id	sid	tid	token	lemma	pos
ajst-2992	1	1	academic	academic	ADJ
ajst-2992	1	2	journal	journal	NOUN
ajst-2992	1	3	of	of	ADP
ajst-2992	1	4	science	science	NOUN
ajst-2992	1	5	and	and	CCONJ
ajst-2992	1	6	technology	technology	NOUN
ajst-2992	1	7	issn	issn	NOUN
ajst-2992	1	8	:	:	PUNCT
ajst-2992	1	9	2771	2771	NUM
ajst-2992	1	10	-	-	SYM
ajst-2992	1	11	3032	3032	NUM
ajst-2992	1	12	|	|	NOUN
ajst-2992	1	13	vol	vol	NOUN
ajst-2992	1	14	.	.	PROPN
ajst-2992	2	1	3	3	NUM
ajst-2992	2	2	,	,	PUNCT
ajst-2992	2	3	no	no	INTJ
ajst-2992	2	4	.	.	NOUN
ajst-2992	2	5	3	3	NUM
ajst-2992	2	6	,	,	PUNCT
ajst-2992	3	1	2022	2022	NUM
ajst-2992	3	2	247	247	NUM
ajst-2992	3	3	analysis	analysis	NOUN
ajst-2992	3	4	of	of	ADP
ajst-2992	3	5	current	current	ADJ
ajst-2992	3	6	imbalance	imbalance	NOUN
ajst-2992	3	7	in	in	ADP
ajst-2992	3	8	paralleled	parallel	VERB
ajst-2992	3	9	silicon	silicon	NOUN
ajst-2992	3	10	carbide	carbide	NOUN
ajst-2992	3	11	power	power	NOUN
ajst-2992	3	12	mosfets	mosfet	NOUN
ajst-2992	3	13	jianing	jiane	VERB
ajst-2992	3	14	guo1	guo1	PROPN
ajst-2992	3	15	,	,	PUNCT
ajst-2992	3	16	a	a	DET
ajst-2992	3	17	1central	1central	NUM
ajst-2992	3	18	south	south	PROPN
ajst-2992	3	19	university	university	NOUN
ajst-2992	3	20	changsha	changsha	PROPN
ajst-2992	3	21	,	,	PUNCT
ajst-2992	3	22	china	china	PROPN
ajst-2992	3	23	a8203190601@csu.edu.cn	a8203190601@csu.edu.cn	PROPN
ajst-2992	3	24	abstract	abstract	NOUN
ajst-2992	3	25	:	:	PUNCT
ajst-2992	3	26	in	in	ADP
ajst-2992	3	27	order	order	NOUN
ajst-2992	3	28	to	to	PART
ajst-2992	3	29	adapt	adapt	VERB
ajst-2992	3	30	to	to	ADP
ajst-2992	3	31	the	the	DET
ajst-2992	3	32	application	application	NOUN
ajst-2992	3	33	scenarios	scenario	NOUN
ajst-2992	3	34	of	of	ADP
ajst-2992	3	35	high	high	ADJ
ajst-2992	3	36	power	power	NOUN
ajst-2992	3	37	variable	variable	NOUN
ajst-2992	3	38	current	current	NOUN
ajst-2992	3	39	,	,	PUNCT
ajst-2992	3	40	it	it	PRON
ajst-2992	3	41	is	be	AUX
ajst-2992	3	42	an	an	DET
ajst-2992	3	43	effective	effective	ADJ
ajst-2992	3	44	solution	solution	NOUN
ajst-2992	3	45	to	to	PART
ajst-2992	3	46	parallel	parallel	VERB
ajst-2992	3	47	multiple	multiple	ADJ
ajst-2992	3	48	silicon	silicon	NOUN
ajst-2992	3	49	carbide	carbide	NOUN
ajst-2992	3	50	(	(	PUNCT
ajst-2992	3	51	sic	sic	ADJ
ajst-2992	3	52	)	)	PUNCT
ajst-2992	3	53	power	power	NOUN
ajst-2992	3	54	.	.	PUNCT
ajst-2992	4	1	however	however	ADV
ajst-2992	4	2	,	,	PUNCT
ajst-2992	4	3	the	the	DET
ajst-2992	4	4	static	static	ADJ
ajst-2992	4	5	parameters	parameter	NOUN
ajst-2992	4	6	of	of	ADP
ajst-2992	4	7	sic	sic	ADJ
ajst-2992	4	8	mosfet	mosfet	NOUN
ajst-2992	4	9	devices	device	NOUN
ajst-2992	4	10	are	be	AUX
ajst-2992	4	11	dispersed	disperse	VERB
ajst-2992	4	12	,	,	PUNCT
ajst-2992	4	13	the	the	DET
ajst-2992	4	14	parasitic	parasitic	ADJ
ajst-2992	4	15	parameters	parameter	NOUN
ajst-2992	4	16	of	of	ADP
ajst-2992	4	17	power	power	NOUN
ajst-2992	4	18	loop	loop	NOUN
ajst-2992	4	19	are	be	AUX
ajst-2992	4	20	asymmetric	asymmetric	ADJ
ajst-2992	4	21	,	,	PUNCT
ajst-2992	4	22	and	and	CCONJ
ajst-2992	4	23	the	the	DET
ajst-2992	4	24	working	work	VERB
ajst-2992	4	25	junction	junction	NOUN
ajst-2992	4	26	temperature	temperature	NOUN
ajst-2992	4	27	of	of	ADP
ajst-2992	4	28	the	the	DET
ajst-2992	4	29	devices	device	NOUN
ajst-2992	4	30	is	be	AUX
ajst-2992	4	31	different	different	ADJ
ajst-2992	4	32	.	.	PUNCT
ajst-2992	5	1	all	all	DET
ajst-2992	5	2	these	these	DET
ajst-2992	5	3	factors	factor	NOUN
ajst-2992	5	4	will	will	AUX
ajst-2992	5	5	lead	lead	VERB
ajst-2992	5	6	to	to	ADP
ajst-2992	5	7	non	non	ADJ
ajst-2992	5	8	-	-	ADJ
ajst-2992	5	9	uniform	uniform	ADJ
ajst-2992	5	10	current	current	ADJ
ajst-2992	5	11	stress	stress	NOUN
ajst-2992	5	12	between	between	ADP
ajst-2992	5	13	parallel	parallel	ADJ
ajst-2992	5	14	devices.this	devices.this	PRON
ajst-2992	5	15	article	article	NOUN
ajst-2992	5	16	is	be	AUX
ajst-2992	5	17	based	base	VERB
ajst-2992	5	18	on	on	ADP
ajst-2992	5	19	the	the	DET
ajst-2992	5	20	sic	sic	ADJ
ajst-2992	5	21	mosfet	mosfet	NOUN
ajst-2992	5	22	device	device	NOUN
ajst-2992	5	23	provided	provide	VERB
ajst-2992	5	24	in	in	ADP
ajst-2992	5	25	wolfspeed	wolfspeed	NOUN
ajst-2992	5	26	,	,	PUNCT
ajst-2992	5	27	to	to	PART
ajst-2992	5	28	explore	explore	VERB
ajst-2992	5	29	the	the	DET
ajst-2992	5	30	impact	impact	NOUN
ajst-2992	5	31	of	of	ADP
ajst-2992	5	32	circuit	circuit	NOUN
ajst-2992	5	33	parameters	parameter	NOUN
ajst-2992	5	34	mismatch	mismatch	VERB
ajst-2992	5	35	on	on	ADP
ajst-2992	5	36	current	current	ADJ
ajst-2992	5	37	sharing	sharing	NOUN
ajst-2992	5	38	in	in	ADP
ajst-2992	5	39	parallel	parallel	ADJ
ajst-2992	5	40	components	component	NOUN
ajst-2992	5	41	.	.	PUNCT
ajst-2992	6	1	the	the	DET
ajst-2992	6	2	influence	influence	NOUN
ajst-2992	6	3	of	of	ADP
ajst-2992	6	4	the	the	DET
ajst-2992	6	5	circuit	circuit	NOUN
ajst-2992	6	6	parameters	parameter	NOUN
ajst-2992	6	7	on	on	ADP
ajst-2992	6	8	the	the	DET
ajst-2992	6	9	static	static	ADJ
ajst-2992	6	10	and	and	CCONJ
ajst-2992	6	11	dynamic	dynamic	ADJ
ajst-2992	6	12	current	current	ADJ
ajst-2992	6	13	sharing	sharing	NOUN
ajst-2992	6	14	of	of	ADP
ajst-2992	6	15	the	the	DET
ajst-2992	6	16	parallel	parallel	ADJ
ajst-2992	6	17	sic	sic	ADJ
ajst-2992	6	18	mosfet	mosfet	NOUN
ajst-2992	6	19	device	device	NOUN
ajst-2992	6	20	is	be	AUX
ajst-2992	6	21	obtained	obtain	VERB
ajst-2992	6	22	,	,	PUNCT
ajst-2992	6	23	and	and	CCONJ
ajst-2992	6	24	the	the	DET
ajst-2992	6	25	influence	influence	NOUN
ajst-2992	6	26	of	of	ADP
ajst-2992	6	27	each	each	DET
ajst-2992	6	28	factor	factor	NOUN
ajst-2992	6	29	on	on	ADP
ajst-2992	6	30	the	the	DET
ajst-2992	6	31	specific	specific	ADJ
ajst-2992	6	32	process	process	NOUN
ajst-2992	6	33	is	be	AUX
ajst-2992	6	34	summarized	summarize	VERB
ajst-2992	6	35	,	,	PUNCT
ajst-2992	6	36	and	and	CCONJ
ajst-2992	6	37	the	the	DET
ajst-2992	6	38	most	most	ADV
ajst-2992	6	39	influential	influential	ADJ
ajst-2992	6	40	factor	factor	NOUN
ajst-2992	6	41	on	on	ADP
ajst-2992	6	42	the	the	DET
ajst-2992	6	43	current	current	ADJ
ajst-2992	6	44	change	change	NOUN
ajst-2992	6	45	in	in	ADP
ajst-2992	6	46	the	the	DET
ajst-2992	6	47	case	case	NOUN
ajst-2992	6	48	of	of	ADP
ajst-2992	6	49	parameter	parameter	NOUN
ajst-2992	6	50	mismatch	mismatch	NOUN
ajst-2992	6	51	is	be	AUX
ajst-2992	6	52	compared	compare	VERB
ajst-2992	6	53	.	.	PUNCT
ajst-2992	7	1	keywords	keyword	NOUN
ajst-2992	7	2	:	:	PUNCT
ajst-2992	7	3	parallel	parallel	VERB
ajst-2992	7	4	sic	sic	ADJ
ajst-2992	7	5	mosfet	mosfet	NOUN
ajst-2992	7	6	,	,	PUNCT
ajst-2992	7	7	parasitic	parasitic	ADJ
ajst-2992	7	8	inductance	inductance	NOUN
ajst-2992	7	9	,	,	PUNCT
ajst-2992	7	10	parasitic	parasitic	ADJ
ajst-2992	7	11	capacitance	capacitance	NOUN
ajst-2992	7	12	,	,	PUNCT
ajst-2992	7	13	control	control	NOUN
ajst-2992	7	14	variable	variable	ADJ
ajst-2992	7	15	method	method	NOUN
ajst-2992	7	16	,	,	PUNCT
ajst-2992	7	17	uneven	uneven	ADJ
ajst-2992	7	18	current	current	ADJ
ajst-2992	7	19	of	of	ADP
ajst-2992	7	20	current	current	ADJ
ajst-2992	7	21	.	.	PUNCT
ajst-2992	8	1	1	1	X
ajst-2992	8	2	.	.	X
ajst-2992	8	3	introduction	introduction	NOUN
ajst-2992	8	4	in	in	ADP
ajst-2992	8	5	the	the	DET
ajst-2992	8	6	field	field	NOUN
ajst-2992	8	7	of	of	ADP
ajst-2992	8	8	new	new	ADJ
ajst-2992	8	9	electronic	electronic	ADJ
ajst-2992	8	10	devices	device	NOUN
ajst-2992	8	11	,	,	PUNCT
ajst-2992	8	12	power	power	NOUN
ajst-2992	8	13	electronics	electronic	NOUN
ajst-2992	8	14	is	be	AUX
ajst-2992	8	15	an	an	DET
ajst-2992	8	16	important	important	ADJ
ajst-2992	8	17	link	link	NOUN
ajst-2992	8	18	in	in	ADP
ajst-2992	8	19	the	the	DET
ajst-2992	8	20	power	power	NOUN
ajst-2992	8	21	energy	energy	NOUN
ajst-2992	8	22	industry	industry	NOUN
ajst-2992	8	23	chain	chain	NOUN
ajst-2992	8	24	,	,	PUNCT
ajst-2992	8	25	the	the	DET
ajst-2992	8	26	core	core	NOUN
ajst-2992	8	27	component	component	NOUN
ajst-2992	8	28	is	be	AUX
ajst-2992	8	29	power	power	NOUN
ajst-2992	8	30	semiconductor	semiconductor	NOUN
ajst-2992	8	31	devices	device	NOUN
ajst-2992	8	32	.	.	PUNCT
ajst-2992	9	1	silicon	silicon	PROPN
ajst-2992	9	2	carbide	carbide	PROPN
ajst-2992	9	3	(	(	PUNCT
ajst-2992	9	4	sic	sic	ADJ
ajst-2992	9	5	)	)	PUNCT
ajst-2992	9	6	mosfet	mosfet	NOUN
ajst-2992	9	7	is	be	AUX
ajst-2992	9	8	considered	consider	VERB
ajst-2992	9	9	to	to	PART
ajst-2992	9	10	be	be	AUX
ajst-2992	9	11	the	the	DET
ajst-2992	9	12	most	most	ADV
ajst-2992	9	13	potential	potential	ADJ
ajst-2992	9	14	development	development	NOUN
ajst-2992	9	15	of	of	ADP
ajst-2992	9	16	new	new	ADJ
ajst-2992	9	17	semiconductor	semiconductor	NOUN
ajst-2992	9	18	devices	device	NOUN
ajst-2992	9	19	.	.	PUNCT
ajst-2992	10	1	however	however	ADV
ajst-2992	10	2	,	,	PUNCT
ajst-2992	10	3	it	it	PRON
ajst-2992	10	4	is	be	AUX
ajst-2992	10	5	difficult	difficult	ADJ
ajst-2992	10	6	for	for	SCONJ
ajst-2992	10	7	sic	sic	ADJ
ajst-2992	10	8	mosfets	mosfet	NOUN
ajst-2992	10	9	meet	meet	VERB
ajst-2992	10	10	the	the	DET
ajst-2992	10	11	requirements	requirement	NOUN
ajst-2992	10	12	of	of	ADP
ajst-2992	10	13	high	high	ADJ
ajst-2992	10	14	power	power	NOUN
ajst-2992	10	15	applications	application	NOUN
ajst-2992	10	16	due	due	ADP
ajst-2992	10	17	to	to	ADP
ajst-2992	10	18	the	the	DET
ajst-2992	10	19	flow	flow	NOUN
ajst-2992	10	20	limit	limit	NOUN
ajst-2992	10	21	resistance	resistance	NOUN
ajst-2992	10	22	of	of	ADP
ajst-2992	10	23	sic	sic	ADJ
ajst-2992	10	24	devices	device	NOUN
ajst-2992	10	25	.	.	PUNCT
ajst-2992	11	1	there	there	PRON
ajst-2992	11	2	are	be	VERB
ajst-2992	11	3	generally	generally	ADV
ajst-2992	11	4	two	two	NUM
ajst-2992	11	5	methods	method	NOUN
ajst-2992	11	6	so	so	SCONJ
ajst-2992	11	7	as	as	SCONJ
ajst-2992	11	8	to	to	PART
ajst-2992	11	9	solve	solve	VERB
ajst-2992	11	10	the	the	DET
ajst-2992	11	11	problem	problem	NOUN
ajst-2992	11	12	that	that	PRON
ajst-2992	11	13	a	a	DET
ajst-2992	11	14	single	single	ADJ
ajst-2992	11	15	sic	sic	ADJ
ajst-2992	11	16	mosfet	mosfet	NOUN
ajst-2992	11	17	discrete	discrete	ADJ
ajst-2992	11	18	device	device	NOUN
ajst-2992	11	19	does	do	AUX
ajst-2992	11	20	not	not	PART
ajst-2992	11	21	meet	meet	VERB
ajst-2992	11	22	the	the	DET
ajst-2992	11	23	current	current	ADJ
ajst-2992	11	24	demand	demand	NOUN
ajst-2992	11	25	,	,	PUNCT
ajst-2992	11	26	.	.	PUNCT
ajst-2992	12	1	the	the	DET
ajst-2992	12	2	first	first	ADJ
ajst-2992	12	3	one	one	NOUN
ajst-2992	12	4	is	be	AUX
ajst-2992	12	5	using	use	VERB
ajst-2992	12	6	a	a	DET
ajst-2992	12	7	multi	multi	ADJ
ajst-2992	12	8	-	-	ADJ
ajst-2992	12	9	chip	chip	ADJ
ajst-2992	12	10	parallel	parallel	ADJ
ajst-2992	12	11	power	power	NOUN
ajst-2992	12	12	module	module	NOUN
ajst-2992	12	13	;	;	PUNCT
ajst-2992	12	14	the	the	DET
ajst-2992	12	15	second	second	ADJ
ajst-2992	12	16	one	one	NOUN
ajst-2992	12	17	is	be	AUX
ajst-2992	12	18	using	use	VERB
ajst-2992	12	19	multiple	multiple	ADJ
ajst-2992	12	20	single	single	ADJ
ajst-2992	12	21	discrete	discrete	ADJ
ajst-2992	12	22	devices	device	NOUN
ajst-2992	12	23	directly	directly	ADV
ajst-2992	12	24	in	in	ADP
ajst-2992	12	25	parallel	parallel	NOUN
ajst-2992	12	26	.	.	PUNCT
ajst-2992	13	1	due	due	ADP
ajst-2992	13	2	to	to	ADP
ajst-2992	13	3	the	the	DET
ajst-2992	13	4	dispersion	dispersion	NOUN
ajst-2992	13	5	of	of	ADP
ajst-2992	13	6	parameters	parameter	NOUN
ajst-2992	13	7	between	between	ADP
ajst-2992	13	8	parallel	parallel	ADJ
ajst-2992	13	9	devices	device	NOUN
ajst-2992	13	10	,	,	PUNCT
ajst-2992	13	11	there	there	PRON
ajst-2992	13	12	are	be	VERB
ajst-2992	13	13	differences	difference	NOUN
ajst-2992	13	14	in	in	ADP
ajst-2992	13	15	junction	junction	NOUN
ajst-2992	13	16	temperature	temperature	NOUN
ajst-2992	13	17	,	,	PUNCT
ajst-2992	13	18	lack	lack	NOUN
ajst-2992	13	19	of	of	ADP
ajst-2992	13	20	consistency	consistency	NOUN
ajst-2992	13	21	in	in	ADP
ajst-2992	13	22	loop	loop	NOUN
ajst-2992	13	23	parasitic	parasitic	ADJ
ajst-2992	13	24	parameters	parameter	NOUN
ajst-2992	13	25	,	,	PUNCT
ajst-2992	13	26	,	,	PUNCT
ajst-2992	13	27	there	there	PRON
ajst-2992	13	28	will	will	AUX
ajst-2992	13	29	inevitably	inevitably	ADV
ajst-2992	13	30	be	be	AUX
ajst-2992	13	31	the	the	DET
ajst-2992	13	32	phenomenon	phenomenon	NOUN
ajst-2992	13	33	of	of	ADP
ajst-2992	13	34	uneven	uneven	ADJ
ajst-2992	13	35	current	current	ADJ
ajst-2992	13	36	,	,	PUNCT
ajst-2992	13	37	resulting	result	VERB
ajst-2992	13	38	in	in	ADP
ajst-2992	13	39	temperature	temperature	NOUN
ajst-2992	13	40	rise	rise	NOUN
ajst-2992	13	41	and	and	CCONJ
ajst-2992	13	42	electromagnetic	electromagnetic	ADJ
ajst-2992	13	43	interference	interference	NOUN
ajst-2992	13	44	differences	difference	NOUN
ajst-2992	13	45	between	between	ADP
ajst-2992	13	46	devices	device	NOUN
ajst-2992	13	47	,	,	PUNCT
ajst-2992	13	48	current	current	ADJ
ajst-2992	13	49	inequality	inequality	NOUN
ajst-2992	13	50	will	will	AUX
ajst-2992	13	51	lead	lead	VERB
ajst-2992	13	52	to	to	ADP
ajst-2992	13	53	large	large	ADJ
ajst-2992	13	54	losses	loss	NOUN
ajst-2992	13	55	,	,	PUNCT
ajst-2992	13	56	high	high	ADJ
ajst-2992	13	57	temperature	temperature	NOUN
ajst-2992	13	58	.	.	PUNCT
ajst-2992	14	1	furthermore	furthermore	ADV
ajst-2992	14	2	,	,	PUNCT
ajst-2992	14	3	the	the	DET
ajst-2992	14	4	aging	age	VERB
ajst-2992	14	5	degree	degree	NOUN
ajst-2992	14	6	of	of	ADP
ajst-2992	14	7	the	the	DET
ajst-2992	14	8	device	device	NOUN
ajst-2992	14	9	is	be	AUX
ajst-2992	14	10	different	different	ADJ
ajst-2992	14	11	.	.	PUNCT
ajst-2992	15	1	if	if	SCONJ
ajst-2992	15	2	the	the	DET
ajst-2992	15	3	current	current	ADJ
ajst-2992	15	4	imbalance	imbalance	NOUN
ajst-2992	15	5	is	be	AUX
ajst-2992	15	6	not	not	PART
ajst-2992	15	7	dealt	deal	VERB
ajst-2992	15	8	with	with	ADP
ajst-2992	15	9	during	during	ADP
ajst-2992	15	10	this	this	DET
ajst-2992	15	11	period	period	NOUN
ajst-2992	15	12	,	,	PUNCT
ajst-2992	15	13	the	the	DET
ajst-2992	15	14	performance	performance	NOUN
ajst-2992	15	15	of	of	ADP
ajst-2992	15	16	the	the	DET
ajst-2992	15	17	device	device	NOUN
ajst-2992	15	18	will	will	AUX
ajst-2992	15	19	be	be	AUX
ajst-2992	15	20	gradually	gradually	ADV
ajst-2992	15	21	reduced	reduce	VERB
ajst-2992	15	22	,	,	PUNCT
ajst-2992	15	23	and	and	CCONJ
ajst-2992	15	24	the	the	DET
ajst-2992	15	25	thermal	thermal	ADJ
ajst-2992	15	26	failure	failure	NOUN
ajst-2992	15	27	of	of	ADP
ajst-2992	15	28	the	the	DET
ajst-2992	15	29	device	device	NOUN
ajst-2992	15	30	will	will	AUX
ajst-2992	15	31	be	be	AUX
ajst-2992	15	32	more	more	ADV
ajst-2992	15	33	likely	likely	ADJ
ajst-2992	15	34	,	,	PUNCT
ajst-2992	15	35	which	which	PRON
ajst-2992	15	36	will	will	AUX
ajst-2992	15	37	further	far	ADV
ajst-2992	15	38	expose	expose	VERB
ajst-2992	15	39	the	the	DET
ajst-2992	15	40	application	application	NOUN
ajst-2992	15	41	circuit	circuit	NOUN
ajst-2992	15	42	to	to	ADP
ajst-2992	15	43	great	great	ADJ
ajst-2992	15	44	risks[1	risks[1	NOUN
ajst-2992	15	45	-	-	SYM
ajst-2992	15	46	5	5	NUM
ajst-2992	15	47	]	]	PUNCT
ajst-2992	15	48	.	.	PUNCT
ajst-2992	16	1	inhomogeneity	inhomogeneity	NOUN
ajst-2992	16	2	current	current	ADJ
ajst-2992	16	3	analysis	analysis	NOUN
ajst-2992	16	4	of	of	ADP
ajst-2992	16	5	parallel	parallel	ADJ
ajst-2992	16	6	devices	device	NOUN
ajst-2992	16	7	includes	include	VERB
ajst-2992	16	8	static	static	ADJ
ajst-2992	16	9	current	current	ADJ
ajst-2992	16	10	inhomogeneity	inhomogeneity	NOUN
ajst-2992	16	11	after	after	ADP
ajst-2992	16	12	conduction	conduction	NOUN
ajst-2992	16	13	and	and	CCONJ
ajst-2992	16	14	dynamic	dynamic	ADJ
ajst-2992	16	15	current	current	ADJ
ajst-2992	16	16	inhomogeneity	inhomogeneity	NOUN
ajst-2992	16	17	during	during	ADP
ajst-2992	16	18	switching	switch	VERB
ajst-2992	16	19	[	[	PUNCT
ajst-2992	16	20	5	5	NUM
ajst-2992	16	21	-	-	SYM
ajst-2992	16	22	6	6	NUM
ajst-2992	16	23	]	]	PUNCT
ajst-2992	16	24	.	.	PUNCT
ajst-2992	17	1	static	static	ADJ
ajst-2992	17	2	current	current	ADJ
ajst-2992	17	3	imbalance	imbalance	NOUN
ajst-2992	17	4	refers	refer	VERB
ajst-2992	17	5	to	to	ADP
ajst-2992	17	6	the	the	DET
ajst-2992	17	7	drain	drain	NOUN
ajst-2992	17	8	current	current	ADJ
ajst-2992	17	9	imbalance	imbalance	NOUN
ajst-2992	17	10	phenomenon	phenomenon	NOUN
ajst-2992	17	11	caused	cause	VERB
ajst-2992	17	12	by	by	ADP
ajst-2992	17	13	the	the	DET
ajst-2992	17	14	mismatch	mismatch	NOUN
ajst-2992	17	15	between	between	ADP
ajst-2992	17	16	the	the	DET
ajst-2992	17	17	on	on	ADP
ajst-2992	17	18	-	-	PUNCT
ajst-2992	17	19	resistance	resistance	NOUN
ajst-2992	17	20	and	and	CCONJ
ajst-2992	17	21	the	the	DET
ajst-2992	17	22	driving	drive	VERB
ajst-2992	17	23	voltage	voltage	NOUN
ajst-2992	17	24	when	when	SCONJ
ajst-2992	17	25	the	the	DET
ajst-2992	17	26	parallel	parallel	ADJ
ajst-2992	17	27	sic	sic	ADJ
ajst-2992	17	28	mosfet	mosfet	NOUN
ajst-2992	17	29	is	be	AUX
ajst-2992	17	30	fully	fully	ADV
ajst-2992	17	31	conducting	conduct	VERB
ajst-2992	17	32	.	.	PUNCT
ajst-2992	18	1	dynamic	dynamic	ADJ
ajst-2992	18	2	current	current	ADJ
ajst-2992	18	3	imbalance	imbalance	NOUN
ajst-2992	18	4	refers	refer	VERB
ajst-2992	18	5	to	to	ADP
ajst-2992	18	6	the	the	DET
ajst-2992	18	7	current	current	ADJ
ajst-2992	18	8	imbalance	imbalance	NOUN
ajst-2992	18	9	phenomenon	phenomenon	NOUN
ajst-2992	18	10	in	in	ADP
ajst-2992	18	11	the	the	DET
ajst-2992	18	12	switching	switch	VERB
ajst-2992	18	13	process	process	NOUN
ajst-2992	18	14	caused	cause	VERB
ajst-2992	18	15	by	by	ADP
ajst-2992	18	16	the	the	DET
ajst-2992	18	17	difference	difference	NOUN
ajst-2992	18	18	of	of	ADP
ajst-2992	18	19	the	the	DET
ajst-2992	18	20	drain	drain	NOUN
ajst-2992	18	21	current	current	NOUN
ajst-2992	18	22	in	in	ADP
ajst-2992	18	23	each	each	DET
ajst-2992	18	24	branch	branch	NOUN
ajst-2992	18	25	due	due	ADP
ajst-2992	18	26	to	to	ADP
ajst-2992	18	27	parasitic	parasitic	ADJ
ajst-2992	18	28	parameters	parameter	NOUN
ajst-2992	18	29	and	and	CCONJ
ajst-2992	18	30	drive	drive	ADJ
ajst-2992	18	31	loop	loop	NOUN
ajst-2992	18	32	.	.	PUNCT
ajst-2992	19	1	regarding	regard	VERB
ajst-2992	19	2	the	the	DET
ajst-2992	19	3	influencing	influence	VERB
ajst-2992	19	4	factors	factor	NOUN
ajst-2992	19	5	of	of	ADP
ajst-2992	19	6	uneven	uneven	ADJ
ajst-2992	19	7	flow	flow	NOUN
ajst-2992	19	8	of	of	ADP
ajst-2992	19	9	electric	electric	ADJ
ajst-2992	19	10	current	current	NOUN
ajst-2992	19	11	,	,	PUNCT
ajst-2992	19	12	there	there	PRON
ajst-2992	19	13	are	be	VERB
ajst-2992	19	14	,	,	PUNCT
ajst-2992	19	15	literatures	literature	NOUN
ajst-2992	19	16	[	[	X
ajst-2992	19	17	7	7	NUM
ajst-2992	19	18	-	-	SYM
ajst-2992	19	19	9	9	NUM
ajst-2992	19	20	]	]	PUNCT
ajst-2992	19	21	have	have	AUX
ajst-2992	19	22	tested	test	VERB
ajst-2992	19	23	and	and	CCONJ
ajst-2992	19	24	evaluated	evaluate	VERB
ajst-2992	19	25	the	the	DET
ajst-2992	19	26	discretization	discretization	NOUN
ajst-2992	19	27	of	of	ADP
ajst-2992	19	28	sic	sic	ADJ
ajst-2992	19	29	mosfet	mosfet	NOUN
ajst-2992	19	30	device	device	NOUN
ajst-2992	19	31	parameters	parameter	NOUN
ajst-2992	19	32	,	,	PUNCT
ajst-2992	19	33	but	but	CCONJ
ajst-2992	19	34	also	also	ADV
ajst-2992	19	35	analyzed	analyze	VERB
ajst-2992	19	36	the	the	DET
ajst-2992	19	37	influence	influence	NOUN
ajst-2992	19	38	of	of	ADP
ajst-2992	19	39	device	device	NOUN
ajst-2992	19	40	parameter	parameter	NOUN
ajst-2992	19	41	inconsistency	inconsistency	NOUN
ajst-2992	19	42	on	on	ADP
ajst-2992	19	43	steady	steady	ADJ
ajst-2992	19	44	-	-	PUNCT
ajst-2992	19	45	state	state	NOUN
ajst-2992	19	46	and	and	CCONJ
ajst-2992	19	47	transient	transient	ADJ
ajst-2992	19	48	current	current	ADJ
ajst-2992	19	49	imbalance	imbalance	NOUN
ajst-2992	19	50	[	[	X
ajst-2992	19	51	10	10	NUM
ajst-2992	19	52	]	]	PUNCT
ajst-2992	19	53	.	.	PUNCT
ajst-2992	20	1	the	the	DET
ajst-2992	20	2	existing	exist	VERB
ajst-2992	20	3	literature	literature	NOUN
ajst-2992	20	4	had	have	AUX
ajst-2992	20	5	already	already	ADV
ajst-2992	20	6	studied	study	VERB
ajst-2992	20	7	its	its	PRON
ajst-2992	20	8	mechanism	mechanism	NOUN
ajst-2992	20	9	and	and	CCONJ
ajst-2992	20	10	countermeasures	countermeasure	NOUN
ajst-2992	20	11	.	.	PUNCT
ajst-2992	21	1	the	the	DET
ajst-2992	21	2	analysis	analysis	NOUN
ajst-2992	21	3	of	of	ADP
ajst-2992	21	4	literature	literature	NOUN
ajst-2992	21	5	[	[	X
ajst-2992	21	6	11	11	NUM
ajst-2992	21	7	-	-	SYM
ajst-2992	21	8	12	12	NUM
ajst-2992	21	9	]	]	PUNCT
ajst-2992	21	10	shows	show	VERB
ajst-2992	21	11	that	that	SCONJ
ajst-2992	21	12	the	the	DET
ajst-2992	21	13	dispersion	dispersion	NOUN
ajst-2992	21	14	of	of	ADP
