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ap-7491	doi.org	https://doi.org/10.1108/03321641011014940
ap-7491	doi.org	https://doi.org/10.1109/tcsi.2012.2215796
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ap-7491	doi.org	https://doi.org/10.1109/tcsi.2012.2215796
ap-7491	doi.org	https://doi.org/10.1109/pesc.2003.1218102
ap-7491	doi.org	https://doi.org/10.1080/00207217.2013.780299
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ap-7491	doi.org	https://doi.org/10.1109/newcas.2017.8010131
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ap-7491	doi.org	https://doi.org/10.3390/electronics7100254
ap-7491	doi.org	https://doi.org/10.1108/03321641311293920
ap-7491	doi.org	https://doi.org/10.1109/isie.2010.5637199
ap-7491	doi.org	https://doi.org/10.5755/j01.eee.119.3.1361
ap-7491	doi.org	https://doi.org/10.1080/21681724.2020.1870717
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ap-7491	doi.org	https://doi.org/10.1109/pesc.2003.1218102
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ap-7491	doi.org	https://doi.org/10.1049/el:19970655
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ap-7491	doi.org	https://doi.org/10.3390/electronics7100254
ap-7491	doi.org	https://doi.org/10.1108/03321641311293920
ap-7491	doi.org	https://doi.org/10.1109/isie.2010.5637199
ap-7491	doi.org	https://doi.org/10.5755/j01.eee.119.3.1361
ap-7491	doi.org	https://doi.org/10.1080/21681724.2020.1870717
ap-7491	doi.org	https://doi.org/10.1109/tau.1967.1161901