	board	PROPN
ajst-2174	82	20	simulation	simulation	PROPN
ajst-2174	82	21	,	,	PUNCT
ajst-2174	82	22	called	call	VERB
ajst-2174	82	23	the	the	DET
ajst-2174	82	24	golden	golden	ADJ
ajst-2174	82	25	signature	signature	NOUN
ajst-2174	82	26	.	.	PUNCT
ajst-2174	83	1	during	during	ADP
ajst-2174	83	2	the	the	DET
ajst-2174	83	3	test	test	NOUN
ajst-2174	83	4	,	,	PUNCT
ajst-2174	83	5	the	the	DET
ajst-2174	83	6	test	test	NOUN
ajst-2174	83	7	response	response	NOUN
ajst-2174	83	8	of	of	ADP
ajst-2174	83	9	the	the	DET
ajst-2174	83	10	circuit	circuit	NOUN
ajst-2174	83	11	under	under	ADP
ajst-2174	83	12	test	test	NOUN
ajst-2174	83	13	is	be	AUX
ajst-2174	83	14	compressed	compress	VERB
ajst-2174	83	15	by	by	ADP
ajst-2174	83	16	the	the	DET
ajst-2174	83	17	same	same	ADJ
ajst-2174	83	18	mechanism	mechanism	NOUN
ajst-2174	83	19	,	,	PUNCT
ajst-2174	83	20	and	and	CCONJ
ajst-2174	83	21	the	the	DET
ajst-2174	83	22	obtained	obtain	VERB
ajst-2174	83	23	features	feature	NOUN
ajst-2174	83	24	are	be	AUX
ajst-2174	83	25	compared	compare	VERB
ajst-2174	83	26	with	with	ADP
ajst-2174	83	27	the	the	DET
ajst-2174	83	28	good	good	PROPN
ajst-2174	83	29	board	board	PROPN
ajst-2174	83	30	features	feature	VERB
ajst-2174	83	31	.	.	PUNCT
ajst-2174	84	1	if	if	SCONJ
ajst-2174	84	2	the	the	DET
ajst-2174	84	3	obtained	obtain	VERB
ajst-2174	84	4	features	feature	NOUN
ajst-2174	84	5	are	be	AUX
ajst-2174	84	6	the	the	DET
ajst-2174	84	7	same	same	ADJ
ajst-2174	84	8	as	as	ADP
ajst-2174	84	9	the	the	DET
ajst-2174	84	10	good	good	PROPN
ajst-2174	84	11	board	board	PROPN
ajst-2174	84	12	features	feature	VERB
ajst-2174	84	13	,	,	PUNCT
ajst-2174	84	14	the	the	DET
ajst-2174	84	15	cut	cut	NOUN
ajst-2174	84	16	is	be	AUX
ajst-2174	84	17	considered	consider	VERB
ajst-2174	84	18	to	to	PART
ajst-2174	84	19	be	be	AUX
ajst-2174	84	20	a	a	DET
ajst-2174	84	21	fault	fault	NOUN
ajst-2174	84	22	-	-	PUNCT
ajst-2174	84	23	free	free	ADJ
ajst-2174	84	24	circuit	circuit	NOUN
ajst-2174	84	25	,	,	PUNCT
ajst-2174	84	26	otherwise	otherwise	ADV
ajst-2174	84	27	it	it	PRON
ajst-2174	84	28	is	be	AUX
ajst-2174	84	29	a	a	DET
ajst-2174	84	30	faulty	faulty	ADJ
ajst-2174	84	31	circuit	circuit	NOUN
ajst-2174	84	32	.	.	PUNCT
ajst-2174	85	1	3	3	X
ajst-2174	85	2	.	.	NOUN
ajst-2174	85	3	results	result	NOUN
ajst-2174	85	4	and	and	CCONJ
ajst-2174	85	5	discussion	discussion	NOUN
ajst-2174	85	6	3.1	3.1	NUM
ajst-2174	85	7	.	.	PUNCT
ajst-2174	86	1	data	datum	NOUN
ajst-2174	86	2	analysis	analysis	NOUN
ajst-2174	86	3	of	of	ADP
ajst-2174	86	4	test	test	NOUN
ajst-2174	86	5	vector	vector	NOUN
ajst-2174	86	6	generation	generation	NOUN
ajst-2174	86	7	module	module	NOUN
ajst-2174	86	8	according	accord	VERB
ajst-2174	86	9	to	to	ADP
ajst-2174	86	10	the	the	DET
ajst-2174	86	11	test	test	NOUN
ajst-2174	86	12	vector	vector	NOUN
ajst-2174	86	13	seed	seed	NOUN
ajst-2174	86	14	generation	generation	NOUN
ajst-2174	86	15	algorithm	algorithm	NOUN
ajst-2174	86	16	based	base	VERB
ajst-2174	86	17	on	on	ADP
ajst-2174	86	18	hamming	ham	VERB
ajst-2174	86	19	distance	distance	NOUN
ajst-2174	86	20	reordering	reordering	NOUN
ajst-2174	86	21	proposed	propose	VERB
ajst-2174	86	22	in	in	ADP
ajst-2174	86	23	the	the	DET
ajst-2174	86	24	second	second	ADJ
ajst-2174	86	25	chapter	chapter	NOUN
ajst-2174	86	26	of	of	ADP
ajst-2174	86	27	this	this	DET
ajst-2174	86	28	paper	paper	NOUN
ajst-2174	86	29	,	,	PUNCT
ajst-2174	86	30	some	some	DET
ajst-2174	86	31	circuits	circuit	NOUN
ajst-2174	86	32	of	of	ADP
ajst-2174	86	33	iscas85	iscas85	NOUN
ajst-2174	86	34	and	and	CCONJ
ajst-2174	86	35	iscas89	iscas89	ADJ
ajst-2174	86	36	in	in	ADP
ajst-2174	86	37	the	the	DET
ajst-2174	86	38	international	international	ADJ
ajst-2174	86	39	benchmark	benchmark	NOUN
ajst-2174	86	40	circuit	circuit	NOUN
ajst-2174	86	41	set	set	VERB
ajst-2174	86	42	are	be	AUX
ajst-2174	86	43	used	use	VERB
ajst-2174	86	44	for	for	ADP
ajst-2174	86	45	experiments	experiment	NOUN
ajst-2174	86	46	.	.	PUNCT
ajst-2174	87	1	the	the	DET
ajst-2174	87	2	experimental	experimental	ADJ
ajst-2174	87	3	circuit	circuit	NOUN
ajst-2174	87	4	generates	generate	VERB
ajst-2174	87	5	the	the	DET
ajst-2174	87	6	original	original	ADJ
ajst-2174	87	7	test	test	NOUN
ajst-2174	87	8	vector	vector	NOUN
ajst-2174	87	9	set	set	VERB
ajst-2174	87	10	through	through	ADP
ajst-2174	87	11	atpg	atpg	NOUN
ajst-2174	87	12	,	,	PUNCT
ajst-2174	87	13	encodes	encode	VERB
ajst-2174	87	14	it	it	PRON
ajst-2174	87	15	into	into	ADP
ajst-2174	87	16	test	test	NOUN
ajst-2174	87	17	vector	vector	NOUN
ajst-2174	87	18	seeds	seed	NOUN
ajst-2174	87	19	through	through	ADP
ajst-2174	87	20	lfsr	lfsr	PROPN
ajst-2174	87	21	,	,	PUNCT
ajst-2174	87	22	and	and	CCONJ
ajst-2174	87	23	stores	store	VERB
ajst-2174	87	24	the	the	DET
ajst-2174	87	25	test	test	NOUN
ajst-2174	87	26	vector	vector	NOUN
ajst-2174	87	27	seeds	seed	NOUN
ajst-2174	87	28	reordered	reorder	VERB
ajst-2174	87	29	based	base	VERB
ajst-2174	87	30	on	on	ADP
ajst-2174	87	31	hamming	ham	VERB
ajst-2174	87	32	distance	distance	NOUN
ajst-2174	87	33	into	into	ADP
ajst-2174	87	34	rom	rom	NOUN
ajst-2174	87	35	for	for	ADP
ajst-2174	87	36	storage	storage	NOUN
ajst-2174	87	37	.	.	PUNCT
ajst-2174	88	1	the	the	DET
ajst-2174	88	2	lfsr	lfsr	PROPN
ajst-2174	88	3	reseeding	reseeding	NOUN
ajst-2174	88	4	technique	technique	NOUN
ajst-2174	88	5	can	can	AUX
ajst-2174	88	6	improve	improve	VERB
ajst-2174	88	7	the	the	DET
ajst-2174	88	8	fault	fault	NOUN
ajst-2174	88	9	coverage	coverage	NOUN
ajst-2174	88	10	of	of	ADP
ajst-2174	88	11	the	the	DET
ajst-2174	88	12	test	test	NOUN
ajst-2174	88	13	by	by	ADP
ajst-2174	88	14	repeatedly	repeatedly	ADV
ajst-2174	88	15	seeding	seed	VERB
ajst-2174	88	16	the	the	DET
ajst-2174	88	17	test	test	NOUN
ajst-2174	88	18	vector	vector	NOUN
ajst-2174	88	19	seeds	seed	NOUN
ajst-2174	88	20	.	.	PUNCT
ajst-2174	89	1	through	through	ADP
ajst-2174	89	2	experiments	experiment	NOUN
ajst-2174	89	3	on	on	ADP
ajst-2174	89	4	some	some	DET
ajst-2174	89	5	circuits	circuit	NOUN
ajst-2174	89	6	of	of	ADP
ajst-2174	89	7	iscas85	iscas85	NOUN
ajst-2174	89	8	and	and	CCONJ
ajst-2174	89	9	iscas89	iscas89	ADJ
ajst-2174	89	10	,	,	PUNCT
ajst-2174	89	11	the	the	DET
ajst-2174	89	12	fault	fault	NOUN
ajst-2174	89	13	coverage	coverage	NOUN
ajst-2174	89	14	rate	rate	NOUN
ajst-2174	89	15	of	of	ADP