ajst-2992	21	15	device	device	NOUN
ajst-2992	21	16	parameters	parameter	NOUN
ajst-2992	21	17	has	have	VERB
ajst-2992	21	18	a	a	DET
ajst-2992	21	19	direct	direct	ADJ
ajst-2992	21	20	impact	impact	NOUN
ajst-2992	21	21	on	on	ADP
ajst-2992	21	22	the	the	DET
ajst-2992	21	23	static	static	ADJ
ajst-2992	21	24	and	and	CCONJ
ajst-2992	21	25	dynamic	dynamic	ADJ
ajst-2992	21	26	current	current	ADJ
ajst-2992	21	27	imbalance	imbalance	NOUN
ajst-2992	21	28	.	.	PUNCT
ajst-2992	22	1	the	the	DET
ajst-2992	22	2	on	on	ADP
ajst-2992	22	3	-	-	PUNCT
ajst-2992	22	4	resistance	resistance	NOUN
ajst-2992	22	5	affects	affect	VERB
ajst-2992	22	6	the	the	DET
ajst-2992	22	7	static	static	ADJ
ajst-2992	22	8	current	current	ADJ
ajst-2992	22	9	balance	balance	NOUN
ajst-2992	22	10	of	of	ADP
ajst-2992	22	11	parallel	parallel	ADJ
ajst-2992	22	12	devices	device	NOUN
ajst-2992	22	13	.	.	PUNCT
ajst-2992	23	1	on	on	ADP
ajst-2992	23	2	the	the	DET
ajst-2992	23	3	other	other	ADJ
ajst-2992	23	4	hand	hand	NOUN
ajst-2992	23	5	，	，	PUNCT
ajst-2992	23	6	the	the	DET
ajst-2992	23	7	threshold	threshold	NOUN
ajst-2992	23	8	voltage	voltage	NOUN
ajst-2992	23	9	affects	affect	VERB
ajst-2992	23	10	the	the	DET
ajst-2992	23	11	dynamic	dynamic	ADJ
ajst-2992	23	12	current	current	ADJ
ajst-2992	23	13	balance	balance	NOUN
ajst-2992	23	14	between	between	ADP
ajst-2992	23	15	devices	device	NOUN
ajst-2992	23	16	.	.	PUNCT
ajst-2992	24	1	the	the	DET
ajst-2992	24	2	pins	pin	NOUN
ajst-2992	24	3	of	of	ADP
ajst-2992	24	4	the	the	DET
ajst-2992	24	5	device	device	NOUN
ajst-2992	24	6	package	package	NOUN
ajst-2992	24	7	will	will	AUX
ajst-2992	24	8	also	also	ADV
ajst-2992	24	9	introduce	introduce	VERB
ajst-2992	24	10	the	the	DET
ajst-2992	24	11	parasitic	parasitic	ADJ
ajst-2992	24	12	inductance	inductance	NOUN
ajst-2992	24	13	of	of	ADP
ajst-2992	24	14	drain	drain	NOUN
ajst-2992	24	15	and	and	CCONJ
ajst-2992	24	16	source	source	NOUN
ajst-2992	24	17	,	,	PUNCT
ajst-2992	24	18	as	as	ADP
ajst-2992	24	19	a	a	DET
ajst-2992	24	20	consequence	consequence	NOUN
ajst-2992	24	21	,	,	PUNCT
ajst-2992	24	22	the	the	DET
ajst-2992	24	23	dispersion	dispersion	NOUN
ajst-2992	24	24	of	of	ADP
ajst-2992	24	25	these	these	DET
ajst-2992	24	26	parameters	parameter	NOUN
ajst-2992	24	27	will	will	AUX
ajst-2992	24	28	also	also	ADV
ajst-2992	24	29	affect	affect	VERB
ajst-2992	24	30	the	the	DET
ajst-2992	24	31	current	current	ADJ
ajst-2992	24	32	balance	balance	NOUN
ajst-2992	24	33	of	of	ADP
ajst-2992	24	34	parallel	parallel	ADJ
ajst-2992	24	35	devices	device	NOUN
ajst-2992	24	36	[	[	X
ajst-2992	24	37	13	13	NUM
ajst-2992	24	38	-	-	SYM
ajst-2992	24	39	14	14	NUM
ajst-2992	24	40	]	]	PUNCT
ajst-2992	24	41	.	.	PUNCT
ajst-2992	25	1	the	the	DET
ajst-2992	25	2	parasitic	parasitic	ADJ
ajst-2992	25	3	parameters	parameter	NOUN
ajst-2992	25	4	are	be	AUX
ajst-2992	25	5	located	locate	VERB
ajst-2992	25	6	in	in	ADP
ajst-2992	25	7	the	the	DET
ajst-2992	25	8	driving	driving	NOUN
ajst-2992	25	9	loop	loop	NOUN
ajst-2992	25	10	and	and	CCONJ
ajst-2992	25	11	power	power	NOUN
ajst-2992	25	12	loop	loop	NOUN
ajst-2992	25	13	of	of	ADP
ajst-2992	25	14	the	the	DET
ajst-2992	25	15	device	device	NOUN
ajst-2992	25	16	and	and	CCONJ
ajst-2992	25	17	their	their	PRON
ajst-2992	25	18	differences	difference	NOUN
ajst-2992	25	19	will	will	AUX
ajst-2992	25	20	affect	affect	VERB
ajst-2992	25	21	the	the	DET
ajst-2992	25	22	drain	drain	NOUN
ajst-2992	25	23	current	current	ADJ
ajst-2992	25	24	and	and	CCONJ
ajst-2992	25	25	switching	switch	VERB
ajst-2992	25	26	time	time	NOUN
ajst-2992	25	27	of	of	ADP
ajst-2992	25	28	sic	sic	ADJ
ajst-2992	25	29	mosfet	mosfet	NOUN
ajst-2992	25	30	in	in	ADP
ajst-2992	25	31	the	the	DET
ajst-2992	25	32	switching	switch	VERB
ajst-2992	25	33	process	process	NOUN
ajst-2992	25	34	to	to	ADP
ajst-2992	25	35	a	a	DET
ajst-2992	25	36	certain	certain	ADJ
ajst-2992	25	37	extent	extent	NOUN
ajst-2992	25	38	.	.	PUNCT
ajst-2992	26	1	therefore	therefore	ADV
ajst-2992	26	2	,	,	PUNCT
ajst-2992	26	3	the	the	DET
ajst-2992	26	4	influence	influence	NOUN
ajst-2992	26	5	of	of	ADP
ajst-2992	26	6	parasitic	parasitic	ADJ
ajst-2992	26	7	parameters	parameter	NOUN
ajst-2992	26	8	on	on	ADP
ajst-2992	26	9	the	the	DET
ajst-2992	26	10	switching	switch	VERB
ajst-2992	26	11	process	process	NOUN
ajst-2992	26	12	should	should	AUX
ajst-2992	26	13	be	be	AUX
ajst-2992	26	14	analyzed	analyze	VERB
ajst-2992	26	15	and	and	CCONJ
ajst-2992	26	16	suppressed	suppress	VERB
ajst-2992	26	17	.	.	PUNCT
ajst-2992	27	1	in	in	ADP
ajst-2992	27	2	this	this	DET
ajst-2992	27	3	paper	paper	NOUN
ajst-2992	27	4	,	,	PUNCT
ajst-2992	27	5	through	through	ADP
ajst-2992	27	6	the	the	DET
ajst-2992	27	7	use	use	NOUN
ajst-2992	27	8	of	of	ADP
ajst-2992	27	9	software	software	NOUN
ajst-2992	27	10	ltspice	ltspice	NOUN
ajst-2992	27	11	simulation	simulation	NOUN
ajst-2992	27	12	method	method	NOUN
ajst-2992	27	13	,	,	PUNCT
ajst-2992	27	14	control	control	NOUN
ajst-2992	27	15	variables	variable	NOUN
ajst-2992	27	16	,	,	PUNCT
ajst-2992	27	17	analysis	analysis	NOUN
ajst-2992	27	18	of	of	ADP
ajst-2992	27	19	inductance	inductance	NOUN
ajst-2992	27	20	,	,	PUNCT
ajst-2992	27	21	capacitance	capacitance	NOUN
ajst-2992	27	22	mismatch	mismatch	NOUN
ajst-2992	27	23	in	in	ADP
ajst-2992	27	24	static	static	ADJ
ajst-2992	27	25	and	and	CCONJ
ajst-2992	27	26	dynamic	dynamic	ADJ
ajst-2992	27	27	switching	switching	NOUN
ajst-2992	27	28	,	,	PUNCT
ajst-2992	27	29	the	the	DET
ajst-2992	27	30	impact	impact	NOUN
ajst-2992	27	31	of	of	ADP
ajst-2992	27	32	current	current	ADJ
ajst-2992	27	33	changes	change	NOUN
ajst-2992	27	34	.	.	PUNCT
ajst-2992	28	1	the	the	DET
ajst-2992	28	2	amplitude	amplitude	NOUN
ajst-2992	28	3	of	of	ADP
ajst-2992	28	4	current	current	ADJ
ajst-2992	28	5	change	change	NOUN
ajst-2992	28	6	was	be	AUX
ajst-2992	28	7	compared	compare	VERB
ajst-2992	28	8	with	with	ADP
ajst-2992	28	9	the	the	DET
ajst-2992	28	10	parameter	parameter	NOUN
ajst-2992	28	11	change	change	NOUN
ajst-2992	28	12	of	of	ADP
ajst-2992	28	13	the	the	DET
ajst-2992	28	14	same	same	ADJ
ajst-2992	28	15	amplitude	amplitude	NOUN
ajst-2992	28	16	,	,	PUNCT
ajst-2992	28	17	then	then	ADV
ajst-2992	28	18	the	the	DET
ajst-2992	28	19	most	most	ADV
ajst-2992	28	20	influential	influential	ADJ
ajst-2992	28	21	factors	factor	NOUN
ajst-2992	28	22	were	be	AUX
ajst-2992	28	23	summarized	summarize	VERB
ajst-2992	28	24	.	.	PUNCT
ajst-2992	29	1	2	2	X
ajst-2992	29	2	.	.	X
ajst-2992	29	3	circuit	circuit	NOUN
ajst-2992	29	4	principle	principle	NOUN
ajst-2992	29	5	and	and	CCONJ
ajst-2992	29	6	heterogeneous	heterogeneous	ADJ
ajst-2992	29	7	current	current	ADJ
ajst-2992	29	8	analysis	analysis	NOUN
ajst-2992	29	9	2.1	2.1	NUM
ajst-2992	29	10	.	.	PUNCT
ajst-2992	29	11	test	test	NOUN
ajst-2992	29	12	circuit	circuit	NOUN
ajst-2992	29	13	analysis	analysis	NOUN
ajst-2992	29	14	in	in	ADP
ajst-2992	29	15	this	this	DET
ajst-2992	29	16	paper	paper	NOUN
ajst-2992	29	17	,	,	PUNCT
ajst-2992	29	18	the	the	DET
ajst-2992	29	19	test	test	NOUN
ajst-2992	29	20	circuit	circuit	NOUN
ajst-2992	29	21	of	of	ADP
ajst-2992	29	22	sic	sic	ADJ
ajst-2992	29	23	mosfet	mosfet	ADJ
ajst-2992	29	24	device	device	NOUN
ajst-2992	29	25	in	in	ADP
ajst-2992	29	26	parallel	parallel	NOUN
ajst-2992	29	27	as	as	SCONJ
ajst-2992	29	28	shown	show	VERB
ajst-2992	29	29	in	in	ADP
ajst-2992	29	30	fig.1	fig.1	PROPN
ajst-2992	29	31	is	be	AUX
ajst-2992	29	32	established	establish	VERB
ajst-2992	29	33	.	.	PUNCT
ajst-2992	30	1	the	the	DET
ajst-2992	30	2	test	test	NOUN
ajst-2992	30	3	circuit	circuit	NOUN
ajst-2992	30	4	can	can	AUX
ajst-2992	30	5	flexibly	flexibly	ADV
ajst-2992	30	6	change	change	VERB
ajst-2992	30	7	the	the	DET
ajst-2992	30	8	parasitic	parasitic	ADJ
ajst-2992	30	9	inductance	inductance	NOUN
ajst-2992	30	10	value	value	NOUN
ajst-2992	30	11	of	of	ADP
ajst-2992	30	12	three	three	NUM
ajst-2992	30	13	peripheral	peripheral	ADJ
ajst-2992	30	14	circuits	circuit	NOUN
ajst-2992	30	15	of	of	ADP
ajst-2992	30	16	the	the	DET
ajst-2992	30	17	parallel	parallel	ADJ
ajst-2992	30	18	device	device	NOUN
ajst-2992	30	19	.	.	PUNCT
ajst-2992	31	1	and	and	CCONJ
ajst-2992	31	2	are	be	AUX
ajst-2992	31	3	two	two	NUM
ajst-2992	31	4	sic	sic	ADJ
ajst-2992	31	5	mosfet	mosfet	NOUN
ajst-2992	31	6	devices	device	NOUN
ajst-2992	31	7	operating	operate	VERB
ajst-2992	31	8	in	in	ADP
ajst-2992	31	9	parallel	parallel	NOUN
ajst-2992	31	10	,	,	PUNCT
ajst-2992	31	11	,	,	PUNCT
ajst-2992	31	12	,	,	PUNCT
ajst-2992	31	13	and	and	CCONJ
ajst-2992	31	14	,	,	PUNCT
ajst-2992	31	15	,	,	PUNCT
ajst-2992	31	16	are	be	AUX
ajst-2992	31	17	respectively	respectively	ADV
ajst-2992	31	18	gate	gate	NOUN
ajst-2992	31	19	-	-	PUNCT
ajst-2992	31	20	source	source	NOUN
ajst-2992	31	21	capacitance	capacitance	NOUN
ajst-2992	31	22	,	,	PUNCT
ajst-2992	31	23	gate	gate	NOUN
ajst-2992	31	24	-	-	PUNCT
ajst-2992	31	25	drain	drain	NOUN
ajst-2992	31	26	capacitance	capacitance	NOUN
ajst-2992	31	27	and	and	CCONJ
ajst-2992	31	28	drainsource	drainsource	ADJ
ajst-2992	31	29	stage	stage	NOUN
ajst-2992	31	30	capacitance	capacitance	NOUN
ajst-2992	31	31	of	of	ADP
ajst-2992	31	32	and	and	CCONJ
ajst-2992	31	33	.	.	PUNCT
ajst-2992	32	1	in	in	ADP
ajst-2992	32	2	order	order	NOUN
ajst-2992	32	3	to	to	PART
ajst-2992	32	4	ensure	ensure	VERB
ajst-2992	32	5	the	the	DET
ajst-2992	32	6	consistency	consistency	NOUN
ajst-2992	32	7	of	of	ADP
ajst-2992	32	8	the	the	DET
ajst-2992	32	9	driving	driving	NOUN
ajst-2992	32	10	signal	signal	NOUN
ajst-2992	32	11	,	,	PUNCT
ajst-2992	32	12	and	and	CCONJ
ajst-2992	32	13	are	be	AUX
ajst-2992	32	14	248	248	NUM
ajst-2992	32	15	adjusted	adjust	VERB
ajst-2992	32	16	to	to	ADP
ajst-2992	32	17	the	the	DET
ajst-2992	32	18	exact	exact	ADJ
ajst-2992	32	19	same	same	ADJ
ajst-2992	32	20	driving	driving	NOUN
ajst-2992	32	21	signal	signal	NOUN
ajst-2992	32	22	.	.	PUNCT
ajst-2992	33	1	is	be	AUX
ajst-2992	33	2	the	the	DET
ajst-2992	33	3	gate	gate	NOUN
ajst-2992	33	4	driving	driving	NOUN
ajst-2992	33	5	resistance	resistance	NOUN
ajst-2992	33	6	;	;	PUNCT
ajst-2992	33	7	is	be	AUX
ajst-2992	33	8	the	the	DET
ajst-2992	33	9	gate	gate	ADJ
ajst-2992	33	10	parasitic	parasitic	ADJ
ajst-2992	33	11	inductance	inductance	NOUN
ajst-2992	33	12	introduced	introduce	VERB
ajst-2992	33	13	into	into	ADP
ajst-2992	33	14	the	the	DET
ajst-2992	33	15	driving	drive	VERB
ajst-2992	33	16	line	line	NOUN
ajst-2992	33	17	;	;	PUNCT
ajst-2992	33	18	and	and	CCONJ
ajst-2992	33	19	are	be	AUX
ajst-2992	33	20	drain	drain	NOUN
ajst-2992	33	21	parasitic	parasitic	ADJ
ajst-2992	33	22	inductance	inductance	NOUN
ajst-2992	33	23	caused	cause	VERB
ajst-2992	33	24	by	by	ADP
ajst-2992	33	25	peripheral	peripheral	ADJ
ajst-2992	33	26	wiring	wiring	NOUN
ajst-2992	33	27	of	of	ADP
ajst-2992	33	28	corresponding	corresponding	ADJ
ajst-2992	33	29	devices	device	NOUN
ajst-2992	33	30	and	and	CCONJ
ajst-2992	33	31	,	,	PUNCT
ajst-2992	33	32	and	and	CCONJ
ajst-2992	33	33	are	be	AUX
ajst-2992	33	34	source	source	NOUN
ajst-2992	33	35	parasitic	parasitic	ADJ
ajst-2992	33	36	inductance	inductance	NOUN
ajst-2992	33	37	caused	cause	VERB
ajst-2992	33	38	by	by	ADP
ajst-2992	33	39	peripheral	peripheral	ADJ
ajst-2992	33	40	wiring	wiring	NOUN
ajst-2992	33	41	of	of	ADP
ajst-2992	33	42	corresponding	corresponding	ADJ
ajst-2992	33	43	devices	device	NOUN
ajst-2992	33	44	and	and	CCONJ
ajst-2992	33	45	.	.	PUNCT
ajst-2992	34	1	l	l	NOUN
ajst-2992	34	2	is	be	AUX
ajst-2992	34	3	the	the	DET
ajst-2992	34	4	load	load	NOUN
ajst-2992	34	5	inductor	inductor	NOUN
ajst-2992	34	6	,	,	PUNCT
ajst-2992	34	7	is	be	AUX
ajst-2992	34	8	the	the	DET
ajst-2992	34	9	sic	sic	ADJ
ajst-2992	34	10	mosfet	mosfet	NOUN
ajst-2992	34	11	power	power	NOUN
ajst-2992	34	12	semiconductor	semiconductor	NOUN
ajst-2992	34	13	,	,	PUNCT
ajst-2992	34	14	the	the	DET
ajst-2992	34	15	ks	ks	NOUN
ajst-2992	34	16	pole	pole	NOUN
ajst-2992	34	17	is	be	AUX
ajst-2992	34	18	connected	connect	VERB
ajst-2992	34	19	with	with	ADP
ajst-2992	34	20	the	the	DET
ajst-2992	34	21	tc	tc	NOUN
ajst-2992	34	22	pole	pole	NOUN
ajst-2992	34	23	,	,	PUNCT
ajst-2992	34	24	so	so	SCONJ
ajst-2992	34	25	that	that	SCONJ
ajst-2992	34	26	it	it	PRON
ajst-2992	34	27	can	can	AUX
ajst-2992	34	28	play	play	VERB
ajst-2992	34	29	the	the	DET
ajst-2992	34	30	role	role	NOUN
ajst-2992	34	31	of	of	ADP
ajst-2992	34	32	continuing	continue	VERB
ajst-2992	34	33	current	current	NOUN
ajst-2992	34	34	after	after	SCONJ
ajst-2992	34	35	the	the	DET
ajst-2992	34	36	device	device	NOUN
ajst-2992	34	37	is	be	AUX
ajst-2992	34	38	turned	turn	VERB
ajst-2992	34	39	off	off	ADP
ajst-2992	34	40	.	.	PUNCT
ajst-2992	35	1	is	be	AUX
ajst-2992	35	2	the	the	DET
ajst-2992	35	3	parasitic	parasitic	ADJ
ajst-2992	35	4	capacitance	capacitance	NOUN
ajst-2992	35	5	of	of	ADP
ajst-2992	35	6	the	the	DET
ajst-2992	35	7	load	load	NOUN
ajst-2992	35	8	inductor	inductor	NOUN
ajst-2992	35	9	and	and	CCONJ
ajst-2992	35	10	power	power	NOUN
ajst-2992	35	11	semiconductor	semiconductor	NOUN
ajst-2992	35	12	.	.	PUNCT
ajst-2992	36	1	is	be	AUX
ajst-2992	36	2	the	the	DET
ajst-2992	36	3	dc	dc	PROPN
ajst-2992	36	4	bus	bus	NOUN
ajst-2992	36	5	voltage	voltage	NOUN
ajst-2992	36	6	and	and	CCONJ
ajst-2992	36	7	is	be	AUX
ajst-2992	36	8	the	the	DET
ajst-2992	36	9	dc	dc	PROPN
ajst-2992	36	10	bus	bus	NOUN
ajst-2992	36	11	capacitance[8	capacitance[8	PROPN
ajst-2992	36	12	]	]	PUNCT
ajst-2992	36	13	.	.	PUNCT
ajst-2992	37	1	figure	figure	NOUN
ajst-2992	37	2	1	1	NUM
ajst-2992	37	3	.	.	PUNCT
ajst-2992	37	4	test	test	NOUN
ajst-2992	37	5	circuit	circuit	PROPN
ajst-2992	37	6	diagram	diagram	PROPN
ajst-2992	37	7	2.2	2.2	NUM
ajst-2992	37	8	.	.	PUNCT
ajst-2992	38	1	analysis	analysis	NOUN
ajst-2992	38	2	of	of	ADP
ajst-2992	38	3	sic	sic	ADJ
ajst-2992	38	4	mosfet	mosfet	NOUN
ajst-2992	38	5	operating	operating	NOUN
ajst-2992	38	6	principle	principle	NOUN
ajst-2992	38	7	in	in	ADP
ajst-2992	38	8	parallel	parallel	ADJ
ajst-2992	38	9	taking	take	VERB
ajst-2992	38	10	the	the	DET
ajst-2992	38	11	test	test	NOUN
ajst-2992	38	12	circuit	circuit	NOUN
ajst-2992	38	13	shown	show	VERB
ajst-2992	38	14	in	in	ADP
ajst-2992	38	15	fig.1	fig.1	PROPN
ajst-2992	38	16	as	as	ADP
ajst-2992	38	17	an	an	DET
ajst-2992	38	18	example	example	NOUN
ajst-2992	38	19	,	,	PUNCT
ajst-2992	38	20	the	the	DET
ajst-2992	38	21	static	static	ADJ
ajst-2992	38	22	and	and	CCONJ
ajst-2992	38	23	dynamic	dynamic	ADJ
ajst-2992	38	24	current	current	ADJ
ajst-2992	38	25	sharing	sharing	NOUN
ajst-2992	38	26	between	between	ADP
ajst-2992	38	27	multiple	multiple	ADJ
ajst-2992	38	28	sic	sic	ADJ
ajst-2992	38	29	mosfet	mosfet	NOUN
ajst-2992	38	30	devices	device	NOUN
ajst-2992	38	31	is	be	AUX
ajst-2992	38	32	analyzed	analyze	VERB
ajst-2992	38	33	.	.	PUNCT
ajst-2992	39	1	in	in	ADP
ajst-2992	39	2	this	this	DET
ajst-2992	39	3	case	case	NOUN
ajst-2992	39	4	,	,	PUNCT
ajst-2992	39	5	there	there	PRON
ajst-2992	39	6	are	be	VERB
ajst-2992	39	7	three	three	NUM
ajst-2992	39	8	devices	device	NOUN
ajst-2992	39	9	under	under	ADP
ajst-2992	39	10	test	test	NOUN
ajst-2992	39	11	.	.	PUNCT
ajst-2992	40	1	the	the	DET
ajst-2992	40	2	top	top	ADJ
ajst-2992	40	3	test	test	NOUN
ajst-2992	40	4	device	device	NOUN
ajst-2992	40	5	is	be	AUX
ajst-2992	40	6	turned	turn	VERB
ajst-2992	40	7	off	off	ADP
ajst-2992	40	8	by	by	ADP
ajst-2992	40	9	overgate	overgate	ADJ
ajst-2992	40	10	back	back	ADJ
ajst-2992	40	11	-	-	PUNCT
ajst-2992	40	12	bias	bias	NOUN
ajst-2992	40	13	,	,	PUNCT
ajst-2992	40	14	and	and	CCONJ
ajst-2992	40	15	the	the	DET
ajst-2992	40	16	switching	switch	VERB
ajst-2992	40	17	characteristics	characteristic	NOUN
ajst-2992	40	18	of	of	ADP
ajst-2992	40	19	its	its	PRON
ajst-2992	40	20	diode	diode	NOUN
ajst-2992	40	21	are	be	AUX
ajst-2992	40	22	tested	test	VERB
ajst-2992	40	23	in	in	ADP
ajst-2992	40	24	the	the	DET
ajst-2992	40	25	experiment	experiment	NOUN
ajst-2992	40	26	.	.	PUNCT
ajst-2992	41	1	the	the	DET
ajst-2992	41	2	bottom	bottom	ADJ
ajst-2992	41	3	two	two	NUM
ajst-2992	41	4	sic	sic	ADJ
ajst-2992	41	5	mosfet	mosfet	NOUN
ajst-2992	41	6	devices	device	NOUN
ajst-2992	41	7	are	be	AUX
ajst-2992	41	8	operated	operate	VERB
ajst-2992	41	9	in	in	ADP
ajst-2992	41	10	parallel	parallel	NOUN
ajst-2992	41	11	.	.	PUNCT
ajst-2992	42	1	in	in	ADP
ajst-2992	42	2	the	the	DET
ajst-2992	42	3	test	test	NOUN
ajst-2992	42	4	device	device	NOUN
ajst-2992	42	5	,	,	PUNCT
ajst-2992	42	6	the	the	DET
ajst-2992	42	7	opening	opening	NOUN
ajst-2992	42	8	and	and	CCONJ
ajst-2992	42	9	closing	closing	NOUN
ajst-2992	42	10	process	process	NOUN
ajst-2992	42	11	of	of	ADP
ajst-2992	42	12	the	the	DET
ajst-2992	42	13	lower	low	ADJ
ajst-2992	42	14	tube	tube	NOUN
ajst-2992	42	15	is	be	AUX
ajst-2992	42	16	shown	show	VERB
ajst-2992	42	17	in	in	ADP
ajst-2992	42	18	the	the	DET
ajst-2992	42	19	fig.2	fig.2	PROPN
ajst-2992	42	20	and	and	CCONJ
ajst-2992	42	21	fig.3	fig.3	PROPN
ajst-2992	42	22	.	.	PROPN
ajst-2992	42	23	figure	figure	NOUN
ajst-2992	42	24	2	2	NUM
ajst-2992	42	25	.	.	PUNCT
ajst-2992	42	26	simplified	simplified	ADJ
ajst-2992	42	27	circuit	circuit	NOUN
ajst-2992	42	28	of	of	ADP
ajst-2992	42	29	parallel	parallel	ADJ
ajst-2992	42	30	sic	sic	ADJ
ajst-2992	42	31	mosfet	mosfet	NOUN
ajst-2992	42	32	opening	opening	NOUN
ajst-2992	42	33	process	process	NOUN
ajst-2992	42	34	figure	figure	NOUN
ajst-2992	42	35	3	3	NUM
ajst-2992	42	36	.	.	PUNCT
ajst-2992	42	37	simplified	simplified	ADJ
ajst-2992	42	38	circuit	circuit	NOUN
ajst-2992	42	39	of	of	ADP
ajst-2992	42	40	sic	sic	ADJ
ajst-2992	42	41	mosfet	mosfet	ADJ
ajst-2992	42	42	turn	turn	NOUN
ajst-2992	42	43	-	-	PUNCT
ajst-2992	42	44	off	off	ADP
ajst-2992	42	45	process	process	NOUN
ajst-2992	42	46	in	in	ADP
ajst-2992	42	47	parallel	parallel	NOUN
ajst-2992	42	48	when	when	SCONJ
ajst-2992	42	49	the	the	DET
ajst-2992	42	50	lower	low	ADJ
ajst-2992	42	51	tube	tube	NOUN
ajst-2992	42	52	is	be	AUX
ajst-2992	42	53	turned	turn	VERB
ajst-2992	42	54	on	on	ADP
ajst-2992	42	55	,	,	PUNCT
ajst-2992	42	56	the	the	DET
ajst-2992	42	57	dc	dc	PROPN
ajst-2992	42	58	power	power	NOUN
ajst-2992	42	59	supply	supply	NOUN
ajst-2992	42	60	and	and	CCONJ
ajst-2992	42	61	dc	dc	PROPN
ajst-2992	42	62	capacitance	capacitance	NOUN
ajst-2992	42	63	supply	supply	NOUN
ajst-2992	42	64	power	power	NOUN
ajst-2992	42	65	to	to	ADP
ajst-2992	42	66	it	it	PRON
ajst-2992	42	67	together	together	ADV
ajst-2992	42	68	.	.	PUNCT
ajst-2992	43	1	when	when	SCONJ
ajst-2992	43	2	the	the	DET
ajst-2992	43	3	lower	low	ADJ
ajst-2992	43	4	tube	tube	NOUN
ajst-2992	43	5	is	be	AUX
ajst-2992	43	6	turned	turn	VERB
ajst-2992	43	7	off	off	ADP
ajst-2992	43	8	,	,	PUNCT
ajst-2992	43	9	the	the	DET
ajst-2992	43	10	current	current	NOUN
ajst-2992	43	11	on	on	ADP
ajst-2992	43	12	the	the	DET
ajst-2992	43	13	inductor	inductor	NOUN
ajst-2992	43	14	l	l	PROPN
ajst-2992	43	15	continues	continue	VERB
ajst-2992	43	16	to	to	PART
ajst-2992	43	17	flow	flow	VERB
ajst-2992	43	18	through	through	ADP
ajst-2992	43	19	the	the	DET
ajst-2992	43	20	anti	anti	ADJ
ajst-2992	43	21	-	-	ADJ
ajst-2992	43	22	parallel	parallel	ADJ
ajst-2992	43	23	diode	diode	NOUN
ajst-2992	43	24	of	of	ADP
ajst-2992	43	25	the	the	DET
ajst-2992	43	26	upper	upper	ADJ
ajst-2992	43	27	tube	tube	NOUN
ajst-2992	43	28	.	.	PUNCT
ajst-2992	44	1	in	in	ADP
ajst-2992	44	2	the	the	DET
ajst-2992	44	3	process	process	NOUN
ajst-2992	44	4	of	of	ADP
ajst-2992	44	5	conducting	conduct	VERB
ajst-2992	44	6	the	the	DET
ajst-2992	44	7	lower	low	ADJ
ajst-2992	44	8	tube	tube	NOUN
ajst-2992	44	9	,	,	PUNCT
ajst-2992	44	10	the	the	DET
ajst-2992	44	11	parasitic	parasitic	ADJ
ajst-2992	44	12	inductance	inductance	NOUN
ajst-2992	44	13	of	of	ADP
ajst-2992	44	14	the	the	DET
ajst-2992	44	15	bus	bus	NOUN
ajst-2992	44	16	and	and	CCONJ
ajst-2992	44	17	capacitor	capacitor	NOUN
ajst-2992	44	18	and	and	CCONJ
ajst-2992	44	19	the	the	DET
ajst-2992	44	20	load	load	NOUN
ajst-2992	44	21	inductance	inductance	NOUN
ajst-2992	44	22	,	,	PUNCT
ajst-2992	44	23	the	the	DET
ajst-2992	44	24	input	input	NOUN
ajst-2992	44	25	capacitance	capacitance	NOUN
ajst-2992	44	26	of	of	ADP
ajst-2992	44	27	the	the	DET
ajst-2992	44	28	load	load	NOUN
ajst-2992	44	29	inductance	inductance	NOUN
ajst-2992	44	30	,	,	PUNCT
ajst-2992	44	31	and	and	CCONJ
ajst-2992	44	32	the	the	DET
ajst-2992	44	33	parasitic	parasitic	ADJ
ajst-2992	44	34	capacitance	capacitance	NOUN
ajst-2992	44	35	of	of	ADP
ajst-2992	44	36	the	the	DET
ajst-2992	44	37	device	device	NOUN
ajst-2992	44	38	together	together	ADV
