id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-1019	Pershenkov, Vyacheslav Sergeevich	CONVERSION MODEL OF THE RADIATION-INDUCED INTERFACE-TRAP BUILDUP AND ITS HARDNESS ASSURANCE APPLICATIONS	2015	14	.pdf	application/pdf	5530	304	62	dt G N   , (15) where G is accumulation rate of interface trap; Nit is density of interface traps; (τann)it is the time constant of interface state annihilation. The value of density of interface trap in saturation, as follows from (24), depends on product of interface trap accumulation rate (Kacc)it and constant KAD which is function of thermal velocity, capture cross-section of AD center, generation rate and electron yield of radiation induced electrons.	cache/fuelectenerg-1019.pdf	txt/fuelectenerg-1019.txt