ajst-2174	89	16	deterministic	deterministic	ADJ
ajst-2174	89	17	faults	fault	NOUN
ajst-2174	89	18	generated	generate	VERB
ajst-2174	89	19	by	by	ADP
ajst-2174	89	20	low	low	ADJ
ajst-2174	89	21	-	-	PUNCT
ajst-2174	89	22	power	power	NOUN
ajst-2174	89	23	test	test	NOUN
ajst-2174	89	24	vectors	vector	NOUN
ajst-2174	89	25	is	be	AUX
ajst-2174	89	26	calculated	calculate	VERB
ajst-2174	89	27	and	and	CCONJ
ajst-2174	89	28	compared	compare	VERB
ajst-2174	89	29	with	with	ADP
ajst-2174	89	30	other	other	ADJ
ajst-2174	89	31	methods	method	NOUN
ajst-2174	89	32	,	,	PUNCT
ajst-2174	89	33	as	as	SCONJ
ajst-2174	89	34	shown	show	VERB
ajst-2174	89	35	in	in	ADP
ajst-2174	89	36	figure	figure	NOUN
ajst-2174	89	37	4	4	NUM
ajst-2174	89	38	.	.	NOUN
ajst-2174	89	39	206	206	NUM
ajst-2174	89	40	figure	figure	NOUN
ajst-2174	89	41	4	4	NUM
ajst-2174	89	42	.	.	PUNCT
ajst-2174	90	1	fault	fault	VERB
ajst-2174	90	2	coverage	coverage	NOUN
ajst-2174	90	3	comparison	comparison	NOUN
ajst-2174	90	4	table	table	NOUN
ajst-2174	90	5	after	after	SCONJ
ajst-2174	90	6	the	the	DET
ajst-2174	90	7	test	test	NOUN
ajst-2174	90	8	vector	vector	NOUN
ajst-2174	90	9	is	be	AUX
ajst-2174	90	10	generated	generate	VERB
ajst-2174	90	11	for	for	ADP
ajst-2174	90	12	the	the	DET
ajst-2174	90	13	c499	c499	PROPN
ajst-2174	90	14	circuit	circuit	NOUN
ajst-2174	90	15	,	,	PUNCT
ajst-2174	90	16	the	the	DET
ajst-2174	90	17	power	power	NOUN
ajst-2174	90	18	consumption	consumption	NOUN
ajst-2174	90	19	analysis	analysis	NOUN
ajst-2174	90	20	is	be	AUX
ajst-2174	90	21	carried	carry	VERB
ajst-2174	90	22	out	out	ADP
ajst-2174	90	23	,	,	PUNCT
ajst-2174	90	24	and	and	CCONJ
ajst-2174	90	25	the	the	DET
ajst-2174	90	26	power	power	NOUN
ajst-2174	90	27	consumption	consumption	NOUN
ajst-2174	90	28	analysis	analysis	NOUN
ajst-2174	90	29	report	report	NOUN
ajst-2174	90	30	is	be	AUX
ajst-2174	90	31	shown	show	VERB
ajst-2174	90	32	in	in	ADP
ajst-2174	90	33	figure	figure	NOUN
ajst-2174	90	34	5	5	NUM
ajst-2174	90	35	.	.	PUNCT
ajst-2174	91	1	according	accord	VERB
ajst-2174	91	2	to	to	ADP
ajst-2174	91	3	the	the	DET
ajst-2174	91	4	power	power	NOUN
ajst-2174	91	5	analysis	analysis	NOUN
ajst-2174	91	6	report	report	NOUN
ajst-2174	91	7	,	,	PUNCT
ajst-2174	91	8	the	the	DET
ajst-2174	91	9	leakage	leakage	NOUN
ajst-2174	91	10	power	power	NOUN
ajst-2174	91	11	consumption	consumption	NOUN
ajst-2174	91	12	of	of	ADP
ajst-2174	91	13	c499	c499	PROPN
ajst-2174	91	14	designed	design	VERB
ajst-2174	91	15	for	for	ADP
ajst-2174	91	16	testability	testability	NOUN
ajst-2174	91	17	is	be	AUX
ajst-2174	91	18	4.8733	4.8733	NUM
ajst-2174	91	19	μw	μw	NOUN
ajst-2174	91	20	,	,	PUNCT
ajst-2174	91	21	the	the	DET
ajst-2174	91	22	shortcircuit	shortcircuit	NOUN
ajst-2174	91	23	power	power	NOUN
ajst-2174	91	24	consumption	consumption	NOUN
ajst-2174	91	25	is	be	AUX
ajst-2174	91	26	104.1798	104.1798	NUM
ajst-2174	91	27	μw	μw	NOUN
ajst-2174	91	28	,	,	PUNCT
ajst-2174	91	29	the	the	DET
ajst-2174	91	30	internal	internal	ADJ
ajst-2174	91	31	power	power	NOUN
ajst-2174	91	32	consumption	consumption	NOUN
ajst-2174	91	33	is	be	AUX
ajst-2174	91	34	104.1798	104.1798	NUM
ajst-2174	91	35	μw	μw	NOUN
ajst-2174	91	36	,	,	PUNCT
ajst-2174	91	37	the	the	DET
ajst-2174	91	38	switching	switch	VERB
ajst-2174	91	39	power	power	NOUN
ajst-2174	91	40	consumption	consumption	NOUN
ajst-2174	91	41	is	be	AUX
ajst-2174	91	42	411.3177	411.3177	NUM
ajst-2174	91	43	μw	μw	NOUN
ajst-2174	91	44	,	,	PUNCT
ajst-2174	91	45	and	and	CCONJ
ajst-2174	91	46	the	the	DET
ajst-2174	91	47	total	total	ADJ
ajst-2174	91	48	dynamic	dynamic	ADJ
ajst-2174	91	49	power	power	NOUN
ajst-2174	91	50	consumption	consumption	NOUN
ajst-2174	91	51	is	be	AUX
ajst-2174	91	52	520.3648	520.3648	NUM
ajst-2174	91	53	μw	μw	NOUN
ajst-2174	91	54	.	.	PUNCT
ajst-2174	92	1	among	among	ADP
ajst-2174	92	2	them	they	PRON
ajst-2174	92	3	,	,	PUNCT
ajst-2174	92	4	the	the	DET
ajst-2174	92	5	leakage	leakage	NOUN
ajst-2174	92	6	power	power	NOUN
ajst-2174	92	7	leakage	leakage	NOUN
ajst-2174	92	8	power	power	NOUN
ajst-2174	92	9	is	be	AUX
ajst-2174	92	10	the	the	DET
ajst-2174	92	11	circuit	circuit	NOUN
ajst-2174	92	12	power	power	NOUN
ajst-2174	92	13	consumption	consumption	NOUN
ajst-2174	92	14	when	when	SCONJ
ajst-2174	92	15	the	the	DET
ajst-2174	92	16	circuit	circuit	NOUN
ajst-2174	92	17	is	be	AUX
ajst-2174	92	18	not	not	PART
ajst-2174	92	19	working	work	VERB
ajst-2174	92	20	,	,	PUNCT
ajst-2174	92	21	so	so	CCONJ
ajst-2174	92	22	it	it	PRON
ajst-2174	92	23	is	be	AUX
ajst-2174	92	24	generally	generally	ADV
ajst-2174	92	25	not	not	PART
ajst-2174	92	26	affected	affect	VERB
ajst-2174	92	27	by	by	ADP
ajst-2174	92	28	the	the	DET
ajst-2174	92	29	working	work	VERB
ajst-2174	92	30	state	state	NOUN
ajst-2174	92	31	and	and	CCONJ
ajst-2174	92	32	frequency	frequency	NOUN
ajst-2174	92	33	.	.	PUNCT
ajst-2174	93	1	it	it	PRON
ajst-2174	93	2	can	can	AUX
ajst-2174	93	3	also	also	ADV
ajst-2174	93	4	be	be	AUX
ajst-2174	93	5	seen	see	VERB
ajst-2174	93	6	from	from	ADP
ajst-2174	93	7	the	the	DET
ajst-2174	93	8	report	report	NOUN
ajst-2174	93	9	that	that	SCONJ
ajst-2174	93	10	switching	switch	VERB
ajst-2174	93	11	power	power	NOUN
ajst-2174	93	12	consumption	consumption	NOUN
ajst-2174	93	13	is	be	AUX
ajst-2174	93	14	the	the	DET
ajst-2174	93	15	main	main	ADJ
ajst-2174	93	16	power	power	NOUN
ajst-2174	93	17	consumption	consumption	NOUN
ajst-2174	93	18	in	in	ADP
ajst-2174	93	19	dynamic	dynamic	ADJ
ajst-2174	93	20	power	power	NOUN
ajst-2174	93	21	consumption	consumption	NOUN
ajst-2174	93	22	,	,	PUNCT
ajst-2174	93	23	and	and	CCONJ
ajst-2174	93	24	needs	need	VERB
ajst-2174	93	25	to	to	PART
ajst-2174	93	26	be	be	AUX
ajst-2174	93	27	paid	pay	VERB
ajst-2174	93	28	attention	attention	NOUN
ajst-2174	93	29	to	to	ADP
ajst-2174	93	30	during	during	ADP
ajst-2174	93	31	the	the	DET
ajst-2174	93	32	chip	chip	NOUN
ajst-2174	93	33	testing	testing	NOUN
ajst-2174	93	34	process	process	NOUN
ajst-2174	93	35	.	.	PUNCT
ajst-2174	94	1	figure	figure	NOUN
ajst-2174	94	2	5	5	NUM
ajst-2174	94	3	.	.	PUNCT
ajst-2174	95	1	power	power	NOUN
ajst-2174	95	2	analysis	analysis	NOUN
ajst-2174	95	3	report	report	NOUN
ajst-2174	95	4	3.2	3.2	NUM
ajst-2174	95	5	.	.	PUNCT
ajst-2174	96	1	experimental	experimental	ADJ
ajst-2174	96	2	simulation	simulation	NOUN
ajst-2174	96	3	analysis	analysis	NOUN
ajst-2174	96	4	of	of	ADP