ajst-2992	44	39	constitute	constitute	VERB
ajst-2992	44	40	the	the	DET
ajst-2992	44	41	power	power	NOUN
ajst-2992	44	42	oscillation	oscillation	NOUN
ajst-2992	44	43	loop	loop	NOUN
ajst-2992	44	44	,	,	PUNCT
ajst-2992	44	45	forming	form	VERB
ajst-2992	44	46	the	the	DET
ajst-2992	44	47	voltage	voltage	NOUN
ajst-2992	44	48	and	and	CCONJ
ajst-2992	44	49	current	current	ADJ
ajst-2992	44	50	oscillation[4	oscillation[4	NOUN
ajst-2992	44	51	]	]	PUNCT
ajst-2992	44	52	.	.	PUNCT
ajst-2992	45	1	3	3	X
ajst-2992	45	2	.	.	X
ajst-2992	45	3	influence	influence	NOUN
ajst-2992	45	4	of	of	ADP
ajst-2992	45	5	circuit	circuit	NOUN
ajst-2992	45	6	parameter	parameter	NOUN
ajst-2992	45	7	mismatch	mismatch	NOUN
ajst-2992	45	8	on	on	ADP
ajst-2992	45	9	current	current	ADJ
ajst-2992	45	10	sharing	sharing	NOUN
ajst-2992	45	11	in	in	ADP
ajst-2992	45	12	an	an	DET
ajst-2992	45	13	ideal	ideal	ADJ
ajst-2992	45	14	situation	situation	NOUN
ajst-2992	45	15	,	,	PUNCT
ajst-2992	45	16	the	the	DET
ajst-2992	45	17	parameters	parameter	NOUN
ajst-2992	45	18	of	of	ADP
ajst-2992	45	19	the	the	DET
ajst-2992	45	20	parallel	parallel	ADJ
ajst-2992	45	21	devices	device	NOUN
ajst-2992	45	22	are	be	AUX
ajst-2992	45	23	exactly	exactly	ADV
ajst-2992	45	24	the	the	DET
ajst-2992	45	25	same	same	ADJ
ajst-2992	45	26	.	.	PUNCT
ajst-2992	46	1	according	accord	VERB
ajst-2992	46	2	to	to	ADP
ajst-2992	46	3	ohm	ohm	PROPN
ajst-2992	46	4	's	's	PART
ajst-2992	46	5	law	law	NOUN
ajst-2992	46	6	and	and	CCONJ
ajst-2992	46	7	davenen	davenen	PROPN
ajst-2992	46	8	's	's	PART
ajst-2992	46	9	voltage	voltage	NOUN
ajst-2992	46	10	theorem	theorem	NOUN
ajst-2992	46	11	of	of	ADP
ajst-2992	46	12	closed	closed	ADJ
ajst-2992	46	13	loop	loop	NOUN
ajst-2992	46	14	,	,	PUNCT
ajst-2992	46	15	the	the	DET
ajst-2992	46	16	voltage	voltage	NOUN
ajst-2992	46	17	at	at	ADP
ajst-2992	46	18	both	both	DET
ajst-2992	46	19	ends	end	NOUN
ajst-2992	46	20	of	of	ADP
ajst-2992	46	21	the	the	DET
ajst-2992	46	22	parallel	parallel	ADJ
ajst-2992	46	23	devices	device	NOUN
ajst-2992	46	24	is	be	AUX
ajst-2992	46	25	the	the	DET
ajst-2992	46	26	same	same	ADJ
ajst-2992	46	27	,	,	PUNCT
ajst-2992	46	28	the	the	DET
ajst-2992	46	29	impedance	impedance	NOUN
ajst-2992	46	30	on	on	ADP
ajst-2992	46	31	the	the	DET
ajst-2992	46	32	parallel	parallel	ADJ
ajst-2992	46	33	branch	branch	NOUN
ajst-2992	46	34	is	be	AUX
ajst-2992	46	35	the	the	DET
ajst-2992	46	36	same	same	ADJ
ajst-2992	46	37	,	,	PUNCT
ajst-2992	46	38	and	and	CCONJ
ajst-2992	46	39	the	the	DET
ajst-2992	46	40	current	current	NOUN
ajst-2992	46	41	must	must	AUX
ajst-2992	46	42	be	be	AUX
ajst-2992	46	43	the	the	DET
ajst-2992	46	44	same	same	ADJ
ajst-2992	46	45	.	.	PUNCT
ajst-2992	47	1	there	there	PRON
ajst-2992	47	2	will	will	AUX
ajst-2992	47	3	be	be	AUX
ajst-2992	47	4	no	no	DET
ajst-2992	47	5	current	current	ADJ
ajst-2992	47	6	imbalance	imbalance	NOUN
ajst-2992	47	7	in	in	ADP
ajst-2992	47	8	the	the	DET
ajst-2992	47	9	process	process	NOUN
ajst-2992	47	10	of	of	ADP
ajst-2992	47	11	parallel	parallel	ADJ
ajst-2992	47	12	use	use	NOUN
ajst-2992	47	13	.	.	PUNCT
ajst-2992	48	1	however	however	ADV
ajst-2992	48	2	,	,	PUNCT
ajst-2992	48	3	in	in	ADP
ajst-2992	48	4	the	the	DET
ajst-2992	48	5	actual	actual	ADJ
ajst-2992	48	6	parallel	parallel	ADJ
ajst-2992	48	7	use	use	NOUN
ajst-2992	48	8	process	process	NOUN
ajst-2992	48	9	of	of	ADP
ajst-2992	48	10	sic	sic	ADJ
ajst-2992	48	11	mosfet	mosfet	NOUN
ajst-2992	48	12	,	,	PUNCT
ajst-2992	48	13	the	the	DET
ajst-2992	48	14	difference	difference	NOUN
ajst-2992	48	15	of	of	ADP
ajst-2992	48	16	various	various	ADJ
ajst-2992	48	17	uncontrollable	uncontrollable	ADJ
ajst-2992	48	18	factors	factor	NOUN
ajst-2992	48	19	will	will	AUX
ajst-2992	48	20	lead	lead	VERB
ajst-2992	48	21	to	to	ADP
ajst-2992	48	22	the	the	DET
ajst-2992	48	23	occurrence	occurrence	NOUN
ajst-2992	48	24	of	of	ADP
ajst-2992	48	25	current	current	ADJ
ajst-2992	48	26	imbalance	imbalance	NOUN
ajst-2992	48	27	.	.	PUNCT
ajst-2992	49	1	circuit	circuit	NOUN
ajst-2992	49	2	parameter	parameter	NOUN
ajst-2992	49	3	mismatch	mismatch	NOUN
ajst-2992	49	4	is	be	AUX
ajst-2992	49	5	mainly	mainly	ADV
ajst-2992	49	6	reflected	reflect	VERB
ajst-2992	49	7	in	in	ADP
ajst-2992	49	8	the	the	DET
ajst-2992	49	9	difference	difference	NOUN
ajst-2992	49	10	of	of	ADP
ajst-2992	49	11	drain	drain	NOUN
ajst-2992	49	12	and	and	CCONJ
ajst-2992	49	13	source	source	VERB
ajst-2992	49	14	parasitic	parasitic	ADJ
ajst-2992	49	15	inductances	inductance	NOUN
ajst-2992	49	16	.	.	PUNCT
ajst-2992	50	1	3.1	3.1	NUM
ajst-2992	50	2	.	.	PUNCT
ajst-2992	50	3	effect	effect	NOUN
ajst-2992	50	4	of	of	ADP
ajst-2992	50	5	difference	difference	NOUN
ajst-2992	50	6	in	in	ADP
ajst-2992	50	7	drain	drain	NOUN
ajst-2992	50	8	inductance	inductance	NOUN
ajst-2992	50	9	by	by	ADP
ajst-2992	50	10	referring	refer	VERB
ajst-2992	50	11	to	to	ADP
ajst-2992	50	12	the	the	DET
ajst-2992	50	13	parameter	parameter	NOUN
ajst-2992	50	14	table	table	NOUN
ajst-2992	50	15	of	of	ADP
ajst-2992	50	16	sic	sic	ADJ
ajst-2992	50	17	mosfet	mosfet	NOUN
ajst-2992	50	18	device	device	NOUN
ajst-2992	50	19	c3moo32120k	c3moo32120k	NOUN
ajst-2992	50	20	provided	provide	VERB
ajst-2992	50	21	in	in	ADP
ajst-2992	50	22	official	official	ADJ
ajst-2992	50	23	website	website	NOUN
ajst-2992	50	24	of	of	ADP
ajst-2992	50	25	wolfspeed	wolfspeed	NOUN
ajst-2992	50	26	,	,	PUNCT
ajst-2992	50	27	the	the	DET
ajst-2992	50	28	order	order	NOUN
ajst-2992	50	29	of	of	ADP
ajst-2992	50	30	magnitude	magnitude	NOUN
ajst-2992	50	31	of	of	ADP
ajst-2992	50	32	key	key	ADJ
ajst-2992	50	33	values	value	NOUN
ajst-2992	50	34	l	l	NOUN
ajst-2992	50	35	is	be	AUX
ajst-2992	50	36	obtained	obtain	VERB
ajst-2992	50	37	.	.	PUNCT
ajst-2992	51	1	for	for	ADP
ajst-2992	51	2	the	the	DET
ajst-2992	51	3	convenience	convenience	NOUN
ajst-2992	51	4	of	of	ADP
ajst-2992	51	5	comparison	comparison	NOUN
ajst-2992	51	6	,	,	PUNCT
ajst-2992	51	7	the	the	DET
ajst-2992	51	8	value	value	NOUN
ajst-2992	51	9	which	which	PRON
ajst-2992	51	10	is	be	AUX
ajst-2992	51	11	easy	easy	ADJ
ajst-2992	51	12	to	to	PART
ajst-2992	51	13	compare	compare	VERB
ajst-2992	51	14	will	will	AUX
ajst-2992	51	15	be	be	AUX
ajst-2992	51	16	selected	select	VERB
ajst-2992	51	17	from	from	ADP
ajst-2992	51	18	the	the	DET
ajst-2992	51	19	corresponding	correspond	VERB
ajst-2992	51	20	order	order	NOUN
ajst-2992	51	21	of	of	ADP
ajst-2992	51	22	magnitude	magnitude	NOUN
ajst-2992	51	23	.	.	PUNCT
ajst-2992	52	1	the	the	DET
ajst-2992	52	2	simulation	simulation	NOUN
ajst-2992	52	3	experiment	experiment	NOUN
ajst-2992	52	4	of	of	ADP
ajst-2992	52	5	drain	drain	NOUN
ajst-2992	52	6	inductance	inductance	NOUN
ajst-2992	52	7	mismatch	mismatch	NOUN
ajst-2992	52	8	is	be	AUX
ajst-2992	52	9	carried	carry	VERB
ajst-2992	52	10	out	out	ADP
ajst-2992	52	11	by	by	ADP
ajst-2992	52	12	ltspice	ltspice	NOUN
ajst-2992	52	13	,	,	PUNCT
ajst-2992	52	14	and	and	CCONJ
ajst-2992	52	15	the	the	DET
ajst-2992	52	16	relevant	relevant	ADJ
ajst-2992	52	17	data	datum	NOUN
ajst-2992	52	18	are	be	AUX
ajst-2992	52	19	shown	show	VERB
ajst-2992	52	20	in	in	ADP
ajst-2992	52	21	tab.1	tab.1	PROPN
ajst-2992	52	22	.	.	PUNCT
ajst-2992	52	23	table	table	NOUN
ajst-2992	52	24	1	1	NUM
ajst-2992	52	25	.	.	PUNCT
ajst-2992	52	26	test	test	NOUN
ajst-2992	52	27	value	value	NOUN
ajst-2992	52	28	of	of	ADP
ajst-2992	52	29	drain	drain	NOUN
ajst-2992	52	30	inductance	inductance	NOUN
ajst-2992	52	31	mismatch	mismatch	NOUN
ajst-2992	52	32	device	device	NOUN
ajst-2992	52	33	size	size	NOUN
ajst-2992	52	34	device	device	NOUN
ajst-2992	52	35	size	size	NOUN
ajst-2992	52	36	device	device	NOUN
ajst-2992	52	37	size	size	NOUN
ajst-2992	52	38	device	device	NOUN
ajst-2992	52	39	size	size	NOUN
ajst-2992	52	40	1nh	1nh	NOUN
ajst-2992	52	41	10nh	10nh	NOUN
ajst-2992	52	42	10pf	10pf	NOUN
ajst-2992	52	43	10pf	10pf	NOUN
ajst-2992	52	44	1nh	1nh	NOUN
ajst-2992	52	45	1nh	1nh	NOUN
ajst-2992	52	46	1000pf	1000pf	NOUN
ajst-2992	52	47	1000pf	1000pf	NOUN
ajst-2992	52	48	1nh	1nh	NOUN
ajst-2992	52	49	1nh	1nh	NOUN
ajst-2992	52	50	100pf	100pf	NOUN
ajst-2992	52	51	100pf	100pf	VERB
ajst-2992	52	52	1mω	1mω	ADJ
ajst-2992	52	53	1mω	1mω	ADJ
ajst-2992	52	54	l	l	NOUN
ajst-2992	52	55	100uh	100uh	PROPN
ajst-2992	52	56	1nf	1nf	ADJ
ajst-2992	52	57	20ω	20ω	NOUN
ajst-2992	52	58	20ω	20ω	PROPN
ajst-2992	53	1	1000uf	1000uf	PROPN
ajst-2992	53	2	500v	500v	PROPN
ajst-2992	53	3	20ω	20ω	NOUN
ajst-2992	53	4	20ω	20ω	NOUN
ajst-2992	53	5	249	249	NUM
ajst-2992	53	6	figure	figure	NOUN
ajst-2992	53	7	4	4	NUM
ajst-2992	53	8	.	.	PUNCT
ajst-2992	53	9	simulation	simulation	NOUN
ajst-2992	53	10	diagram	diagram	PROPN
ajst-2992	53	11	of	of	ADP
ajst-2992	53	12	drain	drain	NOUN
ajst-2992	53	13	inductance	inductance	NOUN
ajst-2992	53	14	mismatch	mismatch	NOUN
ajst-2992	53	15	it	it	PRON
ajst-2992	53	16	can	can	AUX
ajst-2992	53	17	be	be	AUX
ajst-2992	53	18	seen	see	VERB
ajst-2992	53	19	from	from	ADP
ajst-2992	53	20	the	the	DET
ajst-2992	53	21	fig.4	fig.4	PROPN
ajst-2992	53	22	that	that	SCONJ
ajst-2992	53	23	the	the	DET
ajst-2992	53	24	inductance	inductance	NOUN
ajst-2992	53	25	difference	difference	NOUN
ajst-2992	53	26	is	be	AUX
ajst-2992	53	27	mainly	mainly	ADV
ajst-2992	53	28	reflected	reflect	VERB
ajst-2992	53	29	in	in	ADP
ajst-2992	53	30	the	the	DET
ajst-2992	53	31	influence	influence	NOUN
ajst-2992	53	32	on	on	ADP
ajst-2992	53	33	the	the	DET
ajst-2992	53	34	switching	switch	VERB
ajst-2992	53	35	instantaneous	instantaneous	ADJ
ajst-2992	53	36	current	current	ADJ
ajst-2992	53	37	change	change	NOUN
ajst-2992	53	38	,	,	PUNCT
ajst-2992	53	39	which	which	PRON
ajst-2992	53	40	has	have	VERB
ajst-2992	53	41	little	little	ADJ
ajst-2992	53	42	influence	influence	NOUN
ajst-2992	53	43	on	on	ADP
ajst-2992	53	44	the	the	DET
ajst-2992	53	45	static	static	ADJ
ajst-2992	53	46	current	current	ADJ
ajst-2992	53	47	.	.	PUNCT
ajst-2992	54	1	table	table	NOUN
ajst-2992	54	2	2	2	NUM
ajst-2992	54	3	.	.	PUNCT
ajst-2992	54	4	experimental	experimental	ADJ
ajst-2992	54	5	results	result	NOUN
ajst-2992	54	6	of	of	ADP
ajst-2992	54	7	drain	drain	NOUN
ajst-2992	54	8	inductance	inductance	NOUN
ajst-2992	54	9	difference	difference	NOUN
ajst-2992	54	10	in	in	ADP
ajst-2992	54	11	static	static	ADJ
ajst-2992	54	12	state	state	NOUN
ajst-2992	54	13	type	type	NOUN
ajst-2992	54	14	node1/(µs	node1/(µs	PROPN
ajst-2992	54	15	,	,	PUNCT
ajst-2992	54	16	a	a	PRON
ajst-2992	54	17	)	)	PUNCT
ajst-2992	54	18	node2(µs	node2(µ	NOUN
ajst-2992	54	19	,	,	PUNCT
ajst-2992	54	20	a	a	PRON
ajst-2992	54	21	)	)	PUNCT
ajst-2992	54	22	di	di	NOUN
ajst-2992	54	23	/	/	SYM
ajst-2992	54	24	dt	dt	NOUN
ajst-2992	54	25	∆	∆	PROPN
ajst-2992	54	26	/	/	SYM
ajst-2992	55	1	5.63,6.09	5.63,6.09	NUM
ajst-2992	55	2	22.11,47.23	22.11,47.23	NUM
ajst-2992	55	3	2.496e+6	2.496e+6	NUM
ajst-2992	55	4	57.42	57.42	NUM
ajst-2992	55	5	5.63,6.71	5.63,6.71	NUM
ajst-2992	55	6	22.11,47.78	22.11,47.78	VERB
ajst-2992	55	7	2.493e+6	2.493e+6	NUM
ajst-2992	55	8	56.94	56.94	NUM
ajst-2992	55	9	according	accord	VERB
ajst-2992	55	10	to	to	ADP
ajst-2992	55	11	the	the	DET
ajst-2992	55	12	static	static	ADJ
ajst-2992	55	13	experimental	experimental	ADJ
ajst-2992	55	14	data	datum	NOUN
ajst-2992	55	15	in	in	ADP
ajst-2992	55	16	tab.2	tab.2	PROPN
ajst-2992	55	17	,	,	PUNCT
ajst-2992	55	18	the	the	DET
ajst-2992	55	19	party	party	NOUN
ajst-2992	55	20	with	with	ADP
ajst-2992	55	21	larger	large	ADJ
ajst-2992	55	22	drain	drain	NOUN
ajst-2992	55	23	inductance	inductance	NOUN
ajst-2992	55	24	bears	bear	VERB
ajst-2992	55	25	less	less	ADV
ajst-2992	55	26	current	current	ADJ
ajst-2992	55	27	and	and	CCONJ
ajst-2992	55	28	the	the	DET
ajst-2992	55	29	current	current	ADJ
ajst-2992	55	30	change	change	NOUN
ajst-2992	55	31	rate	rate	NOUN
ajst-2992	55	32	is	be	AUX
ajst-2992	55	33	slower	slow	ADJ
ajst-2992	55	34	.	.	PUNCT
ajst-2992	56	1	figure	figure	NOUN
ajst-2992	56	2	5	5	NUM
ajst-2992	56	3	.	.	PUNCT
ajst-2992	56	4	simulation	simulation	NOUN
ajst-2992	56	5	diagram	diagram	PROPN
ajst-2992	56	6	of	of	ADP
ajst-2992	56	7	drain	drain	NOUN
ajst-2992	56	8	inductance	inductance	NOUN
ajst-2992	56	9	mismatch	mismatch	NOUN
ajst-2992	56	10	at	at	ADP
ajst-2992	56	11	opening	opening	NOUN
ajst-2992	56	12	moment	moment	NOUN
ajst-2992	56	13	table	table	NOUN
ajst-2992	56	14	3	3	NUM
ajst-2992	56	15	.	.	PUNCT
ajst-2992	57	1	experimental	experimental	ADJ
ajst-2992	57	2	results	result	NOUN
ajst-2992	57	3	of	of	ADP
ajst-2992	57	4	drain	drain	NOUN
ajst-2992	57	5	inductance	inductance	NOUN
ajst-2992	57	6	difference	difference	NOUN
ajst-2992	57	7	at	at	ADP
ajst-2992	57	8	opening	opening	NOUN
ajst-2992	57	9	moment	moment	NOUN
ajst-2992	57	10	type	type	NOUN
ajst-2992	57	11	node1/(µs	node1/(µs	PROPN
ajst-2992	57	12	,	,	PUNCT
ajst-2992	57	13	a	a	PRON
ajst-2992	57	14	)	)	PUNCT
ajst-2992	57	15	node2/(µs	node2/(µs	PROPN
ajst-2992	57	16	,	,	PUNCT
ajst-2992	57	17	a	a	DET
ajst-2992	57	18	)	)	PUNCT
ajst-2992	57	19	di	di	NOUN
ajst-2992	57	20	/	/	SYM
ajst-2992	57	21	dt	dt	NOUN
ajst-2992	57	22	∆	∆	PROPN
ajst-2992	57	23	/	/	SYM
ajst-2992	57	24	∆	∆	PROPN
ajst-2992	57	25	/	/	SYM
ajst-2992	57	26	25.06,8.19	25.06,8.19	NUM
ajst-2992	57	27	25.08,72.10	25.08,72.10	VERB
ajst-2992	57	28	3.4e+9	3.4e+9	NOUN
ajst-2992	57	29	83.1	83.1	NUM
ajst-2992	57	30	18.8	18.8	NUM
ajst-2992	57	31	25.06,6.98	25.06,6.98	NUM
ajst-2992	57	32	25.08,61.13	25.08,61.13	NUM
ajst-2992	57	33	2.7e+9	2.7e+9	NOUN
ajst-2992	57	34	61.8	61.8	NUM
ajst-2992	57	35	20.2	20.2	NUM
ajst-2992	57	36	through	through	ADP
ajst-2992	57	37	the	the	DET
ajst-2992	57	38	simulation	simulation	NOUN
ajst-2992	57	39	results	result	NOUN
ajst-2992	57	40	of	of	ADP
ajst-2992	57	41	the	the	DET
ajst-2992	57	42	opening	opening	NOUN
ajst-2992	57	43	moment	moment	NOUN
ajst-2992	57	44	in	in	ADP
ajst-2992	57	45	tab.3	tab.3	NUM
ajst-2992	57	46	,	,	PUNCT
ajst-2992	57	47	it	it	PRON
ajst-2992	57	48	can	can	AUX
ajst-2992	57	49	be	be	AUX
ajst-2992	57	50	inferred	infer	VERB
ajst-2992	57	51	that	that	SCONJ
ajst-2992	57	52	the	the	DET
ajst-2992	57	53	increase	increase	NOUN
ajst-2992	57	54	of	of	ADP
ajst-2992	57	55	drain	drain	NOUN
ajst-2992	57	56	inductance	inductance	NOUN
ajst-2992	57	57	will	will	AUX
ajst-2992	57	58	lead	lead	VERB
ajst-2992	57	59	to	to	ADP
ajst-2992	57	60	the	the	DET
ajst-2992	57	61	decrease	decrease	NOUN
ajst-2992	57	62	of	of	ADP
ajst-2992	57	63	current	current	ADJ
ajst-2992	57	64	change	change	NOUN
ajst-2992	57	65	rate	rate	NOUN
ajst-2992	57	66	and	and	CCONJ
ajst-2992	57	67	current	current	ADJ
ajst-2992	57	68	peak	peak	NOUN
ajst-2992	57	69	value	value	NOUN
ajst-2992	57	70	,	,	PUNCT
ajst-2992	57	71	result	result	VERB
ajst-2992	57	72	in	in	ADP
ajst-2992	57	73	the	the	DET
ajst-2992	57	74	extension	extension	NOUN
ajst-2992	57	75	of	of	ADP
ajst-2992	57	76	the	the	DET
ajst-2992	57	77	opening	opening	NOUN
ajst-2992	57	78	time	time	NOUN
ajst-2992	57	79	.	.	PUNCT
ajst-2992	58	1	figure	figure	VERB
ajst-2992	58	2	6	6	NUM
ajst-2992	58	3	.	.	PUNCT
ajst-2992	59	1	simulation	simulation	NOUN
ajst-2992	59	2	diagram	diagram	PROPN
ajst-2992	59	3	of	of	ADP
ajst-2992	59	4	drain	drain	NOUN
ajst-2992	59	5	inductance	inductance	NOUN
ajst-2992	59	6	mismatch	mismatch	NOUN
ajst-2992	59	7	at	at	ADP
ajst-2992	59	8	turn	turn	NOUN
ajst-2992	59	9	-	-	PUNCT
ajst-2992	59	10	off	off	ADP
ajst-2992	59	11	moment	moment	NOUN
ajst-2992	59	12	table	table	NOUN
ajst-2992	59	13	4	4	NUM
ajst-2992	59	14	.	.	PUNCT
ajst-2992	59	15	experimental	experimental	ADJ
ajst-2992	59	16	results	result	NOUN
ajst-2992	59	17	of	of	ADP
ajst-2992	59	18	the	the	DET
ajst-2992	59	19	difference	difference	NOUN
ajst-2992	59	20	in	in	ADP
ajst-2992	59	21	drain	drain	NOUN
ajst-2992	59	22	inductance	inductance	NOUN
ajst-2992	59	23	at	at	ADP
ajst-2992	59	24	the	the	DET
ajst-2992	59	25	turn	turn	VERB
ajst-2992	59	26	-	-	PUNCT
ajst-2992	59	27	off	off	ADP
ajst-2992	59	28	moment	moment	NOUN
ajst-2992	59	29	type	type	NOUN
ajst-2992	59	30	node1/(µs	node1/(µs	PROPN
ajst-2992	59	31	,	,	PUNCT
ajst-2992	59	32	a	a	PRON
ajst-2992	59	33	)	)	PUNCT
ajst-2992	59	34	node2/(µs	node2/(µs	PROPN
ajst-2992	59	35	,	,	PUNCT
ajst-2992	59	36	a	a	DET
ajst-2992	59	37	)	)	PUNCT
ajst-2992	59	38	di	di	NOUN
ajst-2992	59	39	/	/	SYM
ajst-2992	59	40	dt	dt	NOUN
ajst-2992	59	41	∆	∆	PROPN
ajst-2992	59	42	/	/	SYM
ajst-2992	59	43	∆	∆	PROPN
ajst-2992	59	44	/	/	SYM
ajst-2992	59	45	23.09,44.98	23.09,44.98	NUM
ajst-2992	59	46	23.14,4.95	23.14,4.95	PROPN
ajst-2992	59	47	-9.5e+8	-9.5e+8	NOUN
ajst-2992	59	48	-49.7	-49.7	ADP
ajst-2992	59	49	41.7	41.7	NUM
ajst-2992	59	50	23.10,44.51	23.10,44.51	PROPN
ajst-2992	59	51	23.14,4.82	23.14,4.82	NUM
ajst-2992	59	52	-1.1e+9	-1.1e+9	NOUN
ajst-2992	59	53	-49.5	-49.5	NOUN
ajst-2992	59	54	36.8	36.8	NUM
ajst-2992	59	55	through	through	ADP
ajst-2992	59	56	the	the	DET
ajst-2992	59	57	simulation	simulation	NOUN
ajst-2992	59	58	results	result	NOUN
ajst-2992	59	59	of	of	ADP
ajst-2992	59	60	the	the	DET
ajst-2992	59	61	turn	turn	NOUN
ajst-2992	59	62	-	-	PUNCT
ajst-2992	59	63	off	off	ADP
ajst-2992	59	64	moment	moment	NOUN
ajst-2992	59	65	in	in	ADP
ajst-2992	59	66	tab.4	tab.4	PROPN
ajst-2992	59	67	,	,	PUNCT
ajst-2992	59	68	it	it	PRON
ajst-2992	59	69	can	can	AUX
ajst-2992	59	70	be	be	AUX
ajst-2992	59	71	concluded	conclude	VERB
ajst-2992	59	72	that	that	SCONJ
ajst-2992	59	73	the	the	DET
ajst-2992	59	74	increase	increase	NOUN
ajst-2992	59	75	of	of	ADP
ajst-2992	59	76	drain	drain	NOUN
ajst-2992	59	77	inductance	inductance	NOUN
ajst-2992	59	78	in	in	ADP
ajst-2992	59	79	the	the	DET
ajst-2992	59	80	turn	turn	VERB
ajst-2992	59	81	-	-	PUNCT
ajst-2992	59	82	off	off	ADP
ajst-2992	59	83	process	process	NOUN
ajst-2992	59	84	will	will	AUX
ajst-2992	59	85	lead	lead	VERB
ajst-2992	59	86	to	to	ADP
ajst-2992	59	87	the	the	DET
ajst-2992	59	88	increase	increase	NOUN
ajst-2992	59	89	of	of	ADP
ajst-2992	59	90	current	current	ADJ
ajst-2992	59	91	change	change	NOUN
ajst-2992	59	92	rate	rate	NOUN
ajst-2992	59	93	,	,	PUNCT
ajst-2992	59	94	the	the	DET
ajst-2992	59	95	decrease	decrease	NOUN
ajst-2992	59	96	of	of	ADP
ajst-2992	59	97	the	the	DET
ajst-2992	59	98	maximum	maximum	ADJ
ajst-2992	59	99	current	current	ADJ
ajst-2992	59	100	difference	difference	NOUN
ajst-2992	59	101	,	,	PUNCT
ajst-2992	59	102	and	and	CCONJ
ajst-2992	59	103	the	the	DET
ajst-2992	59	104	shortening	shortening	NOUN
ajst-2992	59	105	of	of	ADP
ajst-2992	59	106	the	the	DET
ajst-2992	59	107	turn	turn	NOUN
ajst-2992	59	108	-	-	PUNCT
ajst-2992	59	109	off	off	ADP
ajst-2992	59	110	time	time	NOUN
ajst-2992	59	111	.	.	PUNCT
ajst-2992	60	1	however	however	ADV
ajst-2992	60	2	,	,	PUNCT
ajst-2992	60	3	the	the	DET
ajst-2992	60	4	overall	overall	ADJ
ajst-2992	60	5	impact	impact	NOUN
ajst-2992	60	6	on	on	ADP
ajst-2992	60	7	the	the	DET
ajst-2992	60	8	turn	turn	NOUN
ajst-2992	60	9	-	-	PUNCT
ajst-2992	60	10	off	off	ADP
ajst-2992	60	11	moment	moment	NOUN
ajst-2992	60	12	is	be	AUX
ajst-2992	60	13	negligible	negligible	ADJ
ajst-2992	60	14	compared	compare	VERB
ajst-2992	60	15	with	with	ADP
ajst-2992	60	16	the	the	DET
ajst-2992	60	17	turn	turn	NOUN
ajst-2992	60	18	-	-	PUNCT
ajst-2992	60	19	on	on	ADP
ajst-2992	60	20	moment	moment	NOUN
ajst-2992	60	21	.	.	PUNCT
ajst-2992	61	1	based	base	VERB
ajst-2992	61	2	on	on	ADP
ajst-2992	61	3	the	the	DET
ajst-2992	61	4	experimental	experimental	ADJ
ajst-2992	61	5	results	result	NOUN
ajst-2992	61	6	obtained	obtain	VERB
ajst-2992	61	7	from	from	ADP
ajst-2992	61	8	the	the	DET
ajst-2992	61	9	data	datum	NOUN
ajst-2992	61	10	of	of	ADP
ajst-2992	61	11	90	90	NUM
ajst-2992	61	12	%	%	NOUN
ajst-2992	61	13	and	and	CCONJ
ajst-2992	61	14	10	10	NUM
ajst-2992	61	15	%	%	NOUN
ajst-2992	61	16	of	of	ADP
ajst-2992	61	17	peak	peak	NOUN
ajst-2992	61	18	values	value	NOUN
ajst-2992	61	19	,	,	PUNCT
ajst-2992	61	20	it	it	PRON
ajst-2992	61	21	can	can	AUX
ajst-2992	61	22	be	be	AUX
ajst-2992	61	23	inferred	infer	VERB
ajst-2992	61	24	that	that	SCONJ
ajst-2992	61	25	the	the	DET
ajst-2992	61	26	branch	branch	NOUN
ajst-2992	61	27	with	with	ADP
ajst-2992	61	28	smaller	small	ADJ
ajst-2992	61	29	parasitic	parasitic	ADJ
ajst-2992	61	30	gate	gate	NOUN
ajst-2992	61	31	inductance	inductance	NOUN
ajst-2992	61	32	has	have	VERB
ajst-2992	61	33	a	a	DET
ajst-2992	61	34	faster	fast	ADJ
ajst-2992	61	35	opening	opening	NOUN
ajst-2992	61	36	speed	speed	NOUN
ajst-2992	61	37	and	and	CCONJ
ajst-2992	61	38	a	a	DET
ajst-2992	61	39	smaller	small	ADJ
ajst-2992	61	40	current	current	NOUN
