id	sid	tid	token	lemma	pos
fcis-31255	1	1	frontiers	frontier	NOUN
fcis-31255	1	2	in	in	ADP
fcis-31255	1	3	computing	computing	NOUN
fcis-31255	1	4	and	and	CCONJ
fcis-31255	1	5	intelligent	intelligent	ADJ
fcis-31255	1	6	systems	system	NOUN
fcis-31255	1	7	issn	issn	VERB
fcis-31255	1	8	:	:	PUNCT
fcis-31255	1	9	2832	2832	NUM
fcis-31255	1	10	-	-	SYM
fcis-31255	1	11	6024	6024	NUM
fcis-31255	1	12	|	|	NOUN
fcis-31255	1	13	vol	vol	NOUN
fcis-31255	1	14	.	.	PROPN
fcis-31255	2	1	12	12	NUM
fcis-31255	2	2	,	,	PUNCT
fcis-31255	2	3	no	no	INTJ
fcis-31255	2	4	.	.	NOUN
fcis-31255	2	5	3	3	NUM
fcis-31255	2	6	,	,	PUNCT
fcis-31255	2	7	2025	2025	NUM
fcis-31255	2	8	83	83	NUM
fcis-31255	2	9	research	research	NOUN
fcis-31255	2	10	on	on	ADP
fcis-31255	2	11	parallel	parallel	ADJ
fcis-31255	2	12	testing	testing	NOUN
fcis-31255	2	13	technology	technology	NOUN
fcis-31255	2	14	of	of	ADP
fcis-31255	2	15	mcu	mcu	PROPN
fcis-31255	2	16	chips	chip	NOUN
fcis-31255	2	17	based	base	VERB
fcis-31255	2	18	on	on	ADP
fcis-31255	2	19	ate	ate	PROPN
fcis-31255	2	20	bowen	bowen	PROPN
fcis-31255	2	21	wang	wang	PROPN
fcis-31255	2	22	,	,	PUNCT
fcis-31255	2	23	xuemei	xuemei	PROPN
fcis-31255	2	24	guan	guan	PROPN
fcis-31255	2	25	northeast	northeast	PROPN
fcis-31255	2	26	forestry	forestry	PROPN
fcis-31255	2	27	university	university	PROPN
fcis-31255	2	28	,	,	PUNCT
fcis-31255	2	29	harbin	harbin	PROPN
fcis-31255	2	30	heilongjiang	heilongjiang	PROPN
fcis-31255	2	31	,	,	PUNCT
fcis-31255	2	32	226200	226200	NUM
fcis-31255	2	33	,	,	PUNCT
fcis-31255	2	34	china	china	PROPN
fcis-31255	2	35	abstract	abstract	PROPN
fcis-31255	2	36	:	:	PUNCT
fcis-31255	3	1	micro	micro	PROPN
fcis-31255	3	2	control	control	PROPN
fcis-31255	3	3	units	unit	NOUN
fcis-31255	3	4	(	(	PUNCT
fcis-31255	3	5	mcus	mcus	PROPN
fcis-31255	3	6	)	)	PUNCT
fcis-31255	3	7	are	be	AUX
fcis-31255	3	8	extensively	extensively	ADV
fcis-31255	3	9	applied	apply	VERB
fcis-31255	3	10	across	across	ADP
fcis-31255	3	11	various	various	ADJ
fcis-31255	3	12	domains	domain	NOUN
fcis-31255	3	13	such	such	ADJ
fcis-31255	3	14	as	as	ADP
fcis-31255	3	15	automotive	automotive	ADJ
fcis-31255	3	16	electronics	electronic	NOUN
fcis-31255	3	17	,	,	PUNCT
fcis-31255	3	18	smart	smart	ADJ
fcis-31255	3	19	homes	home	NOUN
fcis-31255	3	20	,	,	PUNCT
fcis-31255	3	21	and	and	CCONJ
fcis-31255	3	22	communication	communication	NOUN
fcis-31255	3	23	equipment	equipment	NOUN
fcis-31255	3	24	.	.	PUNCT
fcis-31255	4	1	their	their	PRON
fcis-31255	4	2	testing	testing	NOUN
fcis-31255	4	3	technology	technology	NOUN
fcis-31255	4	4	stands	stand	VERB
fcis-31255	4	5	as	as	ADP
fcis-31255	4	6	a	a	DET
fcis-31255	4	7	pivotal	pivotal	ADJ
fcis-31255	4	8	element	element	NOUN
fcis-31255	4	9	in	in	ADP
fcis-31255	4	10	guaranteeing	guarantee	VERB
fcis-31255	4	11	product	product	NOUN
fcis-31255	4	12	quality	quality	NOUN
fcis-31255	4	13	.	.	PUNCT
fcis-31255	5	1	conventional	conventional	ADJ
fcis-31255	5	2	mcu	mcu	PROPN
fcis-31255	5	3	chip	chip	NOUN
fcis-31255	5	4	testing	testing	NOUN
fcis-31255	5	5	predominantly	predominantly	ADV
fcis-31255	5	6	utilizes	utilize	VERB
fcis-31255	5	7	a	a	DET
fcis-31255	5	8	serial	serial	ADJ
fcis-31255	5	9	testing	testing	NOUN
fcis-31255	5	10	mode	mode	NOUN
fcis-31255	5	11	,	,	PUNCT
fcis-31255	5	12	which	which	PRON
fcis-31255	5	13	is	be	AUX
fcis-31255	5	14	plagued	plague	VERB
fcis-31255	5	15	by	by	ADP
fcis-31255	5	16	issues	issue	NOUN
fcis-31255	5	17	like	like	ADP
fcis-31255	5	18	lengthy	lengthy	ADJ
fcis-31255	5	19	testing	testing	NOUN
fcis-31255	5	20	duration	duration	NOUN
fcis-31255	5	21	and	and	CCONJ
fcis-31255	5	22	low	low	ADJ
fcis-31255	5	23	efficiency	efficiency	NOUN
fcis-31255	5	24	,	,	PUNCT
fcis-31255	5	25	rendering	render	VERB
fcis-31255	5	26	it	it	PRON
fcis-31255	5	27	incapable	incapable	ADJ
fcis-31255	5	28	of	of	ADP
fcis-31255	5	29	satisfying	satisfy	VERB
fcis-31255	5	30	the	the	DET
fcis-31255	5	31	rapid	rapid	ADJ
fcis-31255	5	32	testing	testing	NOUN
fcis-31255	5	33	demands	demand	NOUN
fcis-31255	5	34	of	of	ADP
fcis-31255	5	35	large	large	ADJ
fcis-31255	5	36	scale	scale	NOUN
fcis-31255	5	37	production	production	NOUN
fcis-31255	5	38	lines	line	NOUN
fcis-31255	5	39	.	.	PUNCT
fcis-31255	6	1	this	this	DET
fcis-31255	6	2	paper	paper	NOUN
fcis-31255	6	3	delves	delve	VERB
fcis-31255	6	4	into	into	ADP
fcis-31255	6	5	the	the	DET
fcis-31255	6	6	parallel	parallel	ADJ
fcis-31255	6	7	testing	testing	NOUN
fcis-31255	6	8	technology	technology	NOUN
fcis-31255	6	9	of	of	ADP
fcis-31255	6	10	mcu	mcu	PROPN
fcis-31255	6	11	chips	chip	NOUN
fcis-31255	6	12	based	base	VERB
fcis-31255	6	13	on	on	ADP
fcis-31255	6	14	automatic	automatic	ADJ
fcis-31255	6	15	test	test	NOUN
fcis-31255	6	16	equipment	equipment	NOUN
fcis-31255	6	17	(	(	PUNCT
fcis-31255	6	18	ate	ate	NOUN
fcis-31255	6	19	)	)	PUNCT
fcis-31255	6	20	.	.	PUNCT
fcis-31255	7	1	by	by	ADP
fcis-31255	7	2	refining	refine	VERB
fcis-31255	7	3	the	the	DET
fcis-31255	7	4	testing	testing	NOUN
fcis-31255	7	5	scheme	scheme	NOUN
fcis-31255	7	6	,	,	PUNCT
fcis-31255	7	7	it	it	PRON
fcis-31255	7	8	enhances	enhance	VERB
fcis-31255	7	9	test	test	NOUN
fcis-31255	7	10	parallelism	parallelism	NOUN
fcis-31255	7	11	to	to	PART
fcis-31255	7	12	ensure	ensure	VERB
fcis-31255	7	13	testing	testing	NOUN
fcis-31255	7	14	efficiency	efficiency	NOUN
fcis-31255	7	15	and	and	CCONJ
fcis-31255	7	16	diminish	diminish	VERB
fcis-31255	7	17	testing	testing	NOUN
fcis-31255	7	18	costs	cost	NOUN
fcis-31255	7	19	.	.	PUNCT
fcis-31255	8	1	this	this	DET
fcis-31255	8	2	study	study	NOUN
fcis-31255	8	3	also	also	ADV
fcis-31255	8	4	scrutinizes	scrutinize	VERB
fcis-31255	8	5	the	the	DET
fcis-31255	8	6	fundamental	fundamental	ADJ
fcis-31255	8	7	testing	testing	NOUN
fcis-31255	8	8	requirements	requirement	NOUN
fcis-31255	8	9	of	of	ADP
fcis-31255	8	10	mcu	mcu	PROPN
fcis-31255	8	11	chips	chip	NOUN
fcis-31255	8	12	and	and	CCONJ
fcis-31255	8	13	elaborates	elaborate	VERB
fcis-31255	8	14	on	on	ADP
fcis-31255	8	15	the	the	DET
fcis-31255	8	16	implementation	implementation	NOUN
fcis-31255	8	17	methodology	methodology	NOUN
fcis-31255	8	18	of	of	ADP
fcis-31255	8	19	parallel	parallel	ADJ
fcis-31255	8	20	testing	testing	NOUN
fcis-31255	8	21	technology	technology	NOUN
fcis-31255	8	22	based	base	VERB
fcis-31255	8	23	on	on	ADP
fcis-31255	8	24	ate	ate	NOUN
fcis-31255	8	25	.	.	PUNCT
fcis-31255	9	1	it	it	PRON
fcis-31255	9	2	posits	posit	VERB
fcis-31255	9	3	that	that	SCONJ
fcis-31255	9	4	parallel	parallel	ADJ
fcis-31255	9	5	testing	testing	NOUN
fcis-31255	9	6	technology	technology	NOUN
fcis-31255	9	7	can	can	AUX
fcis-31255	9	8	substantially	substantially	ADV
fcis-31255	9	9	curtail	curtail	VERB
fcis-31255	9	10	testing	testing	NOUN
fcis-31255	9	11	time	time	NOUN
fcis-31255	9	12	,	,	PUNCT
