id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-12392	Veljković, Sandra; Mitrović, Nikola; Davidović, Vojkan; Živanović, Emilija; Ristić, Goran; Danković, Danijel	SUCCESSIVE IRRADIATION AND BIAS TEMPERATURE STRESS INDUCED EFFECTS ON COMMERCIAL P-CHANNEL POWER VDMOS TRANSISTORS	2024	19	.pdf	application/pdf	8049	395	53	The data presented in the paper were obtained by exposing components to NBT stresses with different polarizations on the gate, which were previously exposed to radiation to different doses, with and without polarization. Also, the results with different frequencies applied during NBT stress are presented.	cache/fuelectenerg-12392.pdf	txt/fuelectenerg-12392.txt