id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-2829	Petrov, Andrey G.; Nikiforov, Aleksander Y.; Boruzdina, Anna B.; Ulanova, Anastasia V.; Yanenko, Andrey V.	MEMORY CHIPS AND UNITS RADIATION TOLERANCE DEPENDENCE ON SUPPLY VOLTAGE DURING IRRADIATION AND TEST	2017	10	.pdf	application/pdf	3405	172	52	These SRAMs were manufactured on various CMOS processes, supply voltages vary from 2,7 V to 5,5 V. Device irradiation was performed at maximum supply voltage. In this work we concentrated our investigations on radiation tolerance dependence with supply voltage for memory segment of digital ICs.	cache/fuelectenerg-2829.pdf	txt/fuelectenerg-2829.txt