fcis-31255	9	13	amplify	amplify	VERB
fcis-31255	9	14	testing	test	VERB
fcis-31255	9	15	throughput	throughput	NOUN
fcis-31255	9	16	,	,	PUNCT
fcis-31255	9	17	ensure	ensure	VERB
fcis-31255	9	18	the	the	DET
fcis-31255	9	19	accuracy	accuracy	NOUN
fcis-31255	9	20	and	and	CCONJ
fcis-31255	9	21	reliability	reliability	NOUN
fcis-31255	9	22	of	of	ADP
fcis-31255	9	23	testing	test	VERB
fcis-31255	9	24	outcomes	outcome	NOUN
fcis-31255	9	25	,	,	PUNCT
fcis-31255	9	26	and	and	CCONJ
fcis-31255	9	27	offers	offer	VERB
fcis-31255	9	28	a	a	DET
fcis-31255	9	29	novel	novel	ADJ
fcis-31255	9	30	solution	solution	NOUN
fcis-31255	9	31	for	for	ADP
fcis-31255	9	32	large	large	ADJ
fcis-31255	9	33	scale	scale	NOUN
fcis-31255	9	34	mcu	mcu	NOUN
fcis-31255	9	35	chip	chip	NOUN
fcis-31255	9	36	testing	testing	NOUN
fcis-31255	9	37	.	.	PUNCT
fcis-31255	10	1	keywords	keyword	NOUN
fcis-31255	10	2	:	:	PUNCT
fcis-31255	10	3	mcu	mcu	NOUN
fcis-31255	10	4	;	;	PUNCT
fcis-31255	10	5	ate	eat	VERB
fcis-31255	10	6	;	;	PUNCT
fcis-31255	10	7	parallel	parallel	ADJ
fcis-31255	10	8	testing	testing	NOUN
fcis-31255	10	9	technology	technology	NOUN
fcis-31255	10	10	;	;	PUNCT
fcis-31255	10	11	test	test	NOUN
fcis-31255	10	12	efficiency	efficiency	NOUN
fcis-31255	10	13	.	.	PUNCT
fcis-31255	11	1	1	1	X
fcis-31255	11	2	.	.	X
fcis-31255	11	3	introduction	introduction	NOUN
fcis-31255	11	4	the	the	DET
fcis-31255	11	5	industry	industry	NOUN
fcis-31255	11	6	is	be	AUX
fcis-31255	11	7	exploring	explore	VERB
fcis-31255	11	8	parallel	parallel	ADJ
fcis-31255	11	9	testing	testing	NOUN
fcis-31255	11	10	technology	technology	NOUN
fcis-31255	11	11	based	base	VERB
fcis-31255	11	12	on	on	ADP
fcis-31255	11	13	automatic	automatic	ADJ
fcis-31255	11	14	test	test	NOUN
fcis-31255	11	15	equipment	equipment	NOUN
fcis-31255	11	16	(	(	PUNCT
fcis-31255	11	17	ate	ate	NOUN
fcis-31255	11	18	)	)	PUNCT
fcis-31255	11	19	.	.	PUNCT
fcis-31255	12	1	as	as	ADP
fcis-31255	12	2	a	a	DET
fcis-31255	12	3	highly	highly	ADV
fcis-31255	12	4	automated	automate	VERB
fcis-31255	12	5	testing	testing	NOUN
fcis-31255	12	6	device	device	NOUN
fcis-31255	12	7	,	,	PUNCT
fcis-31255	12	8	it	it	PRON
fcis-31255	12	9	can	can	AUX
fcis-31255	12	10	accurately	accurately	ADV
fcis-31255	12	11	test	test	VERB
fcis-31255	12	12	chips	chip	NOUN
fcis-31255	12	13	and	and	CCONJ
fcis-31255	12	14	simultaneously	simultaneously	ADV
fcis-31255	12	15	test	test	VERB
fcis-31255	12	16	multiple	multiple	ADJ
fcis-31255	12	17	chip	chip	NOUN
fcis-31255	12	18	functional	functional	ADJ
fcis-31255	12	19	modules	module	NOUN
fcis-31255	12	20	,	,	PUNCT
fcis-31255	12	21	further	far	ADV
fcis-31255	12	22	improving	improve	VERB
fcis-31255	12	23	testing	testing	NOUN
fcis-31255	12	24	efficiency	efficiency	NOUN
fcis-31255	12	25	.	.	PUNCT
fcis-31255	13	1	this	this	DET
fcis-31255	13	2	paper	paper	NOUN
fcis-31255	13	3	introduces	introduce	VERB
fcis-31255	13	4	the	the	DET
fcis-31255	13	5	implementation	implementation	NOUN
fcis-31255	13	6	methods	method	NOUN
fcis-31255	13	7	of	of	ADP
fcis-31255	13	8	parallel	parallel	ADJ
fcis-31255	13	9	testing	testing	NOUN
fcis-31255	13	10	technology	technology	NOUN
fcis-31255	13	11	based	base	VERB
fcis-31255	13	12	on	on	ADP
fcis-31255	13	13	ate	ate	NOUN
fcis-31255	13	14	,	,	PUNCT
fcis-31255	13	15	such	such	ADJ
fcis-31255	13	16	as	as	ADP
fcis-31255	13	17	the	the	DET
fcis-31255	13	18	hardware	hardware	NOUN
fcis-31255	13	19	architecture	architecture	NOUN
fcis-31255	13	20	design	design	NOUN
fcis-31255	13	21	of	of	ADP
fcis-31255	13	22	the	the	DET
fcis-31255	13	23	test	test	NOUN
fcis-31255	13	24	system	system	NOUN
fcis-31255	13	25	,	,	PUNCT
fcis-31255	13	26	the	the	DET
fcis-31255	13	27	optimization	optimization	NOUN
fcis-31255	13	28	strategy	strategy	NOUN
fcis-31255	13	29	of	of	ADP
fcis-31255	13	30	the	the	DET
fcis-31255	13	31	test	test	NOUN
fcis-31255	13	32	process	process	NOUN
fcis-31255	13	33	,	,	PUNCT
fcis-31255	13	34	and	and	CCONJ
fcis-31255	13	35	the	the	DET
fcis-31255	13	36	processing	processing	NOUN
fcis-31255	13	37	and	and	CCONJ
fcis-31255	13	38	analysis	analysis	NOUN
fcis-31255	13	39	methods	method	NOUN
fcis-31255	13	40	of	of	ADP
fcis-31255	13	41	test	test	NOUN
fcis-31255	13	42	data	datum	NOUN
fcis-31255	13	43	.	.	PUNCT
fcis-31255	14	1	provide	provide	VERB
fcis-31255	14	2	reliable	reliable	ADJ
fcis-31255	14	3	parallel	parallel	ADJ
fcis-31255	14	4	testing	testing	NOUN
fcis-31255	14	5	solutions	solution	NOUN
fcis-31255	14	6	for	for	ADP
fcis-31255	14	7	mcu	mcu	PROPN
fcis-31255	14	8	chips	chip	NOUN
fcis-31255	14	9	to	to	PART
fcis-31255	14	10	meet	meet	VERB
fcis-31255	14	11	the	the	DET
fcis-31255	14	12	rapid	rapid	ADJ
fcis-31255	14	13	testing	testing	NOUN
fcis-31255	14	14	requirements	requirement	NOUN
fcis-31255	14	15	of	of	ADP
fcis-31255	14	16	large	large	ADJ
fcis-31255	14	17	-	-	PUNCT
fcis-31255	14	18	scale	scale	NOUN
fcis-31255	14	19	production	production	NOUN
fcis-31255	14	20	lines	line	NOUN
fcis-31255	14	21	and	and	CCONJ
fcis-31255	14	22	promote	promote	VERB
fcis-31255	14	23	the	the	DET
fcis-31255	14	24	application	application	NOUN
fcis-31255	14	25	of	of	ADP
fcis-31255	14	26	mcu	mcu	PROPN
fcis-31255	14	27	chip	chip	NOUN
fcis-31255	14	28	testing	testing	NOUN
fcis-31255	14	29	technology	technology	NOUN
fcis-31255	15	1	[	[	X
fcis-31255	15	2	1	1	NUM
fcis-31255	15	3	]	]	PUNCT
fcis-31255	15	4	.	.	PUNCT
fcis-31255	16	1	this	this	DET
fcis-31255	16	2	paper	paper	NOUN
fcis-31255	16	3	uses	use	VERB
fcis-31255	16	4	the	the	DET
fcis-31255	16	5	tr6836s	tr6836s	NOUN
fcis-31255	16	6	sii	sii	ADJ
fcis-31255	16	7	test	test	NOUN
fcis-31255	16	8	machine	machine	NOUN
fcis-31255	16	9	of	of	ADP
fcis-31255	16	10	the	the	DET
fcis-31255	16	11	new	new	ADJ
fcis-31255	16	12	model	model	NOUN
fcis-31255	16	13	of	of	ADP
fcis-31255	16	14	tri	tri	PROPN
fcis-31255	16	15	and	and	CCONJ
fcis-31255	16	16	the	the	DET
fcis-31255	16	17	sop	sop	PROPN
fcis-31255	16	18	turret	turret	PROPN
fcis-31255	16	19	sorter	sorter	PROPN
fcis-31255	16	20	of	of	ADP
fcis-31255	16	21	macrotest	macrot	ADJ
fcis-31255	16	22	to	to	PART
fcis-31255	16	23	develop	develop	VERB
fcis-31255	16	24	the	the	DET
fcis-31255	16	25	test	test	NOUN
fcis-31255	16	26	scheme	scheme	NOUN
fcis-31255	16	27	of	of	ADP
fcis-31255	16	28	mcu	mcu	PROPN
fcis-31255	16	29	chips	chip	NOUN
fcis-31255	16	30	.	.	PUNCT
fcis-31255	17	1	fig	fig	NOUN
fcis-31255	17	2	1	1	NUM
fcis-31255	17	3	.	.	PUNCT
fcis-31255	18	1	tr6836s	tr6836s	NOUN
fcis-31255	18	2	sii	sii	NOUN
fcis-31255	18	3	2	2	NUM
fcis-31255	18	4	.	.	PUNCT
fcis-31255	18	5	analysis	analysis	NOUN
fcis-31255	18	6	of	of	ADP
fcis-31255	18	7	testing	testing	NOUN
fcis-31255	18	8	requirements	requirement	NOUN
fcis-31255	18	9	and	and	CCONJ
fcis-31255	18	10	difficulties	difficulty	NOUN
fcis-31255	18	11	for	for	ADP
