id	domain	url
fuelectenerg-3620	doi.org	https://doi.org/10.2298/fuee1803343s
fuelectenerg-3620	en.wikipedia.org	https://en.wikipedia.org/wiki/double-gate_transistor
fuelectenerg-3620	en.wikipedia.org	https://en.wikipedia.org/wiki/wafer_(electronics
fuelectenerg-3620	en.wikipedia.org	https://en.wikipedia.org/wiki/cmos
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224525678_negative_bias_stress_of_mos_devices_at_high_electric_fields_and_degradation_of_mnos_devices_j_appl_phys?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/2985293_cramming_more_components_onto_integrated_circuits?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/2985293_cramming_more_components_onto_integrated_circuits?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/2985293_cramming_more_components_onto_integrated_circuits?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/2985293_cramming_more_components_onto_integrated_circuits?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/242353242_mos_scaling_transistor_challenges_for_the_21st_century?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/242353242_mos_scaling_transistor_challenges_for_the_21st_century?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/242353242_mos_scaling_transistor_challenges_for_the_21st_century?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/261039047_cmos_scaling_for_the_22nm_node_and_beyond_device_physics_and_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/261039047_cmos_scaling_for_the_22nm_node_and_beyond_device_physics_and_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/261039047_cmos_scaling_for_the_22nm_node_and_beyond_device_physics_and_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224102934_high-performance_cmos_variability_in_the_65-nm_regime_and_beyond_ibm_j_res_and_dev?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224102934_high-performance_cmos_variability_in_the_65-nm_regime_and_beyond_ibm_j_res_and_dev?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224102934_high-performance_cmos_variability_in_the_65-nm_regime_and_beyond_ibm_j_res_and_dev?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224102934_high-performance_cmos_variability_in_the_65-nm_regime_and_beyond_ibm_j_res_and_dev?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224102934_high-performance_cmos_variability_in_the_65-nm_regime_and_beyond_ibm_j_res_and_dev?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	public.itrs.net	http://public.itrs.net
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/234945384_negative_bias_temperature_instability_road_to_cross_in_deep_submicron_silicon_semiconductor_manufacturing_j_appl_phys_94_1?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/234945384_negative_bias_temperature_instability_road_to_cross_in_deep_submicron_silicon_semiconductor_manufacturing_j_appl_phys_94_1?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/234945384_negative_bias_temperature_instability_road_to_cross_in_deep_submicron_silicon_semiconductor_manufacturing_j_appl_phys_94_1?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/234945384_negative_bias_temperature_instability_road_to_cross_in_deep_submicron_silicon_semiconductor_manufacturing_j_appl_phys_94_1?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/241634466_statistical_variability_and_reliability_in_nanoscale_finfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/241634466_statistical_variability_and_reliability_in_nanoscale_finfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/241634466_statistical_variability_and_reliability_in_nanoscale_finfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/241634466_statistical_variability_and_reliability_in_nanoscale_finfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224147129_origin_of_nbti_variability_in_deeply_scaled_pfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224147129_origin_of_nbti_variability_in_deeply_scaled_pfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224147129_origin_of_nbti_variability_in_deeply_scaled_pfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224147129_origin_of_nbti_variability_in_deeply_scaled_pfets?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224672870_prediction_of_logic_product_failure_due_to_thin-gate_oxide_breakdown?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224672870_prediction_of_logic_product_failure_due_to_thin-gate_oxide_breakdown?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224672870_prediction_of_logic_product_failure_due_to_thin-gate_oxide_breakdown?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/251520646_from_defects_creation_to_circuit_reliability_-_a_bottom-up_approach_invited?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/251520646_from_defects_creation_to_circuit_reliability_-_a_bottom-up_approach_invited?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/251520646_from_defects_creation_to_circuit_reliability_-_a_bottom-up_approach_invited?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/251520646_from_defects_creation_to_circuit_reliability_-_a_bottom-up_approach_invited?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/251520646_from_defects_creation_to_circuit_reliability_-_a_bottom-up_approach_invited?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239046513_investigation_of_silicon-silicon_dioxide_interface_using_mos_structure?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239046513_investigation_of_silicon-silicon_dioxide_interface_using_mos_structure?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239046513_investigation_of_silicon-silicon_dioxide_interface_using_mos_structure?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239763174_bti_impact_on_logical_gates_in_nano-scale_cmos_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239763174_bti_impact_on_logical_gates_in_nano-scale_cmos_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239763174_bti_impact_on_logical_gates_in_nano-scale_cmos_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239763174_bti_impact_on_logical_gates_in_nano-scale_cmos_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/239763174_bti_impact_on_logical_gates_in_nano-scale_cmos_technology?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
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fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/259097263_impact_of_duty_factor_stress_stimuli_and_gate_drive_strength_on_gate_delay_degradation_with_an_atomistic_trap-based_bti_model?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/259097263_impact_of_duty_factor_stress_stimuli_and_gate_drive_strength_on_gate_delay_degradation_with_an_atomistic_trap-based_bti_model?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/259097263_impact_of_duty_factor_stress_stimuli_and_gate_drive_strength_on_gate_delay_degradation_with_an_atomistic_trap-based_bti_model?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/259097263_impact_of_duty_factor_stress_stimuli_and_gate_drive_strength_on_gate_delay_degradation_with_an_atomistic_trap-based_bti_model?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/259097263_impact_of_duty_factor_stress_stimuli_and_gate_drive_strength_on_gate_delay_degradation_with_an_atomistic_trap-based_bti_model?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/222753189_nbti_degradation_from_physical_mechanisms_to_modeling?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/222753189_nbti_degradation_from_physical_mechanisms_to_modeling?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224567194_a_two-stage_model_for_negative_bias_temperature_instability?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224567194_a_two-stage_model_for_negative_bias_temperature_instability?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224567194_a_two-stage_model_for_negative_bias_temperature_instability?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224490639_the_impact_of_nbti_effect_on_combinational_circuit_modeling_simulation_and_analysis?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224490639_the_impact_of_nbti_effect_on_combinational_circuit_modeling_simulation_and_analysis?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224490639_the_impact_of_nbti_effect_on_combinational_circuit_modeling_simulation_and_analysis?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224490639_the_impact_of_nbti_effect_on_combinational_circuit_modeling_simulation_and_analysis?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.researchgate.net	https://www.researchgate.net/publication/224490639_the_impact_of_nbti_effect_on_combinational_circuit_modeling_simulation_and_analysis?el=1_x_8&enrichid=rgreq-d53d2898-5e0d-4d8d-ba15-6a400a9455e7&enrichsource=y292zxjqywdlozi2otgxodcwmjtbuzoxnzy5nzyymtiwmtmwntzamtqxotiwntgyntq4mw=
fuelectenerg-3620	www.itrs.net	www.itrs.net>