id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-1288	Manić, Ivica; Danković, Danijel; Davidović, Vojkan; Prijić, Aneta; Djorić-Veljković, Snežana; Golubović, Snežana; Prijić, Zoran; Stojadinović, Ninoslav	EFFECTS OF PULSED NEGATIVE BIAS TEMPERATURE STRESSING IN P-CHANNEL POWER VDMOSFETS	2015	12	.pdf	application/pdf	5185	251	55	However, it should be noted that frequency remains constant, so variations in duty cycle change the ratio between the pulse and no-pulse fractions of the period: the lower duty cycle actually means shorter pulses and longer breaks in between the pulses, which further means shorter stress time and longer recovery time during each period of pulsed stress voltage applied. Two characteristic sets of data (for different stress voltages at 175 C and at different temperatures for stress voltage of 45 V) for the stress-induced threshold voltage shifts found during the static and pulsed NBT stressing of IRF9520 p-channel VDMOSFETs are shown in Fig.	cache/fuelectenerg-1288.pdf	txt/fuelectenerg-1288.txt