id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-2154	Shrestha, Neelu; Reeves, Geoffrey K.; Leech, Patrick W.; Pan, Yue; Holland, Anthony S.	ANALYTICAL TEST STRUCTURE MODEL FOR DETERMINING LATERAL EFFECTS OF TRI-LAYER OHMIC CONTACT BEYOND THE CONTACT EDGE	2016	9	.pdf	application/pdf	3168	145	57	Fig. 2 (a) Current distribution in one TLTLM contact and dual layer contact regions for a test structure with Rsa=40 Ω/sq, Rsu= 60Ω/sq, ρca=8e-7Ω.cm2, ρcu= 1.6e-6Ω.cm2 with dual active layer of 20m (b) distribution of corresponding voltage contours, determined by FEM for the test structure Fig. The higher error value of ~5% between Rtot(Std) and Rtot(FEM) shows that the total resistance between contacts is not given by Rsh*l/w. Fig. 3 (a) Current distribution in a TLTLM contact and dual layer contact regions for a test structure with Rsa=40 Ω/sq, Rsu= 60Ω/sq, ρca=8e-7Ω.cm2, ρcu= 1.6e-6Ω.cm2 with a dual active layer of 5.2m in length (b) distribution of corresponding voltage contours, determined by FEM for the test structure Analytical Test Structure Model for Determining Lateral Effects of Tri-Layer Ohmic Contact... 263 4.	cache/fuelectenerg-2154.pdf	txt/fuelectenerg-2154.txt