fcis-31255	18	12	mcu	mcu	NOUN
fcis-31255	18	13	chips	chip	NOUN
fcis-31255	18	14	2.1	2.1	NUM
fcis-31255	18	15	.	.	PUNCT
fcis-31255	19	1	test	test	NOUN
fcis-31255	19	2	requirements	requirement	NOUN
fcis-31255	19	3	mcu	mcu	PROPN
fcis-31255	19	4	chip	chip	NOUN
fcis-31255	19	5	testing	testing	NOUN
fcis-31255	19	6	includes	include	VERB
fcis-31255	19	7	multiple	multiple	ADJ
fcis-31255	19	8	aspects	aspect	NOUN
fcis-31255	19	9	such	such	ADJ
fcis-31255	19	10	as	as	ADP
fcis-31255	19	11	functional	functional	ADJ
fcis-31255	19	12	testing	testing	NOUN
fcis-31255	19	13	,	,	PUNCT
fcis-31255	19	14	parameter	parameter	NOUN
fcis-31255	19	15	testing	testing	NOUN
fcis-31255	19	16	,	,	PUNCT
fcis-31255	19	17	and	and	CCONJ
fcis-31255	19	18	stability	stability	NOUN
fcis-31255	19	19	testing	testing	NOUN
fcis-31255	19	20	.	.	PUNCT
fcis-31255	20	1	functional	functional	ADJ
fcis-31255	20	2	testing	testing	NOUN
fcis-31255	20	3	is	be	AUX
fcis-31255	20	4	used	use	VERB
fcis-31255	20	5	to	to	PART
fcis-31255	20	6	verify	verify	VERB
fcis-31255	20	7	whether	whether	SCONJ
fcis-31255	20	8	the	the	DET
fcis-31255	20	9	chip	chip	NOUN
fcis-31255	20	10	meets	meet	VERB
fcis-31255	20	11	the	the	DET
fcis-31255	20	12	basic	basic	ADJ
fcis-31255	20	13	design	design	NOUN
fcis-31255	20	14	requirements	requirement	NOUN
fcis-31255	20	15	.	.	PUNCT
fcis-31255	21	1	parameter	parameter	NOUN
fcis-31255	21	2	testing	testing	NOUN
fcis-31255	21	3	focuses	focus	VERB
fcis-31255	21	4	on	on	ADP
fcis-31255	21	5	chip	chip	NOUN
fcis-31255	21	6	simulation	simulation	NOUN
fcis-31255	21	7	parameters	parameter	NOUN
fcis-31255	21	8	,	,	PUNCT
fcis-31255	21	9	such	such	ADJ
fcis-31255	21	10	as	as	ADP
fcis-31255	21	11	voltage	voltage	NOUN
fcis-31255	21	12	,	,	PUNCT
fcis-31255	21	13	current	current	ADJ
fcis-31255	21	14	,	,	PUNCT
fcis-31255	21	15	rise	rise	NOUN
fcis-31255	21	16	time	time	NOUN
fcis-31255	21	17	,	,	PUNCT
fcis-31255	21	18	fall	fall	VERB
fcis-31255	21	19	time	time	NOUN
fcis-31255	21	20	,	,	PUNCT
fcis-31255	21	21	etc	etc	X
fcis-31255	21	22	.	.	X
fcis-31255	21	23	stability	stability	NOUN
fcis-31255	21	24	testing	testing	NOUN
fcis-31255	21	25	assesses	assess	VERB
fcis-31255	21	26	the	the	DET
fcis-31255	21	27	performance	performance	NOUN
fcis-31255	21	28	of	of	ADP
fcis-31255	21	29	the	the	DET
fcis-31255	21	30	chip	chip	NOUN
fcis-31255	21	31	under	under	ADP
fcis-31255	21	32	external	external	ADJ
fcis-31255	21	33	stress	stress	NOUN
fcis-31255	21	34	conditions	condition	NOUN
fcis-31255	21	35	.	.	PUNCT
fcis-31255	22	1	2.2	2.2	NUM
fcis-31255	22	2	.	.	PUNCT
fcis-31255	23	1	test	test	NOUN
fcis-31255	23	2	difficulties	difficulty	NOUN
fcis-31255	23	3	(	(	PUNCT
fcis-31255	23	4	1	1	X
fcis-31255	23	5	)	)	PUNCT
fcis-31255	23	6	the	the	DET
fcis-31255	23	7	issue	issue	NOUN
fcis-31255	23	8	of	of	ADP
fcis-31255	23	9	interface	interface	NOUN
fcis-31255	23	10	board	board	NOUN
fcis-31255	23	11	universality	universality	NOUN
fcis-31255	23	12	:	:	PUNCT
fcis-31255	23	13	different	different	ADJ
fcis-31255	23	14	package	package	NOUN
fcis-31255	23	15	of	of	ADP
fcis-31255	23	16	mcu	mcu	PROPN
fcis-31255	23	17	chips	chip	NOUN
fcis-31255	23	18	have	have	VERB
fcis-31255	23	19	different	different	ADJ
fcis-31255	23	20	interfaces	interface	NOUN
fcis-31255	23	21	,	,	PUNCT
fcis-31255	23	22	resulting	result	VERB
fcis-31255	23	23	in	in	ADP
fcis-31255	23	24	the	the	DET
fcis-31255	23	25	interface	interface	NOUN
fcis-31255	23	26	board	board	NOUN
fcis-31255	23	27	of	of	ADP
fcis-31255	23	28	the	the	DET
fcis-31255	23	29	test	test	NOUN
fcis-31255	23	30	system	system	NOUN
fcis-31255	23	31	being	be	AUX
fcis-31255	23	32	single	single	ADJ
fcis-31255	23	33	,	,	PUNCT
fcis-31255	23	34	highly	highly	ADV
fcis-31255	23	35	specialized	specialized	ADJ
fcis-31255	23	36	,	,	PUNCT
fcis-31255	23	37	and	and	CCONJ
fcis-31255	23	38	having	have	VERB
fcis-31255	23	39	a	a	DET
fcis-31255	23	40	long	long	ADJ
fcis-31255	23	41	development	development	NOUN
fcis-31255	23	42	cycle[2	cycle[2	PROPN
fcis-31255	23	43	]	]	PUNCT
fcis-31255	23	44	.	.	PUNCT
fcis-31255	24	1	fig	fig	NOUN
fcis-31255	24	2	2	2	NUM
fcis-31255	24	3	.	.	PUNCT
fcis-31255	25	1	different	different	ADJ
fcis-31255	25	2	package	package	NOUN
fcis-31255	25	3	(	(	PUNCT
fcis-31255	25	4	2)signal	2)signal	NUM
fcis-31255	25	5	integrity	integrity	NOUN
fcis-31255	25	6	issue	issue	NOUN
fcis-31255	25	7	:	:	PUNCT
fcis-31255	25	8	in	in	ADP
fcis-31255	25	9	parallel	parallel	ADJ
fcis-31255	25	10	testing	testing	NOUN
fcis-31255	25	11	,	,	PUNCT
fcis-31255	25	12	interference	interference	NOUN
fcis-31255	25	13	delays	delay	NOUN
fcis-31255	25	14	between	between	ADP
fcis-31255	25	15	multi	multi	ADJ
fcis-31255	25	16	-	-	ADJ
fcis-31255	25	17	channel	channel	ADJ
fcis-31255	25	18	signals	signal	NOUN
fcis-31255	25	19	lead	lead	VERB
fcis-31255	25	20	to	to	ADP
fcis-31255	25	21	inaccurate	inaccurate	ADJ
fcis-31255	25	22	test	test	NOUN
fcis-31255	25	23	results	result	NOUN
fcis-31255	25	24	.	.	PUNCT
fcis-31255	26	1	(	(	PUNCT
fcis-31255	26	2	3)low	3)low	NUM
fcis-31255	26	3	testing	testing	NOUN
fcis-31255	26	4	efficiency	efficiency	NOUN
fcis-31255	26	5	:	:	PUNCT
fcis-31255	26	6	the	the	DET
fcis-31255	26	7	traditional	traditional	ADJ
fcis-31255	26	8	serial	serial	ADJ
fcis-31255	26	9	testing	testing	NOUN
fcis-31255	26	10	method	method	NOUN
fcis-31255	26	11	takes	take	VERB
fcis-31255	26	12	a	a	DET
fcis-31255	26	13	long	long	ADJ
fcis-31255	26	14	time	time	NOUN
fcis-31255	26	15	to	to	PART
fcis-31255	26	16	test	test	VERB
fcis-31255	26	17	and	and	CCONJ
fcis-31255	26	18	is	be	AUX
fcis-31255	26	19	difficult	difficult	ADJ
fcis-31255	26	20	to	to	PART
fcis-31255	26	21	meet	meet	VERB
fcis-31255	26	22	the	the	DET
fcis-31255	26	23	demands	demand	NOUN
fcis-31255	26	24	of	of	ADP
fcis-31255	26	25	large	large	ADJ
fcis-31255	26	26	-	-	PUNCT
fcis-31255	26	27	scale	scale	NOUN
fcis-31255	26	28	production	production	NOUN
fcis-31255	26	29	[	[	X
fcis-31255	26	30	3	3	NUM
fcis-31255	26	31	]	]	PUNCT
fcis-31255	26	32	.	.	PUNCT
fcis-31255	27	1	3	3	X
fcis-31255	27	2	.	.	X
fcis-31255	27	3	the	the	DET
fcis-31255	27	4	implementation	implementation	NOUN
fcis-31255	27	5	of	of	ADP
fcis-31255	27	6	parallel	parallel	ADJ
fcis-31255	27	7	testing	testing	NOUN
fcis-31255	27	8	technology	technology	NOUN
fcis-31255	27	9	for	for	ADP
fcis-31255	27	10	mcu	mcu	PROPN
fcis-31255	27	11	chips	chip	NOUN
fcis-31255	27	12	based	base	VERB
fcis-31255	27	13	on	on	ADP
fcis-31255	27	14	ate	ate	NOUN
fcis-31255	27	15	testing	testing	NOUN
fcis-31255	27	16	system	system	NOUN
fcis-31255	27	17	hardware	hardware	NOUN
fcis-31255	27	18	design	design	NOUN
fcis-31255	27	19	3.1	3.1	NUM
fcis-31255	27	20	.	.	PUNCT
fcis-31255	27	21	test	test	VERB
fcis-31255	27	22	the	the	DET
fcis-31255	27	23	hardware	hardware	NOUN