ajst-2992	61	41	than	than	ADP
ajst-2992	61	42	the	the	DET
ajst-2992	61	43	other	other	ADJ
ajst-2992	61	44	branch	branch	NOUN
ajst-2992	61	45	.	.	PUNCT
ajst-2992	62	1	overall	overall	ADJ
ajst-2992	62	2	observation	observation	NOUN
ajst-2992	62	3	shows	show	VERB
ajst-2992	62	4	that	that	SCONJ
ajst-2992	62	5	the	the	DET
ajst-2992	62	6	drain	drain	NOUN
ajst-2992	62	7	parasitic	parasitic	ADJ
ajst-2992	62	8	inductance	inductance	NOUN
ajst-2992	62	9	will	will	AUX
ajst-2992	62	10	cause	cause	VERB
ajst-2992	62	11	sharp	sharp	ADJ
ajst-2992	62	12	current	current	ADJ
ajst-2992	62	13	oscillation	oscillation	NOUN
ajst-2992	62	14	after	after	ADP
ajst-2992	62	15	opening	open	VERB
ajst-2992	62	16	.	.	PUNCT
ajst-2992	63	1	with	with	ADP
ajst-2992	63	2	the	the	DET
ajst-2992	63	3	increase	increase	NOUN
ajst-2992	63	4	of	of	ADP
ajst-2992	63	5	the	the	DET
ajst-2992	63	6	drain	drain	NOUN
ajst-2992	63	7	parasitic	parasitic	ADJ
ajst-2992	63	8	inductance	inductance	NOUN
ajst-2992	63	9	,	,	PUNCT
ajst-2992	63	10	the	the	DET
ajst-2992	63	11	amplitude	amplitude	NOUN
ajst-2992	63	12	and	and	CCONJ
ajst-2992	63	13	frequency	frequency	NOUN
ajst-2992	63	14	of	of	ADP
ajst-2992	63	15	current	current	ADJ
ajst-2992	63	16	oscillation	oscillation	NOUN
ajst-2992	63	17	will	will	AUX
ajst-2992	63	18	decrease	decrease	VERB
ajst-2992	63	19	.	.	PUNCT
ajst-2992	64	1	after	after	ADP
ajst-2992	64	2	reaching	reach	VERB
ajst-2992	64	3	a	a	DET
ajst-2992	64	4	stable	stable	ADJ
ajst-2992	64	5	working	work	VERB
ajst-2992	64	6	state	state	NOUN
ajst-2992	64	7	,	,	PUNCT
ajst-2992	64	8	the	the	DET
ajst-2992	64	9	effect	effect	NOUN
ajst-2992	64	10	will	will	AUX
ajst-2992	64	11	almost	almost	ADV
ajst-2992	64	12	disappear	disappear	VERB
ajst-2992	64	13	,	,	PUNCT
ajst-2992	64	14	and	and	CCONJ
ajst-2992	64	15	no	no	DET
ajst-2992	64	16	obvious	obvious	ADJ
ajst-2992	64	17	effect	effect	NOUN
ajst-2992	64	18	will	will	AUX
ajst-2992	64	19	be	be	AUX
ajst-2992	64	20	caused	cause	VERB
ajst-2992	64	21	until	until	ADP
ajst-2992	64	22	the	the	DET
ajst-2992	64	23	shutdown	shutdown	NOUN
ajst-2992	64	24	process	process	NOUN
ajst-2992	64	25	.	.	PUNCT
ajst-2992	65	1	3.2	3.2	NUM
ajst-2992	65	2	.	.	PUNCT
ajst-2992	65	3	effect	effect	NOUN
ajst-2992	65	4	of	of	ADP
ajst-2992	65	5	source	source	NOUN
ajst-2992	65	6	inductance	inductance	NOUN
ajst-2992	65	7	difference	difference	NOUN
ajst-2992	65	8	refer	refer	VERB
ajst-2992	65	9	to	to	ADP
ajst-2992	65	10	official	official	ADJ
ajst-2992	65	11	website	website	NOUN
ajst-2992	65	12	of	of	ADP
ajst-2992	65	13	wolfspeed	wolfspeed	NOUN
ajst-2992	65	14	provided	provide	VERB
ajst-2992	65	15	in	in	ADP
ajst-2992	65	16	the	the	DET
ajst-2992	65	17	sic	sic	ADJ
ajst-2992	65	18	mosfet	mosfet	NOUN
ajst-2992	65	19	device	device	NOUN
ajst-2992	65	20	c3moo32120k	c3moo32120k	NOUN
ajst-2992	65	21	parameter	parameter	NOUN
ajst-2992	65	22	table	table	NOUN
ajst-2992	65	23	,	,	PUNCT
ajst-2992	65	24	get	get	VERB
ajst-2992	65	25	the	the	DET
ajst-2992	65	26	order	order	NOUN
ajst-2992	65	27	of	of	ADP
ajst-2992	65	28	magnitude	magnitude	NOUN
ajst-2992	65	29	of	of	ADP
ajst-2992	65	30	the	the	DET
ajst-2992	65	31	key	key	ADJ
ajst-2992	65	32	value	value	NOUN
ajst-2992	65	33	.set	.set	PUNCT
ajst-2992	66	1	parameters	parameter	NOUN
ajst-2992	66	2	as	as	SCONJ
ajst-2992	66	3	shown	show	VERB
ajst-2992	66	4	in	in	ADP
ajst-2992	66	5	tab.5	tab.5	NOUN
ajst-2992	66	6	.	.	PUNCT
ajst-2992	67	1	table	table	NOUN
ajst-2992	67	2	5	5	NUM
ajst-2992	67	3	.	.	PUNCT
ajst-2992	67	4	source	source	NOUN
ajst-2992	67	5	inductance	inductance	NOUN
ajst-2992	67	6	mismatch	mismatch	NOUN
ajst-2992	67	7	test	test	NOUN
ajst-2992	67	8	values	value	NOUN
ajst-2992	67	9	device	device	NOUN
ajst-2992	67	10	size	size	NOUN
ajst-2992	67	11	device	device	NOUN
ajst-2992	67	12	size	size	NOUN
ajst-2992	67	13	device	device	NOUN
ajst-2992	67	14	size	size	NOUN
ajst-2992	67	15	device	device	NOUN
ajst-2992	67	16	size	size	NOUN
ajst-2992	67	17	1nh	1nh	NOUN
ajst-2992	67	18	1nh	1nh	NOUN
ajst-2992	67	19	10pf	10pf	NOUN
ajst-2992	67	20	10pf	10pf	NOUN
ajst-2992	67	21	1nh	1nh	NOUN
ajst-2992	67	22	1nh	1nh	NOUN
ajst-2992	67	23	1000pf	1000pf	NOUN
ajst-2992	67	24	1000pf	1000pf	VERB
ajst-2992	67	25	1nh	1nh	ADJ
ajst-2992	67	26	10nh	10nh	ADJ
ajst-2992	67	27	100pf	100pf	NOUN
ajst-2992	67	28	100pf	100pf	VERB
ajst-2992	67	29	1mω	1mω	ADJ
ajst-2992	67	30	1mω	1mω	ADJ
ajst-2992	67	31	l	l	NOUN
ajst-2992	67	32	100uh	100uh	PROPN
ajst-2992	67	33	1nf	1nf	ADJ
ajst-2992	67	34	20ω	20ω	NOUN
ajst-2992	67	35	20ω	20ω	PROPN
ajst-2992	68	1	1000uf	1000uf	PROPN
ajst-2992	68	2	500v	500v	PROPN
ajst-2992	68	3	20ω	20ω	NOUN
ajst-2992	68	4	20ω	20ω	NOUN
ajst-2992	69	1	i	i	PRON
ajst-2992	69	2	d	d	PROPN
ajst-2992	69	3	/	/	PUNCT
ajst-2992	69	4	a	a	DET
ajst-2992	69	5	t	t	NOUN
ajst-2992	69	6	/	/	PUNCT
ajst-2992	69	7	µs	µs	PROPN
ajst-2992	69	8	t	t	PROPN
ajst-2992	69	9	/	/	PUNCT
ajst-2992	69	10	µs	µs	X
ajst-2992	70	1	i	i	PROPN
ajst-2992	70	2	d	d	PROPN
ajst-2992	70	3	/	/	SYM
ajst-2992	70	4	a	a	DET
ajst-2992	70	5	t	t	NOUN
ajst-2992	70	6	/	/	SYM
ajst-2992	70	7	µs	µs	NOUN
ajst-2992	71	1	i	i	PROPN
ajst-2992	71	2	d	d	PROPN
ajst-2992	71	3	/	/	SYM
ajst-2992	71	4	a	a	DET
ajst-2992	71	5	250	250	NUM
ajst-2992	71	6	figure	figure	NOUN
ajst-2992	71	7	7	7	NUM
ajst-2992	71	8	.	.	PUNCT
ajst-2992	71	9	simulation	simulation	NOUN
ajst-2992	71	10	diagram	diagram	PROPN
ajst-2992	71	11	of	of	ADP
ajst-2992	71	12	source	source	NOUN
ajst-2992	71	13	inductance	inductance	NOUN
ajst-2992	71	14	mismatch	mismatch	NOUN
ajst-2992	71	15	table	table	NOUN
ajst-2992	71	16	6	6	NUM
ajst-2992	71	17	.	.	PUNCT
ajst-2992	72	1	experimental	experimental	ADJ
ajst-2992	72	2	results	result	NOUN
ajst-2992	72	3	of	of	ADP
ajst-2992	72	4	source	source	NOUN
ajst-2992	72	5	inductance	inductance	NOUN
ajst-2992	72	6	difference	difference	NOUN
ajst-2992	72	7	in	in	ADP
ajst-2992	72	8	static	static	ADJ
ajst-2992	72	9	state	state	NOUN
ajst-2992	72	10	type	type	NOUN
ajst-2992	72	11	node1/(µs	node1/(µs	PROPN
ajst-2992	72	12	,	,	PUNCT
ajst-2992	72	13	a	a	PRON
ajst-2992	72	14	)	)	PUNCT
ajst-2992	72	15	node2/(µs	node2/(µs	PROPN
ajst-2992	72	16	,	,	PUNCT
ajst-2992	72	17	a	a	DET
ajst-2992	72	18	)	)	PUNCT
ajst-2992	72	19	di	di	NOUN
ajst-2992	72	20	/	/	SYM
ajst-2992	72	21	dt	dt	NOUN
ajst-2992	72	22	∆	∆	PROPN
ajst-2992	72	23	/	/	SYM
ajst-2992	72	24	4.43,3.67	4.43,3.67	PROPN
ajst-2992	72	25	22.14,47.86	22.14,47.86	PROPN
ajst-2992	72	26	2.494e+6	2.494e+6	NUM
ajst-2992	72	27	57.47	57.47	NUM
ajst-2992	72	28	4.43,3.08	4.43,3.08	NUM
ajst-2992	72	29	22.14,47.30	22.14,47.30	NUM
ajst-2992	72	30	2.492e+6	2.492e+6	NUM
ajst-2992	72	31	56.94	56.94	NUM
ajst-2992	72	32	according	accord	VERB
ajst-2992	72	33	to	to	ADP
ajst-2992	72	34	the	the	DET
ajst-2992	72	35	static	static	ADJ
ajst-2992	72	36	data	datum	NOUN
ajst-2992	72	37	in	in	ADP
ajst-2992	72	38	tab.6	tab.6	PROPN
ajst-2992	72	39	,	,	PUNCT
ajst-2992	72	40	the	the	DET
ajst-2992	72	41	side	side	NOUN
ajst-2992	72	42	with	with	ADP
ajst-2992	72	43	the	the	DET
ajst-2992	72	44	larger	large	ADJ
ajst-2992	72	45	source	source	NOUN
ajst-2992	72	46	inductance	inductance	NOUN
ajst-2992	72	47	is	be	AUX
ajst-2992	72	48	subjected	subject	VERB
ajst-2992	72	49	to	to	ADP
ajst-2992	72	50	less	less	ADV
ajst-2992	72	51	current	current	ADJ
ajst-2992	72	52	and	and	CCONJ
ajst-2992	72	53	the	the	DET
ajst-2992	72	54	rate	rate	NOUN
ajst-2992	72	55	of	of	ADP
ajst-2992	72	56	current	current	ADJ
ajst-2992	72	57	change	change	NOUN
ajst-2992	72	58	is	be	AUX
ajst-2992	72	59	slower	slow	ADJ
ajst-2992	72	60	.	.	PUNCT
ajst-2992	73	1	figure	figure	NOUN
ajst-2992	73	2	8	8	NUM
ajst-2992	73	3	.	.	PUNCT
ajst-2992	74	1	simulation	simulation	NOUN
ajst-2992	74	2	diagram	diagram	PROPN
ajst-2992	74	3	of	of	ADP
ajst-2992	74	4	source	source	NOUN
ajst-2992	74	5	inductance	inductance	NOUN
ajst-2992	74	6	mismatch	mismatch	NOUN
ajst-2992	74	7	at	at	ADP
ajst-2992	74	8	the	the	DET
ajst-2992	74	9	opening	opening	NOUN
ajst-2992	74	10	moment	moment	NOUN
ajst-2992	74	11	table	table	NOUN
ajst-2992	74	12	6	6	NUM
ajst-2992	74	13	.	.	PUNCT
ajst-2992	75	1	results	result	NOUN
ajst-2992	75	2	of	of	ADP
ajst-2992	75	3	source	source	NOUN
ajst-2992	75	4	inductance	inductance	NOUN
ajst-2992	75	5	difference	difference	NOUN
ajst-2992	75	6	at	at	ADP
ajst-2992	75	7	opening	opening	NOUN
ajst-2992	75	8	moment	moment	NOUN
ajst-2992	75	9	type	type	NOUN
ajst-2992	75	10	node1/(µs	node1/(µs	PROPN
ajst-2992	75	11	,	,	PUNCT
ajst-2992	75	12	a	a	PRON
ajst-2992	75	13	)	)	PUNCT
ajst-2992	75	14	node2/(µs	node2/(µs	PROPN
ajst-2992	75	15	,	,	PUNCT
ajst-2992	75	16	a	a	DET
ajst-2992	75	17	)	)	PUNCT
ajst-2992	75	18	di	di	NOUN
ajst-2992	75	19	/	/	SYM
ajst-2992	75	20	dt	dt	NOUN
ajst-2992	75	21	∆	∆	PROPN
ajst-2992	75	22	/	/	SYM
ajst-2992	75	23	∆	∆	PROPN
ajst-2992	75	24	/	/	SYM
ajst-2992	76	1	25.06,8.21	25.06,8.21	NUM
ajst-2992	76	2	25.08,74.69	25.08,74.69	NUM
ajst-2992	76	3	3.4e+9	3.4e+9	NOUN
ajst-2992	76	4	83.2	83.2	NUM
ajst-2992	76	5	19.3	19.3	NUM
ajst-2992	76	6	25.06,6.84	25.06,6.84	NUM
ajst-2992	76	7	25.08,61.96	25.08,61.96	NUM
ajst-2992	76	8	2.7e+9	2.7e+9	NOUN
ajst-2992	76	9	68.81	68.81	NUM
ajst-2992	76	10	20.3	20.3	NUM
ajst-2992	76	11	according	accord	VERB
ajst-2992	76	12	to	to	ADP
ajst-2992	76	13	the	the	DET
ajst-2992	76	14	static	static	ADJ
ajst-2992	76	15	data	datum	NOUN
ajst-2992	76	16	in	in	ADP
ajst-2992	76	17	tab.6	tab.6	PROPN
ajst-2992	76	18	,	,	PUNCT
ajst-2992	76	19	the	the	DET
ajst-2992	76	20	side	side	NOUN
ajst-2992	76	21	with	with	ADP
ajst-2992	76	22	the	the	DET
ajst-2992	76	23	larger	large	ADJ
ajst-2992	76	24	source	source	NOUN
ajst-2992	76	25	inductance	inductance	NOUN
ajst-2992	76	26	is	be	AUX
ajst-2992	76	27	subjected	subject	VERB
ajst-2992	76	28	to	to	ADP
ajst-2992	76	29	less	less	ADV
ajst-2992	76	30	current	current	ADJ
ajst-2992	76	31	and	and	CCONJ
ajst-2992	76	32	the	the	DET
ajst-2992	76	33	rate	rate	NOUN
ajst-2992	76	34	of	of	ADP
ajst-2992	76	35	current	current	ADJ
ajst-2992	76	36	change	change	NOUN
ajst-2992	76	37	is	be	AUX
ajst-2992	76	38	slower	slow	ADJ
ajst-2992	76	39	.	.	PUNCT
ajst-2992	77	1	figure	figure	NOUN
ajst-2992	77	2	9	9	NUM
ajst-2992	77	3	.	.	PUNCT
ajst-2992	77	4	dynamic	dynamic	ADJ
ajst-2992	77	5	diagram	diagram	NOUN
ajst-2992	77	6	of	of	ADP
ajst-2992	77	7	source	source	NOUN
ajst-2992	77	8	inductance	inductance	NOUN
ajst-2992	77	9	mismatch	mismatch	NOUN
ajst-2992	77	10	at	at	ADP
ajst-2992	77	11	turn	turn	NOUN
ajst-2992	77	12	-	-	PUNCT
ajst-2992	77	13	off	off	ADP
ajst-2992	77	14	moment	moment	NOUN
ajst-2992	77	15	table	table	NOUN
ajst-2992	77	16	7	7	NUM
ajst-2992	77	17	.	.	PUNCT
ajst-2992	77	18	results	result	NOUN
ajst-2992	77	19	of	of	ADP
ajst-2992	77	20	source	source	NOUN
ajst-2992	77	21	inductance	inductance	NOUN
ajst-2992	77	22	difference	difference	NOUN
ajst-2992	77	23	at	at	ADP
ajst-2992	77	24	turnoff	turnoff	ADJ
ajst-2992	77	25	moment	moment	NOUN
ajst-2992	77	26	type	type	NOUN
ajst-2992	77	27	node1/(µs	node1/(µs	PROPN
ajst-2992	77	28	,	,	PUNCT
ajst-2992	77	29	a	a	PRON
ajst-2992	77	30	)	)	PUNCT
ajst-2992	77	31	node2/(µs	node2/(µs	PROPN
ajst-2992	77	32	,	,	PUNCT
ajst-2992	77	33	a	a	DET
ajst-2992	77	34	)	)	PUNCT
ajst-2992	77	35	di	di	NOUN
ajst-2992	77	36	/	/	SYM
ajst-2992	77	37	dt	dt	NOUN
ajst-2992	77	38	∆	∆	PROPN
ajst-2992	77	39	/	/	SYM
ajst-2992	77	40	∆	∆	PROPN
ajst-2992	77	41	/	/	SYM
ajst-2992	77	42	23.09,44.96	23.09,44.96	PROPN
ajst-2992	77	43	23.13,5.06	23.13,5.06	PROPN
ajst-2992	77	44	-9.4e+8	-9.4e+8	PUNCT
ajst-2992	77	45	-49.9	-49.9	PROPN
ajst-2992	77	46	42.2	42.2	NUM
ajst-2992	77	47	23.09,44.50	23.09,44.50	NUM
ajst-2992	77	48	23.13,4.87	23.13,4.87	PROPN
ajst-2992	77	49	-1.1e+9	-1.1e+9	NOUN
ajst-2992	77	50	-49.5	-49.5	NOUN
ajst-2992	77	51	36.7	36.7	NUM
ajst-2992	77	52	by	by	ADP
ajst-2992	77	53	selecting	select	VERB
ajst-2992	77	54	the	the	DET
ajst-2992	77	55	data	datum	NOUN
ajst-2992	77	56	of	of	ADP
ajst-2992	77	57	experimental	experimental	ADJ
ajst-2992	77	58	results	result	NOUN
ajst-2992	77	59	obtained	obtain	VERB
ajst-2992	77	60	at	at	ADP
ajst-2992	77	61	two	two	NUM
ajst-2992	77	62	points	point	NOUN
ajst-2992	77	63	,	,	PUNCT
ajst-2992	77	64	peak	peak	VERB
ajst-2992	77	65	90	90	NUM
ajst-2992	77	66	%	%	NOUN
ajst-2992	77	67	and	and	CCONJ
ajst-2992	77	68	peak	peak	NOUN
ajst-2992	77	69	10	10	NUM
ajst-2992	77	70	%	%	NOUN
ajst-2992	77	71	,	,	PUNCT
ajst-2992	77	72	which	which	PRON
ajst-2992	77	73	can	can	AUX
ajst-2992	77	74	be	be	AUX
ajst-2992	77	75	inferred	infer	VERB
ajst-2992	77	76	that	that	SCONJ
ajst-2992	77	77	on	on	ADP
ajst-2992	77	78	the	the	DET
ajst-2992	77	79	branch	branch	NOUN
ajst-2992	77	80	with	with	ADP
ajst-2992	77	81	larger	large	ADJ
ajst-2992	77	82	source	source	NOUN
ajst-2992	77	83	inductance	inductance	NOUN
ajst-2992	77	84	,	,	PUNCT
ajst-2992	77	85	the	the	DET
ajst-2992	77	86	opening	opening	NOUN
ajst-2992	77	87	time	time	NOUN
ajst-2992	77	88	of	of	ADP
ajst-2992	77	89	sic	sic	ADJ
ajst-2992	77	90	mosfet	mosfet	NOUN
ajst-2992	77	91	is	be	AUX
ajst-2992	77	92	relatively	relatively	ADV
ajst-2992	77	93	long	long	ADJ
ajst-2992	77	94	,	,	PUNCT
ajst-2992	77	95	the	the	DET
ajst-2992	77	96	turn	turn	VERB
ajst-2992	77	97	-	-	PUNCT
ajst-2992	77	98	off	off	ADP
ajst-2992	77	99	time	time	NOUN
ajst-2992	77	100	is	be	AUX
ajst-2992	77	101	short	short	ADJ
ajst-2992	77	102	,	,	PUNCT
ajst-2992	77	103	and	and	CCONJ
ajst-2992	77	104	the	the	DET
ajst-2992	77	105	overall	overall	ADJ
ajst-2992	77	106	switching	switching	NOUN
ajst-2992	77	107	time	time	NOUN
ajst-2992	77	108	is	be	AUX
ajst-2992	77	109	relatively	relatively	ADV
ajst-2992	77	110	long	long	ADJ
ajst-2992	77	111	.	.	PUNCT
ajst-2992	78	1	the	the	DET
ajst-2992	78	2	tip	tip	NOUN
ajst-2992	78	3	current	current	NOUN
ajst-2992	78	4	at	at	ADP
ajst-2992	78	5	the	the	DET
ajst-2992	78	6	opening	opening	NOUN
ajst-2992	78	7	moment	moment	NOUN
ajst-2992	78	8	is	be	AUX
ajst-2992	78	9	small	small	ADJ
ajst-2992	78	10	,	,	PUNCT
ajst-2992	78	11	as	as	ADP
ajst-2992	78	12	a	a	DET
ajst-2992	78	13	result	result	NOUN
ajst-2992	78	14	,	,	PUNCT
ajst-2992	78	15	the	the	DET
ajst-2992	78	16	source	source	NOUN
ajst-2992	78	17	parasitic	parasitic	ADJ
ajst-2992	78	18	inductance	inductance	NOUN
ajst-2992	78	19	can	can	AUX
ajst-2992	78	20	be	be	AUX
ajst-2992	78	21	increased	increase	VERB
ajst-2992	78	22	appropriately	appropriately	ADV
ajst-2992	78	23	for	for	ADP
ajst-2992	78	24	the	the	DET
ajst-2992	78	25	purpose	purpose	NOUN
ajst-2992	78	26	of	of	ADP
ajst-2992	78	27	protecting	protect	VERB
ajst-2992	78	28	the	the	DET
ajst-2992	78	29	circuit	circuit	NOUN
ajst-2992	78	30	.	.	PUNCT
ajst-2992	79	1	however	however	ADV
ajst-2992	79	2	,	,	PUNCT
ajst-2992	79	3	too	too	ADV
ajst-2992	79	4	much	much	ADJ
ajst-2992	79	5	increase	increase	NOUN
ajst-2992	79	6	will	will	AUX
ajst-2992	79	7	reduce	reduce	VERB
ajst-2992	79	8	the	the	DET
ajst-2992	79	9	switching	switching	NOUN
ajst-2992	79	10	speed	speed	NOUN
ajst-2992	79	11	.	.	PUNCT
ajst-2992	80	1	3.3	3.3	NUM
ajst-2992	80	2	.	.	PUNCT
ajst-2992	80	3	effect	effect	NOUN
ajst-2992	80	4	of	of	ADP
ajst-2992	80	5	parasitic	parasitic	ADJ
ajst-2992	80	6	capacitance	capacitance	NOUN
ajst-2992	80	7	difference	difference	NOUN
ajst-2992	80	8	at	at	ADP
ajst-2992	80	9	gate	gate	PROPN
ajst-2992	80	10	source	source	NOUN
ajst-2992	80	11	reference	reference	NOUN
ajst-2992	80	12	official	official	ADJ
ajst-2992	80	13	website	website	NOUN
ajst-2992	80	14	of	of	ADP
ajst-2992	80	15	wolfspeed	wolfspeed	NOUN
ajst-2992	80	16	provided	provide	VERB
ajst-2992	80	17	in	in	ADP
ajst-2992	80	18	the	the	DET
ajst-2992	80	19	sic	sic	ADJ
ajst-2992	80	20	mosfet	mosfet	NOUN
ajst-2992	80	21	device	device	NOUN
ajst-2992	80	22	c3moo32120k	c3moo32120k	NOUN
ajst-2992	80	23	parameter	parameter	NOUN
ajst-2992	80	24	table	table	NOUN
ajst-2992	80	25	,	,	PUNCT
ajst-2992	80	26	the	the	DET
ajst-2992	80	27	order	order	NOUN
ajst-2992	80	28	of	of	ADP
ajst-2992	80	29	magnitude	magnitude	NOUN
ajst-2992	80	30	of	of	ADP
ajst-2992	80	31	the	the	DET
ajst-2992	80	32	gate	gate	PROPN
ajst-2992	80	33	source	source	NOUN
ajst-2992	80	34	parasitic	parasitic	ADJ
ajst-2992	80	35	inductance	inductance	NOUN
ajst-2992	80	36	is	be	AUX
ajst-2992	80	37	103	103	NUM
ajst-2992	80	38	.	.	PUNCT
ajst-2992	81	1	to	to	PART
ajst-2992	81	2	make	make	VERB
ajst-2992	81	3	the	the	DET
ajst-2992	81	4	data	datum	NOUN
ajst-2992	81	5	more	more	ADV
ajst-2992	81	6	intuitive	intuitive	ADJ
ajst-2992	81	7	,	,	PUNCT
ajst-2992	81	8	set	set	VERB
ajst-2992	81	9	it	it	PRON
ajst-2992	81	10	to	to	ADP
ajst-2992	81	11	the	the	DET
ajst-2992	81	12	integer	integer	NOUN
ajst-2992	81	13	data	datum	NOUN
ajst-2992	81	14	shown	show	VERB
ajst-2992	81	15	in	in	ADP
ajst-2992	81	16	tab.8	tab.8	PROPN
ajst-2992	81	17	.	.	PUNCT
ajst-2992	81	18	table	table	NOUN
ajst-2992	81	19	8	8	NUM
ajst-2992	81	20	.	.	PUNCT
ajst-2992	82	1	test	test	NOUN
ajst-2992	82	2	values	value	NOUN
ajst-2992	82	3	of	of	ADP
ajst-2992	82	4	gate	gate	NOUN
ajst-2992	82	5	-	-	PUNCT
ajst-2992	82	6	source	source	NOUN
ajst-2992	82	7	capacitance	capacitance	NOUN
ajst-2992	82	8	mismatch	mismatch	NOUN
ajst-2992	82	9	device	device	NOUN
ajst-2992	82	10	size	size	NOUN
ajst-2992	82	11	device	device	NOUN
ajst-2992	82	12	size	size	NOUN
ajst-2992	82	13	device	device	NOUN
ajst-2992	82	14	size	size	NOUN
ajst-2992	82	15	device	device	NOUN
ajst-2992	82	16	size	size	NOUN
ajst-2992	82	17	1nh	1nh	NOUN
ajst-2992	82	18	1nh	1nh	NOUN
ajst-2992	82	19	10pf	10pf	NOUN
ajst-2992	82	20	10pf	10pf	NOUN
ajst-2992	82	21	1nh	1nh	NOUN
ajst-2992	82	22	1nh	1nh	NOUN
ajst-2992	82	23	1000pf	1000pf	NOUN
ajst-2992	82	24	1200pf	1200pf	VERB
ajst-2992	82	25	1nh	1nh	NOUN
ajst-2992	82	26	1nh	1nh	NOUN
ajst-2992	82	27	100pf	100pf	NOUN
ajst-2992	82	28	100pf	100pf	VERB
ajst-2992	82	29	1mω	1mω	ADJ
ajst-2992	82	30	1mω	1mω	ADJ
ajst-2992	82	31	l	l	NOUN
ajst-2992	82	32	100uh	100uh	PROPN
ajst-2992	82	33	1nf	1nf	ADJ
ajst-2992	82	34	20ω	20ω	NOUN
ajst-2992	82	35	20ω	20ω	PROPN
ajst-2992	83	1	1000uf	1000uf	PROPN
ajst-2992	83	2	500v	500v	PROPN
ajst-2992	83	3	20ω	20ω	NOUN
ajst-2992	83	4	20ω	20ω	NOUN
ajst-2992	83	5	t	t	NOUN
ajst-2992	83	6	/	/	SYM
ajst-2992	83	7	µs	µs	X
ajst-2992	83	8	i	i	PROPN
ajst-2992	83	9	d	d	PROPN
ajst-2992	83	10	/	/	SYM
ajst-2992	83	11	a	a	DET
ajst-2992	83	12	t	t	NOUN
ajst-2992	83	13	/	/	SYM
ajst-2992	83	14	µs	µs	NOUN
ajst-2992	84	1	i	i	PROPN
ajst-2992	84	2	d	d	PROPN
ajst-2992	84	3	/	/	SYM
ajst-2992	84	4	a	a	DET
ajst-2992	84	5	t	t	NOUN
ajst-2992	84	6	/	/	SYM
ajst-2992	84	7	µs	µs	NOUN
ajst-2992	85	1	i	i	PROPN
ajst-2992	85	2	d	d	PROPN
ajst-2992	85	3	/	/	SYM
ajst-2992	85	4	a	a	DET
ajst-2992	85	5	251	251	NUM
ajst-2992	85	6	figure	figure	NOUN
ajst-2992	85	7	11	11	NUM
ajst-2992	85	8	.	.	PUNCT
ajst-2992	86	1	simulation	simulation	NOUN
ajst-2992	86	2	diagram	diagram	PROPN
ajst-2992	86	3	of	of	ADP
ajst-2992	86	4	gate	gate	NOUN
ajst-2992	86	5	-	-	PUNCT
ajst-2992	86	6	source	source	NOUN
ajst-2992	86	7	capacitance	capacitance	NOUN
ajst-2992	86	8	mismatch	mismatch	NOUN
ajst-2992	86	9	table	table	NOUN
ajst-2992	86	10	9	9	NUM
ajst-2992	86	11	.	.	PUNCT
ajst-2992	87	1	experimental	experimental	ADJ
ajst-2992	87	2	results	result	NOUN
ajst-2992	87	3	of	of	ADP
ajst-2992	87	4	gate	gate	NOUN
ajst-2992	87	5	source	source	NOUN
ajst-2992	87	6	capacitance	capacitance	NOUN
ajst-2992	87	7	difference	difference	NOUN
ajst-2992	87	8	in	in	ADP
ajst-2992	87	9	static	static	ADJ
ajst-2992	87	10	state	state	NOUN
ajst-2992	87	11	type	type	NOUN
ajst-2992	87	12	node1/(µs	node1/(µs	PROPN
ajst-2992	87	13	,	,	PUNCT
ajst-2992	87	14	a	a	PRON
ajst-2992	87	15	)	)	PUNCT
ajst-2992	87	16	node2/(µs	node2/(µs	PROPN
ajst-2992	87	17	,	,	PUNCT
ajst-2992	87	18	a	a	DET
ajst-2992	87	19	)	)	PUNCT
ajst-2992	87	20	di	di	NOUN
ajst-2992	87	21	/	/	SYM
ajst-2992	87	22	dt	dt	PROPN
ajst-2992	87	23	4.01,2.33	4.01,2.33	NUM
ajst-2992	87	24	22.46,48.38	22.46,48.38	NUM
ajst-2992	87	25	2.495e+6	2.495e+6	NUM
ajst-2992	87	26	4.01,2.34	4.01,2.34	NUM
ajst-2992	87	27	22.47,48.38	22.47,48.38	NOUN
ajst-2992	87	28	2.495e+6	2.495e+6	NUM
ajst-2992	87	29	by	by	ADP
ajst-2992	87	30	observing	observe	VERB
ajst-2992	87	31	the	the	DET
ajst-2992	87	32	fig.11	fig.11	NOUN
ajst-2992	87	33	and	and	CCONJ
ajst-2992	87	34	the	the	DET
ajst-2992	87	35	experimental	experimental	ADJ
ajst-2992	87	36	data	datum	NOUN
ajst-2992	87	37	in	in	ADP
ajst-2992	87	38	tab.9	tab.9	PROPN
ajst-2992	87	39	,	,	PUNCT
ajst-2992	87	40	it	it	PRON
ajst-2992	87	41	can	can	AUX