ajst-2174	96	5	test	test	NOUN
ajst-2174	96	6	response	response	NOUN
ajst-2174	96	7	comparison	comparison	NOUN
ajst-2174	96	8	module	module	NOUN
ajst-2174	96	9	the	the	DET
ajst-2174	96	10	c499	c499	PROPN
ajst-2174	96	11	circuit	circuit	NOUN
ajst-2174	96	12	can	can	AUX
ajst-2174	96	13	be	be	AUX
ajst-2174	96	14	regarded	regard	VERB
ajst-2174	96	15	as	as	ADP
ajst-2174	96	16	an	an	DET
ajst-2174	96	17	8	8	NUM
ajst-2174	96	18	-	-	PUNCT
ajst-2174	96	19	bit	bit	NOUN
ajst-2174	96	20	traveling	travel	VERB
ajst-2174	96	21	wave	wave	NOUN
ajst-2174	96	22	carry	carry	VERB
ajst-2174	96	23	adder	adder	NOUN
ajst-2174	96	24	,	,	PUNCT
ajst-2174	96	25	and	and	CCONJ
ajst-2174	96	26	its	its	PRON
ajst-2174	96	27	bist	bist	ADJ
ajst-2174	96	28	logic	logic	NOUN
ajst-2174	96	29	synthesis	synthesis	NOUN
ajst-2174	96	30	waveform	waveform	NOUN
ajst-2174	96	31	simulation	simulation	NOUN
ajst-2174	96	32	is	be	AUX
ajst-2174	96	33	shown	show	VERB
ajst-2174	96	34	in	in	ADP
ajst-2174	96	35	figure	figure	NOUN
ajst-2174	96	36	6	6	NUM
ajst-2174	96	37	.	.	PUNCT
ajst-2174	97	1	after	after	ADP
ajst-2174	97	2	8	8	NUM
ajst-2174	97	3	clock	clock	NOUN
ajst-2174	97	4	cycles	cycle	NOUN
ajst-2174	97	5	,	,	PUNCT
ajst-2174	97	6	test	test	VERB
ajst-2174	97	7	the	the	DET
ajst-2174	97	8	output	output	NOUN
ajst-2174	97	9	of	of	ADP
ajst-2174	97	10	the	the	DET
ajst-2174	97	11	adder	adder	NOUN
ajst-2174	97	12	once	once	ADV
ajst-2174	97	13	,	,	PUNCT
ajst-2174	97	14	and	and	CCONJ
ajst-2174	97	15	analyze	analyze	VERB
ajst-2174	97	16	the	the	DET
ajst-2174	97	17	test	test	NOUN
ajst-2174	97	18	result	result	NOUN
ajst-2174	97	19	according	accord	VERB
ajst-2174	97	20	to	to	ADP
ajst-2174	97	21	the	the	DET
ajst-2174	97	22	value	value	NOUN
ajst-2174	97	23	of	of	ADP
ajst-2174	97	24	pass	pass	NOUN
ajst-2174	97	25	.	.	PUNCT
ajst-2174	98	1	if	if	SCONJ
ajst-2174	98	2	there	there	PRON
ajst-2174	98	3	is	be	VERB
ajst-2174	98	4	no	no	DET
ajst-2174	98	5	fault	fault	NOUN
ajst-2174	98	6	in	in	ADP
ajst-2174	98	7	this	this	DET
ajst-2174	98	8	circuit	circuit	NOUN
ajst-2174	98	9	,	,	PUNCT
ajst-2174	98	10	the	the	DET
ajst-2174	98	11	result	result	NOUN
ajst-2174	98	12	will	will	AUX
ajst-2174	98	13	output	output	VERB
ajst-2174	98	14	1	1	NUM
ajst-2174	98	15	,	,	PUNCT
ajst-2174	98	16	and	and	CCONJ
ajst-2174	98	17	if	if	SCONJ
ajst-2174	98	18	there	there	PRON
ajst-2174	98	19	is	be	VERB
ajst-2174	98	20	a	a	DET
ajst-2174	98	21	fault	fault	NOUN
ajst-2174	98	22	,	,	PUNCT
ajst-2174	98	23	it	it	PRON
ajst-2174	98	24	will	will	AUX
ajst-2174	98	25	output	output	VERB
ajst-2174	98	26	0	0	NUM
ajst-2174	98	27	.	.	PUNCT
ajst-2174	99	1	when	when	SCONJ
ajst-2174	99	2	the	the	DET
ajst-2174	99	3	value	value	NOUN
ajst-2174	99	4	of	of	ADP
ajst-2174	99	5	the	the	DET
ajst-2174	99	6	finish	finish	NOUN
ajst-2174	99	7	signal	signal	NOUN
ajst-2174	99	8	is	be	AUX
ajst-2174	99	9	1	1	NUM
ajst-2174	99	10	,	,	PUNCT
ajst-2174	99	11	it	it	PRON
ajst-2174	99	12	represents	represent	VERB
ajst-2174	99	13	the	the	DET
ajst-2174	99	14	end	end	NOUN
ajst-2174	99	15	of	of	ADP
ajst-2174	99	16	the	the	DET
ajst-2174	99	17	test	test	NOUN
ajst-2174	99	18	.	.	PUNCT
ajst-2174	100	1	if	if	SCONJ
ajst-2174	100	2	there	there	PRON
ajst-2174	100	3	is	be	VERB
ajst-2174	100	4	a	a	DET
ajst-2174	100	5	failure	failure	NOUN
ajst-2174	100	6	,	,	PUNCT
ajst-2174	100	7	the	the	DET
ajst-2174	100	8	value	value	NOUN
ajst-2174	100	9	of	of	ADP
ajst-2174	100	10	finish	finish	NOUN
ajst-2174	100	11	remains	remain	VERB
ajst-2174	100	12	unchanged	unchanged	ADJ
ajst-2174	100	13	at	at	ADP
ajst-2174	100	14	0	0	NUM
ajst-2174	100	15	.	.	PUNCT
ajst-2174	101	1	analysis	analysis	NOUN
ajst-2174	101	2	of	of	ADP
ajst-2174	101	3	figure	figure	NOUN
ajst-2174	101	4	5	5	NUM
ajst-2174	101	5	-	-	SYM
ajst-2174	101	6	13	13	NUM
ajst-2174	101	7	shows	show	VERB
ajst-2174	101	8	that	that	SCONJ
ajst-2174	101	9	the	the	DET
ajst-2174	101	10	logic	logic	NOUN
ajst-2174	101	11	simulation	simulation	NOUN
ajst-2174	101	12	generated	generate	VERB
ajst-2174	101	13	by	by	ADP
ajst-2174	101	14	the	the	DET
ajst-2174	101	15	adder	adder	NOUN
ajst-2174	101	16	correctly	correctly	ADV
ajst-2174	101	17	proves	prove	VERB
ajst-2174	101	18	the	the	DET
ajst-2174	101	19	generated	generate	VERB
ajst-2174	101	20	test	test	NOUN
ajst-2174	101	21	code	code	NOUN
ajst-2174	101	22	,	,	PUNCT
ajst-2174	101	23	and	and	CCONJ
ajst-2174	101	24	the	the	DET
ajst-2174	101	25	logic	logic	NOUN
ajst-2174	101	26	simulation	simulation	NOUN
ajst-2174	101	27	results	result	NOUN
ajst-2174	101	28	of	of	ADP
ajst-2174	101	29	the	the	DET
ajst-2174	101	30	feature	feature	NOUN
ajst-2174	101	31	analysis	analysis	NOUN
ajst-2174	101	32	are	be	AUX
ajst-2174	101	33	reasonable	reasonable	ADJ
ajst-2174	101	34	.	.	PUNCT
ajst-2174	102	1	the	the	DET
ajst-2174	102	2	waveform	waveform	PROPN
ajst-2174	102	3	simulation	simulation	NOUN
ajst-2174	102	4	characteristics	characteristic	NOUN
ajst-2174	102	5	obtained	obtain	VERB
ajst-2174	102	6	by	by	ADP
ajst-2174	102	7	the	the	DET
ajst-2174	102	8	test	test	NOUN
ajst-2174	102	9	are	be	AUX
ajst-2174	102	10	compact	compact	ADJ
ajst-2174	102	11	and	and	CCONJ
ajst-2174	102	12	orderly	orderly	ADJ
ajst-2174	102	13	,	,	PUNCT
ajst-2174	102	14	which	which	PRON
ajst-2174	102	15	proves	prove	VERB
ajst-2174	102	16	that	that	SCONJ
ajst-2174	102	17	the	the	DET
ajst-2174	102	18	bist	bist	ADJ
ajst-2174	102	19	control	control	NOUN
ajst-2174	102	20	rationality	rationality	NOUN
ajst-2174	102	21	.	.	PUNCT
ajst-2174	103	1	207	207	NUM
ajst-2174	103	2	figure	figure	VERB
ajst-2174	103	3	6	6	NUM
ajst-2174	103	4	.	.	PUNCT
ajst-2174	103	5	logic	logic	NOUN
ajst-2174	103	6	synthesis	synthesis	NOUN
ajst-2174	103	7	waveform	waveform	VERB
ajst-2174	103	8	simulation	simulation	NOUN
ajst-2174	103	9	4	4	NUM
ajst-2174	103	10	.	.	PUNCT
ajst-2174	103	11	conclusion	conclusion	VERB
ajst-2174	103	12	this	this	DET
ajst-2174	103	13	paper	paper	NOUN
ajst-2174	103	14	analyzes	analyze	VERB
ajst-2174	103	15	the	the	DET
ajst-2174	103	16	development	development	NOUN
ajst-2174	103	17	trend	trend	NOUN
ajst-2174	103	18	of	of	ADP
ajst-2174	103	19	bist	bist	ADJ
ajst-2174	103	20	test	test	NOUN
ajst-2174	103	21	technology	technology	NOUN
ajst-2174	103	22	,	,	PUNCT
ajst-2174	103	23	and	and	CCONJ
ajst-2174	103	24	introduces	introduce	VERB
ajst-2174	103	25	the	the	DET