fcis-31255	27	24	design	design	NOUN
fcis-31255	27	25	of	of	ADP
fcis-31255	27	26	the	the	DET
fcis-31255	27	27	system	system	NOUN
fcis-31255	27	28	(	(	PUNCT
fcis-31255	27	29	1)main	1)main	NUM
fcis-31255	27	30	control	control	NOUN
fcis-31255	27	31	device	device	NOUN
fcis-31255	27	32	selection	selection	NOUN
fcis-31255	27	33	and	and	CCONJ
fcis-31255	27	34	design	design	NOUN
fcis-31255	27	35	:	:	PUNCT
fcis-31255	27	36	fpga	fpga	PROPN
fcis-31255	27	37	is	be	AUX
fcis-31255	27	38	selected	select	VERB
fcis-31255	27	39	as	as	ADP
fcis-31255	27	40	the	the	DET
fcis-31255	27	41	main	main	ADJ
fcis-31255	27	42	control	control	NOUN
fcis-31255	27	43	device	device	NOUN
fcis-31255	27	44	.	.	PUNCT
fcis-31255	28	1	fpga	fpga	PROPN
fcis-31255	28	2	has	have	VERB
fcis-31255	28	3	a	a	DET
fcis-31255	28	4	high	high	ADJ
fcis-31255	28	5	degree	degree	NOUN
fcis-31255	28	6	of	of	ADP
fcis-31255	28	7	programmability	programmability	NOUN
fcis-31255	28	8	and	and	CCONJ
fcis-31255	28	9	can	can	AUX
fcis-31255	28	10	be	be	AUX
fcis-31255	28	11	quickly	quickly	ADV
fcis-31255	28	12	configured	configure	VERB
fcis-31255	28	13	and	and	CCONJ
fcis-31255	28	14	the	the	DET
fcis-31255	28	15	test	test	NOUN
fcis-31255	28	16	logic	logic	NOUN
fcis-31255	28	17	adjusted	adjust	VERB
fcis-31255	28	18	according	accord	VERB
fcis-31255	28	19	to	to	ADP
fcis-31255	28	20	the	the	DET
fcis-31255	28	21	test	test	NOUN
fcis-31255	28	22	requirements	requirement	NOUN
fcis-31255	28	23	.	.	PUNCT
fcis-31255	29	1	the	the	DET
fcis-31255	29	2	relay	relay	NOUN
fcis-31255	29	3	84	84	NUM
fcis-31255	29	4	matrix	matrix	NOUN
fcis-31255	29	5	control	control	NOUN
fcis-31255	29	6	circuit	circuit	NOUN
fcis-31255	29	7	is	be	AUX
fcis-31255	29	8	designed	design	VERB
fcis-31255	29	9	through	through	ADP
fcis-31255	29	10	fpga	fpga	PROPN
fcis-31255	29	11	to	to	PART
fcis-31255	29	12	achieve	achieve	VERB
fcis-31255	29	13	the	the	DET
fcis-31255	29	14	parallel	parallel	ADJ
fcis-31255	29	15	control	control	NOUN
fcis-31255	29	16	switching	switching	NOUN
fcis-31255	29	17	of	of	ADP
fcis-31255	29	18	multi	multi	ADJ
fcis-31255	29	19	-	-	ADJ
fcis-31255	29	20	channel	channel	NOUN
fcis-31255	29	21	signals	signal	NOUN
fcis-31255	29	22	and	and	CCONJ
fcis-31255	29	23	improve	improve	VERB
fcis-31255	29	24	the	the	DET
fcis-31255	29	25	test	test	NOUN
fcis-31255	29	26	efficiency	efficiency	NOUN
fcis-31255	29	27	.	.	PUNCT
fcis-31255	30	1	(	(	PUNCT
fcis-31255	30	2	2	2	X
fcis-31255	30	3	)	)	PUNCT
fcis-31255	30	4	test	test	NOUN
fcis-31255	30	5	board	board	NOUN
fcis-31255	30	6	design	design	NOUN
fcis-31255	30	7	:	:	PUNCT
fcis-31255	30	8	in	in	ADP
fcis-31255	30	9	the	the	DET
fcis-31255	30	10	design	design	NOUN
fcis-31255	30	11	of	of	ADP
fcis-31255	30	12	test	test	NOUN
fcis-31255	30	13	boards	board	NOUN
fcis-31255	30	14	,	,	PUNCT
fcis-31255	30	15	factors	factor	NOUN
fcis-31255	30	16	such	such	ADJ
fcis-31255	30	17	as	as	ADP
fcis-31255	30	18	signal	signal	NOUN
fcis-31255	30	19	integrity	integrity	NOUN
fcis-31255	30	20	,	,	PUNCT
fcis-31255	30	21	impedance	impedance	NOUN
fcis-31255	30	22	matching	matching	NOUN
fcis-31255	30	23	,	,	PUNCT
fcis-31255	30	24	and	and	CCONJ
fcis-31255	30	25	equal	equal	ADJ
fcis-31255	30	26	delay	delay	NOUN
fcis-31255	30	27	need	need	VERB
fcis-31255	30	28	to	to	PART
fcis-31255	30	29	be	be	AUX
fcis-31255	30	30	fully	fully	ADV
fcis-31255	30	31	considered	consider	VERB
fcis-31255	30	32	.	.	PUNCT
fcis-31255	31	1	to	to	PART
fcis-31255	31	2	ensure	ensure	VERB
fcis-31255	31	3	the	the	DET
fcis-31255	31	4	accuracy	accuracy	NOUN
fcis-31255	31	5	of	of	ADP
fcis-31255	31	6	multichannel	multichannel	ADJ
fcis-31255	31	7	signals	signal	NOUN
fcis-31255	31	8	during	during	ADP
fcis-31255	31	9	transmission	transmission	NOUN
fcis-31255	31	10	,	,	PUNCT
fcis-31255	31	11	high	high	ADJ
fcis-31255	31	12	-	-	PUNCT
fcis-31255	31	13	quality	quality	NOUN
fcis-31255	31	14	transmission	transmission	NOUN
fcis-31255	31	15	lines	line	NOUN
fcis-31255	31	16	and	and	CCONJ
fcis-31255	31	17	meticulous	meticulous	ADJ
fcis-31255	31	18	wiring	wiring	NOUN
fcis-31255	31	19	design	design	NOUN
fcis-31255	31	20	are	be	AUX
fcis-31255	31	21	required	require	VERB
fcis-31255	31	22	.	.	PUNCT
fcis-31255	32	1	it	it	PRON
fcis-31255	32	2	has	have	VERB
fcis-31255	32	3	sufficient	sufficient	ADJ
fcis-31255	32	4	test	test	NOUN
fcis-31255	32	5	resources	resource	NOUN
fcis-31255	32	6	to	to	PART
fcis-31255	32	7	meet	meet	VERB
fcis-31255	32	8	the	the	DET
fcis-31255	32	9	test	test	NOUN
fcis-31255	32	10	requirements	requirement	NOUN
fcis-31255	32	11	of	of	ADP
fcis-31255	32	12	different	different	ADJ
fcis-31255	32	13	models	model	NOUN
fcis-31255	32	14	of	of	ADP
fcis-31255	32	15	mcu	mcu	PROPN
fcis-31255	32	16	chips	chip	NOUN
fcis-31255	32	17	.	.	PUNCT
fcis-31255	33	1	fig	fig	NOUN
fcis-31255	33	2	3	3	NUM
fcis-31255	33	3	.	.	PUNCT
fcis-31255	34	1	dd64	dd64	PROPN
fcis-31255	34	2	interface	interface	NOUN
fcis-31255	34	3	definition	definition	NOUN
fcis-31255	34	4	(	(	PUNCT
fcis-31255	34	5	3)impedance	3)impedance	NUM
fcis-31255	34	6	matching	matching	NOUN
fcis-31255	34	7	and	and	CCONJ
fcis-31255	34	8	equal	equal	ADJ
fcis-31255	34	9	delay	delay	NOUN
fcis-31255	34	10	design	design	NOUN
fcis-31255	34	11	:	:	PUNCT
fcis-31255	34	12	in	in	ADP
fcis-31255	34	13	the	the	DET
fcis-31255	34	14	hardware	hardware	NOUN
fcis-31255	34	15	design	design	NOUN
fcis-31255	34	16	of	of	ADP
fcis-31255	34	17	the	the	DET
fcis-31255	34	18	test	test	NOUN
fcis-31255	34	19	system	system	NOUN
fcis-31255	34	20	,	,	PUNCT
fcis-31255	34	21	impedance	impedance	NOUN
fcis-31255	34	22	matching	matching	NOUN
fcis-31255	34	23	and	and	CCONJ
fcis-31255	34	24	equal	equal	ADJ
fcis-31255	34	25	delay	delay	NOUN
fcis-31255	34	26	design	design	NOUN
fcis-31255	34	27	are	be	AUX
fcis-31255	34	28	completed	complete	VERB
fcis-31255	34	29	.	.	PUNCT
fcis-31255	35	1	impedance	impedance	NOUN
fcis-31255	35	2	matching	matching	NOUN
fcis-31255	35	3	ensures	ensure	VERB
fcis-31255	35	4	the	the	DET
fcis-31255	35	5	reflection	reflection	NOUN
fcis-31255	35	6	of	of	ADP
fcis-31255	35	7	signals	signal	NOUN
fcis-31255	35	8	during	during	ADP
fcis-31255	35	9	transmission	transmission	NOUN
fcis-31255	35	10	and	and	CCONJ
fcis-31255	35	11	improves	improve	VERB
fcis-31255	35	12	the	the	DET
fcis-31255	35	13	quality	quality	NOUN
fcis-31255	35	14	of	of	ADP
fcis-31255	35	15	signal	signal	ADJ
fcis-31255	35	16	transmission	transmission	NOUN
fcis-31255	35	17	.	.	PUNCT
fcis-31255	36	1	the	the	DET
fcis-31255	36	2	equal	equal	ADJ
fcis-31255	36	3	delay	delay	NOUN
fcis-31255	36	4	design	design	NOUN
fcis-31255	36	5	ensures	ensure	VERB
fcis-31255	36	6	that	that	SCONJ
fcis-31255	36	7	the	the	DET
fcis-31255	36	8	delay	delay	NOUN
fcis-31255	36	9	of	of	ADP
fcis-31255	36	10	multi	multi	ADJ