ajst-2992	87	42	be	be	AUX
ajst-2992	87	43	concluded	conclude	VERB
ajst-2992	87	44	that	that	SCONJ
ajst-2992	87	45	the	the	DET
ajst-2992	87	46	mismatch	mismatch	NOUN
ajst-2992	87	47	of	of	ADP
ajst-2992	87	48	the	the	DET
ajst-2992	87	49	gatesource	gatesource	NOUN
ajst-2992	87	50	capacitance	capacitance	NOUN
ajst-2992	87	51	will	will	AUX
ajst-2992	87	52	hardly	hardly	ADV
ajst-2992	87	53	bring	bring	VERB
ajst-2992	87	54	any	any	DET
ajst-2992	87	55	effect	effect	NOUN
ajst-2992	87	56	in	in	ADP
ajst-2992	87	57	the	the	DET
ajst-2992	87	58	static	static	ADJ
ajst-2992	87	59	process	process	NOUN
ajst-2992	87	60	.	.	PUNCT
ajst-2992	88	1	figure	figure	NOUN
ajst-2992	88	2	12	12	NUM
ajst-2992	88	3	.	.	PUNCT
ajst-2992	89	1	simulation	simulation	NOUN
ajst-2992	89	2	diagram	diagram	PROPN
ajst-2992	89	3	of	of	ADP
ajst-2992	89	4	gate	gate	PROPN
ajst-2992	89	5	source	source	NOUN
ajst-2992	89	6	capacitance	capacitance	NOUN
ajst-2992	89	7	mismatch	mismatch	NOUN
ajst-2992	89	8	at	at	ADP
ajst-2992	89	9	the	the	DET
ajst-2992	89	10	opening	opening	NOUN
ajst-2992	89	11	moment	moment	NOUN
ajst-2992	89	12	table	table	NOUN
ajst-2992	89	13	10	10	NUM
ajst-2992	89	14	.	.	PUNCT
ajst-2992	90	1	experimental	experimental	ADJ
ajst-2992	90	2	results	result	NOUN
ajst-2992	90	3	of	of	ADP
ajst-2992	90	4	parasitic	parasitic	ADJ
ajst-2992	90	5	capacitance	capacitance	NOUN
ajst-2992	90	6	difference	difference	NOUN
ajst-2992	90	7	of	of	ADP
ajst-2992	90	8	gate	gate	NOUN
ajst-2992	90	9	source	source	NOUN
ajst-2992	90	10	at	at	ADP
ajst-2992	90	11	opening	opening	NOUN
ajst-2992	90	12	moment	moment	NOUN
ajst-2992	90	13	type	type	NOUN
ajst-2992	90	14	node1/(µs	node1/(µs	PROPN
ajst-2992	90	15	,	,	PUNCT
ajst-2992	90	16	a	a	PRON
ajst-2992	90	17	)	)	PUNCT
ajst-2992	90	18	node2/(µs	node2/(µs	PROPN
ajst-2992	90	19	,	,	PUNCT
ajst-2992	90	20	a	a	DET
ajst-2992	90	21	)	)	PUNCT
ajst-2992	90	22	di	di	NOUN
ajst-2992	90	23	/	/	SYM
ajst-2992	90	24	dt	dt	NOUN
ajst-2992	90	25	∆	∆	PROPN
ajst-2992	90	26	/	/	SYM
ajst-2992	90	27	∆	∆	PROPN
ajst-2992	90	28	/	/	SYM
ajst-2992	90	29	25.06,8.88	25.06,8.88	PROPN
ajst-2992	90	30	25.06,79.28	25.06,79.28	NOUN
ajst-2992	90	31	3.6e+9	3.6e+9	NOUN
ajst-2992	90	32	88.2	88.2	NUM
ajst-2992	90	33	19.6	19.6	NUM
ajst-2992	90	34	25.06,6.19	25.06,6.19	NUM
ajst-2992	90	35	25.08,55.46	25.08,55.46	NOUN
ajst-2992	90	36	2.6e+9	2.6e+9	NOUN
ajst-2992	90	37	61.5	61.5	NUM
ajst-2992	90	38	18.6	18.6	NUM
ajst-2992	90	39	through	through	ADP
ajst-2992	90	40	the	the	DET
ajst-2992	90	41	simulation	simulation	NOUN
ajst-2992	90	42	results	result	NOUN
ajst-2992	90	43	of	of	ADP
ajst-2992	90	44	the	the	DET
ajst-2992	90	45	opening	opening	NOUN
ajst-2992	90	46	moment	moment	NOUN
ajst-2992	90	47	in	in	ADP
ajst-2992	90	48	tab.10	tab.10	NOUN
ajst-2992	90	49	,	,	PUNCT
ajst-2992	90	50	it	it	PRON
ajst-2992	90	51	can	can	AUX
ajst-2992	90	52	be	be	AUX
ajst-2992	90	53	inferred	infer	VERB
ajst-2992	90	54	that	that	SCONJ
ajst-2992	90	55	the	the	DET
ajst-2992	90	56	increase	increase	NOUN
ajst-2992	90	57	of	of	ADP
ajst-2992	90	58	the	the	DET
ajst-2992	90	59	parasitic	parasitic	ADJ
ajst-2992	90	60	capacitance	capacitance	NOUN
ajst-2992	90	61	of	of	ADP
ajst-2992	90	62	the	the	DET
ajst-2992	90	63	gate	gate	PROPN
ajst-2992	90	64	source	source	NOUN
ajst-2992	90	65	will	will	AUX
ajst-2992	90	66	reduce	reduce	VERB
ajst-2992	90	67	the	the	DET
ajst-2992	90	68	tip	tip	NOUN
ajst-2992	90	69	current	current	ADJ
ajst-2992	90	70	,	,	PUNCT
ajst-2992	90	71	slow	slow	VERB
ajst-2992	90	72	down	down	ADP
ajst-2992	90	73	the	the	DET
ajst-2992	90	74	rate	rate	NOUN
ajst-2992	90	75	of	of	ADP
ajst-2992	90	76	current	current	ADJ
ajst-2992	90	77	change	change	NOUN
ajst-2992	90	78	,	,	PUNCT
ajst-2992	90	79	and	and	CCONJ
ajst-2992	90	80	shorten	shorten	VERB
ajst-2992	90	81	the	the	DET
ajst-2992	90	82	opening	opening	NOUN
ajst-2992	90	83	time	time	NOUN
ajst-2992	90	84	.	.	PUNCT
ajst-2992	91	1	figure	figure	NOUN
ajst-2992	91	2	13	13	NUM
ajst-2992	91	3	.	.	PUNCT
ajst-2992	92	1	simulation	simulation	NOUN
ajst-2992	92	2	diagram	diagram	PROPN
ajst-2992	92	3	of	of	ADP
ajst-2992	92	4	gate	gate	PROPN
ajst-2992	92	5	source	source	NOUN
ajst-2992	92	6	capacitance	capacitance	NOUN
ajst-2992	92	7	mismatch	mismatch	NOUN
ajst-2992	92	8	at	at	ADP
ajst-2992	92	9	turn	turn	NOUN
ajst-2992	92	10	-	-	PUNCT
ajst-2992	92	11	off	off	ADP
ajst-2992	92	12	moment	moment	NOUN
ajst-2992	92	13	table	table	NOUN
ajst-2992	92	14	11	11	NUM
ajst-2992	92	15	.	.	PUNCT
ajst-2992	93	1	experimental	experimental	ADJ
ajst-2992	93	2	results	result	NOUN
ajst-2992	93	3	of	of	ADP
ajst-2992	93	4	parasitic	parasitic	ADJ
ajst-2992	93	5	capacitance	capacitance	NOUN
ajst-2992	93	6	difference	difference	NOUN
ajst-2992	93	7	at	at	ADP
ajst-2992	93	8	the	the	DET
ajst-2992	93	9	gate	gate	PROPN
ajst-2992	93	10	source	source	NOUN
ajst-2992	93	11	at	at	ADP
ajst-2992	93	12	the	the	DET
ajst-2992	93	13	turn	turn	NOUN
ajst-2992	93	14	-	-	PUNCT
ajst-2992	93	15	off	off	ADP
ajst-2992	93	16	moment	moment	NOUN
ajst-2992	93	17	type	type	NOUN
ajst-2992	93	18	node1/(µs	node1/(µs	PROPN
ajst-2992	93	19	,	,	PUNCT
ajst-2992	93	20	a	a	PRON
ajst-2992	93	21	)	)	PUNCT
ajst-2992	93	22	node2/(µs	node2/(µs	PROPN
ajst-2992	93	23	,	,	PUNCT
ajst-2992	93	24	a	a	DET
ajst-2992	93	25	)	)	PUNCT
ajst-2992	93	26	di	di	NOUN
ajst-2992	93	27	/	/	SYM
ajst-2992	93	28	dt	dt	NOUN
ajst-2992	93	29	∆	∆	PROPN
ajst-2992	93	30	/	/	SYM
ajst-2992	93	31	∆	∆	PROPN
ajst-2992	93	32	/	/	SYM
ajst-2992	94	1	23.08,44.84	23.08,44.84	ADP
ajst-2992	94	2	23.14,4.84	23.14,4.84	PROPN
ajst-2992	94	3	-7.9e+8	-7.9e+8	PROPN
ajst-2992	94	4	-49.6	-49.6	PUNCT
ajst-2992	94	5	50.92	50.92	NUM
ajst-2992	94	6	23.11,45.61	23.11,45.61	NOUN
ajst-2992	94	7	23.14,5.05	23.14,5.05	PROPN
ajst-2992	94	8	-1.8e+9	-1.8e+9	ADP
ajst-2992	94	9	-50.0	-50.0	NUM
ajst-2992	94	10	22.39	22.39	NUM
ajst-2992	94	11	by	by	ADP
ajst-2992	94	12	comparing	compare	VERB
ajst-2992	94	13	the	the	DET
ajst-2992	94	14	simulation	simulation	NOUN
ajst-2992	94	15	results	result	NOUN
ajst-2992	94	16	of	of	ADP
ajst-2992	94	17	the	the	DET
ajst-2992	94	18	turn	turn	NOUN
ajst-2992	94	19	-	-	PUNCT
ajst-2992	94	20	off	off	ADP
ajst-2992	94	21	moment	moment	NOUN
ajst-2992	94	22	in	in	ADP
ajst-2992	94	23	tab.11	tab.11	NOUN
ajst-2992	94	24	,	,	PUNCT
ajst-2992	94	25	it	it	PRON
ajst-2992	94	26	can	can	AUX
ajst-2992	94	27	be	be	AUX
ajst-2992	94	28	inferred	infer	VERB
ajst-2992	94	29	that	that	SCONJ
ajst-2992	94	30	the	the	DET
ajst-2992	94	31	increase	increase	NOUN
ajst-2992	94	32	of	of	ADP
ajst-2992	94	33	gate	gate	NOUN
ajst-2992	94	34	-	-	PUNCT
ajst-2992	94	35	source	source	NOUN
ajst-2992	94	36	parasitic	parasitic	ADJ
ajst-2992	94	37	capacitance	capacitance	NOUN
ajst-2992	94	38	will	will	AUX
ajst-2992	94	39	lead	lead	VERB
ajst-2992	94	40	to	to	ADP
ajst-2992	94	41	the	the	DET
ajst-2992	94	42	increase	increase	NOUN
ajst-2992	94	43	of	of	ADP
ajst-2992	94	44	current	current	ADJ
ajst-2992	94	45	change	change	NOUN
ajst-2992	94	46	rate	rate	NOUN
ajst-2992	94	47	and	and	CCONJ
ajst-2992	94	48	maximum	maximum	ADJ
ajst-2992	94	49	current	current	ADJ
ajst-2992	94	50	difference	difference	NOUN
ajst-2992	94	51	during	during	ADP
ajst-2992	94	52	the	the	DET
ajst-2992	94	53	turnoff	turnoff	ADJ
ajst-2992	94	54	process	process	NOUN
ajst-2992	94	55	;	;	PUNCT
ajst-2992	94	56	however	however	ADV
ajst-2992	94	57	,	,	PUNCT
ajst-2992	94	58	the	the	DET
ajst-2992	94	59	turn	turn	VERB
ajst-2992	94	60	-	-	PUNCT
ajst-2992	94	61	off	off	ADP
ajst-2992	94	62	time	time	NOUN
ajst-2992	94	63	will	will	AUX
ajst-2992	94	64	be	be	AUX
ajst-2992	94	65	shortened	shorten	VERB
ajst-2992	94	66	.	.	PUNCT
ajst-2992	95	1	3.4	3.4	NUM
ajst-2992	95	2	.	.	PUNCT
ajst-2992	95	3	effect	effect	NOUN
ajst-2992	95	4	of	of	ADP
ajst-2992	95	5	parasitic	parasitic	ADJ
ajst-2992	95	6	capacitance	capacitance	NOUN
ajst-2992	95	7	difference	difference	NOUN
ajst-2992	95	8	on	on	ADP
ajst-2992	95	9	gate	gate	NOUN
ajst-2992	95	10	-	-	PUNCT
ajst-2992	95	11	drain	drain	NOUN
ajst-2992	95	12	pole	pole	NOUN
ajst-2992	95	13	by	by	ADP
ajst-2992	95	14	referring	refer	VERB
ajst-2992	95	15	to	to	ADP
ajst-2992	95	16	the	the	DET
ajst-2992	95	17	device	device	NOUN
ajst-2992	95	18	parameter	parameter	NOUN
ajst-2992	95	19	table	table	NOUN
ajst-2992	95	20	of	of	ADP
ajst-2992	95	21	c3moo32120k	c3moo32120k	NOUN
ajst-2992	95	22	,	,	PUNCT
ajst-2992	95	23	the	the	DET
ajst-2992	95	24	order	order	NOUN
ajst-2992	95	25	of	of	ADP
ajst-2992	95	26	magnitude	magnitude	NOUN
ajst-2992	95	27	of	of	ADP
ajst-2992	95	28	gate	gate	NOUN
ajst-2992	95	29	-	-	PUNCT
ajst-2992	95	30	drain	drain	NOUN
ajst-2992	95	31	parasitic	parasitic	ADJ
ajst-2992	95	32	capacitance	capacitance	NOUN
ajst-2992	95	33	can	can	AUX
ajst-2992	95	34	be	be	AUX
ajst-2992	95	35	obtained	obtain	VERB
ajst-2992	95	36	as	as	ADP
ajst-2992	95	37	101	101	NUM
ajst-2992	95	38	.	.	PUNCT
ajst-2992	96	1	to	to	PART
ajst-2992	96	2	facilitate	facilitate	VERB
ajst-2992	96	3	the	the	DET
ajst-2992	96	4	comparison	comparison	NOUN
ajst-2992	96	5	of	of	ADP
ajst-2992	96	6	the	the	DET
ajst-2992	96	7	impact	impact	NOUN
ajst-2992	96	8	on	on	ADP
ajst-2992	96	9	current	current	ADJ
ajst-2992	96	10	changes	change	NOUN
ajst-2992	96	11	,	,	PUNCT
ajst-2992	96	12	the	the	DET
ajst-2992	96	13	parasitic	parasitic	ADJ
ajst-2992	96	14	parameters	parameter	NOUN
ajst-2992	96	15	of	of	ADP
ajst-2992	96	16	gate	gate	NOUN
ajst-2992	96	17	-	-	PUNCT
ajst-2992	96	18	drain	drain	NOUN
ajst-2992	96	19	capacitance	capacitance	NOUN
ajst-2992	96	20	will	will	AUX
ajst-2992	96	21	be	be	AUX
ajst-2992	96	22	increased	increase	VERB
ajst-2992	96	23	in	in	ADP
ajst-2992	96	24	the	the	DET
ajst-2992	96	25	same	same	ADJ
ajst-2992	96	26	proportion	proportion	NOUN
ajst-2992	96	27	as	as	SCONJ
ajst-2992	96	28	shown	show	VERB
ajst-2992	96	29	in	in	ADP
ajst-2992	96	30	tab.12	tab.12	NOUN
ajst-2992	96	31	.	.	NOUN
ajst-2992	96	32	table	table	NOUN
ajst-2992	96	33	12	12	NUM
ajst-2992	96	34	.	.	PUNCT
ajst-2992	97	1	gate	gate	PROPN
ajst-2992	97	2	drain	drain	PROPN
ajst-2992	97	3	capacitance	capacitance	NOUN
ajst-2992	97	4	mismatch	mismatch	NOUN
ajst-2992	97	5	test	test	NOUN
ajst-2992	97	6	values	value	NOUN
ajst-2992	97	7	device	device	NOUN
ajst-2992	97	8	size	size	NOUN
ajst-2992	97	9	device	device	NOUN
ajst-2992	97	10	size	size	NOUN
ajst-2992	97	11	device	device	NOUN
ajst-2992	97	12	size	size	NOUN
ajst-2992	97	13	device	device	NOUN
ajst-2992	97	14	size	size	NOUN
ajst-2992	97	15	1nh	1nh	NOUN
ajst-2992	97	16	1nh	1nh	NOUN
ajst-2992	97	17	10pf	10pf	NOUN
ajst-2992	97	18	12pf	12pf	NOUN
ajst-2992	97	19	1nh	1nh	NOUN
ajst-2992	97	20	1nh	1nh	NOUN
ajst-2992	97	21	1000pf	1000pf	NOUN
ajst-2992	97	22	1000pf	1000pf	NOUN
ajst-2992	97	23	1nh	1nh	NOUN
ajst-2992	97	24	1nh	1nh	NOUN
ajst-2992	97	25	100pf	100pf	NOUN
ajst-2992	97	26	100pf	100pf	VERB
ajst-2992	97	27	1mω	1mω	ADJ
ajst-2992	97	28	1mω	1mω	ADJ
ajst-2992	97	29	l	l	NOUN
ajst-2992	97	30	100uh	100uh	PROPN
ajst-2992	97	31	1nf	1nf	ADJ
ajst-2992	97	32	20ω	20ω	NOUN
ajst-2992	97	33	20ω	20ω	PROPN
ajst-2992	98	1	1000uf	1000uf	PROPN
ajst-2992	98	2	500v	500v	PROPN
ajst-2992	98	3	20ω	20ω	NOUN
ajst-2992	98	4	20ω	20ω	NOUN
ajst-2992	98	5	figure	figure	VERB
ajst-2992	98	6	14	14	NUM
ajst-2992	98	7	.	.	PUNCT
ajst-2992	99	1	simulation	simulation	NOUN
ajst-2992	99	2	diagram	diagram	PROPN
ajst-2992	99	3	of	of	ADP
ajst-2992	99	4	gate	gate	PROPN
ajst-2992	99	5	capacitance	capacitance	NOUN
ajst-2992	99	6	mismatch	mismatch	NOUN
ajst-2992	100	1	i	i	NOUN
ajst-2992	100	2	d	d	PROPN
ajst-2992	100	3	/	/	PUNCT
ajst-2992	100	4	a	a	DET
ajst-2992	100	5	t	t	NOUN
ajst-2992	100	6	/	/	SYM
ajst-2992	100	7	µs	µs	NOUN
ajst-2992	101	1	i	i	PROPN
ajst-2992	101	2	d	d	PROPN
ajst-2992	101	3	/	/	SYM
ajst-2992	101	4	a	a	DET
ajst-2992	101	5	t	t	NOUN
ajst-2992	101	6	/	/	PUNCT
ajst-2992	101	7	µs	µs	PROPN
ajst-2992	101	8	t	t	PROPN
ajst-2992	101	9	/	/	PUNCT
ajst-2992	101	10	µs	µs	X
ajst-2992	102	1	i	i	PROPN
ajst-2992	102	2	d	d	PROPN
ajst-2992	102	3	/	/	SYM
ajst-2992	102	4	a	a	DET
ajst-2992	102	5	t	t	NOUN
ajst-2992	102	6	/	/	SYM
ajst-2992	102	7	µs	µs	NOUN
ajst-2992	102	8	252	252	NUM
ajst-2992	102	9	table	table	NOUN
ajst-2992	102	10	15	15	NUM
ajst-2992	102	11	.	.	PUNCT
ajst-2992	103	1	experimental	experimental	ADJ
ajst-2992	103	2	results	result	NOUN
ajst-2992	103	3	of	of	ADP
ajst-2992	103	4	gate	gate	NOUN
ajst-2992	103	5	drain	drain	NOUN
ajst-2992	103	6	capacitance	capacitance	NOUN
ajst-2992	103	7	difference	difference	NOUN
ajst-2992	103	8	in	in	ADP
ajst-2992	103	9	static	static	ADJ
ajst-2992	103	10	state	state	NOUN
ajst-2992	103	11	type	type	NOUN
ajst-2992	103	12	node1/(µs	node1/(µs	PROPN
ajst-2992	103	13	,	,	PUNCT
ajst-2992	103	14	a	a	PRON
ajst-2992	103	15	)	)	PUNCT
ajst-2992	103	16	node2/(µs	node2/(µs	PROPN
ajst-2992	103	17	,	,	PUNCT
ajst-2992	103	18	a	a	DET
ajst-2992	103	19	)	)	PUNCT
ajst-2992	103	20	di	di	NOUN
ajst-2992	103	21	/	/	SYM
ajst-2992	103	22	dt	dt	X
ajst-2992	103	23	4.82,4.36	4.82,4.36	NUM
ajst-2992	103	24	20.71,44.02	20.71,44.02	PROPN
ajst-2992	103	25	2.495e+6	2.495e+6	NUM
ajst-2992	103	26	4.82,4.36	4.82,4.36	NUM
ajst-2992	103	27	20.71,44.02	20.71,44.02	NUM
ajst-2992	103	28	2.495e+6	2.495e+6	NUM
ajst-2992	103	29	figure	figure	NOUN
ajst-2992	103	30	15	15	NUM
ajst-2992	103	31	.	.	PUNCT
ajst-2992	104	1	dynamic	dynamic	ADJ
ajst-2992	104	2	diagram	diagram	NOUN
ajst-2992	104	3	of	of	ADP
ajst-2992	104	4	gate	gate	PROPN
ajst-2992	104	5	drain	drain	NOUN
ajst-2992	104	6	capacitance	capacitance	NOUN
ajst-2992	104	7	mismatch	mismatch	NOUN
ajst-2992	104	8	at	at	ADP
ajst-2992	104	9	opening	opening	NOUN
ajst-2992	104	10	moment	moment	NOUN
ajst-2992	104	11	table	table	NOUN
ajst-2992	104	12	16	16	NUM
ajst-2992	104	13	.	.	PUNCT
ajst-2992	105	1	experimental	experimental	ADJ
ajst-2992	105	2	results	result	NOUN
ajst-2992	105	3	of	of	ADP
ajst-2992	105	4	difference	difference	NOUN
ajst-2992	105	5	of	of	ADP
ajst-2992	105	6	gate	gate	NOUN
ajst-2992	105	7	drain	drain	NOUN
ajst-2992	105	8	parasitic	parasitic	ADJ
ajst-2992	105	9	capacitance	capacitance	NOUN
ajst-2992	105	10	at	at	ADP
ajst-2992	105	11	opening	opening	NOUN
ajst-2992	105	12	moment	moment	NOUN
ajst-2992	105	13	type	type	NOUN
ajst-2992	105	14	node1/(µs	node1/(µs	PROPN
ajst-2992	105	15	,	,	PUNCT
ajst-2992	105	16	a	a	PRON
ajst-2992	105	17	)	)	PUNCT
ajst-2992	105	18	node2/(µs	node2/(µs	PROPN
ajst-2992	105	19	,	,	PUNCT
ajst-2992	105	20	a	a	DET
ajst-2992	105	21	)	)	PUNCT
ajst-2992	105	22	di	di	NOUN
ajst-2992	105	23	/	/	SYM
ajst-2992	105	24	dt	dt	NOUN
ajst-2992	105	25	∆	∆	PROPN
ajst-2992	105	26	/	/	SYM
ajst-2992	105	27	∆	∆	PROPN
ajst-2992	105	28	/	/	SYM
ajst-2992	106	1	25.06,7.70	25.06,7.70	NUM
ajst-2992	106	2	25.08,69.34	25.08,69.34	NOUN
ajst-2992	106	3	3.2e+9	3.2e+9	VERB
ajst-2992	106	4	77.09	77.09	NUM
ajst-2992	106	5	19.07	19.07	NUM
ajst-2992	106	6	25.06,7.19	25.06,7.19	NUM
ajst-2992	106	7	25.08,65.53	25.08,65.53	NOUN
ajst-2992	106	8	3.0e+9	3.0e+9	NOUN
ajst-2992	106	9	72.73	72.73	NUM
ajst-2992	106	10	19.11	19.11	NUM
ajst-2992	106	11	through	through	ADP
ajst-2992	106	12	the	the	DET
ajst-2992	106	13	simulation	simulation	NOUN
ajst-2992	106	14	results	result	NOUN
ajst-2992	106	15	at	at	ADP
ajst-2992	106	16	the	the	DET
ajst-2992	106	17	opening	opening	NOUN
ajst-2992	106	18	moment	moment	NOUN
ajst-2992	106	19	in	in	ADP
ajst-2992	106	20	tab.16	tab.16	PROPN
ajst-2992	106	21	,	,	PUNCT
ajst-2992	106	22	it	it	PRON
ajst-2992	106	23	can	can	AUX
ajst-2992	106	24	be	be	AUX
ajst-2992	106	25	inferred	infer	VERB
ajst-2992	106	26	that	that	SCONJ
ajst-2992	106	27	the	the	DET
ajst-2992	106	28	increase	increase	NOUN
ajst-2992	106	29	of	of	ADP
ajst-2992	106	30	gate	gate	NOUN
ajst-2992	106	31	-	-	PUNCT
ajst-2992	106	32	drain	drain	NOUN
ajst-2992	106	33	parasitic	parasitic	ADJ
ajst-2992	106	34	capacitance	capacitance	NOUN
ajst-2992	106	35	will	will	AUX
ajst-2992	106	36	lead	lead	VERB
ajst-2992	106	37	to	to	ADP
ajst-2992	106	38	the	the	DET
ajst-2992	106	39	decrease	decrease	NOUN
ajst-2992	106	40	of	of	ADP
ajst-2992	106	41	current	current	ADJ
ajst-2992	106	42	change	change	NOUN
ajst-2992	106	43	speed	speed	NOUN
ajst-2992	106	44	and	and	CCONJ
ajst-2992	106	45	peak	peak	NOUN
ajst-2992	106	46	current	current	NOUN
ajst-2992	106	47	during	during	ADP
ajst-2992	106	48	the	the	DET
ajst-2992	106	49	opening	opening	NOUN
ajst-2992	106	50	process	process	NOUN
ajst-2992	106	51	,	,	PUNCT
ajst-2992	106	52	but	but	CCONJ
ajst-2992	106	53	will	will	AUX
ajst-2992	106	54	prolong	prolong	VERB
ajst-2992	106	55	the	the	DET
ajst-2992	106	56	opening	opening	NOUN
ajst-2992	106	57	time	time	NOUN
ajst-2992	106	58	.	.	PUNCT
ajst-2992	107	1	figure	figure	NOUN
ajst-2992	107	2	16	16	NUM
ajst-2992	107	3	.	.	PUNCT
ajst-2992	108	1	dynamic	dynamic	ADJ
ajst-2992	108	2	diagram	diagram	NOUN
ajst-2992	108	3	of	of	ADP
ajst-2992	108	4	gate	gate	NOUN
ajst-2992	108	5	-	-	PUNCT
ajst-2992	108	6	drain	drain	NOUN
ajst-2992	108	7	capacitance	capacitance	NOUN
ajst-2992	108	8	mismatch	mismatch	NOUN
ajst-2992	108	9	at	at	ADP
ajst-2992	108	10	turn	turn	NOUN
ajst-2992	108	11	-	-	PUNCT
ajst-2992	108	12	off	off	ADP
ajst-2992	108	13	moment	moment	NOUN
ajst-2992	108	14	table	table	NOUN
ajst-2992	108	15	17	17	NUM
ajst-2992	108	16	.	.	PUNCT
ajst-2992	109	1	results	result	NOUN
ajst-2992	109	2	of	of	ADP
ajst-2992	109	3	gate	gate	NOUN
ajst-2992	109	4	-	-	PUNCT
ajst-2992	109	5	drain	drain	NOUN
ajst-2992	109	6	capacitance	capacitance	NOUN
ajst-2992	109	7	differences	difference	NOUN
ajst-2992	109	8	at	at	ADP
ajst-2992	109	9	the	the	DET
ajst-2992	109	10	moment	moment	NOUN
ajst-2992	109	11	of	of	ADP
ajst-2992	109	12	turn	turn	VERB
ajst-2992	109	13	-	-	PUNCT
ajst-2992	109	14	off	off	ADP
ajst-2992	109	15	type	type	NOUN
ajst-2992	109	16	node1/(µs	node1/(µs	PROPN
ajst-2992	109	17	,	,	PUNCT
ajst-2992	109	18	a	a	PRON
ajst-2992	109	19	)	)	PUNCT
ajst-2992	109	20	node2/(µs	node2/(µs	PROPN
ajst-2992	109	21	,	,	PUNCT
ajst-2992	109	22	a	a	DET
ajst-2992	109	23	)	)	PUNCT
ajst-2992	109	24	di	di	NOUN
ajst-2992	109	25	/	/	SYM
ajst-2992	109	26	dt	dt	NOUN
ajst-2992	109	27	∆	∆	PROPN
ajst-2992	109	28	/	/	SYM
ajst-2992	109	29	∆	∆	PROPN
ajst-2992	109	30	/	/	SYM
ajst-2992	110	1	23.09,44,72	23.09,44,72	PROPN
ajst-2992	110	2	23.14,4.91	23.14,4.91	PROPN
ajst-2992	110	3	-9.6e+8	-9.6e+8	PROPN
ajst-2992	110	4	-49.6	-49.6	PUNCT
ajst-2992	110	5	41.59	41.59	NUM
ajst-2992	110	6	23.10,44.72	23.10,44.72	NOUN
ajst-2992	110	7	23.14,5.00	23.14,5.00	NUM
ajst-2992	110	8	-1.1e+9	-1.1e+9	NOUN
ajst-2992	110	9	-49.4	-49.4	NUM
ajst-2992	110	10	36.97	36.97	NUM
ajst-2992	110	11	according	accord	VERB
ajst-2992	110	12	to	to	ADP
ajst-2992	110	13	the	the	DET
ajst-2992	110	14	simulation	simulation	NOUN
ajst-2992	110	15	results	result	NOUN
ajst-2992	110	16	of	of	ADP
ajst-2992	110	17	the	the	DET
ajst-2992	110	18	turn	turn	NOUN
ajst-2992	110	19	-	-	PUNCT
ajst-2992	110	20	off	off	ADP
ajst-2992	110	21	moment	moment	NOUN
ajst-2992	110	22	in	in	ADP
ajst-2992	110	23	tab.17	tab.17	PROPN
ajst-2992	110	24	,	,	PUNCT
ajst-2992	110	25	it	it	PRON
ajst-2992	110	26	can	can	AUX
ajst-2992	110	27	be	be	AUX
ajst-2992	110	28	inferred	infer	VERB
ajst-2992	110	29	that	that	SCONJ
ajst-2992	110	30	the	the	DET
ajst-2992	110	31	increase	increase	NOUN
ajst-2992	110	32	of	of	ADP
ajst-2992	110	33	gate	gate	NOUN
ajst-2992	110	34	-	-	PUNCT
ajst-2992	110	35	drain	drain	NOUN
ajst-2992	110	36	parasitic	parasitic	ADJ
ajst-2992	110	37	capacitance	capacitance	NOUN
ajst-2992	110	38	will	will	AUX
ajst-2992	110	39	lead	lead	VERB
ajst-2992	110	40	to	to	ADP
ajst-2992	110	41	not	not	PART
ajst-2992	110	42	only	only	ADV
ajst-2992	110	43	the	the	DET
ajst-2992	110	44	increase	increase	NOUN
ajst-2992	110	45	of	of	ADP
ajst-2992	110	46	current	current	ADJ
ajst-2992	110	47	change	change	NOUN
ajst-2992	110	48	speed	speed	NOUN
ajst-2992	110	49	,	,	PUNCT
ajst-2992	110	50	but	but	CCONJ
ajst-2992	110	51	also	also	ADV
ajst-2992	110	52	the	the	DET
ajst-2992	110	53	decrease	decrease	NOUN
ajst-2992	110	54	of	of	ADP
ajst-2992	110	55	current	current	ADJ
ajst-2992	110	56	change	change	NOUN
ajst-2992	110	57	and	and	CCONJ
ajst-2992	110	58	the	the	DET
ajst-2992	110	59	shortening	shortening	NOUN
ajst-2992	110	60	of	of	ADP
ajst-2992	110	61	turn	turn	NOUN
ajst-2992	110	62	-	-	PUNCT
ajst-2992	110	63	off	off	ADP
ajst-2992	110	64	time	time	NOUN
ajst-2992	110	65	in	in	ADP
ajst-2992	110	66	the	the	DET
ajst-2992	110	67	turn	turn	VERB
