id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
ap-742	Hrouzek, M.	Feedback Control in an Atomic Force Microscope Used as a Nano-Manipulator	2005	5	.pdf	application/pdf	2398	130	53	In the tapping mode, the tip is touches the surface in each period of cantilever movement at its maximum deflection to- © Czech Technical University Publishing House http://ctn.cvut.cz/ap/ 65 Czech Technical University in Prague Acta Polytechnica Vol. 45 No. 4/2005 Feedback Control in an Atomic Force Microscope Used as a Nano-Manipulator M. Hrouzek This paper offers a concise survey of the most commonly used feedback loops for atomic force microscopes. 6 shows control loops affecting the sensitivity of the AFM.	cache/ap-742.pdf	txt/ap-742.txt