fcis-31255	36	11	-	-	ADJ
fcis-31255	36	12	channel	channel	ADJ
fcis-31255	36	13	signals	signal	NOUN
fcis-31255	36	14	is	be	AUX
fcis-31255	36	15	consistent	consistent	ADJ
fcis-31255	36	16	during	during	ADP
fcis-31255	36	17	transmission	transmission	NOUN
fcis-31255	36	18	,	,	PUNCT
fcis-31255	36	19	avoiding	avoid	VERB
fcis-31255	36	20	test	test	NOUN
fcis-31255	36	21	errors	error	NOUN
fcis-31255	36	22	caused	cause	VERB
fcis-31255	36	23	by	by	ADP
fcis-31255	36	24	delay	delay	NOUN
fcis-31255	36	25	differences[4	differences[4	PROPN
fcis-31255	36	26	]	]	X
fcis-31255	36	27	.	.	PUNCT
fcis-31255	37	1	(	(	PUNCT
fcis-31255	37	2	4)test	4)t	ADJ
fcis-31255	37	3	head	head	NOUN
fcis-31255	37	4	and	and	CCONJ
fcis-31255	37	5	interface	interface	NOUN
fcis-31255	37	6	design	design	NOUN
fcis-31255	37	7	:	:	PUNCT
fcis-31255	37	8	in	in	ADP
fcis-31255	37	9	the	the	DET
fcis-31255	37	10	design	design	NOUN
fcis-31255	37	11	of	of	ADP
fcis-31255	37	12	the	the	DET
fcis-31255	37	13	test	test	NOUN
fcis-31255	37	14	head	head	NOUN
fcis-31255	37	15	,	,	PUNCT
fcis-31255	37	16	the	the	DET
fcis-31255	37	17	layout	layout	NOUN
fcis-31255	37	18	and	and	CCONJ
fcis-31255	37	19	arrangement	arrangement	NOUN
fcis-31255	37	20	of	of	ADP
fcis-31255	37	21	the	the	DET
fcis-31255	37	22	probes	probe	NOUN
fcis-31255	37	23	are	be	AUX
fcis-31255	37	24	taken	take	VERB
fcis-31255	37	25	into	into	ADP
fcis-31255	37	26	account	account	NOUN
fcis-31255	37	27	to	to	PART
fcis-31255	37	28	ensure	ensure	VERB
fcis-31255	37	29	that	that	SCONJ
fcis-31255	37	30	the	the	DET
fcis-31255	37	31	probes	probe	NOUN
fcis-31255	37	32	can	can	AUX
fcis-31255	37	33	accurately	accurately	ADV
fcis-31255	37	34	contact	contact	VERB
fcis-31255	37	35	the	the	DET
fcis-31255	37	36	pins	pin	NOUN
fcis-31255	37	37	of	of	ADP
fcis-31255	37	38	the	the	DET
fcis-31255	37	39	mcu	mcu	PROPN
fcis-31255	37	40	chip	chip	NOUN
fcis-31255	37	41	.	.	PUNCT
fcis-31255	38	1	the	the	DET
fcis-31255	38	2	test	test	NOUN
fcis-31255	38	3	head	head	NOUN
fcis-31255	38	4	needs	need	VERB
fcis-31255	38	5	to	to	PART
fcis-31255	38	6	be	be	AUX
fcis-31255	38	7	equipped	equip	VERB
fcis-31255	38	8	with	with	ADP
fcis-31255	38	9	a	a	DET
fcis-31255	38	10	built	build	VERB
fcis-31255	38	11	-	-	PUNCT
fcis-31255	38	12	in	in	ADP
fcis-31255	38	13	test	test	NOUN
fcis-31255	38	14	board	board	NOUN
fcis-31255	38	15	card	card	NOUN
fcis-31255	38	16	and	and	CCONJ
fcis-31255	38	17	test	test	NOUN
fcis-31255	38	18	channel	channel	NOUN
fcis-31255	38	19	interface	interface	NOUN
fcis-31255	38	20	to	to	PART
fcis-31255	38	21	facilitate	facilitate	VERB
fcis-31255	38	22	connection	connection	NOUN
fcis-31255	38	23	and	and	CCONJ
fcis-31255	38	24	communication	communication	NOUN
fcis-31255	38	25	with	with	ADP
fcis-31255	38	26	devices	device	NOUN
fcis-31255	38	27	such	such	ADJ
fcis-31255	38	28	as	as	ADP
fcis-31255	38	29	ate	ate	NOUN
fcis-31255	38	30	,	,	PUNCT
fcis-31255	38	31	probe	probe	NOUN
fcis-31255	38	32	stations	station	NOUN
fcis-31255	38	33	and	and	CCONJ
fcis-31255	38	34	sorters	sorter	NOUN
fcis-31255	38	35	.	.	PUNCT
fcis-31255	39	1	3.2	3.2	NUM
fcis-31255	39	2	.	.	PUNCT
fcis-31255	39	3	test	test	NOUN
fcis-31255	39	4	process	process	NOUN
fcis-31255	39	5	optimization	optimization	NOUN
fcis-31255	39	6	in	in	ADP
fcis-31255	39	7	the	the	DET
fcis-31255	39	8	parallel	parallel	ADJ
fcis-31255	39	9	testing	testing	NOUN
fcis-31255	39	10	of	of	ADP
fcis-31255	39	11	mcu	mcu	PROPN
fcis-31255	39	12	chips	chip	NOUN
fcis-31255	39	13	based	base	VERB
fcis-31255	39	14	on	on	ADP
fcis-31255	39	15	ate	ate	NOUN
fcis-31255	39	16	,	,	PUNCT
fcis-31255	39	17	test	test	NOUN
fcis-31255	39	18	programs	program	NOUN
fcis-31255	39	19	are	be	AUX
fcis-31255	39	20	written	write	VERB
fcis-31255	39	21	in	in	ADP
fcis-31255	39	22	c	c	PROPN
fcis-31255	39	23	language	language	NOUN
fcis-31255	39	24	to	to	PART
fcis-31255	39	25	achieve	achieve	VERB
fcis-31255	39	26	the	the	DET
fcis-31255	39	27	automatic	automatic	ADJ
fcis-31255	39	28	sending	sending	NOUN
fcis-31255	39	29	and	and	CCONJ
fcis-31255	39	30	receiving	receiving	NOUN
fcis-31255	39	31	of	of	ADP
fcis-31255	39	32	test	test	NOUN
fcis-31255	39	33	instructions[5	instructions[5	ADV
fcis-31255	39	34	]	]	PUNCT
fcis-31255	39	35	.	.	PUNCT
fcis-31255	40	1	to	to	PART
fcis-31255	40	2	improve	improve	VERB
fcis-31255	40	3	the	the	DET
fcis-31255	40	4	maintainability	maintainability	NOUN
fcis-31255	40	5	of	of	ADP
fcis-31255	40	6	the	the	DET
fcis-31255	40	7	test	test	NOUN
fcis-31255	40	8	program	program	NOUN
fcis-31255	40	9	,	,	PUNCT
fcis-31255	40	10	the	the	DET
fcis-31255	40	11	modular	modular	ADJ
fcis-31255	40	12	design	design	NOUN
fcis-31255	40	13	concept	concept	NOUN
fcis-31255	40	14	is	be	AUX
fcis-31255	40	15	adopted	adopt	VERB
fcis-31255	40	16	,	,	PUNCT
fcis-31255	40	17	and	and	CCONJ
fcis-31255	40	18	the	the	DET
fcis-31255	40	19	test	test	NOUN
fcis-31255	40	20	program	program	NOUN
fcis-31255	40	21	is	be	AUX
fcis-31255	40	22	divided	divide	VERB
fcis-31255	40	23	into	into	ADP
fcis-31255	40	24	multiple	multiple	ADJ
fcis-31255	40	25	independent	independent	ADJ
fcis-31255	40	26	modules	module	NOUN
fcis-31255	40	27	,	,	PUNCT
fcis-31255	40	28	such	such	ADJ
fcis-31255	40	29	as	as	ADP
fcis-31255	40	30	the	the	DET
fcis-31255	40	31	initialization	initialization	NOUN
fcis-31255	40	32	module	module	NOUN
fcis-31255	40	33	,	,	PUNCT
fcis-31255	40	34	functional	functional	ADJ
fcis-31255	40	35	test	test	NOUN
fcis-31255	40	36	module	module	NOUN
fcis-31255	40	37	,	,	PUNCT
fcis-31255	40	38	parameter	parameter	NOUN
fcis-31255	40	39	test	test	NOUN
fcis-31255	40	40	module	module	NOUN
fcis-31255	40	41	,	,	PUNCT
fcis-31255	40	42	etc	etc	X
fcis-31255	40	43	.	.	X
fcis-31255	40	44	fig	fig	PROPN
fcis-31255	40	45	4	4	NUM
fcis-31255	40	46	.	.	PUNCT
fcis-31255	40	47	test	test	VERB
fcis-31255	40	48	the	the	DET
fcis-31255	40	49	basic	basic	ADJ
fcis-31255	40	50	structure	structure	NOUN
fcis-31255	40	51	of	of	ADP
fcis-31255	40	52	the	the	DET
fcis-31255	40	53	system	system	NOUN
fcis-31255	40	54	when	when	SCONJ
fcis-31255	40	55	it	it	PRON
fcis-31255	40	56	is	be	AUX
fcis-31255	40	57	necessary	necessary	ADJ
fcis-31255	40	58	to	to	PART
fcis-31255	40	59	adjust	adjust	VERB
fcis-31255	40	60	a	a	DET
fcis-31255	40	61	certain	certain	ADJ
fcis-31255	40	62	test	test	NOUN
fcis-31255	40	63	item	item	NOUN
fcis-31255	40	64	,	,	PUNCT
fcis-31255	40	65	only	only	ADV
fcis-31255	40	66	the	the	DET
fcis-31255	40	67	corresponding	correspond	VERB
fcis-31255	40	68	module	module	NOUN
fcis-31255	40	69	needs	need	VERB
fcis-31255	40	70	to	to	PART
fcis-31255	40	71	be	be	AUX
fcis-31255	40	72	modified	modify	VERB
fcis-31255	40	73	instead	instead	ADV
fcis-31255	40	74	of	of	ADP
fcis-31255	40	75	making	make	VERB
fcis-31255	40	76	large	large	ADJ