ajst-2174	103	26	research	research	NOUN
ajst-2174	103	27	status	status	NOUN
ajst-2174	103	28	of	of	ADP
ajst-2174	103	29	lfsr	lfsr	PROPN
ajst-2174	103	30	reseeding	reseed	VERB
ajst-2174	103	31	technology	technology	NOUN
ajst-2174	103	32	and	and	CCONJ
ajst-2174	103	33	low	low	ADJ
ajst-2174	103	34	-	-	PUNCT
ajst-2174	103	35	power	power	NOUN
ajst-2174	103	36	test	test	NOUN
ajst-2174	103	37	vector	vector	NOUN
ajst-2174	103	38	generation	generation	NOUN
ajst-2174	103	39	technology	technology	NOUN
ajst-2174	103	40	.	.	PUNCT
ajst-2174	104	1	reducing	reduce	VERB
ajst-2174	104	2	the	the	DET
ajst-2174	104	3	power	power	NOUN
ajst-2174	104	4	consumption	consumption	NOUN
ajst-2174	104	5	of	of	ADP
ajst-2174	104	6	chip	chip	NOUN
ajst-2174	104	7	testing	testing	NOUN
ajst-2174	104	8	by	by	ADP
ajst-2174	104	9	generating	generate	VERB
ajst-2174	104	10	low	low	ADJ
ajst-2174	104	11	-	-	PUNCT
ajst-2174	104	12	power	power	NOUN
ajst-2174	104	13	test	test	NOUN
ajst-2174	104	14	vectors	vector	NOUN
ajst-2174	104	15	is	be	AUX
ajst-2174	104	16	an	an	DET
ajst-2174	104	17	important	important	ADJ
ajst-2174	104	18	goal	goal	NOUN
ajst-2174	104	19	of	of	ADP
ajst-2174	104	20	chip	chip	NOUN
ajst-2174	104	21	testability	testability	NOUN
ajst-2174	104	22	design	design	NOUN
ajst-2174	104	23	and	and	CCONJ
ajst-2174	104	24	the	the	DET
ajst-2174	104	25	main	main	ADJ
ajst-2174	104	26	research	research	NOUN
ajst-2174	104	27	direction	direction	NOUN
ajst-2174	104	28	in	in	ADP
ajst-2174	104	29	the	the	DET
ajst-2174	104	30	field	field	NOUN
ajst-2174	104	31	of	of	ADP
ajst-2174	104	32	chip	chip	NOUN
ajst-2174	104	33	testing	testing	NOUN
ajst-2174	104	34	.	.	PUNCT
ajst-2174	105	1	this	this	DET
ajst-2174	105	2	paper	paper	NOUN
ajst-2174	105	3	mainly	mainly	ADV
ajst-2174	105	4	introduces	introduce	VERB
ajst-2174	105	5	the	the	DET
ajst-2174	105	6	lowpower	lowpower	NOUN
ajst-2174	105	7	test	test	NOUN
ajst-2174	105	8	vector	vector	NOUN
ajst-2174	105	9	generation	generation	NOUN
ajst-2174	105	10	technology	technology	NOUN
ajst-2174	105	11	,	,	PUNCT
ajst-2174	105	12	the	the	DET
ajst-2174	105	13	principle	principle	NOUN
ajst-2174	105	14	of	of	ADP
ajst-2174	105	15	lfsr	lfsr	PROPN
ajst-2174	105	16	reseeding	reseed	VERB
ajst-2174	105	17	technology	technology	NOUN
ajst-2174	105	18	and	and	CCONJ
ajst-2174	105	19	the	the	DET
ajst-2174	105	20	structure	structure	NOUN
ajst-2174	105	21	principle	principle	NOUN
ajst-2174	105	22	of	of	ADP
ajst-2174	105	23	built	build	VERB
ajst-2174	105	24	-	-	PUNCT
ajst-2174	105	25	in	in	ADP
ajst-2174	105	26	self	self	NOUN
ajst-2174	105	27	-	-	PUNCT
ajst-2174	105	28	test	test	NOUN
ajst-2174	105	29	.	.	PUNCT
ajst-2174	106	1	the	the	DET
ajst-2174	106	2	main	main	ADJ
ajst-2174	106	3	work	work	NOUN
ajst-2174	106	4	of	of	ADP
ajst-2174	106	5	the	the	DET
ajst-2174	106	6	article	article	NOUN
ajst-2174	106	7	is	be	AUX
ajst-2174	106	8	as	as	SCONJ
ajst-2174	106	9	follows	follow	VERB
ajst-2174	106	10	:	:	PUNCT
ajst-2174	106	11	by	by	ADP
ajst-2174	106	12	studying	study	VERB
ajst-2174	106	13	the	the	DET
ajst-2174	106	14	influence	influence	NOUN
ajst-2174	106	15	of	of	ADP
ajst-2174	106	16	the	the	DET
ajst-2174	106	17	loading	loading	NOUN
ajst-2174	106	18	of	of	ADP
ajst-2174	106	19	the	the	DET
ajst-2174	106	20	test	test	NOUN
ajst-2174	106	21	vector	vector	NOUN
ajst-2174	106	22	inside	inside	ADP
ajst-2174	106	23	the	the	DET
ajst-2174	106	24	circuit	circuit	NOUN
ajst-2174	106	25	under	under	ADP
ajst-2174	106	26	test	test	NOUN
ajst-2174	106	27	on	on	ADP
ajst-2174	106	28	the	the	DET
ajst-2174	106	29	dynamic	dynamic	ADJ
ajst-2174	106	30	test	test	NOUN
ajst-2174	106	31	power	power	NOUN
ajst-2174	106	32	consumption	consumption	NOUN
ajst-2174	106	33	,	,	PUNCT
ajst-2174	106	34	the	the	DET
ajst-2174	106	35	relationship	relationship	NOUN
ajst-2174	106	36	between	between	ADP
ajst-2174	106	37	the	the	DET
ajst-2174	106	38	test	test	NOUN
ajst-2174	106	39	vector	vector	NOUN
ajst-2174	106	40	and	and	CCONJ
ajst-2174	106	41	the	the	DET
ajst-2174	106	42	test	test	NOUN
ajst-2174	106	43	vector	vector	NOUN
ajst-2174	106	44	seed	seed	NOUN
ajst-2174	106	45	in	in	ADP
ajst-2174	106	46	the	the	DET
ajst-2174	106	47	lfsr	lfsr	PROPN
ajst-2174	106	48	reseeding	reseeding	NOUN
ajst-2174	106	49	technology	technology	NOUN
ajst-2174	106	50	is	be	AUX
ajst-2174	106	51	analyzed	analyze	VERB
ajst-2174	106	52	,	,	PUNCT
ajst-2174	106	53	and	and	CCONJ
ajst-2174	106	54	it	it	PRON
ajst-2174	106	55	is	be	AUX
ajst-2174	106	56	concluded	conclude	VERB
ajst-2174	106	57	that	that	SCONJ
ajst-2174	106	58	the	the	DET
ajst-2174	106	59	test	test	NOUN
ajst-2174	106	60	vector	vector	NOUN
ajst-2174	106	61	seed	seed	NOUN
ajst-2174	106	62	and	and	CCONJ
ajst-2174	106	63	the	the	DET
ajst-2174	106	64	test	test	NOUN
ajst-2174	106	65	vector	vector	NOUN
ajst-2174	106	66	have	have	VERB
ajst-2174	106	67	a	a	DET
ajst-2174	106	68	linear	linear	ADJ
ajst-2174	106	69	correlation	correlation	NOUN
ajst-2174	106	70	characteristic	characteristic	ADJ
ajst-2174	106	71	.	.	PUNCT
ajst-2174	107	1	a	a	DET
ajst-2174	107	2	model	model	NOUN
ajst-2174	107	3	for	for	ADP
ajst-2174	107	4	optimizing	optimize	VERB
ajst-2174	107	5	dynamic	dynamic	ADJ
ajst-2174	107	6	test	test	NOUN
ajst-2174	107	7	power	power	NOUN
ajst-2174	107	8	consumption	consumption	NOUN
ajst-2174	107	9	based	base	VERB
ajst-2174	107	10	on	on	ADP
ajst-2174	107	11	hamming	ham	VERB
ajst-2174	107	12	distance	distance	NOUN
ajst-2174	107	13	sorting	sort	VERB
ajst-2174	107	14	test	test	NOUN
ajst-2174	107	15	vector	vector	NOUN
ajst-2174	107	16	seeds	seed	NOUN
ajst-2174	107	17	is	be	AUX
ajst-2174	107	18	proposed	propose	VERB
ajst-2174	107	19	to	to	PART
ajst-2174	107	20	realize	realize	VERB
ajst-2174	107	21	the	the	DET
ajst-2174	107	22	design	design	NOUN
ajst-2174	107	23	of	of	ADP
ajst-2174	107	24	a	a	DET
ajst-2174	107	25	low	low	ADJ
ajst-2174	107	26	-	-	PUNCT
ajst-2174	107	27	power	power	NOUN
ajst-2174	107	28	test	test	NOUN
ajst-2174	107	29	vector	vector	NOUN
ajst-2174	107	30	seed	seed	NOUN
ajst-2174	107	31	generation	generation	NOUN
ajst-2174	107	32	algorithm	algorithm	NOUN
ajst-2174	107	33	.	.	PUNCT
ajst-2174	108	1	the	the	DET
ajst-2174	108	2	middle	middle	ADJ
ajst-2174	108	3	part	part	NOUN
ajst-2174	108	4	of	of	ADP
ajst-2174	108	5	iscas85	iscas85	NOUN
ajst-2174	108	6	and	and	CCONJ
