id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-3620	Shaheen, Saleh; Golan, Gady; Azoulay, Moshe; Bernstein, Joseph Baruch	A COMPARATIVE STUDY OF RELIABILITY FOR FINFET	2018	24	.pdf	application/pdf	13119	690	36	This methodology is opposed to the common approach for assessing device reliability today, using High Temperature Operating Life (HTOL) testing, which is based on the assumption that just one dominant failure mechanism is acting on the device. In many cases, this gate current is responsible for device degradation as a result of carrier trapping.	cache/fuelectenerg-3620.pdf	txt/fuelectenerg-3620.txt