id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-1853	Bensoussan, Alain	MICROELECTRONIC RELIABILITY MODELS FOR MORE THAN MOORE NANOTECHNOLOGY PRODUCTS	2016	25	.pdf	application/pdf	11523	540	42	These Standard methods develop failure mechanism models and their associated activation energies or acceleration factors that may be used in making system failure rate estimations. Our research will demonstrate the utilization of physics of failure models in conjunction with qualification testing using our Multiple – Temperature Operating Life (M-TOL) matrix solution to make cost-effective reliability predictions that are meaningful and based on the system operating conditions.	cache/fuelectenerg-1853.pdf	txt/fuelectenerg-1853.txt