ajst-2174	108	7	iscas89	iscas89	ADJ
ajst-2174	108	8	circuits	circuit	NOUN
ajst-2174	108	9	are	be	AUX
ajst-2174	108	10	selected	select	VERB
ajst-2174	108	11	for	for	ADP
ajst-2174	108	12	low	low	ADJ
ajst-2174	108	13	-	-	PUNCT
ajst-2174	108	14	power	power	NOUN
ajst-2174	108	15	test	test	NOUN
ajst-2174	108	16	vector	vector	NOUN
ajst-2174	108	17	generator	generator	PROPN
ajst-2174	108	18	simulation	simulation	NOUN
ajst-2174	108	19	design	design	NOUN
ajst-2174	108	20	experiment	experiment	NOUN
ajst-2174	108	21	.	.	PUNCT
ajst-2174	109	1	the	the	DET
ajst-2174	109	2	method	method	NOUN
ajst-2174	109	3	proposed	propose	VERB
ajst-2174	109	4	in	in	ADP
ajst-2174	109	5	this	this	DET
ajst-2174	109	6	paper	paper	NOUN
ajst-2174	109	7	reduces	reduce	VERB
ajst-2174	109	8	the	the	DET
ajst-2174	109	9	total	total	ADJ
ajst-2174	109	10	number	number	NOUN
ajst-2174	109	11	of	of	ADP
ajst-2174	109	12	test	test	NOUN
ajst-2174	109	13	vector	vector	NOUN
ajst-2174	109	14	seed	seed	NOUN
ajst-2174	109	15	storage	storage	NOUN
ajst-2174	109	16	bits	bit	NOUN
ajst-2174	109	17	by	by	ADP
ajst-2174	109	18	64.39	64.39	NUM
ajst-2174	109	19	%	%	NOUN
ajst-2174	109	20	on	on	ADP
ajst-2174	109	21	average	average	ADJ
ajst-2174	109	22	,	,	PUNCT
ajst-2174	109	23	the	the	DET
ajst-2174	109	24	test	test	NOUN
ajst-2174	109	25	vector	vector	NOUN
ajst-2174	109	26	generation	generation	NOUN
ajst-2174	109	27	fault	fault	NOUN
ajst-2174	109	28	coverage	coverage	NOUN
ajst-2174	109	29	rate	rate	NOUN
ajst-2174	109	30	is	be	AUX
ajst-2174	109	31	97.42	97.42	NUM
ajst-2174	109	32	%	%	NOUN
ajst-2174	109	33	,	,	PUNCT
ajst-2174	109	34	the	the	DET
ajst-2174	109	35	circuit	circuit	NOUN
ajst-2174	109	36	area	area	NOUN
ajst-2174	109	37	overhead	overhead	ADV
ajst-2174	109	38	is	be	AUX
ajst-2174	109	39	4.32	4.32	NUM
ajst-2174	109	40	%	%	NOUN
ajst-2174	109	41	,	,	PUNCT
ajst-2174	109	42	and	and	CCONJ
ajst-2174	109	43	the	the	DET
ajst-2174	109	44	dynamic	dynamic	ADJ
ajst-2174	109	45	test	test	NOUN
ajst-2174	109	46	power	power	NOUN
ajst-2174	109	47	consumption	consumption	NOUN
ajst-2174	109	48	is	be	AUX
ajst-2174	109	49	reduced	reduce	VERB
ajst-2174	109	50	by	by	ADP
ajst-2174	109	51	44.21	44.21	NUM
ajst-2174	109	52	%	%	NOUN
ajst-2174	109	53	on	on	ADP
ajst-2174	109	54	average	average	ADJ
ajst-2174	109	55	,	,	PUNCT
ajst-2174	109	56	achieving	achieve	VERB
ajst-2174	109	57	a	a	DET
ajst-2174	109	58	low	low	ADJ
ajst-2174	109	59	-	-	PUNCT
ajst-2174	109	60	power	power	NOUN
ajst-2174	109	61	test	test	NOUN
ajst-2174	109	62	vector	vector	NOUN
ajst-2174	109	63	generated	generate	VERB
ajst-2174	109	64	request	request	NOUN
ajst-2174	109	65	.	.	PUNCT
ajst-2174	110	1	compared	compare	VERB
ajst-2174	110	2	with	with	ADP
ajst-2174	110	3	other	other	ADJ
ajst-2174	110	4	lfsr	lfsr	PROPN
ajst-2174	110	5	reseeding	reseeding	NOUN
ajst-2174	110	6	methods	method	NOUN
ajst-2174	110	7	,	,	PUNCT
ajst-2174	110	8	the	the	DET
ajst-2174	110	9	method	method	NOUN
ajst-2174	110	10	proposed	propose	VERB
ajst-2174	110	11	in	in	ADP
ajst-2174	110	12	this	this	DET
ajst-2174	110	13	paper	paper	NOUN
ajst-2174	110	14	has	have	VERB
ajst-2174	110	15	certain	certain	ADJ
ajst-2174	110	16	advantages	advantage	NOUN
ajst-2174	110	17	in	in	ADP
ajst-2174	110	18	reducing	reduce	VERB
ajst-2174	110	19	the	the	DET
ajst-2174	110	20	number	number	NOUN
ajst-2174	110	21	of	of	ADP
ajst-2174	110	22	test	test	NOUN
ajst-2174	110	23	vector	vector	NOUN
ajst-2174	110	24	seed	seed	NOUN
ajst-2174	110	25	storage	storage	NOUN
ajst-2174	110	26	bits	bit	NOUN
ajst-2174	110	27	,	,	PUNCT
ajst-2174	110	28	reducing	reduce	VERB
ajst-2174	110	29	the	the	DET
ajst-2174	110	30	circuit	circuit	NOUN
ajst-2174	110	31	area	area	NOUN
ajst-2174	110	32	overhead	overhead	ADV
ajst-2174	110	33	of	of	ADP
ajst-2174	110	34	the	the	DET
ajst-2174	110	35	test	test	NOUN
ajst-2174	110	36	vector	vector	NOUN
ajst-2174	110	37	generator	generator	NOUN
ajst-2174	110	38	,	,	PUNCT
ajst-2174	110	39	and	and	CCONJ
ajst-2174	110	40	reducing	reduce	VERB
ajst-2174	110	41	the	the	DET
ajst-2174	110	42	dynamic	dynamic	ADJ
ajst-2174	110	43	test	test	NOUN
ajst-2174	110	44	power	power	NOUN
ajst-2174	110	45	consumption	consumption	NOUN
ajst-2174	110	46	.	.	PUNCT
ajst-2174	111	1	the	the	DET
ajst-2174	111	2	c499	c499	PROPN
ajst-2174	111	3	circuit	circuit	NOUN
ajst-2174	111	4	is	be	AUX
ajst-2174	111	5	selected	select	VERB
ajst-2174	111	6	to	to	PART
ajst-2174	111	7	build	build	VERB
ajst-2174	111	8	a	a	DET
ajst-2174	111	9	bist	bist	ADJ
ajst-2174	111	10	circuit	circuit	NOUN
ajst-2174	111	11	,	,	PUNCT
ajst-2174	111	12	and	and	CCONJ
ajst-2174	111	13	the	the	DET
ajst-2174	111	14	results	result	NOUN
ajst-2174	111	15	are	be	AUX
ajst-2174	111	16	tested	test	VERB
ajst-2174	111	17	and	and	CCONJ
ajst-2174	111	18	compared	compare	VERB
ajst-2174	111	19	through	through	ADP
ajst-2174	111	20	feature	feature	NOUN
ajst-2174	111	21	analysis	analysis	NOUN
ajst-2174	111	22	,	,	PUNCT
ajst-2174	111	23	and	and	CCONJ
ajst-2174	111	24	the	the	DET
ajst-2174	111	25	comparison	comparison	NOUN
ajst-2174	111	26	information	information	NOUN
ajst-2174	111	27	between	between	ADP
ajst-2174	111	28	the	the	DET
ajst-2174	111	29	test	test	NOUN
ajst-2174	111	30	response	response	NOUN
ajst-2174	111	31	and	and	CCONJ
ajst-2174	111	32	the	the	DET
ajst-2174	111	33	correct	correct	ADJ
ajst-2174	111	34	response	response	NOUN
ajst-2174	111	35	is	be	AUX
ajst-2174	111	36	obtained	obtain	VERB
ajst-2174	111	37	,	,	PUNCT
ajst-2174	111	38	thereby	thereby	ADV
ajst-2174	111	39	proving	prove	VERB
ajst-2174	111	40	the	the	DET
ajst-2174	111	41	effectiveness	effectiveness	NOUN
ajst-2174	111	42	of	of	ADP
ajst-2174	111	43	the	the	DET
ajst-2174	111	44	bist	bist	NOUN
ajst-2174	111	45	.	.	PUNCT
ajst-2174	112	1	acknowledgment	acknowledgment	NOUN
ajst-2174	112	2	this	this	DET
ajst-2174	112	3	work	work	NOUN
ajst-2174	112	4	was	be	AUX
ajst-2174	112	5	financially	financially	ADV
ajst-2174	112	6	supported	support	VERB
ajst-2174	112	7	by	by	ADP
ajst-2174	112	8	hangzhou	hangzhou	PROPN
ajst-2174	112	9	xiongmai	xiongmai	PROPN
ajst-2174	112	10	integrated	integrated	PROPN
ajst-2174	112	11	circuit	circuit	PROPN
ajst-2174	112	12	co.	co.	PROPN
ajst-2174	112	13	ltd	ltd	PROPN
ajst-2174	112	14	fund	fund	PROPN
ajst-2174	112	15	.	.	PUNCT
ajst-2174	113	1	references	reference	NOUN
