id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-882	Papež, Vaclav; Hájek, Jiri; Kojecký, Bedrich	CAPACITIVE METHODS FOR TESTING OF POWER SEMICONDUCTOR DEVICES	2015	11	.pdf	application/pdf	4640	212	57	In case of breakdown at the measured p- n junction during high voltage measurements, the over voltage protection circuits are not usually able to ensure the RLC meter protection. We consider the measured voltage dependence of junction capacity, as it is given by Eq.	cache/fuelectenerg-882.pdf	txt/fuelectenerg-882.txt