id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-162	Ceric, Hajdin; Lacerda de Orio, Roberto; Zisser, Wolfhard H.; Selberherr, Siegfried	MICROSTRUCTURAL IMPACT ON ELECTROMIGRATION: A TCAD STUDY	2014	11	.pdf	application/pdf	3670	213	55	Results of ab initio and atomistic calculations are also used for the derivation of a compact model for early EM failures in copper dual-damascene M1/via structures. For a copper dual-damascene M1/via structure with downstream electron flow, this is the typical site for void formation and growth leading to early EM failures.	cache/fuelectenerg-162.pdf	txt/fuelectenerg-162.txt