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ajsts-3210	doi.org	https://doi.org/10.54536/ajsts.v3i2.3210
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	doi.org	https://doi.org/10.1016/j
ajsts-3210	doi.org	https://doi.org/10.1016/j
ajsts-3210	doi.org	https://doi.org/10.1186/s13677-022-00315-4
ajsts-3210	doi.org	https://doi.org/10.3390/electronics10212718
ajsts-3210	doi.org	https://doi.org/10.1201/9781003230427-5
ajsts-3210	doi.org	https://doi.org/10.1007/s00521-02409723-w
ajsts-3210	doi.org	https://doi.org/10.3390/en14165129
ajsts-3210	doi.org	https://doi.org/10.52783/tjjpt.v44.i3.2466
ajsts-3210	doi.org	https://doi.org/10.1177/16878132221122770
ajsts-3210	doi.org	https://doi.org/10.1109
ajsts-3210	doi.org	https://doi.org/10.3390/app13031681
ajsts-3210	journals.e-palli.com	https://journals.e-palli.com/home/index.php/ajsts
ajsts-3210	doi.org	https://doi.org/10.4018/9798-3693-1431-9.ch009
ajsts-3210	doi.org	https://doi.org/10.1016/j
ajsts-3210	doi.org	https://doi.org/10.1109/jiot.2024.3383896
ajsts-3210	doi.org	https://doi.org/10.1177/16878132221122770