fcis-31255	40	77	-	-	PUNCT
fcis-31255	40	78	scale	scale	NOUN
fcis-31255	40	79	modifications	modification	NOUN
fcis-31255	40	80	to	to	ADP
fcis-31255	40	81	the	the	DET
fcis-31255	40	82	entire	entire	ADJ
fcis-31255	40	83	test	test	NOUN
fcis-31255	40	84	program	program	NOUN
fcis-31255	40	85	.	.	PUNCT
fcis-31255	41	1	test	test	NOUN
fcis-31255	41	2	items	item	NOUN
fcis-31255	41	3	that	that	PRON
fcis-31255	41	4	independently	independently	ADV
fcis-31255	41	5	use	use	VERB
fcis-31255	41	6	test	test	NOUN
fcis-31255	41	7	resources	resource	NOUN
fcis-31255	41	8	,	,	PUNCT
fcis-31255	41	9	such	such	ADJ
fcis-31255	41	10	as	as	ADP
fcis-31255	41	11	functional	functional	ADJ
fcis-31255	41	12	matching	matching	NOUN
fcis-31255	41	13	tests	test	NOUN
fcis-31255	41	14	,	,	PUNCT
fcis-31255	41	15	frequency	frequency	NOUN
fcis-31255	41	16	tests	test	NOUN
fcis-31255	41	17	,	,	PUNCT
fcis-31255	41	18	and	and	CCONJ
fcis-31255	41	19	parameter	parameter	NOUN
fcis-31255	41	20	tests	test	NOUN
fcis-31255	41	21	,	,	PUNCT
fcis-31255	41	22	are	be	AUX
fcis-31255	41	23	processed	process	VERB
fcis-31255	41	24	in	in	ADP
fcis-31255	41	25	parallel	parallel	NOUN
fcis-31255	41	26	.	.	PUNCT
fcis-31255	42	1	for	for	ADP
fcis-31255	42	2	example	example	NOUN
fcis-31255	42	3	,	,	PUNCT
fcis-31255	42	4	during	during	ADP
fcis-31255	42	5	the	the	DET
fcis-31255	42	6	functional	functional	ADJ
fcis-31255	42	7	testing	testing	NOUN
fcis-31255	42	8	stage	stage	NOUN
fcis-31255	42	9	,	,	PUNCT
fcis-31255	42	10	the	the	DET
fcis-31255	42	11	basic	basic	ADJ
fcis-31255	42	12	functions	function	NOUN
fcis-31255	42	13	of	of	ADP
fcis-31255	42	14	multiple	multiple	ADJ
fcis-31255	42	15	mcu	mcu	NOUN
fcis-31255	42	16	chips	chip	NOUN
fcis-31255	42	17	are	be	AUX
fcis-31255	42	18	verified	verify	VERB
fcis-31255	42	19	simultaneously	simultaneously	ADV
fcis-31255	42	20	.	.	PUNCT
fcis-31255	43	1	during	during	ADP
fcis-31255	43	2	the	the	DET
fcis-31255	43	3	parameter	parameter	NOUN
fcis-31255	43	4	testing	testing	NOUN
fcis-31255	43	5	stage	stage	NOUN
fcis-31255	43	6	,	,	PUNCT
fcis-31255	43	7	the	the	DET
fcis-31255	43	8	analog	analog	NOUN
fcis-31255	43	9	parameters	parameter	NOUN
fcis-31255	43	10	of	of	ADP
fcis-31255	43	11	multiple	multiple	ADJ
fcis-31255	43	12	chips	chip	NOUN
fcis-31255	43	13	,	,	PUNCT
fcis-31255	43	14	such	such	ADJ
fcis-31255	43	15	as	as	ADP
fcis-31255	43	16	voltage	voltage	NOUN
fcis-31255	43	17	and	and	CCONJ
fcis-31255	43	18	current	current	ADJ
fcis-31255	43	19	,	,	PUNCT
fcis-31255	43	20	are	be	AUX
fcis-31255	43	21	tested	test	VERB
fcis-31255	43	22	in	in	ADP
fcis-31255	43	23	parallel	parallel	NOUN
fcis-31255	43	24	.	.	PUNCT
fcis-31255	44	1	in	in	ADP
fcis-31255	44	2	order	order	NOUN
fcis-31255	44	3	to	to	PART
fcis-31255	44	4	achieve	achieve	VERB
fcis-31255	44	5	real	real	ADJ
fcis-31255	44	6	-	-	PUNCT
fcis-31255	44	7	time	time	NOUN
fcis-31255	44	8	collection	collection	NOUN
fcis-31255	44	9	and	and	CCONJ
fcis-31255	44	10	processing	processing	NOUN
fcis-31255	44	11	of	of	ADP
fcis-31255	44	12	test	test	NOUN
fcis-31255	44	13	data	datum	NOUN
fcis-31255	44	14	,	,	PUNCT
fcis-31255	44	15	corresponding	correspond	VERB
fcis-31255	44	16	data	data	NOUN
fcis-31255	44	17	collection	collection	NOUN
fcis-31255	44	18	points	point	NOUN
fcis-31255	44	19	are	be	AUX
fcis-31255	44	20	set	set	VERB
fcis-31255	44	21	in	in	ADP
fcis-31255	44	22	the	the	DET
fcis-31255	44	23	test	test	NOUN
fcis-31255	44	24	program	program	NOUN
fcis-31255	44	25	.	.	PUNCT
fcis-31255	45	1	when	when	SCONJ
fcis-31255	45	2	ate	eat	VERB
fcis-31255	45	3	sends	send	VERB
fcis-31255	45	4	test	test	NOUN
fcis-31255	45	5	instructions	instruction	NOUN
fcis-31255	45	6	and	and	CCONJ
fcis-31255	45	7	receives	receive	VERB
fcis-31255	45	8	test	test	NOUN
fcis-31255	45	9	responses	response	NOUN
fcis-31255	45	10	,	,	PUNCT
fcis-31255	45	11	the	the	DET
fcis-31255	45	12	test	test	NOUN
fcis-31255	45	13	program	program	NOUN
fcis-31255	45	14	automatically	automatically	ADV
fcis-31255	45	15	collects	collect	VERB
fcis-31255	45	16	the	the	DET
fcis-31255	45	17	corresponding	corresponding	ADJ
fcis-31255	45	18	test	test	NOUN
fcis-31255	45	19	data	datum	NOUN
fcis-31255	45	20	,	,	PUNCT
fcis-31255	45	21	observes	observe	VERB
fcis-31255	45	22	the	the	DET
fcis-31255	45	23	test	test	NOUN
fcis-31255	45	24	data	datum	NOUN
fcis-31255	45	25	in	in	ADP
fcis-31255	45	26	real	real	ADJ
fcis-31255	45	27	time	time	NOUN
fcis-31255	45	28	,	,	PUNCT
fcis-31255	45	29	and	and	CCONJ
fcis-31255	45	30	promptly	promptly	ADV
fcis-31255	45	31	handles	handle	VERB
fcis-31255	45	32	abnormal	abnormal	ADJ
fcis-31255	45	33	situations	situation	NOUN
fcis-31255	45	34	to	to	PART
fcis-31255	45	35	ensure	ensure	VERB
fcis-31255	45	36	the	the	DET
fcis-31255	45	37	smooth	smooth	ADJ
fcis-31255	45	38	progress	progress	NOUN
fcis-31255	45	39	of	of	ADP
fcis-31255	45	40	the	the	DET
fcis-31255	45	41	test	test	NOUN
fcis-31255	45	42	.	.	PUNCT
fcis-31255	46	1	fig	fig	NOUN
fcis-31255	46	2	5	5	NUM
fcis-31255	46	3	.	.	PUNCT
fcis-31255	47	1	dd64	dd64	PROPN
fcis-31255	47	2	interface	interface	NOUN
fcis-31255	47	3	definition	definition	NOUN
fcis-31255	47	4	the	the	DET
fcis-31255	47	5	parallel	parallel	ADJ
fcis-31255	47	6	testing	testing	NOUN
fcis-31255	47	7	technology	technology	NOUN
fcis-31255	47	8	of	of	ADP
fcis-31255	47	9	mcu	mcu	PROPN
fcis-31255	47	10	chips	chip	NOUN
fcis-31255	47	11	based	base	VERB
fcis-31255	47	12	on	on	ADP
fcis-31255	47	13	ate	ate	NOUN
fcis-31255	47	14	,	,	PUNCT
fcis-31255	47	15	combined	combine	VERB
fcis-31255	47	16	with	with	ADP
fcis-31255	47	17	intelligent	intelligent	ADJ
fcis-31255	47	18	algorithms	algorithm	NOUN
fcis-31255	47	19	such	such	ADJ
fcis-31255	47	20	as	as	ADP
fcis-31255	47	21	machine	machine	NOUN
fcis-31255	47	22	learning	learning	NOUN
fcis-31255	47	23	and	and	CCONJ
fcis-31255	47	24	artificial	artificial	ADJ
fcis-31255	47	25	intelligence	intelligence	NOUN
fcis-31255	47	26	,	,	PUNCT
fcis-31255	47	27	conducts	conduct	VERB
fcis-31255	47	28	in	in	ADP
fcis-31255	47	29	-	-	PUNCT
fcis-31255	47	30	depth	depth	NOUN
fcis-31255	47	31	analysis	analysis	NOUN
fcis-31255	47	32	of	of	ADP
fcis-31255	47	33	test	test	NOUN
fcis-31255	47	34	data	datum	NOUN
fcis-31255	47	35	.	.	PUNCT
fcis-31255	48	1	through	through	ADP
fcis-31255	48	2	intelligent	intelligent	ADJ
fcis-31255	48	3	algorithms	algorithm	NOUN
fcis-31255	48	4	,	,	PUNCT
fcis-31255	48	5	abnormal	abnormal	ADJ
fcis-31255	48	6	trends	trend	NOUN
fcis-31255	48	7	85	85	NUM
fcis-31255	48	8	in	in	ADP
fcis-31255	48	9	test	test	NOUN
fcis-31255	48	10	data	datum	NOUN
fcis-31255	48	11	are	be	AUX
fcis-31255	48	12	automatically	automatically	ADV
fcis-31255	48	13	identified	identify	VERB
fcis-31255	48	14	,	,	PUNCT
fcis-31255	48	15	providing	provide	VERB
