id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-299	Sogoyan, Armen V.; Artamonov, Alexey S.; Nikiforov, Aleksander Y; Boychenko, Dmitry V.	METHOD FOR INTEGRATED CIRCUITS TOTAL IONIZING DOSE HARDNESS TESTING BASED ON COMBINED GAMMA- AND X-RAY IRRADIATION FACILITIES	2014	10	.pdf	application/pdf	3651	175	49	The power of X-ray radiation absorbed on the crystal surface, based on the estimated attenuation ratio, should fall in the range of X-ray irradiation facility power used for calibration. In tests with X-ray facilities, intensity is tuned so as to result in a tantamount change in parameters, faults and failures of electronic components compared to the real-world ionization sources having the same dominant effect.	cache/fuelectenerg-299.pdf	txt/fuelectenerg-299.txt