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ap-8720	doi.org	https://doi.org/10.22215/timreview/1282
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ap-8720	doi.org	https://doi.org/10.3390/electronics8030292
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ap-8720	doi.org	https://doi.org/10.1109/cvpr.2008.4587756
ap-8720	doi.org	https://doi.org/10.1109/cvpr42600.2020.00808
ap-8720	arxiv.org	https://arxiv.org/pdf/1812.04948.pdf
ap-8720	arxiv.org	https://arxiv.org/pdf/1710.10196.pdf
ap-8720	doi.org	https://doi.org/10.1007/978-981-15-7421-4_27
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ap-8720	doi.org	https://doi.org/10.1109/icassp.2019.8683164
ap-8720	doi.org	https://doi.org/10.1109/jstsp.2020.2999185
ap-8720	doi.org	https://doi.org/10.1109/cvpr.2017.195
ap-8720	doi.org	https://doi.org/10.1016/j.asoc.2021.107256
ap-8720	doi.org	https://doi.org/10.1109/bigdata.2016.7840826
ap-8720	doi.org	https://doi.org/10.1109/access.2018.2874767
ap-8720	arxiv.org	https://arxiv.org/pdf/1412.6572.pdf
ap-8720	arxiv.org	https://arxiv.org/pdf/1511.06434.pdf
ap-8720	doi.org	https://doi.org/10.1109/bigdata.2016.7840826
ap-8720	doi.org	https://doi.org/10.1109/access.2018.2874767
