id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-13316	Danković, Danijel	THEMATIC ISSUE ON FAILURE MECHANISMS IN MICROELECTRONIC DEVICES	2024	2	.pdf	application/pdf	920	33	27	The data presented in the paper were obtained by exposing components to NBT stresses with different polarizations on the gate, which were previously exposed to radiation to different doses, with and without polarization. Also, the results with different frequencies applied during NBT stress are presented.	cache/fuelectenerg-13316.pdf	txt/fuelectenerg-13316.txt