id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fumecheng-9954	Shugurov, Artur R.; Nikonov, Anton Y.; Dmitriev, Andrey I.	THE EFFECT OF ELECTRON-BEAM TREATMENT ON THE DEFORMATION BEHAVIOR OF THE EBAM TI-6AL-4V UNDER SCRATCHING	2022	13	.pdf	application/pdf	5541	294	57	The CEBS treated EBAM Ti-6Al-4V sample also primarily demonstrates peaks of the α-Ti phase in the XRD pattern, but (100) preferred orientation became slightly less pronounced. The microstructure of the as-built and CEBS treated EBAM Ti–6Al–4V samples was investigated using an Axiovert 40 Mat optical microscope (Carl Zeiss, Göttingen, Germany).	cache/fumecheng-9954.pdf	txt/fumecheng-9954.txt