fcis-31255	48	16	support	support	NOUN
fcis-31255	48	17	for	for	ADP
fcis-31255	48	18	the	the	DET
fcis-31255	48	19	optimization	optimization	NOUN
fcis-31255	48	20	design	design	NOUN
fcis-31255	48	21	and	and	CCONJ
fcis-31255	48	22	improvement	improvement	NOUN
fcis-31255	48	23	of	of	ADP
fcis-31255	48	24	chips	chip	NOUN
fcis-31255	48	25	.	.	PUNCT
fcis-31255	49	1	the	the	DET
fcis-31255	49	2	parallel	parallel	ADJ
fcis-31255	49	3	testing	testing	NOUN
fcis-31255	49	4	technology	technology	NOUN
fcis-31255	49	5	of	of	ADP
fcis-31255	49	6	mcu	mcu	PROPN
fcis-31255	49	7	chips	chip	NOUN
fcis-31255	49	8	based	base	VERB
fcis-31255	49	9	on	on	ADP
fcis-31255	49	10	ate	ate	NOUN
fcis-31255	49	11	allows	allow	VERB
fcis-31255	49	12	for	for	ADP
fcis-31255	49	13	the	the	DET
fcis-31255	49	14	automatic	automatic	ADJ
fcis-31255	49	15	generation	generation	NOUN
fcis-31255	49	16	of	of	ADP
fcis-31255	49	17	detailed	detailed	ADJ
fcis-31255	49	18	test	test	NOUN
fcis-31255	49	19	reports	report	NOUN
fcis-31255	49	20	and	and	CCONJ
fcis-31255	49	21	visually	visually	ADV
fcis-31255	49	22	presents	present	VERB
fcis-31255	49	23	the	the	DET
fcis-31255	49	24	test	test	NOUN
fcis-31255	49	25	results	result	NOUN
fcis-31255	49	26	in	in	ADP
fcis-31255	49	27	the	the	DET
fcis-31255	49	28	form	form	NOUN
fcis-31255	49	29	of	of	ADP
fcis-31255	49	30	charts	chart	NOUN
fcis-31255	49	31	,	,	PUNCT
fcis-31255	49	32	curves	curve	NOUN
fcis-31255	49	33	,	,	PUNCT
fcis-31255	49	34	etc	etc	X
fcis-31255	49	35	.	.	X
fcis-31255	49	36	3.3	3.3	NUM
fcis-31255	49	37	.	.	PUNCT
fcis-31255	50	1	test	test	NOUN
fcis-31255	50	2	production	production	NOUN
fcis-31255	50	3	efficiency	efficiency	NOUN
fcis-31255	50	4	large	large	ADJ
fcis-31255	50	5	-	-	PUNCT
fcis-31255	50	6	scale	scale	NOUN
fcis-31255	50	7	production	production	NOUN
fcis-31255	50	8	enterprises	enterprise	NOUN
fcis-31255	50	9	have	have	VERB
fcis-31255	50	10	very	very	ADV
fcis-31255	50	11	short	short	ADJ
fcis-31255	50	12	requirements	requirement	NOUN
fcis-31255	50	13	for	for	ADP
fcis-31255	50	14	the	the	DET
fcis-31255	50	15	testing	testing	NOUN
fcis-31255	50	16	cycle	cycle	NOUN
fcis-31255	50	17	.	.	PUNCT
fcis-31255	51	1	each	each	DET
fcis-31255	51	2	batch	batch	NOUN
fcis-31255	51	3	is	be	AUX
fcis-31255	51	4	a	a	DET
fcis-31255	51	5	product	product	NOUN
fcis-31255	51	6	of	of	ADP
fcis-31255	51	7	the	the	DET
fcis-31255	51	8	kk	kk	PROPN
fcis-31255	51	9	scale	scale	NOUN
fcis-31255	51	10	.	.	PUNCT
fcis-31255	52	1	generally	generally	ADV
fcis-31255	52	2	,	,	PUNCT
fcis-31255	52	3	all	all	DET
fcis-31255	52	4	testing	testing	NOUN
fcis-31255	52	5	steps	step	NOUN
fcis-31255	52	6	,	,	PUNCT
fcis-31255	52	7	including	include	VERB
fcis-31255	52	8	testing	testing	NOUN
fcis-31255	52	9	,	,	PUNCT
fcis-31255	52	10	appearance	appearance	NOUN
fcis-31255	52	11	inspection	inspection	NOUN
fcis-31255	52	12	,	,	PUNCT
fcis-31255	52	13	packaging	packaging	NOUN
fcis-31255	52	14	,	,	PUNCT
fcis-31255	52	15	etc	etc	X
fcis-31255	52	16	.	.	X
fcis-31255	52	17	,	,	PUNCT
fcis-31255	52	18	are	be	AUX
fcis-31255	52	19	required	require	VERB
fcis-31255	52	20	to	to	PART
fcis-31255	52	21	be	be	AUX
fcis-31255	52	22	completed	complete	VERB
fcis-31255	52	23	within	within	ADP
fcis-31255	52	24	1	1	NUM
fcis-31255	52	25	to	to	PART
fcis-31255	52	26	2	2	NUM
fcis-31255	52	27	days	day	NOUN
fcis-31255	52	28	.	.	PUNCT
fcis-31255	53	1	therefore	therefore	ADV
fcis-31255	53	2	,	,	PUNCT
fcis-31255	53	3	the	the	DET
fcis-31255	53	4	time	time	NOUN
fcis-31255	53	5	left	leave	VERB
fcis-31255	53	6	for	for	ADP
fcis-31255	53	7	the	the	DET
fcis-31255	53	8	testing	testing	NOUN
fcis-31255	53	9	station	station	NOUN
fcis-31255	53	10	is	be	AUX
fcis-31255	53	11	usually	usually	ADV
fcis-31255	53	12	less	less	ADJ
fcis-31255	53	13	than	than	ADP
fcis-31255	53	14	1	1	NUM
fcis-31255	53	15	day	day	NOUN
fcis-31255	53	16	.	.	PUNCT
fcis-31255	54	1	therefore	therefore	ADV
fcis-31255	54	2	,	,	PUNCT
fcis-31255	54	3	the	the	DET
fcis-31255	54	4	efficiency	efficiency	NOUN
fcis-31255	54	5	of	of	ADP
fcis-31255	54	6	testing	testing	NOUN
fcis-31255	54	7	is	be	AUX
fcis-31255	54	8	of	of	ADP
fcis-31255	54	9	great	great	ADJ
fcis-31255	54	10	significance	significance	NOUN
fcis-31255	54	11	to	to	ADP
fcis-31255	54	12	the	the	DET
fcis-31255	54	13	output	output	NOUN
fcis-31255	54	14	of	of	ADP
fcis-31255	54	15	test	test	NOUN
fcis-31255	54	16	production	production	NOUN
fcis-31255	54	17	,	,	PUNCT
fcis-31255	54	18	directly	directly	ADV
fcis-31255	54	19	affecting	affect	VERB
fcis-31255	54	20	the	the	DET
fcis-31255	54	21	production	production	NOUN
fcis-31255	54	22	costs	cost	NOUN
fcis-31255	54	23	,	,	PUNCT
fcis-31255	54	24	profits	profit	NOUN
fcis-31255	54	25	,	,	PUNCT
fcis-31255	54	26	etc	etc	X
fcis-31255	54	27	.	.	X
fcis-31255	54	28	of	of	ADP
fcis-31255	54	29	enterprises	enterprise	NOUN
fcis-31255	54	30	,	,	PUNCT
fcis-31255	54	31	and	and	CCONJ
fcis-31255	54	32	is	be	AUX
fcis-31255	54	33	an	an	DET
fcis-31255	54	34	important	important	ADJ
fcis-31255	54	35	indicator	indicator	NOUN
fcis-31255	54	36	for	for	ADP
fcis-31255	54	37	test	test	NOUN
fcis-31255	54	38	production	production	NOUN
fcis-31255	54	39	enterprises	enterprise	NOUN
fcis-31255	54	40	to	to	PART
fcis-31255	54	41	measure	measure	VERB
fcis-31255	54	42	factory	factory	NOUN
fcis-31255	54	43	operations	operation	NOUN
fcis-31255	54	44	.	.	PUNCT
fcis-31255	55	1	the	the	DET
fcis-31255	55	2	manifestation	manifestation	NOUN
fcis-31255	55	3	of	of	ADP
fcis-31255	55	4	testing	test	VERB
fcis-31255	55	5	production	production	NOUN
fcis-31255	55	6	efficiency	efficiency	NOUN
fcis-31255	55	7	can	can	AUX
fcis-31255	55	8	be	be	AUX
fcis-31255	55	9	intuitively	intuitively	ADV
fcis-31255	55	10	reflected	reflect	VERB
fcis-31255	55	11	in	in	ADP
fcis-31255	55	12	the	the	DET
fcis-31255	55	13	output	output	NOUN
fcis-31255	55	14	of	of	ADP
fcis-31255	55	15	the	the	DET
fcis-31255	55	16	produced	produce	VERB
fcis-31255	55	17	products	product	NOUN
fcis-31255	55	18	.	.	PUNCT
fcis-31255	56	1	if	if	SCONJ
fcis-31255	56	2	the	the	DET
fcis-31255	56	3	quantity	quantity	NOUN
fcis-31255	56	4	of	of	ADP
fcis-31255	56	5	products	product	NOUN
fcis-31255	56	6	produced	produce	VERB
fcis-31255	56	7	per	per	ADP
fcis-31255	56	8	day	day	NOUN
fcis-31255	56	9	in	in	ADP
fcis-31255	56	10	the	the	DET
fcis-31255	56	11	test	test	NOUN
fcis-31255	56	12	production	production	NOUN
fcis-31255	56	13	increases	increase	NOUN
fcis-31255	56	14	,	,	PUNCT
fcis-31255	56	15	it	it	PRON
fcis-31255	56	16	can	can	AUX
fcis-31255	56	17	be	be	AUX
fcis-31255	56	18	understood	understand	VERB
fcis-31255	56	19	as	as	ADP
fcis-31255	56	20	an	an	DET
fcis-31255	56	21	improvement	improvement	NOUN
fcis-31255	56	22	in	in	ADP
fcis-31255	56	23	the	the	DET
