id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fuelectenerg-971	Shurenkov, Vladimir Vasilevich; Pershenkov, Vyacheslav Sergeevich	ELECTROMAGNETIC PULSE EFFECTS AND DAMAGE MECHANISM ON THE SEMICONDUCTOR ELECTRONICS	2016	9	.pdf	application/pdf	3180	169	52	This paper examines physical mechanism of malfunction and destruction of electronic devices by high power microwaves electromagnetic pulse. [5] S. M. Hwang, J. I. Hong, and C. S. Huh, “Characterization of the susceptibility of integrated circuits with induction caused by high power microwaves”, Progress In Electromagnetics Research, PIER, vol. 81, pp. 61-72, 2008.	cache/fuelectenerg-971.pdf	txt/fuelectenerg-971.txt