id	domain	url
easat-5983	www.kaggle.com	https://www.kaggle.com/datasets/samsonqian/college-admissions
easat-5983	www.kaggle.com	https://www.kaggle.com/datasets/samsonqian/college-admissions
easat-5983	creativecommons.org	https://creativecommons.org/licenses/by/4.0/)
easat-5983	doi.org	https://doi.org/10.14742/ajet.8903
easat-5983	doi.org	https://doi.org/10.1016/j.ijinfomgt.2024.102824
easat-5983	doi.org	https://doi.org/10.1109/access.2022.3198955
easat-5983	doi.org	https://doi.org/10.1145/3624988
easat-5983	doi.org	https://doi.org/10.3390/info15080461
easat-5983	doi.org	https://doi.org/10.3390/appliedmath3010014
easat-5983	doi.org	https://doi.org/10.58459/rptel.2023.18002
easat-5983	doi.org	https://doi.org/10.14778/3554821.3554894
easat-5983	doi.org	https://doi.org/10.1007/s10844022-00759-9
easat-5983	doi.org	https://doi.org/10.3390/computers10080101
easat-5983	doi.org	https://doi.org/10.1109/access.2024.3405583
easat-5983	doi.org	https://doi.org/10.1016/j.neucom.2023.127141
easat-5983	doi.org	https://doi.org/10.1109/access.2024.3395449
easat-5983	doi.org	https://doi.org/10.3390/electronics13081436
easat-5983	doi.org	https://doi.org/10.1109/access.2024.3403101
easat-5983	creativecommons.org	https://creativecommons.org/licenses/by/4.0
easat-5983	doi.org	https://doi.org/10.14742/ajet.8903
easat-5983	doi.org	https://doi.org/10.1016/j.ijinfomgt.2024.102824
easat-5983	doi.org	https://doi.org/10.1109/access.2022.3198955
easat-5983	doi.org	https://doi.org/10.1145/3624988
easat-5983	doi.org	https://doi.org/10.3390/info15080461
easat-5983	doi.org	https://doi.org/10.3390/appliedmath3010014
easat-5983	doi.org	https://doi.org/10.58459/rptel.2023.18002
easat-5983	doi.org	https://doi.org/10.14778/3554821.3554894
easat-5983	doi.org	https://doi.org/10.1007/s10844-022-00759-9
easat-5983	doi.org	https://doi.org/10.1007/s10844-022-00759-9
easat-5983	doi.org	https://doi.org/10.3390/computers10080101
easat-5983	doi.org	https://doi.org/10.1109/access.2024.3405583
easat-5983	doi.org	https://doi.org/10.1016/j.neucom.2023.127141
easat-5983	doi.org	https://doi.org/10.1109/access.2024.3395449
easat-5983	doi.org	https://doi.org/10.3390/electronics13081436
easat-5983	doi.org	https://doi.org/10.1109/access.2024.3403101
easat-5983	doi.org	https://doi.org/10.1613/jair.1.15642
easat-5983	doi.org	https://doi.org/10.3390/rs16091477
easat-5983	doi.org	https://doi.org/10.1371/journal.pone.0301696
easat-5983	doi.org	https://doi.org/10.1016/j.jbi.2024.104748
easat-5983	doi.org	https://doi.org/10.1109/tlt.2024.3491801
easat-5983	doi.org	https://doi.org/10.1016/j.cviu.2023.103862
easat-5983	doi.org	https://doi.org/10.1109/jbhi.2022.3163751
easat-5983	doi.org	https://doi.org/10.1007/s10489023-04751-w
easat-5983	doi.org	https://doi.org/10.1016/j.jbi.2023.104486
easat-5983	doi.org	https://doi.org/10.7717/peerj-cs.952
easat-5983	doi.org	https://doi.org/10.1007/978-3-03156121-4_24
easat-5983	doi.org	https://doi.org/10.1613/jair.1.15642
easat-5983	doi.org	https://doi.org/10.3390/rs16091477
easat-5983	doi.org	https://doi.org/10.1371/journal.pone.0301696
easat-5983	doi.org	https://doi.org/10.1016/j.jbi.2024.104748
easat-5983	doi.org	https://doi.org/10.1109/tlt.2024.3491801
easat-5983	doi.org	https://doi.org/10.1016/j.cviu.2023.103862
easat-5983	doi.org	https://doi.org/10.1109/jbhi.2022.3163751
easat-5983	doi.org	https://doi.org/10.1007/s10489-023-04751-w
easat-5983	doi.org	https://doi.org/10.1007/s10489-023-04751-w
easat-5983	doi.org	https://doi.org/10.1016/j.jbi.2023.104486
easat-5983	doi.org	https://doi.org/10.7717/peerj-cs.952
easat-5983	doi.org	https://doi.org/10.1007/978-3-031-56121-4_24
easat-5983	doi.org	https://doi.org/10.1007/978-3-031-56121-4_24