ajst-2992	110	68	-	-	PUNCT
ajst-2992	110	69	off	off	ADP
ajst-2992	110	70	process	process	NOUN
ajst-2992	110	71	.	.	PUNCT
ajst-2992	111	1	3.5	3.5	NUM
ajst-2992	111	2	.	.	PUNCT
ajst-2992	112	1	influence	influence	NOUN
ajst-2992	112	2	of	of	ADP
ajst-2992	112	3	device	device	NOUN
ajst-2992	112	4	temperature	temperature	NOUN
ajst-2992	112	5	difference	difference	NOUN
ajst-2992	112	6	due	due	ADP
ajst-2992	112	7	to	to	ADP
ajst-2992	112	8	the	the	DET
ajst-2992	112	9	asymmetric	asymmetric	ADJ
ajst-2992	112	10	heat	heat	NOUN
ajst-2992	112	11	dissipation	dissipation	NOUN
ajst-2992	112	12	condition	condition	NOUN
ajst-2992	112	13	and	and	CCONJ
ajst-2992	112	14	asymmetric	asymmetric	ADJ
ajst-2992	112	15	aging	aging	NOUN
ajst-2992	112	16	of	of	ADP
ajst-2992	112	17	the	the	DET
ajst-2992	112	18	device	device	NOUN
ajst-2992	112	19	,	,	PUNCT
ajst-2992	112	20	the	the	DET
ajst-2992	112	21	junction	junction	NOUN
ajst-2992	112	22	temperature	temperature	NOUN
ajst-2992	112	23	of	of	ADP
ajst-2992	112	24	the	the	DET
ajst-2992	112	25	device	device	NOUN
ajst-2992	112	26	will	will	AUX
ajst-2992	112	27	be	be	AUX
ajst-2992	112	28	different	different	ADJ
ajst-2992	112	29	during	during	ADP
ajst-2992	112	30	operation	operation	NOUN
ajst-2992	112	31	.	.	PUNCT
ajst-2992	113	1	since	since	SCONJ
ajst-2992	113	2	many	many	ADJ
ajst-2992	113	3	characteristic	characteristic	ADJ
ajst-2992	113	4	parameters	parameter	NOUN
ajst-2992	113	5	of	of	ADP
ajst-2992	113	6	sic	sic	ADJ
ajst-2992	113	7	mosfet	mosfet	NOUN
ajst-2992	113	8	devices	device	NOUN
ajst-2992	113	9	are	be	AUX
ajst-2992	113	10	extremely	extremely	ADV
ajst-2992	113	11	sensitive	sensitive	ADJ
ajst-2992	113	12	to	to	ADP
ajst-2992	113	13	temperature	temperature	NOUN
ajst-2992	113	14	,	,	PUNCT
ajst-2992	113	15	the	the	DET
ajst-2992	113	16	difference	difference	NOUN
ajst-2992	113	17	of	of	ADP
ajst-2992	113	18	operating	operate	VERB
ajst-2992	113	19	temperature	temperature	NOUN
ajst-2992	113	20	of	of	ADP
ajst-2992	113	21	devices	device	NOUN
ajst-2992	113	22	could	could	AUX
ajst-2992	113	23	also	also	ADV
ajst-2992	113	24	affect	affect	VERB
ajst-2992	113	25	the	the	DET
ajst-2992	113	26	unbalance	unbalance	NOUN
ajst-2992	113	27	current	current	NOUN
ajst-2992	113	28	of	of	ADP
ajst-2992	113	29	parallel	parallel	ADJ
ajst-2992	113	30	devices	device	NOUN
ajst-2992	113	31	.	.	PUNCT
ajst-2992	114	1	in	in	ADP
ajst-2992	114	2	the	the	DET
ajst-2992	114	3	on	on	ADP
ajst-2992	114	4	-	-	PUNCT
ajst-2992	114	5	state	state	NOUN
ajst-2992	114	6	,	,	PUNCT
ajst-2992	114	7	the	the	DET
ajst-2992	114	8	temperature	temperature	NOUN
ajst-2992	114	9	function	function	NOUN
ajst-2992	114	10	of	of	ADP
ajst-2992	114	11	the	the	DET
ajst-2992	114	12	on	on	ADP
ajst-2992	114	13	-	-	PUNCT
ajst-2992	114	14	resistance	resistance	NOUN
ajst-2992	114	15	is	be	AUX
ajst-2992	114	16	shown	show	VERB
ajst-2992	114	17	below	below	ADV
ajst-2992	114	18	.	.	PUNCT
ajst-2992	115	1	25	25	NUM
ajst-2992	115	2	1	1	NUM
ajst-2992	115	3	(	(	PUNCT
ajst-2992	115	4	1	1	NUM
ajst-2992	115	5	)	)	PUNCT
ajst-2992	115	6	figure	figure	NOUN
ajst-2992	115	7	17	17	NUM
ajst-2992	115	8	.	.	PUNCT
ajst-2992	116	1	curve	curve	NOUN
ajst-2992	116	2	of	of	ADP
ajst-2992	116	3	rdson	rdson	NOUN
ajst-2992	116	4	and	and	CCONJ
ajst-2992	116	5	temperature	temperature	NOUN
ajst-2992	116	6	change	change	NOUN
ajst-2992	116	7	combined	combine	VERB
ajst-2992	116	8	with	with	ADP
ajst-2992	116	9	rds	rds	NOUN
ajst-2992	116	10	and	and	CCONJ
ajst-2992	116	11	temperature	temperature	NOUN
ajst-2992	116	12	change	change	NOUN
ajst-2992	116	13	curve	curve	NOUN
ajst-2992	116	14	,	,	PUNCT
ajst-2992	116	15	as	as	SCONJ
ajst-2992	116	16	shown	show	VERB
ajst-2992	116	17	in	in	ADP
ajst-2992	116	18	fig.17	fig.17	NOUN
ajst-2992	116	19	,	,	PUNCT
ajst-2992	116	20	under	under	ADP
ajst-2992	116	21	normal	normal	ADJ
ajst-2992	116	22	working	working	NOUN
ajst-2992	116	23	conditions	condition	NOUN
ajst-2992	116	24	,	,	PUNCT
ajst-2992	116	25	with	with	ADP
ajst-2992	116	26	the	the	DET
ajst-2992	116	27	increase	increase	NOUN
ajst-2992	116	28	of	of	ADP
ajst-2992	116	29	temperature	temperature	NOUN
ajst-2992	116	30	,	,	PUNCT
ajst-2992	116	31	the	the	DET
ajst-2992	116	32	resistance	resistance	NOUN
ajst-2992	116	33	value	value	NOUN
ajst-2992	116	34	of	of	ADP
ajst-2992	116	35	the	the	DET
ajst-2992	116	36	onresistance	onresistance	NOUN
ajst-2992	116	37	will	will	AUX
ajst-2992	116	38	increase	increase	VERB
ajst-2992	116	39	.	.	PUNCT
ajst-2992	117	1	in	in	ADP
ajst-2992	117	2	order	order	NOUN
ajst-2992	117	3	to	to	PART
ajst-2992	117	4	detect	detect	VERB
ajst-2992	117	5	the	the	DET
ajst-2992	117	6	specific	specific	ADJ
ajst-2992	117	7	influence	influence	NOUN
ajst-2992	117	8	brought	bring	VERB
ajst-2992	117	9	by	by	ADP
ajst-2992	117	10	temperature	temperature	NOUN
ajst-2992	117	11	,	,	PUNCT
ajst-2992	117	12	tj1	tj1	NOUN
ajst-2992	117	13	=	=	NOUN
ajst-2992	117	14	50	50	NUM
ajst-2992	117	15	c	c	NOUN
ajst-2992	117	16	and	and	CCONJ
ajst-2992	117	17	tj2	tj2	NOUN
ajst-2992	117	18	=	=	NUM
ajst-2992	118	1	75	75	NUM
ajst-2992	118	2	c	c	NOUN
ajst-2992	118	3	were	be	AUX
ajst-2992	118	4	set	set	VERB
ajst-2992	118	5	during	during	ADP
ajst-2992	118	6	the	the	DET
ajst-2992	118	7	experiment	experiment	NOUN
ajst-2992	118	8	.	.	PUNCT
ajst-2992	119	1	figure	figure	NOUN
ajst-2992	119	2	18	18	NUM
ajst-2992	119	3	.	.	PUNCT
ajst-2992	120	1	simulation	simulation	NOUN
ajst-2992	120	2	diagram	diagram	NOUN
ajst-2992	120	3	of	of	ADP
ajst-2992	120	4	temperature	temperature	NOUN
ajst-2992	120	5	mismatch	mismatch	NOUN
ajst-2992	120	6	table	table	NOUN
ajst-2992	120	7	18	18	NUM
ajst-2992	120	8	.	.	PUNCT
ajst-2992	121	1	temperature	temperature	NOUN
ajst-2992	121	2	differences	difference	NOUN
ajst-2992	121	3	in	in	ADP
ajst-2992	121	4	static	static	ADJ
ajst-2992	121	5	results	result	NOUN
ajst-2992	121	6	type	type	VERB
ajst-2992	121	7	node1/(µs	node1/(µs	PROPN
ajst-2992	121	8	,	,	PUNCT
ajst-2992	121	9	a	a	PRON
ajst-2992	121	10	)	)	PUNCT
ajst-2992	121	11	node2/(µs	node2/(µs	PROPN
ajst-2992	121	12	,	,	PUNCT
ajst-2992	121	13	a	a	DET
ajst-2992	121	14	)	)	PUNCT
ajst-2992	121	15	di	di	NOUN
ajst-2992	121	16	/	/	SYM
ajst-2992	121	17	dt	dt	PUNCT
ajst-2992	121	18	∆	∆	PROPN
ajst-2992	121	19	/a	/a	PUNCT
ajst-2992	122	1	5.42,6.12	5.42,6.12	NUM
ajst-2992	122	2	21.57,48.70	21.57,48.70	ADJ
ajst-2992	122	3	2.63e+6	2.63e+6	NUM
ajst-2992	122	4	60.37	60.37	NUM
ajst-2992	122	5	5.42,5.60	5.42,5.60	NUM
ajst-2992	122	6	21.57,43.61	21.57,43.61	NOUN
ajst-2992	122	7	2.35e+6	2.35e+6	NUM
ajst-2992	122	8	54.00	54.00	NUM
ajst-2992	122	9	by	by	ADP
ajst-2992	122	10	comparing	compare	VERB
ajst-2992	122	11	the	the	DET
ajst-2992	122	12	simulation	simulation	NOUN
ajst-2992	122	13	results	result	NOUN
ajst-2992	122	14	of	of	ADP
ajst-2992	122	15	tab.18	tab.18	PROPN
ajst-2992	122	16	at	at	ADP
ajst-2992	122	17	different	different	ADJ
ajst-2992	122	18	temperatures	temperature	NOUN
ajst-2992	122	19	under	under	ADP
ajst-2992	122	20	static	static	ADJ
ajst-2992	122	21	conditions	condition	NOUN
ajst-2992	122	22	,	,	PUNCT
ajst-2992	122	23	it	it	PRON
ajst-2992	122	24	can	can	AUX
ajst-2992	122	25	be	be	AUX
ajst-2992	122	26	inferred	infer	VERB
ajst-2992	122	27	that	that	SCONJ
ajst-2992	122	28	the	the	DET
ajst-2992	122	29	increase	increase	NOUN
ajst-2992	122	30	of	of	ADP
ajst-2992	122	31	node	node	ADJ
ajst-2992	122	32	temperature	temperature	NOUN
ajst-2992	122	33	will	will	AUX
ajst-2992	122	34	lead	lead	VERB
ajst-2992	122	35	to	to	ADP
ajst-2992	122	36	the	the	DET
ajst-2992	122	37	decrease	decrease	NOUN
ajst-2992	122	38	of	of	ADP
ajst-2992	122	39	current	current	ADJ
ajst-2992	122	40	change	change	NOUN
ajst-2992	122	41	speed	speed	NOUN
ajst-2992	122	42	and	and	CCONJ
ajst-2992	122	43	peak	peak	NOUN
ajst-2992	122	44	current	current	NOUN
ajst-2992	122	45	in	in	ADP
ajst-2992	122	46	the	the	DET
ajst-2992	122	47	static	static	NOUN
ajst-2992	122	48	working	work	VERB
ajst-2992	123	1	i	i	PRON
ajst-2992	124	1	d	d	PROPN
ajst-2992	124	2	/	/	SYM
ajst-2992	124	3	a	a	DET
ajst-2992	124	4	t	t	NOUN
ajst-2992	124	5	/	/	PUNCT
ajst-2992	124	6	µs	µs	PROPN
ajst-2992	124	7	t	t	PROPN
ajst-2992	124	8	/	/	PUNCT
ajst-2992	124	9	µs	µs	PROPN
ajst-2992	124	10	t	t	PROPN
ajst-2992	124	11	/	/	PUNCT
ajst-2992	124	12	µs	µs	X
ajst-2992	125	1	i	i	PROPN
ajst-2992	125	2	d	d	PROPN
ajst-2992	125	3	/	/	PUNCT
ajst-2992	126	1	a	a	PRON
ajst-2992	126	2	i	i	NOUN
ajst-2992	126	3	d	d	PROPN
ajst-2992	126	4	/	/	PUNCT
ajst-2992	126	5	a	a	DET
ajst-2992	126	6	253	253	NUM
ajst-2992	126	7	process	process	NOUN
ajst-2992	126	8	.	.	PUNCT
ajst-2992	127	1	figure	figure	NOUN
ajst-2992	127	2	19	19	NUM
ajst-2992	127	3	.	.	PUNCT
ajst-2992	127	4	simulation	simulation	NOUN
ajst-2992	127	5	diagram	diagram	NOUN
ajst-2992	127	6	of	of	ADP
ajst-2992	127	7	temperature	temperature	NOUN
ajst-2992	127	8	mismatch	mismatch	NOUN
ajst-2992	127	9	at	at	ADP
ajst-2992	127	10	the	the	DET
ajst-2992	127	11	opening	opening	NOUN
ajst-2992	127	12	moment	moment	NOUN
ajst-2992	127	13	table	table	NOUN
ajst-2992	127	14	19	19	NUM
ajst-2992	127	15	.	.	PUNCT
ajst-2992	128	1	results	result	NOUN
ajst-2992	128	2	of	of	ADP
ajst-2992	128	3	temperature	temperature	NOUN
ajst-2992	128	4	difference	difference	NOUN
ajst-2992	128	5	at	at	ADP
ajst-2992	128	6	opening	opening	NOUN
ajst-2992	128	7	moment	moment	NOUN
ajst-2992	128	8	type	type	NOUN
ajst-2992	128	9	node1/(µs	node1/(µs	PROPN
ajst-2992	128	10	,	,	PUNCT
ajst-2992	128	11	a	a	PRON
ajst-2992	128	12	)	)	PUNCT
ajst-2992	128	13	node2/(µs	node2/(µs	PROPN
ajst-2992	128	14	,	,	PUNCT
ajst-2992	128	15	a	a	DET
ajst-2992	128	16	)	)	PUNCT
ajst-2992	128	17	di	di	NOUN
ajst-2992	128	18	/	/	SYM
ajst-2992	128	19	dt	dt	NOUN
ajst-2992	128	20	∆	∆	PROPN
ajst-2992	129	1	/	/	SYM
ajst-2992	129	2	∆	∆	PROPN
ajst-2992	129	3	/	/	SYM
ajst-2992	129	4	25.05,7.17	25.05,7.17	NUM
ajst-2992	129	5	25.08,64.44	25.08,64.44	NUM
ajst-2992	129	6	3.1e+9	3.1e+9	PROPN
ajst-2992	129	7	71.42	71.42	NUM
ajst-2992	129	8	18.48	18.48	NUM
ajst-2992	129	9	25.06,7.90	25.06,7.90	NUM
ajst-2992	129	10	25.08,71.48	25.08,71.48	NOUN
ajst-2992	129	11	3.2e+9	3.2e+9	VERB
ajst-2992	129	12	79.50	79.50	NUM
ajst-2992	129	13	19.58	19.58	NUM
ajst-2992	129	14	by	by	ADP
ajst-2992	129	15	comparing	compare	VERB
ajst-2992	129	16	the	the	DET
ajst-2992	129	17	simulation	simulation	NOUN
ajst-2992	129	18	results	result	NOUN
ajst-2992	129	19	of	of	ADP
ajst-2992	129	20	tab.19	tab.19	PRON
ajst-2992	129	21	at	at	ADP
ajst-2992	129	22	different	different	ADJ
ajst-2992	129	23	temperatures	temperature	NOUN
ajst-2992	129	24	in	in	ADP
ajst-2992	129	25	the	the	DET
ajst-2992	129	26	opening	opening	NOUN
ajst-2992	129	27	moment	moment	NOUN
ajst-2992	129	28	,	,	PUNCT
ajst-2992	129	29	the	the	DET
ajst-2992	129	30	increase	increase	NOUN
ajst-2992	129	31	of	of	ADP
ajst-2992	129	32	node	node	ADJ
ajst-2992	129	33	temperature	temperature	NOUN
ajst-2992	129	34	will	will	AUX
ajst-2992	129	35	lead	lead	VERB
ajst-2992	129	36	to	to	ADP
ajst-2992	129	37	the	the	DET
ajst-2992	129	38	decrease	decrease	NOUN
ajst-2992	129	39	of	of	ADP
ajst-2992	129	40	peak	peak	NOUN
ajst-2992	129	41	current	current	NOUN
ajst-2992	129	42	during	during	ADP
ajst-2992	129	43	the	the	DET
ajst-2992	129	44	opening	opening	NOUN
ajst-2992	129	45	process	process	NOUN
ajst-2992	129	46	.	.	PUNCT
ajst-2992	130	1	figure	figure	NOUN
ajst-2992	130	2	20	20	NUM
ajst-2992	130	3	.	.	PUNCT
ajst-2992	131	1	simulation	simulation	NOUN
ajst-2992	131	2	diagram	diagram	NOUN
ajst-2992	131	3	of	of	ADP
ajst-2992	131	4	temperature	temperature	NOUN
ajst-2992	131	5	mismatch	mismatch	NOUN
ajst-2992	131	6	at	at	ADP
ajst-2992	131	7	the	the	DET
ajst-2992	131	8	turn	turn	VERB
ajst-2992	131	9	-	-	PUNCT
ajst-2992	131	10	off	off	ADP
ajst-2992	131	11	moment	moment	NOUN
ajst-2992	131	12	table	table	NOUN
ajst-2992	131	13	20	20	NUM
ajst-2992	131	14	.	.	PUNCT
ajst-2992	132	1	experimental	experimental	ADJ
ajst-2992	132	2	results	result	NOUN
ajst-2992	132	3	of	of	ADP
ajst-2992	132	4	temperature	temperature	NOUN
ajst-2992	132	5	difference	difference	NOUN
ajst-2992	132	6	at	at	ADP
ajst-2992	132	7	the	the	DET
ajst-2992	132	8	turn	turn	NOUN
ajst-2992	132	9	-	-	PUNCT
ajst-2992	132	10	off	off	ADP
ajst-2992	132	11	moment	moment	NOUN
ajst-2992	132	12	type	type	NOUN
ajst-2992	132	13	node1/(µs	node1/(µs	PROPN
ajst-2992	132	14	,	,	PUNCT
ajst-2992	132	15	a	a	PRON
ajst-2992	132	16	)	)	PUNCT
ajst-2992	132	17	node2/(µs	node2/(µs	PROPN
ajst-2992	132	18	,	,	PUNCT
ajst-2992	132	19	a	a	DET
ajst-2992	132	20	)	)	PUNCT
ajst-2992	132	21	di	di	NOUN
ajst-2992	132	22	/	/	SYM
ajst-2992	132	23	dt	dt	NOUN
ajst-2992	132	24	∆	∆	PROPN
ajst-2992	132	25	/	/	SYM
ajst-2992	132	26	∆	∆	PROPN
ajst-2992	132	27	/	/	SYM
ajst-2992	132	28	23.08,47.15	23.08,47.15	NUM
ajst-2992	132	29	23.13,5.13	23.13,5.13	NUM
ajst-2992	133	1	-7.87e+8	-7.87e+8	X
ajst-2992	133	2	-52.32	-52.32	PROPN
ajst-2992	133	3	53.38	53.38	NUM
ajst-2992	133	4	23.10,45.25	23.10,45.25	NUM
ajst-2992	134	1	23.14,4.98	23.14,4.98	NUM
ajst-2992	134	2	-1.31e+9	-1.31e+9	NOUN
ajst-2992	134	3	-49.76	-49.76	PROPN
ajst-2992	134	4	30.53	30.53	NUM
ajst-2992	134	5	by	by	ADP
ajst-2992	134	6	comparing	compare	VERB
ajst-2992	134	7	the	the	DET
ajst-2992	134	8	simulation	simulation	NOUN
ajst-2992	134	9	results	result	NOUN
ajst-2992	134	10	of	of	ADP
ajst-2992	134	11	tab.20	tab.20	PROPN
ajst-2992	134	12	at	at	ADP
ajst-2992	134	13	different	different	ADJ
ajst-2992	134	14	temperatures	temperature	NOUN
ajst-2992	134	15	in	in	ADP
ajst-2992	134	16	the	the	DET
ajst-2992	134	17	turn	turn	NOUN
ajst-2992	134	18	-	-	PUNCT
ajst-2992	134	19	off	off	ADP
ajst-2992	134	20	moment	moment	NOUN
ajst-2992	134	21	,	,	PUNCT
ajst-2992	134	22	it	it	PRON
ajst-2992	134	23	can	can	AUX
ajst-2992	134	24	be	be	AUX
ajst-2992	134	25	inferred	infer	VERB
ajst-2992	134	26	that	that	SCONJ
ajst-2992	134	27	the	the	DET
ajst-2992	134	28	increase	increase	NOUN
ajst-2992	134	29	of	of	ADP
ajst-2992	134	30	node	node	ADJ
ajst-2992	134	31	temperature	temperature	NOUN
ajst-2992	134	32	will	will	AUX
ajst-2992	134	33	lead	lead	VERB
ajst-2992	134	34	to	to	ADP
ajst-2992	134	35	the	the	DET
ajst-2992	134	36	increase	increase	NOUN
ajst-2992	134	37	of	of	ADP
ajst-2992	134	38	current	current	ADJ
ajst-2992	134	39	change	change	NOUN
ajst-2992	134	40	velocity	velocity	NOUN
ajst-2992	134	41	and	and	CCONJ
ajst-2992	134	42	shortening	shortening	NOUN
ajst-2992	134	43	of	of	ADP
ajst-2992	134	44	shutdown	shutdown	ADJ
ajst-2992	134	45	time	time	NOUN
ajst-2992	134	46	during	during	ADP
ajst-2992	134	47	the	the	DET
ajst-2992	134	48	shutdown	shutdown	NOUN
ajst-2992	134	49	process	process	NOUN
ajst-2992	134	50	.	.	PUNCT
ajst-2992	135	1	it	it	PRON
ajst-2992	135	2	can	can	AUX
ajst-2992	135	3	be	be	AUX
ajst-2992	135	4	found	find	VERB
ajst-2992	135	5	that	that	SCONJ
ajst-2992	135	6	with	with	ADP
ajst-2992	135	7	the	the	DET
ajst-2992	135	8	increase	increase	NOUN
ajst-2992	135	9	of	of	ADP
ajst-2992	135	10	junction	junction	NOUN
ajst-2992	135	11	temperature	temperature	NOUN
ajst-2992	135	12	,	,	PUNCT
ajst-2992	135	13	the	the	DET
ajst-2992	135	14	on	on	ADP
ajst-2992	135	15	-	-	PUNCT
ajst-2992	135	16	resistance	resistance	NOUN
ajst-2992	135	17	of	of	ADP
ajst-2992	135	18	the	the	DET
ajst-2992	135	19	device	device	NOUN
ajst-2992	135	20	increases	increase	NOUN
ajst-2992	135	21	and	and	CCONJ
ajst-2992	135	22	the	the	DET
ajst-2992	135	23	threshold	threshold	NOUN
ajst-2992	135	24	voltage	voltage	NOUN
ajst-2992	135	25	decreases	decrease	VERB
ajst-2992	135	26	.	.	PUNCT
ajst-2992	136	1	in	in	ADP
ajst-2992	136	2	the	the	DET
ajst-2992	136	3	steady	steady	ADJ
ajst-2992	136	4	state	state	NOUN
ajst-2992	136	5	,	,	PUNCT
ajst-2992	136	6	experimental	experimental	ADJ
ajst-2992	136	7	device	device	NOUN
ajst-2992	136	8	one	one	NUM
ajst-2992	136	9	(	(	PUNCT
ajst-2992	136	10	junction	junction	NOUN
ajst-2992	136	11	temperature	temperature	NOUN
ajst-2992	136	12	50	50	NUM
ajst-2992	136	13	degrees	degree	NOUN
ajst-2992	136	14	)	)	PUNCT
ajst-2992	136	15	shares	share	NOUN
ajst-2992	136	16	more	more	ADV
ajst-2992	136	17	current	current	ADJ
ajst-2992	136	18	than	than	ADP
ajst-2992	136	19	experimental	experimental	ADJ
ajst-2992	136	20	device	device	NOUN
ajst-2992	136	21	two	two	NUM
ajst-2992	136	22	(	(	PUNCT
ajst-2992	136	23	junction	junction	NOUN
ajst-2992	136	24	temperature	temperature	NOUN
ajst-2992	136	25	75	75	NUM
ajst-2992	136	26	degrees	degree	NOUN
ajst-2992	136	27	)	)	PUNCT
ajst-2992	136	28	.	.	PUNCT
ajst-2992	137	1	in	in	ADP
ajst-2992	137	2	the	the	DET
ajst-2992	137	3	dynamic	dynamic	ADJ
ajst-2992	137	4	process	process	NOUN
ajst-2992	137	5	,	,	PUNCT
ajst-2992	137	6	the	the	DET
ajst-2992	137	7	junction	junction	NOUN
ajst-2992	137	8	temperature	temperature	NOUN
ajst-2992	137	9	of	of	ADP
ajst-2992	137	10	the	the	DET
ajst-2992	137	11	device	device	NOUN
ajst-2992	137	12	is	be	AUX
ajst-2992	137	13	higher	high	ADJ
ajst-2992	137	14	,	,	PUNCT
ajst-2992	137	15	the	the	DET
ajst-2992	137	16	threshold	threshold	NOUN
ajst-2992	137	17	voltage	voltage	NOUN
ajst-2992	137	18	is	be	AUX
ajst-2992	137	19	smaller	small	ADJ
ajst-2992	137	20	,	,	PUNCT
ajst-2992	137	21	and	and	CCONJ
ajst-2992	137	22	the	the	DET
ajst-2992	137	23	current	current	NOUN
ajst-2992	137	24	is	be	AUX
ajst-2992	137	25	larger	large	ADJ
ajst-2992	137	26	4	4	NUM
ajst-2992	137	27	.	.	NOUN
ajst-2992	137	28	conclusion	conclusion	NOUN
ajst-2992	137	29	and	and	CCONJ
ajst-2992	137	30	prospect	prospect	NOUN
ajst-2992	137	31	4.1	4.1	NUM
ajst-2992	137	32	.	.	PUNCT
ajst-2992	138	1	explore	explore	VERB
ajst-2992	138	2	the	the	DET
ajst-2992	138	3	most	most	ADV
ajst-2992	138	4	influential	influential	ADJ
ajst-2992	138	5	factors	factor	NOUN
ajst-2992	138	6	for	for	ADP
ajst-2992	138	7	current	current	ADJ
ajst-2992	138	8	variation	variation	NOUN
ajst-2992	138	9	to	to	PART
ajst-2992	138	10	facilitate	facilitate	VERB
ajst-2992	138	11	the	the	DET
ajst-2992	138	12	comparison	comparison	NOUN
ajst-2992	138	13	of	of	ADP
ajst-2992	138	14	drain	drain	NOUN
ajst-2992	138	15	inductance	inductance	NOUN
ajst-2992	138	16	and	and	CCONJ
ajst-2992	138	17	source	source	NOUN
ajst-2992	138	18	inductance	inductance	NOUN
ajst-2992	138	19	,	,	PUNCT
ajst-2992	138	20	the	the	DET
ajst-2992	138	21	influence	influence	NOUN
ajst-2992	138	22	degree	degree	NOUN
ajst-2992	138	23	of	of	ADP
ajst-2992	138	24	gate	gate	NOUN
ajst-2992	138	25	-	-	PUNCT
ajst-2992	138	26	source	source	NOUN
ajst-2992	138	27	capacitance	capacitance	NOUN
ajst-2992	138	28	and	and	CCONJ
ajst-2992	138	29	gate	gate	NOUN
ajst-2992	138	30	-	-	PUNCT
ajst-2992	138	31	drain	drain	NOUN
ajst-2992	138	32	capacitance	capacitance	NOUN
ajst-2992	138	33	on	on	ADP
ajst-2992	138	34	the	the	DET
ajst-2992	138	35	current	current	ADJ
ajst-2992	138	36	change	change	NOUN
ajst-2992	138	37	velocity	velocity	NOUN
ajst-2992	138	38	,	,	PUNCT
ajst-2992	138	39	maximum	maximum	ADJ
ajst-2992	138	40	current	current	ADJ
ajst-2992	138	41	difference	difference	NOUN
ajst-2992	138	42	and	and	CCONJ
ajst-2992	138	43	opening	opening	NOUN
ajst-2992	138	44	time	time	NOUN
ajst-2992	138	45	,	,	PUNCT
ajst-2992	138	46	the	the	DET
ajst-2992	138	47	current	current	ADJ
ajst-2992	138	48	change	change	NOUN
ajst-2992	138	49	ratio	ratio	NOUN
ajst-2992	138	50	is	be	AUX
ajst-2992	138	51	defined	define	VERB
ajst-2992	138	52	as	as	ADP
ajst-2992	138	53	the	the	DET
ajst-2992	138	54	ratio	ratio	NOUN
ajst-2992	138	55	of	of	ADP
ajst-2992	138	56	the	the	DET
ajst-2992	138	57	current	current	ADJ
ajst-2992	138	58	change	change	NOUN
ajst-2992	138	59	velocity	velocity	NOUN
ajst-2992	138	60	of	of	ADP
ajst-2992	138	61	two	two	NUM
ajst-2992	138	62	parallel	parallel	ADJ
ajst-2992	138	63	devices	device	NOUN
ajst-2992	138	64	to	to	ADP
ajst-2992	138	65	the	the	DET
ajst-2992	138	66	current	current	ADJ
ajst-2992	138	67	change	change	NOUN
ajst-2992	138	68	value	value	NOUN
ajst-2992	138	69	of	of	ADP
ajst-2992	138	70	the	the	DET
ajst-2992	138	71	device	device	NOUN
ajst-2992	138	72	without	without	ADP
ajst-2992	138	73	change	change	NOUN
ajst-2992	138	74	.	.	PUNCT
ajst-2992	139	1	the	the	DET
ajst-2992	139	2	time	time	NOUN
ajst-2992	139	3	change	change	NOUN
ajst-2992	139	4	ratio	ratio	NOUN
ajst-2992	139	5	is	be	AUX
ajst-2992	139	6	the	the	DET
ajst-2992	139	7	time	time	NOUN
ajst-2992	139	8	change	change	NOUN
ajst-2992	139	9	value	value	NOUN
ajst-2992	139	10	of	of	ADP
ajst-2992	139	11	two	two	NUM
