id	keyword
fuelectenerg-3620	gate
fuelectenerg-3620	reliability
fuelectenerg-3620	aging
fuelectenerg-3620	temperature
fuelectenerg-3620	devices
fuelectenerg-3620	current
fuelectenerg-3620	carrier
fuelectenerg-3620	degradation
fuelectenerg-3620	voltage
fuelectenerg-3620	stress
fuelectenerg-3620	bti
fuelectenerg-3620	channel
fuelectenerg-3620	technology
fuelectenerg-3620	mechanisms
fuelectenerg-3620	effects
fuelectenerg-3620	bias
fuelectenerg-3620	finfet
fuelectenerg-3620	scaling
fuelectenerg-3620	transistor
fuelectenerg-3620	circuit
fuelectenerg-3620	time
fuelectenerg-3620	model
fuelectenerg-3620	injection
fuelectenerg-3620	electrons
fuelectenerg-3620	drain