id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
american_scientific_journal-5823	Cam, Le Xuan ; Vinh, Nguyen Van ; Hai, Hoang Hong 	Measurement Profile of Surface Revolution by Laser Scan Micrometer Method	2020	9	.pdf	application/pdf	2264	121	59	American Scientific Research Journal for Engineering, Technology, and Sciences (ASRJETS) (2020) Volume 67, No 1, pp 36-44 37 In recent years, measurement profile method used by scanning lasers has been used extensively in industrial measurement due to the combination of the outstanding advantages of contactless measurement methods and the fast and accurate measurement speed high of laser. K. Endo, W. Gao, and S. Kiyono, “A new multi-probe arrangement for surface profile measurement of cylinders,” JSME Int.	cache/american_scientific_journal-5823.pdf	txt/american_scientific_journal-5823.txt