id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-671	Collins, Aaron M.; Pan, Yue; Holland, Anthony S.	USING A TWO-CONTACT CIRCULAR TEST STRUCTURE TO DETERMINE THE SPECIFIC CONTACT RESISTIVITY OF CONTACTS TO BULK SEMICONDUCTORS	2015	8	.pdf	application/pdf	2871	155	64	We present a numerical method to extract specific contact resistivity (SCR) for three-dimensional (3-D) contact structures using a two-electrode test structure. The SCR obtained was (2.3-27) ×10-6 Ω·cm2 for the Ni-Ge contacts and (1.3-2.4) ×10-3 Ω·cm2 for the Ti-SiC. Key words: Specific contact resistivity, test structures, ohmic contact.	cache/fuelectenerg-671.pdf	txt/fuelectenerg-671.txt