ajst-2992	139	12	parallel	parallel	ADJ
ajst-2992	139	13	devices	device	NOUN
ajst-2992	139	14	compared	compare	VERB
ajst-2992	139	15	with	with	ADP
ajst-2992	139	16	the	the	DET
ajst-2992	139	17	time	time	NOUN
ajst-2992	139	18	change	change	NOUN
ajst-2992	139	19	value	value	NOUN
ajst-2992	139	20	of	of	ADP
ajst-2992	139	21	the	the	DET
ajst-2992	139	22	device	device	NOUN
ajst-2992	139	23	without	without	ADP
ajst-2992	139	24	change	change	NOUN
ajst-2992	139	25	.	.	PUNCT
ajst-2992	140	1	the	the	DET
ajst-2992	140	2	ratio	ratio	NOUN
ajst-2992	140	3	of	of	ADP
ajst-2992	140	4	the	the	DET
ajst-2992	140	5	maximum	maximum	ADJ
ajst-2992	140	6	current	current	ADJ
ajst-2992	140	7	difference	difference	NOUN
ajst-2992	140	8	of	of	ADP
ajst-2992	140	9	the	the	DET
ajst-2992	140	10	two	two	NUM
ajst-2992	140	11	parallel	parallel	ADJ
ajst-2992	140	12	devices	device	NOUN
ajst-2992	140	13	is	be	AUX
ajst-2992	140	14	the	the	DET
ajst-2992	140	15	maximum	maximum	ADJ
ajst-2992	140	16	current	current	ADJ
ajst-2992	140	17	difference	difference	NOUN
ajst-2992	140	18	of	of	ADP
ajst-2992	140	19	the	the	DET
ajst-2992	140	20	device	device	NOUN
ajst-2992	140	21	with	with	ADP
ajst-2992	140	22	no	no	DET
ajst-2992	140	23	change	change	NOUN
ajst-2992	140	24	in	in	ADP
ajst-2992	140	25	the	the	DET
ajst-2992	140	26	ratio	ratio	NOUN
ajst-2992	140	27	.	.	PUNCT
ajst-2992	141	1	the	the	DET
ajst-2992	141	2	specific	specific	ADJ
ajst-2992	141	3	formula	formula	NOUN
ajst-2992	141	4	is	be	AUX
ajst-2992	141	5	as	as	SCONJ
ajst-2992	141	6	follows	follow	VERB
ajst-2992	141	7	:	:	PUNCT
ajst-2992	141	8	current	current	ADJ
ajst-2992	141	9	change	change	NOUN
ajst-2992	141	10	ratio	ratio	NOUN
ajst-2992	141	11	:	:	PUNCT
ajst-2992	142	1	η1=|	η1=|	PROPN
ajst-2992	142	2	⁄	⁄	PROPN
ajst-2992	142	3	⁄	⁄	PROPN
ajst-2992	142	4	⁄	⁄	PROPN
ajst-2992	143	1	|	|	CCONJ
ajst-2992	143	2	(	(	PUNCT
ajst-2992	143	3	2	2	NUM
ajst-2992	143	4	)	)	PUNCT
ajst-2992	143	5	maximum	maximum	ADJ
ajst-2992	143	6	current	current	ADJ
ajst-2992	143	7	difference	difference	NOUN
ajst-2992	143	8	ratio	ratio	NOUN
ajst-2992	143	9	:	:	PUNCT
ajst-2992	143	10	η2=|	η2=|	PROPN
ajst-2992	143	11	∆	∆	PROPN
ajst-2992	143	12	∆	∆	X
ajst-2992	143	13	∆	∆	X
ajst-2992	144	1	|	|	CCONJ
ajst-2992	144	2	(	(	PUNCT
ajst-2992	144	3	3	3	NUM
ajst-2992	144	4	)	)	PUNCT
ajst-2992	144	5	time	time	NOUN
ajst-2992	144	6	change	change	NOUN
ajst-2992	144	7	ratio	ratio	NOUN
ajst-2992	144	8	:	:	PUNCT
ajst-2992	144	9	η3=|	η3=|	PROPN
ajst-2992	144	10	∆	∆	PROPN
ajst-2992	144	11	∆	∆	X
ajst-2992	144	12	∆	∆	X
ajst-2992	145	1	|	|	CCONJ
ajst-2992	145	2	(	(	PUNCT
ajst-2992	145	3	4	4	X
ajst-2992	145	4	)	)	PUNCT
ajst-2992	145	5	the	the	DET
ajst-2992	145	6	relevant	relevant	ADJ
ajst-2992	145	7	data	datum	NOUN
ajst-2992	145	8	are	be	AUX
ajst-2992	145	9	shown	show	VERB
ajst-2992	145	10	in	in	ADP
ajst-2992	145	11	the	the	DET
ajst-2992	145	12	figure	figure	NOUN
ajst-2992	145	13	below	below	ADP
ajst-2992	145	14	：	：	PUNCT
ajst-2992	145	15	table	table	NOUN
ajst-2992	145	16	21	21	NUM
ajst-2992	145	17	.	.	PUNCT
ajst-2992	146	1	ratio	ratio	NOUN
ajst-2992	146	2	of	of	ADP
ajst-2992	146	3	drain	drain	NOUN
ajst-2992	146	4	inductance	inductance	NOUN
ajst-2992	146	5	to	to	PART
ajst-2992	146	6	source	source	VERB
ajst-2992	146	7	inductance	inductance	NOUN
ajst-2992	146	8	in	in	ADP
ajst-2992	146	9	static	static	ADJ
ajst-2992	146	10	state	state	NOUN
ajst-2992	146	11	influence	influence	NOUN
ajst-2992	146	12	factor	factor	NOUN
ajst-2992	146	13	η1	η1	NOUN
ajst-2992	146	14	η2	η2	PROPN
ajst-2992	146	15	drain	drain	NOUN
ajst-2992	146	16	inductance	inductance	NOUN
ajst-2992	146	17	0.0012	0.0012	NUM
ajst-2992	146	18	0.0084	0.0084	NUM
ajst-2992	146	19	source	source	NOUN
ajst-2992	146	20	inductance	inductance	NOUN
ajst-2992	146	21	0.0008	0.0008	NUM
ajst-2992	146	22	0.0093	0.0093	NUM
ajst-2992	146	23	table	table	NOUN
ajst-2992	146	24	22	22	NUM
ajst-2992	146	25	.	.	PUNCT
ajst-2992	147	1	ratio	ratio	NOUN
ajst-2992	147	2	of	of	ADP
ajst-2992	147	3	drain	drain	NOUN
ajst-2992	147	4	and	and	CCONJ
ajst-2992	147	5	source	source	NOUN
ajst-2992	147	6	inductance	inductance	NOUN
ajst-2992	147	7	parameters	parameter	NOUN
ajst-2992	147	8	at	at	ADP
ajst-2992	147	9	opening	opening	NOUN
ajst-2992	147	10	moment	moment	NOUN
ajst-2992	147	11	influence	influence	NOUN
ajst-2992	147	12	factor	factor	NOUN
ajst-2992	147	13	η1	η1	NOUN
ajst-2992	147	14	η2	η2	VERB
ajst-2992	147	15	η3	η3	PROPN
ajst-2992	147	16	drain	drain	VERB
ajst-2992	147	17	inductance	inductance	NOUN
ajst-2992	147	18	0.199	0.199	NUM
ajst-2992	147	19	0.256	0.256	NUM
ajst-2992	147	20	0.073	0.073	NUM
ajst-2992	147	21	source	source	NOUN
ajst-2992	147	22	inductance	inductance	NOUN
ajst-2992	147	23	0.212	0.212	NUM
ajst-2992	147	24	0.172	0.172	NUM
ajst-2992	147	25	0.052	0.052	NUM
ajst-2992	147	26	table	table	NOUN
ajst-2992	147	27	23	23	NUM
ajst-2992	147	28	.	.	PUNCT
ajst-2992	148	1	the	the	DET
ajst-2992	148	2	ratio	ratio	NOUN
ajst-2992	148	3	of	of	ADP
ajst-2992	148	4	the	the	DET
ajst-2992	148	5	parameters	parameter	NOUN
ajst-2992	148	6	of	of	ADP
ajst-2992	148	7	drain	drain	NOUN
ajst-2992	148	8	and	and	CCONJ
ajst-2992	148	9	source	source	NOUN
ajst-2992	148	10	inductance	inductance	NOUN
ajst-2992	148	11	at	at	ADP
ajst-2992	148	12	the	the	DET
ajst-2992	148	13	turn	turn	VERB
ajst-2992	148	14	-	-	PUNCT
ajst-2992	148	15	off	off	ADP
ajst-2992	148	16	moment	moment	NOUN
ajst-2992	148	17	influence	influence	NOUN
ajst-2992	148	18	factor	factor	NOUN
ajst-2992	148	19	η1	η1	NOUN
ajst-2992	148	20	η2	η2	VERB
ajst-2992	148	21	η3	η3	PROPN
ajst-2992	148	22	drain	drain	VERB
ajst-2992	148	23	inductance	inductance	NOUN
ajst-2992	148	24	0.136	0.136	NUM
ajst-2992	148	25	0.003	0.003	NUM
ajst-2992	148	26	0.117	0.117	NUM
ajst-2992	148	27	source	source	NOUN
ajst-2992	148	28	inductance	inductance	NOUN
ajst-2992	148	29	0.142	0.142	NUM
ajst-2992	148	30	0.084	0.084	NUM
ajst-2992	148	31	0.130	0.130	NUM
ajst-2992	148	32	by	by	ADP
ajst-2992	148	33	comparing	compare	VERB
ajst-2992	148	34	the	the	DET
ajst-2992	148	35	ratio	ratio	NOUN
ajst-2992	148	36	of	of	ADP
ajst-2992	148	37	the	the	DET
ajst-2992	148	38	change	change	NOUN
ajst-2992	148	39	of	of	ADP
ajst-2992	148	40	the	the	DET
ajst-2992	148	41	drain	drain	NOUN
ajst-2992	149	1	i	i	NOUN
ajst-2992	149	2	d	d	PROPN
ajst-2992	149	3	/	/	PUNCT
ajst-2992	149	4	a	a	DET
ajst-2992	149	5	t	t	NOUN
ajst-2992	149	6	/	/	PUNCT
ajst-2992	149	7	µs	µs	PROPN
ajst-2992	149	8	t	t	PROPN
ajst-2992	149	9	/	/	PUNCT
ajst-2992	149	10	µs	µs	X
ajst-2992	150	1	i	i	PROPN
ajst-2992	150	2	d	d	PROPN
ajst-2992	150	3	/	/	SYM
ajst-2992	150	4	a	a	DET
ajst-2992	150	5	254	254	NUM
ajst-2992	150	6	inductance	inductance	NOUN
ajst-2992	150	7	and	and	CCONJ
ajst-2992	150	8	the	the	DET
ajst-2992	150	9	source	source	NOUN
ajst-2992	150	10	inductance	inductance	NOUN
ajst-2992	150	11	at	at	ADP
ajst-2992	150	12	static	static	ADJ
ajst-2992	150	13	state	state	NOUN
ajst-2992	150	14	,	,	PUNCT
ajst-2992	150	15	the	the	DET
ajst-2992	150	16	turnon	turnon	NOUN
ajst-2992	150	17	moment	moment	NOUN
ajst-2992	150	18	and	and	CCONJ
ajst-2992	150	19	turn	turn	VERB
ajst-2992	150	20	-	-	PUNCT
ajst-2992	150	21	off	off	ADP
ajst-2992	150	22	moment	moment	NOUN
ajst-2992	150	23	,	,	PUNCT
ajst-2992	150	24	it	it	PRON
ajst-2992	150	25	can	can	AUX
ajst-2992	150	26	be	be	AUX
ajst-2992	150	27	inferred	infer	VERB
ajst-2992	150	28	that	that	SCONJ
ajst-2992	150	29	under	under	ADP
ajst-2992	150	30	static	static	ADJ
ajst-2992	150	31	state	state	NOUN
ajst-2992	150	32	,	,	PUNCT
ajst-2992	150	33	the	the	DET
ajst-2992	150	34	drain	drain	NOUN
ajst-2992	150	35	inductance	inductance	NOUN
ajst-2992	150	36	has	have	VERB
ajst-2992	150	37	a	a	DET
ajst-2992	150	38	greater	great	ADJ
ajst-2992	150	39	influence	influence	NOUN
ajst-2992	150	40	on	on	ADP
ajst-2992	150	41	the	the	DET
ajst-2992	150	42	current	current	ADJ
ajst-2992	150	43	change	change	NOUN
ajst-2992	150	44	,	,	PUNCT
ajst-2992	150	45	and	and	CCONJ
ajst-2992	150	46	the	the	DET
ajst-2992	150	47	source	source	NOUN
ajst-2992	150	48	inductance	inductance	NOUN
ajst-2992	150	49	has	have	VERB
ajst-2992	150	50	a	a	DET
ajst-2992	150	51	greater	great	ADJ
ajst-2992	150	52	influence	influence	NOUN
ajst-2992	150	53	on	on	ADP
ajst-2992	150	54	the	the	DET
ajst-2992	150	55	peak	peak	NOUN
ajst-2992	150	56	current	current	NOUN
ajst-2992	150	57	.	.	PUNCT
ajst-2992	151	1	at	at	ADP
ajst-2992	151	2	the	the	DET
ajst-2992	151	3	opening	opening	NOUN
ajst-2992	151	4	moment	moment	NOUN
ajst-2992	151	5	,	,	PUNCT
ajst-2992	151	6	the	the	DET
ajst-2992	151	7	influence	influence	NOUN
ajst-2992	151	8	of	of	ADP
ajst-2992	151	9	the	the	DET
ajst-2992	151	10	drain	drain	NOUN
ajst-2992	151	11	inductor	inductor	NOUN
ajst-2992	151	12	on	on	ADP
ajst-2992	151	13	the	the	DET
ajst-2992	151	14	peak	peak	NOUN
ajst-2992	151	15	current	current	ADJ
ajst-2992	151	16	and	and	CCONJ
ajst-2992	151	17	opening	opening	NOUN
ajst-2992	151	18	time	time	NOUN
ajst-2992	151	19	is	be	AUX
ajst-2992	151	20	greater	great	ADJ
ajst-2992	151	21	than	than	ADP
ajst-2992	151	22	that	that	PRON
ajst-2992	151	23	of	of	ADP
ajst-2992	151	24	the	the	DET
ajst-2992	151	25	drain	drain	NOUN
ajst-2992	151	26	inductor	inductor	NOUN
ajst-2992	151	27	with	with	ADP
ajst-2992	151	28	the	the	DET
ajst-2992	151	29	same	same	ADJ
ajst-2992	151	30	amplitude	amplitude	NOUN
ajst-2992	151	31	,	,	PUNCT
ajst-2992	151	32	and	and	CCONJ
ajst-2992	151	33	the	the	DET
ajst-2992	151	34	influence	influence	NOUN
ajst-2992	151	35	of	of	ADP
ajst-2992	151	36	the	the	DET
ajst-2992	151	37	current	current	ADJ
ajst-2992	151	38	change	change	NOUN
ajst-2992	151	39	speed	speed	NOUN
ajst-2992	151	40	is	be	AUX
ajst-2992	151	41	not	not	PART
ajst-2992	151	42	as	as	ADV
ajst-2992	151	43	great	great	ADJ
ajst-2992	151	44	as	as	ADP
ajst-2992	151	45	that	that	PRON
ajst-2992	151	46	of	of	ADP
ajst-2992	151	47	the	the	DET
ajst-2992	151	48	drain	drain	NOUN
ajst-2992	151	49	inductor	inductor	NOUN
ajst-2992	151	50	.	.	PUNCT
ajst-2992	152	1	at	at	ADP
ajst-2992	152	2	the	the	DET
ajst-2992	152	3	turn	turn	VERB
ajst-2992	152	4	-	-	PUNCT
ajst-2992	152	5	off	off	ADP
ajst-2992	152	6	moment	moment	NOUN
ajst-2992	152	7	,	,	PUNCT
ajst-2992	152	8	the	the	DET
ajst-2992	152	9	source	source	NOUN
ajst-2992	152	10	inductance	inductance	NOUN
ajst-2992	152	11	has	have	VERB
ajst-2992	152	12	a	a	DET
ajst-2992	152	13	greater	great	ADJ
ajst-2992	152	14	impact	impact	NOUN
ajst-2992	152	15	on	on	ADP
ajst-2992	152	16	the	the	DET
ajst-2992	152	17	current	current	ADJ
ajst-2992	152	18	variation	variation	NOUN
ajst-2992	152	19	and	and	CCONJ
ajst-2992	152	20	the	the	DET
ajst-2992	152	21	maximum	maximum	ADJ
ajst-2992	152	22	difference	difference	NOUN
ajst-2992	152	23	of	of	ADP
ajst-2992	152	24	the	the	DET
ajst-2992	152	25	current	current	ADJ
ajst-2992	152	26	,	,	PUNCT
ajst-2992	152	27	but	but	CCONJ
ajst-2992	152	28	not	not	PART
ajst-2992	152	29	as	as	ADV
ajst-2992	152	30	much	much	ADJ
ajst-2992	152	31	on	on	ADP
ajst-2992	152	32	the	the	DET
ajst-2992	152	33	turn	turn	NOUN
ajst-2992	152	34	-	-	PUNCT
ajst-2992	152	35	off	off	ADP
ajst-2992	152	36	time	time	NOUN
ajst-2992	152	37	as	as	ADP
ajst-2992	152	38	the	the	DET
ajst-2992	152	39	source	source	NOUN
ajst-2992	152	40	inductance	inductance	NOUN
ajst-2992	152	41	.	.	PUNCT
ajst-2992	153	1	table	table	NOUN
ajst-2992	153	2	25	25	NUM
ajst-2992	153	3	.	.	PUNCT
ajst-2992	154	1	parameter	parameter	PROPN
ajst-2992	154	2	ratios	ratio	NOUN
ajst-2992	154	3	of	of	ADP
ajst-2992	154	4	gate	gate	NOUN
ajst-2992	154	5	-	-	PUNCT
ajst-2992	154	6	drain	drain	NOUN
ajst-2992	154	7	and	and	CCONJ
ajst-2992	154	8	gate	gate	ADJ
ajst-2992	154	9	-	-	PUNCT
ajst-2992	154	10	source	source	NOUN
ajst-2992	154	11	capacitors	capacitor	NOUN
ajst-2992	154	12	at	at	ADP
ajst-2992	154	13	the	the	DET
ajst-2992	154	14	opening	opening	NOUN
ajst-2992	154	15	moment	moment	NOUN
ajst-2992	154	16	influence	influence	NOUN
ajst-2992	154	17	factor	factor	NOUN
ajst-2992	154	18	η1	η1	NOUN
ajst-2992	154	19	η2	η2	VERB
ajst-2992	154	20	η3	η3	PROPN
ajst-2992	154	21	gate	gate	NOUN
ajst-2992	154	22	drain	drain	NOUN
ajst-2992	154	23	capacitance	capacitance	NOUN
ajst-2992	154	24	0.056	0.056	NUM
ajst-2992	154	25	0.056	0.056	NUM
ajst-2992	154	26	0.002	0.002	NUM
ajst-2992	154	27	gate	gate	NOUN
ajst-2992	154	28	source	source	NOUN
ajst-2992	154	29	capacitance	capacitance	NOUN
ajst-2992	154	30	0.265	0.265	NUM
ajst-2992	154	31	0.302	0.302	NUM
ajst-2992	154	32	0.048	0.048	NUM
ajst-2992	154	33	table	table	NOUN
ajst-2992	154	34	26	26	NUM
ajst-2992	154	35	.	.	PUNCT
ajst-2992	155	1	parameter	parameter	NOUN
ajst-2992	155	2	ratios	ratio	NOUN
ajst-2992	155	3	of	of	ADP
ajst-2992	155	4	gate	gate	NOUN
ajst-2992	155	5	-	-	PUNCT
ajst-2992	155	6	drain	drain	NOUN
ajst-2992	155	7	and	and	CCONJ
ajst-2992	155	8	gate	gate	ADJ
ajst-2992	155	9	-	-	PUNCT
ajst-2992	155	10	source	source	NOUN
ajst-2992	155	11	capacitances	capacitance	NOUN
ajst-2992	155	12	at	at	ADP
ajst-2992	155	13	the	the	DET
ajst-2992	155	14	turn	turn	NOUN
ajst-2992	155	15	-	-	PUNCT
ajst-2992	155	16	off	off	ADP
ajst-2992	155	17	moment	moment	NOUN
ajst-2992	155	18	influence	influence	NOUN
ajst-2992	155	19	factor	factor	NOUN
ajst-2992	155	20	η1	η1	NOUN
ajst-2992	155	21	η2	η2	VERB
ajst-2992	155	22	η3	η3	PROPN
ajst-2992	155	23	gate	gate	NOUN
ajst-2992	155	24	drain	drain	NOUN
ajst-2992	155	25	capacitance	capacitance	NOUN
ajst-2992	155	26	0.123	0.123	NUM
ajst-2992	155	27	0.004	0.004	NUM
ajst-2992	155	28	0.111	0.111	NUM
ajst-2992	155	29	gate	gate	NOUN
ajst-2992	155	30	source	source	NOUN
ajst-2992	155	31	capacitance	capacitance	NOUN
ajst-2992	155	32	1.306	1.306	NUM
ajst-2992	155	33	0.009	0.009	NUM
ajst-2992	155	34	0.560	0.560	NUM
ajst-2992	155	35	since	since	SCONJ
ajst-2992	155	36	the	the	DET
ajst-2992	155	37	data	datum	NOUN
ajst-2992	155	38	in	in	ADP
ajst-2992	155	39	the	the	DET
ajst-2992	155	40	static	static	ADJ
ajst-2992	155	41	state	state	NOUN
ajst-2992	155	42	are	be	AUX
ajst-2992	155	43	too	too	ADV
ajst-2992	155	44	close	close	ADJ
ajst-2992	155	45	to	to	ADP
ajst-2992	155	46	each	each	DET
ajst-2992	155	47	other	other	ADJ
ajst-2992	155	48	,	,	PUNCT
ajst-2992	155	49	we	we	PRON
ajst-2992	155	50	will	will	AUX
ajst-2992	155	51	not	not	PART
ajst-2992	155	52	make	make	VERB
ajst-2992	155	53	a	a	DET
ajst-2992	155	54	comparison	comparison	NOUN
ajst-2992	155	55	here	here	ADV
ajst-2992	155	56	.	.	PUNCT
ajst-2992	156	1	at	at	ADP
ajst-2992	156	2	the	the	DET
ajst-2992	156	3	opening	opening	NOUN
ajst-2992	156	4	moment	moment	NOUN
ajst-2992	156	5	,	,	PUNCT
ajst-2992	156	6	the	the	DET
ajst-2992	156	7	impact	impact	NOUN
ajst-2992	156	8	of	of	ADP
ajst-2992	156	9	gate	gate	NOUN
ajst-2992	156	10	-	-	PUNCT
ajst-2992	156	11	source	source	NOUN
ajst-2992	156	12	capacitance	capacitance	NOUN
ajst-2992	156	13	on	on	ADP
ajst-2992	156	14	current	current	ADJ
ajst-2992	156	15	change	change	NOUN
ajst-2992	156	16	rate	rate	NOUN
ajst-2992	156	17	,	,	PUNCT
ajst-2992	156	18	peak	peak	NOUN
ajst-2992	156	19	current	current	ADJ
ajst-2992	156	20	and	and	CCONJ
ajst-2992	156	21	opening	opening	NOUN
ajst-2992	156	22	time	time	NOUN
ajst-2992	156	23	is	be	AUX
ajst-2992	156	24	greater	great	ADJ
ajst-2992	156	25	than	than	ADP
ajst-2992	156	26	that	that	PRON
ajst-2992	156	27	of	of	ADP
ajst-2992	156	28	gatedrain	gatedrain	NOUN
ajst-2992	156	29	capacitance	capacitance	NOUN
ajst-2992	156	30	.	.	PUNCT
ajst-2992	157	1	at	at	ADP
ajst-2992	157	2	the	the	DET
ajst-2992	157	3	turn	turn	VERB
ajst-2992	157	4	-	-	PUNCT
ajst-2992	157	5	off	off	ADP
ajst-2992	157	6	moment	moment	NOUN
ajst-2992	157	7	,	,	PUNCT
ajst-2992	157	8	the	the	DET
ajst-2992	157	9	gate	gate	NOUN
ajst-2992	157	10	-	-	PUNCT
ajst-2992	157	11	source	source	NOUN
ajst-2992	157	12	capacitance	capacitance	NOUN
ajst-2992	157	13	has	have	VERB
ajst-2992	157	14	a	a	DET
ajst-2992	157	15	greater	great	ADJ
ajst-2992	157	16	effect	effect	NOUN
ajst-2992	157	17	on	on	ADP
ajst-2992	157	18	the	the	DET
ajst-2992	157	19	current	current	ADJ
ajst-2992	157	20	change	change	NOUN
ajst-2992	157	21	rate	rate	NOUN
ajst-2992	157	22	,	,	PUNCT
ajst-2992	157	23	the	the	DET
ajst-2992	157	24	maximum	maximum	ADJ
ajst-2992	157	25	current	current	ADJ
ajst-2992	157	26	difference	difference	NOUN
ajst-2992	157	27	and	and	CCONJ
ajst-2992	157	28	the	the	DET
ajst-2992	157	29	turn	turn	VERB
ajst-2992	157	30	-	-	PUNCT
ajst-2992	157	31	off	off	ADP
ajst-2992	157	32	time	time	NOUN
ajst-2992	157	33	than	than	ADP
ajst-2992	157	34	the	the	DET
ajst-2992	157	35	gate	gate	NOUN
ajst-2992	157	36	-	-	PUNCT
ajst-2992	157	37	drain	drain	NOUN
ajst-2992	157	38	capacitance	capacitance	NOUN
ajst-2992	157	39	.	.	PUNCT
ajst-2992	158	1	4.2	4.2	NUM
ajst-2992	158	2	.	.	PUNCT
ajst-2992	158	3	paper	paper	NOUN
ajst-2992	158	4	summarizes	summarize	NOUN
ajst-2992	158	5	in	in	ADP
ajst-2992	158	6	this	this	DET
ajst-2992	158	7	article	article	NOUN
ajst-2992	158	8	,	,	PUNCT
ajst-2992	158	9	through	through	ADP
ajst-2992	158	10	the	the	DET
ajst-2992	158	11	analysis	analysis	NOUN
ajst-2992	158	12	of	of	ADP
ajst-2992	158	13	circuit	circuit	NOUN
ajst-2992	158	14	principle	principle	NOUN
ajst-2992	158	15	,	,	PUNCT
ajst-2992	158	16	device	device	NOUN
ajst-2992	158	17	parameters	parameter	NOUN
ajst-2992	158	18	mismatch	mismatch	VERB
ajst-2992	158	19	analysis	analysis	NOUN
ajst-2992	158	20	.	.	PUNCT
ajst-2992	159	1	using	use	VERB
ajst-2992	159	2	the	the	DET
ajst-2992	159	3	sic	sic	ADJ
ajst-2992	159	4	mosfet	mosfet	ADJ
ajst-2992	159	5	device	device	NOUN
ajst-2992	159	6	provided	provide	VERB
ajst-2992	159	7	in	in	ADP
ajst-2992	159	8	wolfspeed	wolfspeed	NOUN
ajst-2992	159	9	,	,	PUNCT
ajst-2992	159	10	the	the	DET
ajst-2992	159	11	author	author	NOUN
ajst-2992	159	12	explores	explore	VERB
ajst-2992	159	13	the	the	DET
ajst-2992	159	14	effect	effect	NOUN
ajst-2992	159	15	of	of	ADP
ajst-2992	159	16	circuit	circuit	NOUN
ajst-2992	159	17	parameter	parameter	NOUN
ajst-2992	159	18	mismatch	mismatch	NOUN
ajst-2992	159	19	on	on	ADP
ajst-2992	159	20	current	current	ADJ
ajst-2992	159	21	sharing	sharing	NOUN
ajst-2992	159	22	in	in	ADP
ajst-2992	159	23	parallel	parallel	ADJ
ajst-2992	159	24	components	component	NOUN
ajst-2992	159	25	.	.	PUNCT
ajst-2992	160	1	through	through	ADP
ajst-2992	160	2	the	the	DET
ajst-2992	160	3	quantitative	quantitative	ADJ
ajst-2992	160	4	analysis	analysis	NOUN
ajst-2992	160	5	of	of	ADP
ajst-2992	160	6	the	the	DET
ajst-2992	160	7	images	image	NOUN
ajst-2992	160	8	and	and	CCONJ
ajst-2992	160	9	data	datum	NOUN
ajst-2992	160	10	obtained	obtain	VERB
ajst-2992	160	11	by	by	ADP
ajst-2992	160	12	simulation	simulation	NOUN
ajst-2992	160	13	,	,	PUNCT
ajst-2992	160	14	the	the	DET
ajst-2992	160	15	influence	influence	NOUN
ajst-2992	160	16	of	of	ADP
ajst-2992	160	17	each	each	DET
ajst-2992	160	18	factor	factor	NOUN
ajst-2992	160	19	on	on	ADP
ajst-2992	160	20	the	the	DET
ajst-2992	160	21	current	current	NOUN
ajst-2992	160	22	in	in	ADP
ajst-2992	160	23	different	different	ADJ
ajst-2992	160	24	stages	stage	NOUN
ajst-2992	160	25	is	be	AUX
ajst-2992	160	26	obtained	obtain	VERB
ajst-2992	160	27	.	.	PUNCT
ajst-2992	161	1	by	by	ADP
ajst-2992	161	2	comparing	compare	VERB
ajst-2992	161	3	the	the	DET
ajst-2992	161	4	experimental	experimental	ADJ
ajst-2992	161	5	data	datum	NOUN
ajst-2992	161	6	,	,	PUNCT
ajst-2992	161	7	the	the	DET
ajst-2992	161	8	factor	factor	NOUN
ajst-2992	161	9	with	with	ADP
ajst-2992	161	10	the	the	DET
ajst-2992	161	11	greatest	great	ADJ
ajst-2992	161	12	influence	influence	NOUN
ajst-2992	161	13	on	on	ADP
ajst-2992	161	14	the	the	DET
ajst-2992	161	15	current	current	ADJ
ajst-2992	161	16	change	change	NOUN
ajst-2992	161	17	in	in	ADP
ajst-2992	161	18	each	each	DET
ajst-2992	161	19	link	link	NOUN
ajst-2992	161	20	is	be	AUX
ajst-2992	161	21	obtained	obtain	VERB
ajst-2992	161	22	.	.	PUNCT
ajst-2992	162	1	through	through	ADP
ajst-2992	162	2	the	the	DET
ajst-2992	162	3	experiment	experiment	NOUN
ajst-2992	162	4	of	of	ADP
ajst-2992	162	5	this	this	DET
ajst-2992	162	6	article	article	NOUN
ajst-2992	162	7	,	,	PUNCT
ajst-2992	162	8	we	we	PRON
ajst-2992	162	9	can	can	AUX
ajst-2992	162	10	more	more	ADV
ajst-2992	162	11	clearly	clearly	ADV
ajst-2992	162	12	get	get	VERB
ajst-2992	162	13	the	the	DET
ajst-2992	162	14	influence	influence	NOUN
ajst-2992	162	15	of	of	ADP
ajst-2992	162	16	the	the	DET
ajst-2992	162	17	device	device	NOUN
ajst-2992	162	18	parameter	parameter	NOUN