ajst-2174	113	2	[	[	X
ajst-2174	113	3	1	1	NUM
ajst-2174	113	4	]	]	PUNCT
ajst-2174	113	5	a.	a.	NOUN
ajst-2174	113	6	krishnamachary	krishnamachary	PROPN
ajst-2174	113	7	,	,	PUNCT
ajst-2174	113	8	j.	j.	PROPN
ajst-2174	113	9	a.	a.	PROPN
ajst-2174	113	10	abraham	abraham	PROPN
ajst-2174	113	11	.	.	PUNCT
ajst-2174	114	1	effects	effect	NOUN
ajst-2174	114	2	of	of	ADP
ajst-2174	114	3	multi	multi	ADJ
ajst-2174	114	4	-	-	ADJ
ajst-2174	114	5	cycle	cycle	ADJ
ajst-2174	114	6	sensitization	sensitization	NOUN
ajst-2174	114	7	on	on	ADP
ajst-2174	114	8	delaytests[c	delaytests[c	PROPN
ajst-2174	114	9	]	]	PUNCT
ajst-2174	114	10	.	.	PUNCT
ajst-2174	115	1	16th	16th	ADJ
ajst-2174	115	2	international	international	ADJ
ajst-2174	115	3	conference	conference	NOUN
ajst-2174	115	4	on	on	ADP
ajst-2174	115	5	vlsi	vlsi	PROPN
ajst-2174	115	6	design	design	PROPN
ajst-2174	115	7	,	,	PUNCT
ajst-2174	115	8	2003	2003	NUM
ajst-2174	115	9	:	:	PUNCT
ajst-2174	115	10	137	137	NUM
ajst-2174	115	11	-	-	SYM
ajst-2174	115	12	142	142	NUM
ajst-2174	115	13	.	.	PUNCT
ajst-2174	116	1	[	[	X
ajst-2174	116	2	2	2	NUM
ajst-2174	116	3	]	]	PUNCT
ajst-2174	116	4	r.	r.	PROPN
ajst-2174	116	5	hamza	hamza	PROPN
ajst-2174	116	6	.	.	PUNCT
ajst-2174	117	1	a	a	DET
ajst-2174	117	2	novel	novel	ADJ
ajst-2174	117	3	pseudo	pseudo	NOUN
ajst-2174	117	4	random	random	ADJ
ajst-2174	117	5	sequence	sequence	NOUN
ajst-2174	117	6	generator	generator	NOUN
ajst-2174	117	7	for	for	ADP
ajst-2174	117	8	image	image	NOUN
ajst-2174	117	9	cryptographic	cryptographic	ADJ
ajst-2174	117	10	applications[j	applications[j	NOUN
ajst-2174	117	11	]	]	PUNCT
ajst-2174	117	12	.	.	PUNCT
ajst-2174	118	1	journal	journal	PROPN
ajst-2174	118	2	of	of	ADP
ajst-2174	118	3	information	information	NOUN
ajst-2174	118	4	security	security	NOUN
ajst-2174	118	5	and	and	CCONJ
ajst-2174	118	6	applications	application	NOUN
ajst-2174	118	7	,	,	PUNCT
ajst-2174	118	8	2017	2017	NUM
ajst-2174	118	9	,	,	PUNCT
ajst-2174	118	10	35(19):119	35(19):119	NUM
ajst-2174	118	11	-	-	SYM
ajst-2174	118	12	127	127	NUM
ajst-2174	118	13	.	.	PUNCT
ajst-2174	119	1	[	[	X
ajst-2174	119	2	3	3	NUM
ajst-2174	119	3	]	]	PUNCT
ajst-2174	119	4	a.	a.	NOUN
ajst-2174	119	5	jas	jas	PROPN
ajst-2174	119	6	,	,	PUNCT
ajst-2174	119	7	c.	c.	PROPN
ajst-2174	119	8	v.	v.	PROPN
ajst-2174	119	9	krishna	krishna	PROPN
ajst-2174	119	10	,	,	PUNCT
ajst-2174	119	11	n.	n.	PROPN
ajst-2174	119	12	a.	a.	PROPN
ajst-2174	119	13	touba	touba	PROPN
ajst-2174	119	14	.	.	PUNCT
ajst-2174	119	15	hybrid	hybrid	ADJ
ajst-2174	119	16	bist	bist	NOUN
ajst-2174	119	17	based	base	VERB
ajst-2174	119	18	on	on	ADP
ajst-2174	119	19	weighted	weight	VERB
ajst-2174	119	20	pseudo	pseudo	ADJ
ajst-2174	119	21	-	-	ADJ
ajst-2174	119	22	random	random	ADJ
ajst-2174	119	23	testing	testing	NOUN
ajst-2174	119	24	:	:	PUNCT
ajst-2174	119	25	a	a	DET
ajst-2174	119	26	new	new	ADJ
ajst-2174	119	27	test	test	NOUN
ajst-2174	119	28	resource	resource	NOUN
ajst-2174	119	29	partitioning	partition	VERB
ajst-2174	119	30	scheme[c	scheme[c	NOUN
ajst-2174	119	31	]	]	PUNCT
ajst-2174	119	32	.	.	PUNCT
ajst-2174	120	1	proceedings	proceeding	NOUN
ajst-2174	120	2	19th	19th	ADJ
ajst-2174	120	3	ieee	ieee	PROPN
ajst-2174	120	4	vlsi	vlsi	PROPN
ajst-2174	120	5	test	test	PROPN
ajst-2174	120	6	symposium	symposium	NOUN
ajst-2174	120	7	,	,	PUNCT
ajst-2174	120	8	2001	2001	NUM
ajst-2174	120	9	:	:	PUNCT
ajst-2174	120	10	2	2	NUM
ajst-2174	120	11	-	-	SYM
ajst-2174	120	12	8	8	NUM
ajst-2174	120	13	.	.	PUNCT
ajst-2174	121	1	[	[	X
ajst-2174	121	2	4	4	X
ajst-2174	121	3	]	]	PUNCT
ajst-2174	121	4	k.	k.	PROPN
ajst-2174	121	5	balaguru	balaguru	PROPN
ajst-2174	121	6	,	,	PUNCT
ajst-2174	121	7	t.	t.	PROPN
ajst-2174	121	8	v.	v.	PROPN
ajst-2174	121	9	u.	u.	PROPN
ajst-2174	121	10	kiran	kiran	PROPN
ajst-2174	121	11	kumar	kumar	PROPN
ajst-2174	121	12	.	.	PUNCT
ajst-2174	121	13	test	test	PROPN
ajst-2174	121	14	data	datum	NOUN
ajst-2174	121	15	compression	compression	NOUN
ajst-2174	121	16	architecture	architecture	NOUN
ajst-2174	121	17	for	for	ADP
ajst-2174	121	18	low	low	ADJ
ajst-2174	121	19	power	power	PROPN
ajst-2174	121	20	vlsi	vlsi	PROPN
ajst-2174	121	21	testing[j].world	testing[j].world	PROPN
ajst-2174	121	22	applied	apply	VERB
ajst-2174	121	23	sciences	science	NOUN
ajst-2174	121	24	journal	journal	NOUN
ajst-2174	121	25	,	,	PUNCT
ajst-2174	121	26	2014	2014	NUM
ajst-2174	121	27	,	,	PUNCT
ajst-2174	121	28	29(8):1035	29(8):1035	NUM
ajst-2174	121	29	-	-	SYM
ajst-2174	121	30	1038	1038	NUM
ajst-2174	121	31	[	[	X
ajst-2174	121	32	5	5	NUM
ajst-2174	121	33	]	]	PUNCT
ajst-2174	121	34	p.	p.	NOUN
ajst-2174	121	35	rosinger	rosinger	NOUN
ajst-2174	121	36	.	.	PUNCT
ajst-2174	122	1	dual	dual	ADJ
ajst-2174	122	2	multiple	multiple	ADJ
ajst-2174	122	3	-	-	PUNCT
ajst-2174	122	4	polynomial	polynomial	ADJ
ajst-2174	122	5	lfsr	lfsr	PROPN
ajst-2174	122	6	for	for	ADP
ajst-2174	122	7	low	low	ADJ
ajst-2174	122	8	-	-	PUNCT
ajst-2174	122	9	power	power	NOUN
ajst-2174	122	10	mixed	mixed	ADJ
ajst-2174	122	11	-	-	PUNCT
ajst-2174	122	12	mode	mode	NOUN
ajst-2174	122	13	bist[j	bist[j	NOUN
ajst-2174	122	14	]	]	PUNCT
ajst-2174	122	15	.	.	PUNCT
ajst-2174	123	1	ieee	ieee	NOUN
ajst-2174	123	2	proceedings	proceeding	NOUN
ajst-2174	123	3	of	of	ADP
ajst-2174	123	4	computers	computer	NOUN
ajst-2174	123	5	&	&	CCONJ
ajst-2174	123	6	digital	digital	ADJ
ajst-2174	123	7	techniques	technique	NOUN
ajst-2174	123	8	,	,	PUNCT
ajst-2174	123	9	2003	2003	NUM
ajst-2174	123	10	,	,	PUNCT
ajst-2174	123	11	37(9	37(9	NUM
ajst-2174	123	12	):	):	PUNCT
ajst-2174	123	13	47	47	NUM
ajst-2174	123	14	-	-	SYM
ajst-2174	123	15	51	51	NUM
ajst-2174	123	16	.	.	PUNCT
ajst-2174	124	1	[	[	X
ajst-2174	124	2	6	6	NUM
ajst-2174	124	3	]	]	X
ajst-2174	124	4	sun	sun	PROPN
ajst-2174	124	5	xiubin	xiubin	PROPN
ajst-2174	124	6	,	,	PUNCT
ajst-2174	124	7	research	research	NOUN
ajst-2174	124	8	on	on	ADP
ajst-2174	124	9	built	build	VERB
ajst-2174	124	10	in	in	ADP
ajst-2174	124	11	test	test	NOUN
ajst-2174	124	12	(	(	PUNCT
ajst-2174	124	13	bist	bist	NOUN
ajst-2174	124	14	)	)	PUNCT
ajst-2174	124	15	method	method	NOUN
ajst-2174	124	16	for	for	ADP
ajst-2174	124	17	fault	fault	NOUN
ajst-2174	124	18	diagnosis	diagnosis	NOUN
ajst-2174	124	19	of	of	ADP
ajst-2174	124	20	mixed	mixed	ADJ
ajst-2174	124	21	signal	signal	NOUN
ajst-2174	124	22	circuits,2004	circuits,2004	NOUN
