id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-12809	Singh, Karan; Kalra, Shruti; Mahur, Jyoti	EVALUATING NBTI AND HCI EFFECTS ON DEVICE RELIABILITY FOR HIGH-PERFORMANCE APPLICATIONS IN ADVANCED CMOS TECHNOLOGIES	2024	17	.pdf	application/pdf	6991	352	39	Similar to BTI, HCI degradation also has a time dependence, with a power-law relation. This process involves collecting data from multiple identical devices, each tested at different temperatures and bias levels to capture variability in device degradation.	cache/fuelectenerg-12809.pdf	txt/fuelectenerg-12809.txt