id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-441	Boychenko, Dmitry; Kalashnikov, Oleg; Nikiforov, Aleksandr; Ulanova, Anastasija; Bobrovsky, Dmitry; Nekrasov, Pavel	TOTAL IONIZING DOSE EFFECTS AND RADIATION TESTING	2014	12	.pdf	application/pdf	3652	215	47	At the same time, most of radiation test facilities initially are not adopted for IC radiation tests and have rather long signal cables – about ten meters and more, that excludes the real functional test possibility under irradiation for high-frequency and precision devices. The example in Fig. 11 demonstrates the influence of radiation dose rate on CMOS flash-memory WF1M32B (White Electronic Designs) TID hardness.	cache/fuelectenerg-441.pdf	txt/fuelectenerg-441.txt