ajst-2174	124	23	[	[	X
ajst-2174	124	24	7	7	NUM
ajst-2174	124	25	]	]	X
ajst-2174	124	26	g.	g.	PROPN
ajst-2174	124	27	vellingiri	vellingiri	PROPN
ajst-2174	124	28	,	,	PUNCT
ajst-2174	124	29	r.	r.	PROPN
ajst-2174	124	30	jayabalan	jayabalan	PROPN
ajst-2174	124	31	.	.	PUNCT
ajst-2174	125	1	an	an	DET
ajst-2174	125	2	improved	improve	VERB
ajst-2174	125	3	low	low	ADJ
ajst-2174	125	4	transition	transition	NOUN
ajst-2174	125	5	test	test	NOUN
ajst-2174	125	6	pattern	pattern	NOUN
ajst-2174	125	7	generator	generator	NOUN
ajst-2174	125	8	for	for	ADP
ajst-2174	125	9	low	low	ADJ
ajst-2174	125	10	power	power	NOUN
ajst-2174	125	11	applications[j	applications[j	PROPN
ajst-2174	125	12	]	]	PUNCT
ajst-2174	125	13	.	.	PUNCT
ajst-2174	126	1	design	design	NOUN
ajst-2174	126	2	automation	automation	NOUN
ajst-2174	126	3	for	for	ADP
ajst-2174	126	4	embedded	embed	VERB
ajst-2174	126	5	systems	system	NOUN
ajst-2174	126	6	,	,	PUNCT
ajst-2174	126	7	2017	2017	NUM
ajst-2174	126	8	,	,	PUNCT
ajst-2174	126	9	21(7):1	21(7):1	NUM
ajst-2174	126	10	-	-	SYM
ajst-2174	126	11	17	17	NUM
ajst-2174	126	12	.	.	PUNCT
ajst-2174	127	1	[	[	X
ajst-2174	127	2	8	8	NUM
ajst-2174	127	3	]	]	X
ajst-2174	127	4	g.	g.	PROPN
ajst-2174	127	5	vellingiri	vellingiri	PROPN
ajst-2174	127	6	,	,	PUNCT
ajst-2174	127	7	r.	r.	PROPN
ajst-2174	127	8	jayabalan	jayabalan	PROPN
ajst-2174	127	9	.	.	PUNCT
ajst-2174	128	1	an	an	DET
ajst-2174	128	2	improved	improve	VERB
ajst-2174	128	3	low	low	ADJ
ajst-2174	128	4	transition	transition	NOUN
ajst-2174	128	5	test	test	NOUN
ajst-2174	128	6	pattern	pattern	NOUN
ajst-2174	128	7	generator	generator	NOUN
ajst-2174	128	8	for	for	ADP
ajst-2174	128	9	low	low	ADJ
ajst-2174	128	10	power	power	NOUN
ajst-2174	128	11	applications[j	applications[j	PROPN
ajst-2174	128	12	]	]	PUNCT
ajst-2174	128	13	.	.	PUNCT
ajst-2174	129	1	design	design	NOUN
ajst-2174	129	2	automation	automation	NOUN
ajst-2174	129	3	for	for	ADP
ajst-2174	129	4	embedded	embed	VERB
ajst-2174	129	5	systems	system	NOUN
ajst-2174	129	6	,	,	PUNCT
ajst-2174	129	7	2017	2017	NUM
ajst-2174	129	8	,	,	PUNCT
ajst-2174	129	9	21(4):247	21(4):247	NOUN
ajst-2174	129	10	-	-	SYM
ajst-2174	129	11	263	263	NUM
ajst-2174	129	12	.	.	PUNCT
ajst-2174	130	1	[	[	X
ajst-2174	130	2	9	9	NUM
ajst-2174	130	3	]	]	PUNCT
ajst-2174	130	4	p.	p.	PROPN
ajst-2174	130	5	s.	s.	PROPN
ajst-2174	130	6	dilip	dilip	PROPN
ajst-2174	130	7	,	,	PUNCT
ajst-2174	130	8	g.	g.	PROPN
ajst-2174	130	9	r.	r.	PROPN
ajst-2174	130	10	somanathan	somanathan	PROPN
ajst-2174	130	11	,	,	PUNCT
ajst-2174	130	12	r.	r.	PROPN
ajst-2174	130	13	bhakthavatchalu	bhakthavatchalu	PROPN
ajst-2174	130	14	.	.	PUNCT
ajst-2174	131	1	reseeding	reseed	VERB
ajst-2174	131	2	lfsr	lfsr	PROPN
ajst-2174	131	3	for	for	ADP
ajst-2174	131	4	test	test	NOUN
ajst-2174	131	5	pattern	pattern	NOUN
ajst-2174	131	6	generation[c	generation[c	VERB
ajst-2174	131	7	]	]	PUNCT
ajst-2174	131	8	.	.	PUNCT
ajst-2174	132	1	2019	2019	NUM
ajst-2174	132	2	international	international	ADJ
ajst-2174	132	3	conference	conference	NOUN
ajst-2174	132	4	on	on	ADP
ajst-2174	132	5	communication	communication	NOUN
ajst-2174	132	6	and	and	CCONJ
ajst-2174	132	7	signal	signal	NOUN
ajst-2174	132	8	processing	processing	NOUN
ajst-2174	132	9	(	(	PUNCT
ajst-2174	132	10	iccsp	iccsp	PROPN
ajst-2174	132	11	)	)	PUNCT
ajst-2174	132	12	,	,	PUNCT
ajst-2174	132	13	2019	2019	NUM
ajst-2174	132	14	:	:	PUNCT
ajst-2174	132	15	0921	0921	NUM
ajst-2174	132	16	-	-	SYM
ajst-2174	132	17	0925	0925	NUM
ajst-2174	132	18	.	.	PUNCT
ajst-2174	133	1	[	[	X
ajst-2174	133	2	10	10	NUM
ajst-2174	133	3	]	]	PUNCT
ajst-2174	133	4	b.	b.	PROPN
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ajst-2174	133	6	,	,	PUNCT
ajst-2174	133	7	y.	y.	PROPN
ajst-2174	133	8	ye	ye	PROPN
ajst-2174	133	9	,	,	PUNCT
ajst-2174	133	10	x.	x.	PROPN
ajst-2174	133	11	c.	c.	PROPN
ajst-2174	133	12	wu	wu	PROPN
ajst-2174	133	13	,	,	PUNCT
ajst-2174	133	14	et	et	PROPN
ajst-2174	133	15	al	al	PROPN
ajst-2174	133	16	.	.	PROPN
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ajst-2174	133	18	of	of	ADP
ajst-2174	133	19	test	test	NOUN
ajst-2174	133	20	power	power	NOUN
ajst-2174	133	21	and	and	CCONJ
ajst-2174	133	22	data	datum	NOUN
ajst-2174	133	23	volume	volume	NOUN
ajst-2174	133	24	in	in	ADP
ajst-2174	133	25	bist	bist	ADJ
ajst-2174	133	26	scheme	scheme	NOUN
ajst-2174	133	27	based	base	VERB
ajst-2174	133	28	on	on	ADP
ajst-2174	133	29	scan	scan	PROPN
ajst-2174	133	30	slice	slice	PROPN
ajst-2174	133	31	overlapping[c	overlapping[c	PROPN
ajst-2174	133	32	]	]	PUNCT
ajst-2174	133	33	.	.	PUNCT
ajst-2174	134	1	ieee	ieee	PROPN
ajst-2174	134	2	.	.	PUNCT
ajst-2174	135	1	int	int	NOUN
ajst-2174	135	2	.	.	PUNCT
ajst-2174	136	1	symp	symp	PROPN
ajst-2174	136	2	.	.	PUNCT
ajst-2174	137	1	on	on	ADP
ajst-2174	137	2	circuits	circuit	NOUN
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ajst-2174	137	4	systems	system	NOUN
ajst-2174	137	5	,	,	PUNCT
ajst-2174	137	6	2009	2009	NUM
ajst-2174	137	7	:	:	PUNCT
ajst-2174	137	8	2737	2737	NUM
ajst-2174	137	9	.	.	PUNCT
ajst-2174	138	1	[	[	X
ajst-2174	138	2	11	11	NUM
ajst-2174	138	3	]	]	X
ajst-2174	138	4	jing	je	VERB
ajst-2174	138	5	g	g	PROPN
ajst-2174	138	6	,	,	PUNCT
ajst-2174	138	7	yi	yi	PROPN
ajst-2174	138	8	l	l	NOUN
ajst-2174	138	9	,	,	PUNCT
ajst-2174	138	10	yu	yu	PROPN
ajst-2174	138	11	x	x	SYM
ajst-2174	138	12	y.	y.	PROPN
ajst-2174	138	13	research	research	PROPN
ajst-2174	138	14	and	and	CCONJ
ajst-2174	138	15	simulation	simulation	NOUN
ajst-2174	138	16	test	test	NOUN
ajst-2174	138	17	base	base	NOUN
ajst-2174	138	18	on	on	ADP
ajst-2174	138	19	lfsr	lfsr	PROPN
ajst-2174	138	20	reseeding	reseed	VERB
ajst-2174	138	21	test	test	NOUN
ajst-2174	138	22	compression	compression	NOUN
ajst-2174	138	23	technology[c	technology[c	NOUN
ajst-2174	138	24	]	]	PUNCT
ajst-2174	138	25	.	.	PUNCT
ajst-2174	139	1	the	the	DET
ajst-2174	139	2	4th	4th	ADJ
ajst-2174	139	3	international	international	ADJ
ajst-2174	139	4	symposium	symposium	NOUN
ajst-2174	139	5	on	on	ADP
ajst-2174	139	6	computational	computational	ADJ
ajst-2174	139	7	intelligence	intelligence	NOUN
ajst-2174	139	8	and	and	CCONJ
ajst-2174	139	9	industrial	industrial	ADJ
ajst-2174	139	10	applications	application	NOUN
ajst-2174	139	11	,	,	PUNCT
ajst-2174	139	12	2010	2010	NUM
ajst-2174	139	13	:	:	PUNCT
