id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
fcis-31255	Wang, Bowen; Guan, Xuemei	Research on Parallel Testing Technology of MCU Chips Based on ATE	2025	5	.pdf	application/pdf	2815	133	51	This paper introduces the implementation methods of parallel testing technology based on ATE, such as the hardware architecture design of the test system, the optimization strategy of the test process, and the processing and analysis methods of test data. In order to achieve real-time collection and processing of test data, corresponding data collection points are set in the test program.	cache/fcis-31255.pdf	txt/fcis-31255.txt