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ACTA IMEKO 
ISSN: 2221‐870X 
November 2016, Volume 5, Number 3, 2 

 

ACTA IMEKO | www.imeko.org  November 2016 | Volume 5 | Number 3| 2 

Introduction to the Special Section TC21 of the XXI IMEKO 
World Congress 2015 

Franco Pavese 

Torino, Italy 

 

Section: EDITORIAL  

Citation: Franco Pavese, Introduction to the Special Section TC21 of the XXI IMEKO World Congress 2015, Acta IMEKO, vol. 5, no. 3, article 1, 
November 2016, identifier: IMEKO‐ACTA‐05 (2016)‐03‐01 

Section Editor: Franco Pavese, Italy 

Received October 20, 2016; In final form October 20, 2016; Published November 2016 

Copyright: © 2016 IMEKO. This is an open‐access article distributed under the terms of the Creative Commons Attribution 3.0 License, which permits 
unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited 

Corresponding author: Franco Pavese, email: frpavese@gmail.com 

 
 

Dear Reader,  
 

this Special Issue includes five papers, originating from 
subject matters presented at the XXI IMEKO World Congress 
2015 held in Prague, during sessions organized by Technical 
Committee 21 on Mathematical Tools for Measurements, and 
selected for publication in Acta IMEKO. 

 
The first is a short review of concepts of probability related 

to measurement.  
 
The paper of Cundeva-Blajer is devoted to optimization 

methods in electrical metrology. 
 

 
The paper of Shirono concerns the maximum likelihood 

concept applied to evaluate the uncertainty in proficiency tests.  
 
The paper of Volosnikov illustrates the use of neural 

networks for error correction in dynamic measurements. 
 
The paper of Witkovsky proposes an alternative tool to 

form the probability distribution of output quantities by 
numerical inversion in linear models. 
 
Franco Pavese 
Guest Editor 
IMEKO TC21, Chair