id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-2879	Paskaleva, Albena; Spassov, Dencho; Dankovic, Danijel	CONSIDERATION OF CONDUCTION MECHANISMS IN HIGH-K DIELECTRIC STACKS AS A TOOL TO STUDY ELECTRICALLY ACTIVE DEFECTS	2017	38	.pdf	application/pdf	17403	829	62	For higher V conduction is via FN mechanism as the band bending under these applied voltages transforms the trapezoidal barrier into triangular one. EXPERIMENTAL PROCEDURE Investigation of current conduction mechanisms was performed on two kinds of test structures - metal-insulator-Si (MIS) or metal-insulator-metal (MIM) capacitors.	cache/fuelectenerg-2879.pdf	txt/fuelectenerg-2879.txt