id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-513	Tyaginov, Stanislav; Wimmer, Yannick; Grasser, Tibor	MODELING OF HOT-CARRIER DEGRADATION BASED ON THOROUGH CARRIER TRANSPORT TREATMENT	2014	30	.pdf	application/pdf	16628	960	61	[22] P. Moens, J. Mertens, F. Bauwens, P. Joris, W. D. Ceuninck, and M. Tack, “A Comprehensive Model for Hot Carrier Degradation in LDMOS Transistors,” in Proc. [60] M. Jo, S. Kim, C. Cho, M. Chang, and H. Hwang, “Gate Voltage Dependence on Hot Carrier Degradation at an Elevated Temperature in a Device with Ultrathin Silicon Oxynitride,” Appl.	cache/fuelectenerg-513.pdf	txt/fuelectenerg-513.txt