ajst-2174	139	14	168	168	NUM
ajst-2174	139	15	-	-	PUNCT
ajst-2174	139	16	173．	173．	NUM
ajst-2174	140	1	[	[	X
ajst-2174	140	2	12	12	NUM
ajst-2174	140	3	]	]	PUNCT
ajst-2174	140	4	j.	j.	PROPN
ajst-2174	140	5	praveen	praveen	PROPN
ajst-2174	140	6	,	,	PUNCT
ajst-2174	140	7	m.	m.	PROPN
ajst-2174	140	8	n.	n.	PROPN
ajst-2174	140	9	shanmukha	shanmukha	PROPN
ajst-2174	140	10	swamy	swamy	PROPN
ajst-2174	140	11	.	.	PUNCT
ajst-2174	140	12	bist	bist	NOUN
ajst-2174	140	13	-	-	PUNCT
ajst-2174	140	14	based	base	VERB
ajst-2174	140	15	low	low	ADJ
ajst-2174	140	16	power	power	NOUN
ajst-2174	140	17	test	test	NOUN
ajst-2174	140	18	vector	vector	NOUN
ajst-2174	140	19	generator	generator	NOUN
ajst-2174	140	20	and	and	CCONJ
ajst-2174	140	21	minimizing	minimize	VERB
ajst-2174	140	22	bulkiness	bulkiness	NOUN
ajst-2174	140	23	of	of	ADP
ajst-2174	140	24	vlsi	vlsi	PROPN
ajst-2174	140	25	architecture[j	architecture[j	PROPN
ajst-2174	140	26	]	]	PUNCT
ajst-2174	140	27	.	.	PUNCT
ajst-2174	141	1	journal	journal	PROPN
ajst-2174	141	2	of	of	ADP
ajst-2174	141	3	circuits	circuit	NOUN
ajst-2174	141	4	systems	system	NOUN
ajst-2174	141	5	and	and	CCONJ
ajst-2174	141	6	computers	computer	NOUN
ajst-2174	141	7	,	,	PUNCT
ajst-2174	141	8	2018	2018	NUM
ajst-2174	141	9	,	,	PUNCT
ajst-2174	141	10	27(5):1850078	27(5):1850078	NUM
ajst-2174	141	11	-	-	SYM
ajst-2174	141	12	1850082	1850082	NUM
ajst-2174	141	13	.	.	PUNCT
ajst-2174	142	1	[	[	X
ajst-2174	142	2	13	13	NUM
ajst-2174	142	3	]	]	PUNCT
ajst-2174	142	4	a.	a.	NOUN
ajst-2174	142	5	s.	s.	PROPN
ajst-2174	142	6	abu	abu	PROPN
ajst-2174	142	7	-	-	PUNCT
ajst-2174	142	8	issa	issa	PROPN
ajst-2174	142	9	.	.	PUNCT
ajst-2174	143	1	energy	energy	NOUN
ajst-2174	143	2	-	-	PUNCT
ajst-2174	143	3	efficient	efficient	ADJ
ajst-2174	143	4	scheme	scheme	NOUN
ajst-2174	143	5	for	for	ADP
ajst-2174	143	6	multiple	multiple	ADJ
ajst-2174	143	7	scanchains	scanchain	NOUN
ajst-2174	143	8	bist	bist	NOUN
ajst-2174	143	9	using	use	VERB
ajst-2174	143	10	weight	weight	NOUN
ajst-2174	143	11	-	-	PUNCT
ajst-2174	143	12	based	base	VERB
ajst-2174	143	13	segmentation[j	segmentation[j	PROPN
ajst-2174	143	14	]	]	PUNCT
ajst-2174	143	15	.	.	PUNCT
ajst-2174	144	1	ieee	ieee	NOUN
ajst-2174	144	2	transactions	transaction	NOUN
ajst-2174	144	3	on	on	ADP
ajst-2174	144	4	circuits	circuit	NOUN
ajst-2174	144	5	and	and	CCONJ
ajst-2174	144	6	systems	system	NOUN
ajst-2174	144	7	ii	ii	PROPN
ajst-2174	144	8	:	:	PUNCT
ajst-2174	144	9	express	express	VERB
ajst-2174	144	10	briefs	brief	NOUN
ajst-2174	144	11	,	,	PUNCT
ajst-2174	144	12	2018	2018	NUM
ajst-2174	144	13	,	,	PUNCT
ajst-2174	144	14	65(3	65(3	NUM
ajst-2174	144	15	):	):	PUNCT
ajst-2174	144	16	361	361	NUM
ajst-2174	144	17	-	-	SYM
ajst-2174	144	18	365	365	NUM
ajst-2174	144	19	.	.	PUNCT
ajst-2174	144	20	208	208	NUM
ajst-2174	145	1	[	[	X
ajst-2174	145	2	14	14	NUM
ajst-2174	145	3	]	]	PUNCT
ajst-2174	145	4	k.	k.	PROPN
ajst-2174	145	5	thilagavathi	thilagavathi	PROPN
ajst-2174	145	6	,	,	PUNCT
ajst-2174	145	7	s.	s.	PROPN
ajst-2174	145	8	sivanantham	sivanantham	PROPN
ajst-2174	145	9	.	.	PUNCT
ajst-2174	146	1	two	two	NUM
ajst-2174	146	2	-	-	PUNCT
ajst-2174	146	3	stage	stage	NOUN
ajst-2174	146	4	low	low	ADJ
ajst-2174	146	5	power	power	NOUN
ajst-2174	146	6	test	test	NOUN
ajst-2174	146	7	data	datum	NOUN
ajst-2174	146	8	compression	compression	NOUN
ajst-2174	146	9	for	for	ADP
ajst-2174	146	10	digital	digital	PROPN
ajst-2174	146	11	vlsi	vlsi	PROPN
ajst-2174	146	12	circuits[j	circuits[j	PROPN
ajst-2174	146	13	]	]	PUNCT
ajst-2174	146	14	.	.	PUNCT
ajst-2174	147	1	computers	computer	NOUN
ajst-2174	147	2	&	&	CCONJ
ajst-2174	147	3	electrical	electrical	ADJ
ajst-2174	147	4	engineering	engineering	NOUN
ajst-2174	147	5	,	,	PUNCT
ajst-2174	147	6	2018	2018	NUM
ajst-2174	147	7	,	,	PUNCT
ajst-2174	147	8	71	71	NUM
ajst-2174	147	9	:	:	PUNCT
ajst-2174	147	10	309	309	NUM
ajst-2174	147	11	-	-	SYM
ajst-2174	147	12	320	320	NUM
ajst-2174	147	13	.	.	PUNCT
ajst-2174	148	1	[	[	X
ajst-2174	148	2	15	15	NUM
ajst-2174	148	3	]	]	X
ajst-2174	148	4	g.	g.	PROPN
ajst-2174	148	5	zhang	zhang	PROPN
ajst-2174	148	6	,	,	PUNCT
ajst-2174	148	7	y.	y.	PROPN
ajst-2174	148	8	yuan	yuan	PROPN
ajst-2174	148	9	,	,	PUNCT
ajst-2174	148	10	f.	f.	PROPN
ajst-2174	148	11	liang	liang	PROPN
ajst-2174	148	12	,	,	PUNCT
ajst-2174	148	13	et	et	PROPN
ajst-2174	148	14	al	al	PROPN
ajst-2174	148	15	.	.	PROPN
ajst-2174	148	16	low	low	PROPN
ajst-2174	148	17	cost	cost	NOUN
ajst-2174	148	18	test	test	NOUN
ajst-2174	148	19	pattern	pattern	NOUN
ajst-2174	148	20	generation	generation	NOUN
ajst-2174	148	21	in	in	ADP
ajst-2174	148	22	scan	scan	NOUN
ajst-2174	148	23	-	-	PUNCT
ajst-2174	148	24	based	base	VERB
ajst-2174	148	25	bist	bist	NOUN
ajst-2174	148	26	schemes[j	schemes[j	PROPN
ajst-2174	148	27	]	]	PUNCT
ajst-2174	148	28	.	.	PUNCT
ajst-2174	149	1	electronics	electronic	NOUN
ajst-2174	149	2	,	,	PUNCT
ajst-2174	149	3	2019	2019	NUM
ajst-2174	149	4	,	,	PUNCT
ajst-2174	149	5	8	8	NUM
ajst-2174	149	6	:	:	SYM
ajst-2174	149	7	314	314	NUM
ajst-2174	149	8	.	.	PUNCT
ajst-2174	150	1	[	[	X
ajst-2174	150	2	16	16	NUM
ajst-2174	150	3	]	]	X
ajst-2174	150	4	zhang	zhang	PROPN
ajst-2174	150	5	,	,	PUNCT
ajst-2174	150	6	x	x	PROPN
ajst-2174	150	7	w	w	PROPN
ajst-2174	150	8	,	,	PUNCT
ajst-2174	150	9	li	li	PROPN
ajst-2174	150	10	m	m	PROPN
ajst-2174	150	11	,	,	PUNCT
ajst-2174	150	12	hu	hu	PROPN
ajst-2174	150	13	j.	j.	PROPN
ajst-2174	150	14	optimization	optimization	PROPN
ajst-2174	150	15	and	and	CCONJ
ajst-2174	150	16	implementation	implementation	NOUN
ajst-2174	150	17	of	of	ADP
ajst-2174	150	18	aes	aes	PROPN
ajst-2174	150	19	algorithm	algorithm	NOUN
ajst-2174	150	20	based	base	VERB
ajst-2174	150	21	on	on	ADP
ajst-2174	150	22	fpga[c	fpga[c	ADV
ajst-2174	150	23	]	]	PUNCT
ajst-2174	150	24	.	.	PUNCT
ajst-2174	150	25	2018	2018	NUM
ajst-2174	150	26	ieee	ieee	PROPN
ajst-2174	150	27	4th	4th	ADJ
ajst-2174	150	28	international	international	ADJ
ajst-2174	150	29	conference	conference	NOUN
ajst-2174	150	30	on	on	ADP
ajst-2174	150	31	computer	computer	NOUN
ajst-2174	150	32	and	and	CCONJ
ajst-2174	150	33	communications	communication	NOUN
ajst-2174	150	34	,	,	PUNCT
ajst-2174	150	35	2018	2018	NUM
ajst-2174	150	36	:	:	PUNCT
ajst-2174	150	37	2704	2704	NUM
ajst-2174	150	38	-	-	SYM
ajst-2174	150	39	2709	2709	NUM
ajst-2174	150	40	.	.	PUNCT