ajst-2992	162	19	mismatch	mismatch	NOUN
ajst-2992	162	20	on	on	ADP
ajst-2992	162	21	the	the	DET
ajst-2992	162	22	current	current	ADJ
ajst-2992	162	23	change	change	NOUN
ajst-2992	162	24	of	of	ADP
ajst-2992	162	25	each	each	DET
ajst-2992	162	26	link	link	NOUN
ajst-2992	162	27	.	.	PUNCT
ajst-2992	163	1	in	in	ADP
ajst-2992	163	2	practical	practical	ADJ
ajst-2992	163	3	application	application	NOUN
ajst-2992	163	4	,	,	PUNCT
ajst-2992	163	5	we	we	PRON
ajst-2992	163	6	can	can	AUX
ajst-2992	163	7	better	well	ADV
ajst-2992	163	8	improve	improve	VERB
ajst-2992	163	9	the	the	DET
ajst-2992	163	10	circuit	circuit	NOUN
ajst-2992	163	11	parameters	parameter	NOUN
ajst-2992	163	12	according	accord	VERB
ajst-2992	163	13	to	to	ADP
ajst-2992	163	14	the	the	DET
ajst-2992	163	15	actual	actual	ADJ
ajst-2992	163	16	needs	need	NOUN
ajst-2992	163	17	to	to	PART
ajst-2992	163	18	make	make	VERB
ajst-2992	163	19	the	the	DET
ajst-2992	163	20	sic	sic	ADJ
ajst-2992	163	21	mosfet	mosfet	NOUN
ajst-2992	163	22	device	device	NOUN
ajst-2992	163	23	play	play	VERB
ajst-2992	163	24	a	a	DET
ajst-2992	163	25	greater	great	ADJ
ajst-2992	163	26	role	role	NOUN
ajst-2992	163	27	.	.	PUNCT
ajst-2992	164	1	references	reference	NOUN
ajst-2992	164	2	[	[	X
ajst-2992	164	3	1	1	NUM
ajst-2992	164	4	]	]	SYM
ajst-2992	164	5	hu	hu	PROPN
ajst-2992	164	6	j	j	PROPN
ajst-2992	164	7	,	,	PUNCT
ajst-2992	165	1	alatise	alatise	PROPN
ajst-2992	165	2	o	o	NOUN
ajst-2992	165	3	,	,	PUNCT
ajst-2992	165	4	gonzalez	gonzalez	PROPN
ajst-2992	165	5	j	j	PROPN
ajst-2992	166	1	a	a	DET
ajst-2992	166	2	o	o	NOUN
ajst-2992	166	3	,	,	PUNCT
ajst-2992	166	4	et	et	PROPN
ajst-2992	166	5	al	al	PROPN
ajst-2992	166	6	.	.	PUNCT
ajst-2992	167	1	the	the	DET
ajst-2992	167	2	effect	effect	NOUN
ajst-2992	167	3	of	of	ADP
ajst-2992	167	4	electrothermal	electrothermal	ADJ
ajst-2992	167	5	nonuniformities	nonuniformity	NOUN
ajst-2992	167	6	on	on	ADP
ajst-2992	167	7	parallel	parallel	ADJ
ajst-2992	167	8	connected	connect	VERB
ajst-2992	167	9	sic	sic	ADJ
ajst-2992	167	10	power	power	NOUN
ajst-2992	167	11	devices	device	NOUN
ajst-2992	167	12	under	under	ADP
ajst-2992	167	13	unclamped	unclamped	NOUN
ajst-2992	167	14	and	and	CCONJ
ajst-2992	167	15	clamped	clamp	VERB
ajst-2992	167	16	inductive	inductive	ADJ
ajst-2992	167	17	switching[j	switching[j	PROPN
ajst-2992	167	18	]	]	PUNCT
ajst-2992	167	19	.	.	PUNCT
ajst-2992	168	1	ieee	ieee	NOUN
ajst-2992	168	2	transactions	transaction	NOUN
ajst-2992	168	3	on	on	ADP
ajst-2992	168	4	power	power	NOUN
ajst-2992	168	5	electronics,2016	electronics,2016	PROPN
ajst-2992	168	6	,	,	PUNCT
ajst-2992	168	7	31(6):4526	31(6):4526	PROPN
ajst-2992	168	8	-	-	SYM
ajst-2992	168	9	4535	4535	NUM
ajst-2992	168	10	.	.	PUNCT
ajst-2992	169	1	[	[	X
ajst-2992	169	2	2	2	NUM
ajst-2992	169	3	]	]	X
ajst-2992	169	4	chen	chen	PROPN
ajst-2992	169	5	z	z	PROPN
ajst-2992	169	6	,	,	PUNCT
ajst-2992	169	7	yao	yao	PROPN
ajst-2992	169	8	y	y	PROPN
ajst-2992	169	9	,	,	PUNCT
ajst-2992	169	10	boroyevich	boroyevich	NOUN
ajst-2992	169	11	d	d	PROPN
ajst-2992	169	12	,	,	PUNCT
ajst-2992	169	13	et	et	PROPN
ajst-2992	169	14	al	al	PROPN
ajst-2992	169	15	.	.	PUNCT
ajst-2992	170	1	a	a	DET
ajst-2992	170	2	1200v	1200v	NUM
ajst-2992	170	3	,	,	PUNCT
ajst-2992	170	4	60a	60a	NOUN
ajst-2992	170	5	sic	sic	ADJ
ajst-2992	170	6	mosfet	mosfet	NOUN
ajst-2992	170	7	multichip	multichip	NOUN
ajst-2992	170	8	phase	phase	NOUN
ajst-2992	170	9	-	-	PUNCT
ajst-2992	170	10	leg	leg	NOUN
ajst-2992	170	11	module	module	NOUN
ajst-2992	170	12	for	for	ADP
ajst-2992	170	13	high	high	ADJ
ajst-2992	170	14	temperature	temperature	NOUN
ajst-2992	170	15	,	,	PUNCT
ajst-2992	170	16	high	high	ADJ
ajst-2992	170	17	-	-	PUNCT
ajst-2992	170	18	frequency	frequency	NOUN
ajst-2992	170	19	applications[j	applications[j	NOUN
ajst-2992	170	20	]	]	PUNCT
ajst-2992	170	21	.	.	PUNCT
ajst-2992	171	1	ieee	ieee	NOUN
ajst-2992	171	2	transactions	transaction	NOUN
ajst-2992	171	3	on	on	ADP
ajst-2992	171	4	power	power	NOUN
ajst-2992	171	5	electronics	electronic	NOUN
ajst-2992	171	6	,	,	PUNCT
ajst-2992	171	7	2014	2014	NUM
ajst-2992	171	8	,	,	PUNCT
ajst-2992	171	9	29(5):2307	29(5):2307	NUM
ajst-2992	171	10	-	-	SYM
ajst-2992	171	11	2320	2320	NUM
ajst-2992	171	12	.	.	PUNCT
ajst-2992	172	1	[	[	X
ajst-2992	172	2	3	3	X
ajst-2992	172	3	]	]	X
ajst-2992	172	4	lim	lim	PROPN
ajst-2992	172	5	j	j	PROPN
ajst-2992	172	6	,	,	PUNCT
ajst-2992	172	7	peftitsis	peftitsis	NOUN
ajst-2992	172	8	d	d	NOUN
ajst-2992	172	9	,	,	PUNCT
ajst-2992	172	10	rabkowski	rabkowski	PROPN
ajst-2992	172	11	j	j	PROPN
ajst-2992	172	12	,	,	PUNCT
ajst-2992	172	13	et	et	PROPN
ajst-2992	172	14	al	al	PROPN
ajst-2992	172	15	.	.	PUNCT
ajst-2992	172	16	analysis	analysis	NOUN
ajst-2992	172	17	and	and	CCONJ
ajst-2992	172	18	experimental	experimental	ADJ
ajst-2992	172	19	verification	verification	NOUN
ajst-2992	172	20	of	of	ADP
ajst-2992	172	21	the	the	DET
ajst-2992	172	22	influence	influence	NOUN
ajst-2992	172	23	of	of	ADP
ajst-2992	172	24	fabrication	fabrication	NOUN
ajst-2992	172	25	process	process	NOUN
ajst-2992	172	26	tolerances	tolerance	NOUN
ajst-2992	172	27	and	and	CCONJ
ajst-2992	172	28	circuit	circuit	NOUN
ajst-2992	172	29	parasitics	parasitic	NOUN
ajst-2992	172	30	on	on	ADP
ajst-2992	172	31	transient	transient	ADJ
ajst-2992	172	32	current	current	ADJ
ajst-2992	172	33	sharing	sharing	NOUN
ajst-2992	172	34	of	of	ADP
ajst-2992	172	35	parallel	parallel	NOUN
ajst-2992	172	36	-	-	PUNCT
ajst-2992	172	37	connected	connect	VERB
ajst-2992	172	38	sic	sic	ADJ
ajst-2992	172	39	jfets[j	jfets[j	PROPN
ajst-2992	172	40	]	]	PUNCT
ajst-2992	172	41	.	.	PUNCT
ajst-2992	173	1	ieee	ieee	NOUN
ajst-2992	173	2	transactions	transaction	NOUN
ajst-2992	173	3	on	on	ADP
ajst-2992	173	4	power	power	NOUN
ajst-2992	173	5	electronics	electronic	NOUN
ajst-2992	173	6	,	,	PUNCT
ajst-2992	173	7	2014	2014	NUM
ajst-2992	173	8	,	,	PUNCT
ajst-2992	173	9	29(5	29(5	NUM
ajst-2992	173	10	):	):	PUNCT
ajst-2992	173	11	2180	2180	NUM
ajst-2992	173	12	-	-	SYM
ajst-2992	173	13	2191	2191	NUM
ajst-2992	173	14	.	.	PUNCT
ajst-2992	174	1	[	[	X
ajst-2992	174	2	4	4	X
ajst-2992	174	3	]	]	X
ajst-2992	174	4	peftitsis	peftitsis	NOUN
ajst-2992	174	5	d	d	NOUN
ajst-2992	174	6	,	,	PUNCT
ajst-2992	174	7	baburske	baburske	ADJ
ajst-2992	174	8	r	r	PROPN
ajst-2992	174	9	,	,	PUNCT
ajst-2992	174	10	rabkowski	rabkowski	PROPN
ajst-2992	174	11	j	j	PROPN
ajst-2992	174	12	,	,	PUNCT
ajst-2992	174	13	et	et	PROPN
ajst-2992	174	14	al	al	PROPN
ajst-2992	174	15	.	.	PUNCT
ajst-2992	175	1	challenges	challenge	NOUN
ajst-2992	175	2	regarding	regard	VERB
ajst-2992	175	3	parallel	parallel	ADJ
ajst-2992	175	4	connection	connection	NOUN
ajst-2992	175	5	of	of	ADP
ajst-2992	175	6	sic	sic	ADJ
ajst-2992	175	7	jfets[j	jfets[j	PROPN
ajst-2992	175	8	]	]	PUNCT
ajst-2992	175	9	.	.	PUNCT
ajst-2992	176	1	ieee	ieee	NOUN
ajst-2992	176	2	transactions	transaction	NOUN
ajst-2992	176	3	on	on	ADP
ajst-2992	176	4	power	power	NOUN
ajst-2992	176	5	electronics	electronic	NOUN
ajst-2992	176	6	,	,	PUNCT
ajst-2992	176	7	2013	2013	NUM
ajst-2992	176	8	,	,	PUNCT
ajst-2992	176	9	28(3	28(3	NUM
ajst-2992	176	10	):	):	PUNCT
ajst-2992	176	11	1449	1449	NUM
ajst-2992	176	12	-	-	SYM
ajst-2992	176	13	1463	1463	NUM
ajst-2992	176	14	.	.	PUNCT
ajst-2992	177	1	[	[	X
ajst-2992	177	2	5	5	NUM
ajst-2992	177	3	]	]	SYM
ajst-2992	177	4	hu	hu	PROPN
ajst-2992	177	5	j	j	PROPN
ajst-2992	177	6	,	,	PUNCT
ajst-2992	177	7	alatise	alatise	PROPN
ajst-2992	177	8	o	o	NOUN
ajst-2992	177	9	,	,	PUNCT
ajst-2992	177	10	gonzalez	gonzalez	PROPN
ajst-2992	177	11	j	j	PROPN
ajst-2992	177	12	,	,	PUNCT
ajst-2992	177	13	et	et	PROPN
ajst-2992	177	14	al	al	PROPN
ajst-2992	177	15	.	.	PUNCT
ajst-2992	177	16	robustness	robustness	NOUN
ajst-2992	177	17	and	and	CCONJ
ajst-2992	177	18	alancing	alancing	NOUN
ajst-2992	177	19	of	of	ADP
ajst-2992	177	20	parallel	parallel	ADJ
ajst-2992	177	21	connected	connect	VERB
ajst-2992	177	22	power	power	NOUN
ajst-2992	177	23	devices	device	NOUN
ajst-2992	177	24	:	:	PUNCT
ajst-2992	177	25	sicvs	sicvs	PROPN
ajst-2992	177	26	.	.	PUNCT
ajst-2992	178	1	coolmos[j	coolmos[j	PROPN
ajst-2992	178	2	]	]	PUNCT
ajst-2992	178	3	.	.	PUNCT
ajst-2992	179	1	ieee	ieee	NOUN
ajst-2992	179	2	transactions	transaction	NOUN
ajst-2992	179	3	on	on	ADP
ajst-2992	179	4	industrial	industrial	ADJ
ajst-2992	179	5	electronics	electronic	NOUN
ajst-2992	179	6	,	,	PUNCT
ajst-2992	179	7	2016	2016	NUM
ajst-2992	179	8	,	,	PUNCT
ajst-2992	179	9	63(4	63(4	NUM
ajst-2992	179	10	):	):	PUNCT
ajst-2992	179	11	092	092	NUM
ajst-2992	179	12	-	-	SYM
ajst-2992	179	13	2102	2102	NUM
ajst-2992	179	14	.	.	PUNCT
ajst-2992	180	1	[	[	X
ajst-2992	180	2	6	6	NUM
ajst-2992	180	3	]	]	SYM
ajst-2992	180	4	li	li	PROPN
ajst-2992	180	5	h	h	PROPN
ajst-2992	180	6	,	,	PUNCT
ajst-2992	180	7	munk	munk	PROPN
ajst-2992	180	8	-	-	PUNCT
ajst-2992	180	9	nielsen	nielsen	PROPN
ajst-2992	180	10	s	s	PROPN
ajst-2992	180	11	,	,	PUNCT
ajst-2992	180	12	wang	wang	PROPN
ajst-2992	180	13	x	x	PROPN
ajst-2992	180	14	,	,	PUNCT
ajst-2992	180	15	et	et	PROPN
ajst-2992	180	16	al	al	PROPN
ajst-2992	180	17	.	.	PROPN
ajst-2992	180	18	influences	influence	NOUN
ajst-2992	180	19	of	of	ADP
ajst-2992	180	20	device	device	NOUN
ajst-2992	180	21	and	and	CCONJ
ajst-2992	180	22	circuit	circuit	NOUN
ajst-2992	180	23	mismatches	mismatch	NOUN
ajst-2992	180	24	on	on	ADP
ajst-2992	180	25	paralleling	paralleling	ADJ
ajst-2992	180	26	silicon	silicon	NOUN
ajst-2992	180	27	carbide	carbide	PROPN
ajst-2992	180	28	mosfets[j	mosfets[j	PROPN
ajst-2992	180	29	]	]	PUNCT
ajst-2992	180	30	.	.	PUNCT
ajst-2992	181	1	ieee	ieee	NOUN
ajst-2992	181	2	transactions	transaction	NOUN
ajst-2992	181	3	on	on	ADP
ajst-2992	181	4	power	power	NOUN
ajst-2992	181	5	electronics	electronic	NOUN
ajst-2992	181	6	,	,	PUNCT
ajst-2992	181	7	2016	2016	NUM
ajst-2992	181	8	,	,	PUNCT
ajst-2992	181	9	31(1	31(1	NUM
ajst-2992	181	10	):	):	PUNCT
ajst-2992	181	11	621	621	NUM
ajst-2992	181	12	-	-	SYM
ajst-2992	181	13	634	634	NUM
ajst-2992	181	14	.	.	PUNCT
ajst-2992	182	1	[	[	X
ajst-2992	182	2	7	7	X
ajst-2992	182	3	]	]	X
ajst-2992	182	4	wang	wang	PROPN
ajst-2992	182	5	g	g	PROPN
ajst-2992	182	6	,	,	PUNCT
ajst-2992	182	7	mookken	mookken	PROPN
ajst-2992	182	8	j	j	PROPN
ajst-2992	182	9	,	,	PUNCT
ajst-2992	182	10	rice	rice	PROPN
ajst-2992	182	11	j	j	PROPN
ajst-2992	182	12	,	,	PUNCT
ajst-2992	182	13	et	et	PROPN
ajst-2992	182	14	al	al	PROPN
ajst-2992	182	15	.	.	PROPN
ajst-2992	182	16	dynamic	dynamic	ADJ
ajst-2992	182	17	and	and	CCONJ
ajst-2992	182	18	static	static	ADJ
ajst-2992	182	19	behavior	behavior	NOUN
ajst-2992	182	20	of	of	ADP
ajst-2992	182	21	packaged	package	VERB
ajst-2992	182	22	silicon	silicon	NOUN
ajst-2992	182	23	carbide	carbide	NOUN
ajst-2992	182	24	mosfets	mosfet	NOUN
ajst-2992	182	25	inparalleled	inparallele	VERB
ajst-2992	182	26	applications	application	NOUN
ajst-2992	182	27	[	[	X
ajst-2992	182	28	c	c	X
ajst-2992	182	29	]	]	X
ajst-2992	182	30	∥	∥	NUM
ajst-2992	182	31	proceedings	proceeding	NOUN
ajst-2992	182	32	of	of	ADP
ajst-2992	182	33	ieee	ieee	NOUN
ajst-2992	182	34	applied	apply	VERB
ajst-2992	182	35	power	power	NOUN
ajst-2992	182	36	electronics	electronic	NOUN
ajst-2992	182	37	conference	conference	NOUN
ajst-2992	182	38	and	and	CCONJ
ajst-2992	182	39	exposition	exposition	NOUN
ajst-2992	182	40	.	.	PUNCT
ajst-2992	183	1	fort	fort	NOUN
ajst-2992	183	2	worth	worth	PROPN
ajst-2992	183	3	,	,	PUNCT
ajst-2992	183	4	tx	tx	PROPN
ajst-2992	183	5	,	,	PUNCT
ajst-2992	183	6	usa	usa	PROPN
ajst-2992	183	7	,	,	PUNCT
ajst-2992	183	8	2014	2014	NUM
ajst-2992	183	9	:	:	PUNCT
ajst-2992	183	10	1478	1478	NUM
ajst-2992	183	11	-	-	SYM
ajst-2992	183	12	1483	1483	NUM
ajst-2992	183	13	.	.	PUNCT
ajst-2992	184	1	[	[	X
ajst-2992	184	2	8	8	X
ajst-2992	184	3	]	]	X
ajst-2992	184	4	zeng	zeng	PROPN
ajst-2992	184	5	z	z	PROPN
ajst-2992	184	6	,	,	PUNCT
ajst-2992	184	7	shao	shao	PROPN
ajst-2992	184	8	w	w	PROPN
ajst-2992	184	9	h	h	PROPN
ajst-2992	184	10	,	,	PUNCT
ajst-2992	184	11	hu	hu	PROPN
ajst-2992	184	12	b	b	PROPN
ajst-2992	185	1	r	r	PROPN
ajst-2992	185	2	,	,	PUNCT
ajst-2992	185	3	et	et	PROPN
ajst-2992	185	4	al	al	PROPN
ajst-2992	185	5	.	.	PUNCT
ajst-2992	186	1	active	active	ADJ
ajst-2992	186	2	current	current	ADJ
ajst-2992	186	3	sharing	sharing	NOUN
ajst-2992	186	4	of	of	ADP
ajst-2992	186	5	paralleled	parallel	VERB
ajst-2992	186	6	sic	sic	ADJ
ajst-2992	186	7	mosfets	mosfet	NOUN
ajst-2992	186	8	by	by	ADP
ajst-2992	186	9	coupling	couple	VERB
ajst-2992	186	10	inductors[j	inductors[j	PROPN
ajst-2992	186	11	]	]	PUNCT
ajst-2992	186	12	.	.	PUNCT
ajst-2992	187	1	proceedings	proceeding	NOUN
ajst-2992	187	2	of	of	ADP
ajst-2992	187	3	the	the	DET
ajst-2992	187	4	csee	csee	NOUN
ajst-2992	187	5	,	,	PUNCT
ajst-2992	187	6	2017	2017	NUM
ajst-2992	187	7	,	,	PUNCT
ajst-2992	187	8	37	37	NUM
ajst-2992	187	9	(	(	PUNCT
ajst-2992	187	10	7	7	NUM
ajst-2992	187	11	):	):	PUNCT
ajst-2992	187	12	2068－	2068－	NUM
ajst-2992	187	13	2080	2080	NUM
ajst-2992	187	14	(	(	PUNCT
ajst-2992	187	15	in	in	ADP
ajst-2992	187	16	chinese	chinese	PROPN
ajst-2992	187	17	)	)	PUNCT
ajst-2992	187	18	.	.	PUNCT
ajst-2992	188	1	[	[	X
ajst-2992	188	2	9	9	NUM
ajst-2992	188	3	]	]	SYM
ajst-2992	188	4	mao	mao	NOUN
ajst-2992	189	1	y	y	PROPN
ajst-2992	189	2	c	c	PROPN
ajst-2992	189	3	,	,	PUNCT
ajst-2992	189	4	miao	miao	PROPN
ajst-2992	189	5	z	z	PROPN
ajst-2992	189	6	c	c	PROPN
ajst-2992	189	7	,	,	PUNCT
ajst-2992	189	8	wang	wang	PROPN
ajst-2992	189	9	c	c	PROPN
ajst-2992	189	10	m	m	PROPN
ajst-2992	189	11	,	,	PUNCT
ajst-2992	189	12	et	et	PROPN
ajst-2992	189	13	al	al	PROPN
ajst-2992	189	14	.	.	PUNCT
ajst-2992	190	1	balancing	balancing	NOUN
ajst-2992	190	2	of	of	ADP
ajst-2992	190	3	peak	peak	NOUN
ajst-2992	190	4	currents	current	NOUN
ajst-2992	190	5	between	between	ADP
ajst-2992	190	6	paralleled	parallel	VERB
ajst-2992	190	7	sic	sic	ADJ
ajst-2992	190	8	mosfets	mosfet	NOUN
ajst-2992	190	9	by	by	ADP
ajst-2992	190	10	drive	drive	ADJ
ajst-2992	190	11	-	-	PUNCT
ajst-2992	190	12	source	source	NOUN
ajst-2992	190	13	resistors	resistor	NOUN
ajst-2992	190	14	and	and	CCONJ
ajst-2992	190	15	coupled	couple	VERB
ajst-2992	190	16	power	power	NOUN
ajst-2992	190	17	-	-	PUNCT
ajst-2992	190	18	source	source	NOUN
ajst-2992	190	19	inductors	inductor	NOUN
ajst-2992	190	20	[	[	X
ajst-2992	190	21	j	j	X
ajst-2992	190	22	]	]	X
ajst-2992	190	23	.	.	PUNCT
ajst-2992	191	1	ieee	ieee	NOUN
ajst-2992	191	2	transactions	transaction	NOUN
ajst-2992	191	3	on	on	ADP
ajst-2992	191	4	industrial	industrial	ADJ
ajst-2992	191	5	electronics	electronic	NOUN
ajst-2992	191	6	,	,	PUNCT
ajst-2992	191	7	2017	2017	NUM
ajst-2992	191	8	,	,	PUNCT
ajst-2992	191	9	64(10):83348343	64(10):83348343	PUNCT
ajst-2992	191	10	.	.	PUNCT
ajst-2992	192	1	[	[	X
ajst-2992	192	2	10	10	NUM
ajst-2992	192	3	]	]	X
ajst-2992	192	4	huang	huang	PROPN
ajst-2992	192	5	h	h	PROPN
ajst-2992	192	6	z	z	PROPN
ajst-2992	192	7	,	,	PUNCT
ajst-2992	192	8	ke	ke	PROPN
ajst-2992	192	9	j	j	PROPN
ajst-2992	192	10	j	j	PROPN
ajst-2992	192	11	,	,	PUNCT
ajst-2992	192	12	sun	sun	PROPN
ajst-2992	192	13	p	p	NOUN
ajst-2992	192	14	,	,	PUNCT
ajst-2992	192	15	zhao	zhao	PROPN
ajst-2992	192	16	z	z	PROPN
ajst-2992	192	17	b	b	PROPN
ajst-2992	192	18	,	,	PUNCT
ajst-2992	192	19	et	et	PROPN
ajst-2992	192	20	al	al	PROPN
ajst-2992	192	21	.	.	PROPN
ajst-2992	192	22	effect	effect	NOUN
ajst-2992	192	23	of	of	ADP
ajst-2992	192	24	parasitic	parasitic	ADJ
ajst-2992	192	25	inductance	inductance	NOUN
ajst-2992	192	26	mismatch	mismatch	NOUN
ajst-2992	192	27	on	on	ADP
ajst-2992	192	28	the	the	DET
ajst-2992	192	29	shunt	shunt	ADJ
ajst-2992	192	30	current	current	ADJ
ajst-2992	192	31	distribution	distribution	NOUN
ajst-2992	192	32	of	of	ADP
ajst-2992	192	33	sic	sic	ADJ
ajst-2992	192	34	mosfet.doi:10.13290	mosfet.doi:10.13290	ADJ
ajst-2992	192	35	/j.cnki.bdtjs.2018.11.006	/j.cnki.bdtjs.2018.11.006	PUNCT
ajst-2992	193	1	[	[	X
ajst-2992	193	2	11	11	NUM
ajst-2992	193	3	]	]	X
ajst-2992	193	4	baliga	baliga	PROPN
ajst-2992	193	5	b	b	PROPN
ajst-2992	193	6	j.	j.	PROPN
ajst-2992	193	7	fundamentals	fundamental	NOUN
ajst-2992	193	8	of	of	ADP
ajst-2992	193	9	power	power	NOUN
ajst-2992	193	10	semiconductor	semiconductor	NOUN
ajst-2992	193	11	devices[m	devices[m	PROPN
ajst-2992	193	12	]	]	PUNCT
ajst-2992	193	13	.	.	PUNCT
ajst-2992	194	1	springer	springer	NOUN
ajst-2992	194	2	,	,	PUNCT
ajst-2992	194	3	2008	2008	NUM
ajst-2992	194	4	:	:	PUNCT
ajst-2992	194	5	436	436	NUM
ajst-2992	194	6	-	-	SYM
ajst-2992	194	7	443	443	NUM
ajst-2992	194	8	.	.	PUNCT
ajst-2992	195	1	[	[	X
ajst-2992	195	2	12	12	NUM
ajst-2992	195	3	]	]	X
ajst-2992	195	4	cheng	cheng	PROPN
ajst-2992	195	5	z	z	PROPN
ajst-2992	195	6	m	m	PROPN
ajst-2992	195	7	,	,	PUNCT
ajst-2992	195	8	li	li	PROPN
ajst-2992	195	9	s	s	PROPN
ajst-2992	195	10	z	z	PROPN
ajst-2992	195	11	,	,	PUNCT
ajst-2992	195	12	wide	wide	ADJ
ajst-2992	195	13	band	band	NOUN
ajst-2992	195	14	gap	gap	NOUN
ajst-2992	195	15	semiconductor	semiconductor	NOUN
ajst-2992	195	16	power	power	NOUN
ajst-2992	195	17	electronic	electronic	ADJ
ajst-2992	195	18	devices	device	NOUN
ajst-2992	195	19	and	and	CCONJ
ajst-2992	195	20	their	their	PRON
ajst-2992	195	21	applications[m	applications[m	NOUN
ajst-2992	195	22	]	]	PUNCT
ajst-2992	195	23	.	.	PUNCT
ajst-2992	196	1	china	china	PROPN
ajst-2992	196	2	machine	machine	PROPN
ajst-2992	196	3	press	press	PROPN
ajst-2992	196	4	,	,	PUNCT
ajst-2992	196	5	2008	2008	NUM
ajst-2992	196	6	:	:	PUNCT
ajst-2992	196	7	80	80	NUM
ajst-2992	196	8	-	-	SYM
ajst-2992	196	9	82	82	NUM
ajst-2992	196	10	.	.	PUNCT
ajst-2992	197	1	[	[	X
ajst-2992	197	2	13	13	NUM
ajst-2992	197	3	]	]	PUNCT
ajst-2992	197	4	tiwari	tiwari	X
ajst-2992	197	5	s	s	PROPN
ajst-2992	197	6	,	,	PUNCT
ajst-2992	197	7	rabiei	rabiei	PROPN
ajst-2992	197	8	a	a	PRON
ajst-2992	197	9	,	,	PUNCT
ajst-2992	197	10	shrestha	shrestha	PROPN
ajst-2992	198	1	p	p	X
ajst-2992	198	2	,	,	PUNCT
ajst-2992	198	3	et	et	PROPN
ajst-2992	198	4	al	al	PROPN
ajst-2992	198	5	.	.	PUNCT
ajst-2992	198	6	design	design	NOUN
ajst-2992	198	7	considerations	consideration	NOUN
ajst-2992	198	8	and	and	CCONJ
ajst-2992	198	9	laboratory	laboratory	NOUN
ajst-2992	198	10	testing	testing	NOUN
ajst-2992	198	11	of	of	ADP
ajst-2992	198	12	power	power	NOUN
ajst-2992	198	13	circuits	circuit	NOUN
ajst-2992	198	14	for	for	ADP
ajst-2992	198	15	parallel	parallel	ADJ
ajst-2992	198	16	operation	operation	NOUN
ajst-2992	198	17	of	of	ADP
ajst-2992	198	18	silicon	silicon	NOUN
ajst-2992	198	19	carbide	carbide	NOUN
ajst-2992	198	20	mosfets[c]//17th	mosfets[c]//17th	PROPN
ajst-2992	198	21	european	european	ADJ
ajst-2992	198	22	conference	conference	NOUN
ajst-2992	198	23	on	on	ADP
ajst-2992	198	24	power	power	NOUN
ajst-2992	198	25	electronics	electronic	NOUN
ajst-2992	198	26	and	and	CCONJ
ajst-2992	198	27	applications	application	NOUN
ajst-2992	198	28	(	(	PUNCT
ajst-2992	198	29	epe'15	epe'15	NOUN
ajst-2992	198	30	-	-	PUNCT
ajst-2992	198	31	ecce	ecce	NOUN
ajst-2992	198	32	europe	europe	PROPN
ajst-2992	198	33	)	)	PUNCT
ajst-2992	198	34	.	.	PUNCT
ajst-2992	199	1	geneva	geneva	PROPN
ajst-2992	199	2	,	,	PUNCT
ajst-2992	199	3	switzerland	switzerland	PROPN
ajst-2992	199	4	:	:	PUNCT
ajst-2992	199	5	ieee	ieee	NOUN
ajst-2992	199	6	,	,	PUNCT
ajst-2992	199	7	2015	2015	NUM
ajst-2992	199	8	:	:	PUNCT
ajst-2992	199	9	1	1	NUM
ajst-2992	199	10	-	-	SYM
ajst-2992	199	11	10	10	NUM
ajst-2992	199	12	.	.	PUNCT
ajst-2992	200	1	[	[	X
ajst-2992	200	2	14	14	NUM
ajst-2992	200	3	]	]	X
ajst-2992	200	4	wang	wang	PROPN
ajst-2992	200	5	g	g	PROPN
ajst-2992	200	6	,	,	PUNCT
ajst-2992	200	7	mookken	mookken	PROPN
ajst-2992	200	8	j	j	PROPN
ajst-2992	200	9	,	,	PUNCT
ajst-2992	200	10	rice	rice	PROPN
ajst-2992	200	11	j	j	PROPN
ajst-2992	200	12	,	,	PUNCT
ajst-2992	200	13	et	et	PROPN
ajst-2992	200	14	al	al	PROPN
ajst-2992	200	15	.	.	PROPN
ajst-2992	200	16	dynamic	dynamic	ADJ
ajst-2992	200	17	and	and	CCONJ
ajst-2992	200	18	static	static	ADJ
ajst-2992	200	19	behavior	behavior	NOUN
ajst-2992	200	20	of	of	ADP
ajst-2992	200	21	packaged	package	VERB
ajst-2992	200	22	silicon	silicon	NOUN
ajst-2992	200	23	carbide	carbide	NOUN
ajst-2992	200	24	mosfets	mosfet	NOUN
ajst-2992	200	25	in	in	ADP
ajst-2992	200	26	paralleled	parallel	VERB
ajst-2992	200	27	applications[c]//twenty	applications[c]//twenty	NUM
ajst-2992	200	28	-	-	ADJ
ajst-2992	200	29	ninth	ninth	ADJ
ajst-2992	200	30	annual	annual	ADJ
ajst-2992	200	31	i.	i.	NOUN