fcis-31255	56	24	efficiency	efficiency	NOUN
fcis-31255	56	25	of	of	ADP
fcis-31255	56	26	the	the	DET
fcis-31255	56	27	test	test	NOUN
fcis-31255	56	28	production	production	NOUN
fcis-31255	56	29	.	.	PUNCT
fcis-31255	57	1	the	the	DET
fcis-31255	57	2	following	follow	VERB
fcis-31255	57	3	is	be	AUX
fcis-31255	57	4	an	an	DET
fcis-31255	57	5	analysis	analysis	NOUN
fcis-31255	57	6	of	of	ADP
fcis-31255	57	7	the	the	DET
fcis-31255	57	8	quantity	quantity	NOUN
fcis-31255	57	9	of	of	ADP
fcis-31255	57	10	products	product	NOUN
fcis-31255	57	11	produced	produce	VERB
fcis-31255	57	12	within	within	ADP
fcis-31255	57	13	a	a	DET
fcis-31255	57	14	unit	unit	NOUN
fcis-31255	57	15	of	of	ADP
fcis-31255	57	16	time	time	NOUN
fcis-31255	57	17	.	.	PUNCT
fcis-31255	58	1	the	the	DET
fcis-31255	58	2	quantity	quantity	NOUN
fcis-31255	58	3	of	of	ADP
fcis-31255	58	4	products	product	NOUN
fcis-31255	58	5	that	that	PRON
fcis-31255	58	6	can	can	AUX
fcis-31255	58	7	be	be	AUX
fcis-31255	58	8	produced	produce	VERB
fcis-31255	58	9	per	per	ADP
fcis-31255	58	10	hour	hour	NOUN
fcis-31255	58	11	is	be	AUX
fcis-31255	58	12	defined	define	VERB
fcis-31255	58	13	as	as	ADP
fcis-31255	58	14	uph	uph	PROPN
fcis-31255	58	15	(	(	PUNCT
fcis-31255	58	16	units	unit	NOUN
fcis-31255	58	17	per	per	ADP
fcis-31255	58	18	hour	hour	NOUN
fcis-31255	58	19	)	)	PUNCT
fcis-31255	58	20	.	.	PUNCT
fcis-31255	59	1	under	under	ADP
fcis-31255	59	2	ideal	ideal	ADJ
fcis-31255	59	3	conditions	condition	NOUN
fcis-31255	59	4	,	,	PUNCT
fcis-31255	59	5	after	after	ADP
fcis-31255	59	6	eliminating	eliminate	VERB
fcis-31255	59	7	uncertain	uncertain	ADJ
fcis-31255	59	8	factors	factor	NOUN
fcis-31255	59	9	such	such	ADJ
fcis-31255	59	10	as	as	ADP
fcis-31255	59	11	equipment	equipment	NOUN
fcis-31255	59	12	malfunctions	malfunction	NOUN
fcis-31255	59	13	and	and	CCONJ
fcis-31255	59	14	human	human	ADJ
fcis-31255	59	15	operational	operational	ADJ
fcis-31255	59	16	errors	error	NOUN
fcis-31255	59	17	,	,	PUNCT
fcis-31255	59	18	theoretically	theoretically	ADV
fcis-31255	59	19	,	,	PUNCT
fcis-31255	59	20	the	the	DET
fcis-31255	59	21	uph	uph	PROPN
fcis-31255	59	22	of	of	ADP
fcis-31255	59	23	test	test	NOUN
fcis-31255	59	24	production	production	NOUN
fcis-31255	59	25	is	be	AUX
fcis-31255	59	26	defined	define	VERB
fcis-31255	59	27	by	by	ADP
fcis-31255	59	28	the	the	DET
fcis-31255	59	29	following	follow	VERB
fcis-31255	59	30	formula	formula	NOUN
fcis-31255	59	31	:	:	PUNCT
fcis-31255	59	32	uph	uph	PROPN
fcis-31255	59	33	3600	3600	NUM
fcis-31255	59	34	t	t	PROPN
fcis-31255	59	35	t	t	PROPN
fcis-31255	59	36	∗	∗	NOUN
fcis-31255	59	37	s	s	NOUN
fcis-31255	59	38	1	1	NUM
fcis-31255	59	39	in	in	ADP
fcis-31255	59	40	the	the	DET
fcis-31255	59	41	formula	formula	NOUN
fcis-31255	59	42	:	:	PUNCT
fcis-31255	59	43	3600	3600	NUM
fcis-31255	59	44	-the	-the	DET
fcis-31255	59	45	number	number	NOUN
fcis-31255	59	46	of	of	ADP
fcis-31255	59	47	seconds	second	NOUN
fcis-31255	59	48	per	per	ADP
fcis-31255	59	49	hour	hour	NOUN
fcis-31255	59	50	;	;	PUNCT
fcis-31255	59	51	t	t	PROPN
fcis-31255	59	52	--test	--test	PUNCT
fcis-31255	59	53	time	time	NOUN
fcis-31255	59	54	,	,	PUNCT
fcis-31255	59	55	the	the	DET
fcis-31255	59	56	number	number	NOUN
fcis-31255	59	57	of	of	ADP
fcis-31255	59	58	seconds	second	NOUN
fcis-31255	59	59	required	require	VERB
fcis-31255	59	60	to	to	PART
fcis-31255	59	61	complete	complete	VERB
fcis-31255	59	62	one	one	NUM
fcis-31255	59	63	touchdown	touchdown	NOUN
fcis-31255	59	64	(	(	PUNCT
fcis-31255	59	65	touchdown	touchdown	NOUN
fcis-31255	59	66	refers	refer	VERB
fcis-31255	59	67	to	to	ADP
fcis-31255	59	68	a	a	DET
fcis-31255	59	69	test	test	NOUN
fcis-31255	59	70	cycle	cycle	NOUN
fcis-31255	59	71	:	:	PUNCT
fcis-31255	59	72	if	if	SCONJ
fcis-31255	59	73	it	it	PRON
fcis-31255	59	74	is	be	AUX
fcis-31255	59	75	a	a	DET
fcis-31255	59	76	single	single	ADJ
fcis-31255	59	77	product	product	NOUN
fcis-31255	59	78	test	test	NOUN
fcis-31255	59	79	,	,	PUNCT
fcis-31255	59	80	it	it	PRON
fcis-31255	59	81	is	be	AUX
fcis-31255	59	82	the	the	DET
fcis-31255	59	83	test	test	NOUN
fcis-31255	59	84	time	time	NOUN
fcis-31255	59	85	of	of	ADP
fcis-31255	59	86	one	one	NUM
fcis-31255	59	87	product	product	NOUN
fcis-31255	59	88	;	;	PUNCT
fcis-31255	59	89	if	if	SCONJ
fcis-31255	59	90	it	it	PRON
fcis-31255	59	91	is	be	AUX
fcis-31255	59	92	a	a	DET
fcis-31255	59	93	multi	multi	ADJ
fcis-31255	59	94	-	-	ADJ
fcis-31255	59	95	station	station	ADJ
fcis-31255	59	96	test	test	NOUN
fcis-31255	59	97	,	,	PUNCT
fcis-31255	59	98	it	it	PRON
fcis-31255	59	99	is	be	AUX
fcis-31255	59	100	the	the	DET
fcis-31255	59	101	test	test	NOUN
fcis-31255	59	102	time	time	NOUN
fcis-31255	59	103	required	require	VERB
fcis-31255	59	104	to	to	PART
fcis-31255	59	105	complete	complete	VERB
fcis-31255	59	106	the	the	DET
fcis-31255	59	107	test	test	NOUN
fcis-31255	59	108	of	of	ADP
fcis-31255	59	109	products	product	NOUN
fcis-31255	59	110	at	at	ADP
fcis-31255	59	111	all	all	DET
fcis-31255	59	112	stations	station	NOUN
fcis-31255	59	113	)	)	PUNCT
fcis-31255	59	114	;	;	PUNCT
fcis-31255	59	115	t	t	PROPN
fcis-31255	59	116	-index	-index	PROPN
fcis-31255	59	117	time	time	NOUN
fcis-31255	59	118	,	,	PUNCT
fcis-31255	59	119	the	the	DET
fcis-31255	59	120	number	number	NOUN
fcis-31255	59	121	of	of	ADP
fcis-31255	59	122	seconds	second	NOUN
fcis-31255	59	123	between	between	ADP
fcis-31255	59	124	the	the	DET
fcis-31255	59	125	end	end	NOUN
fcis-31255	59	126	of	of	ADP
fcis-31255	59	127	one	one	NUM
fcis-31255	59	128	touchdown	touchdown	NOUN
fcis-31255	59	129	test	test	NOUN
fcis-31255	59	130	and	and	CCONJ
fcis-31255	59	131	the	the	DET
fcis-31255	59	132	next	next	ADJ
fcis-31255	59	133	touchdown	touchdown	NOUN
fcis-31255	59	134	;	;	PUNCT
fcis-31255	59	135	s	s	VERB
fcis-31255	59	136	-site	-site	NOUN
fcis-31255	59	137	,	,	PUNCT
fcis-31255	59	138	the	the	DET
fcis-31255	59	139	number	number	NOUN
fcis-31255	59	140	of	of	ADP
fcis-31255	59	141	products	product	NOUN
fcis-31255	59	142	to	to	PART
fcis-31255	59	143	be	be	AUX
fcis-31255	59	144	tested	test	VERB
fcis-31255	59	145	simultaneously	simultaneously	ADV
fcis-31255	59	146	with	with	ADP
fcis-31255	59	147	each	each	DET
fcis-31255	59	148	touchdown	touchdown	NOUN
fcis-31255	59	149	;	;	PUNCT
fcis-31255	59	150	it	it	PRON
fcis-31255	59	151	can	can	AUX
fcis-31255	59	152	be	be	AUX
fcis-31255	59	153	concluded	conclude	VERB
fcis-31255	59	154	through	through	ADP
fcis-31255	59	155	formula	formula	NOUN
fcis-31255	59	156	1	1	NUM
fcis-31255	59	157	that	that	PRON
fcis-31255	59	158	the	the	DET
fcis-31255	59	159	production	production	NOUN
fcis-31255	59	160	output	output	NOUN
fcis-31255	59	161	per	per	ADP
fcis-31255	59	162	hour	hour	NOUN
fcis-31255	59	163	is	be	AUX
fcis-31255	59	164	the	the	DET
fcis-31255	59	165	number	number	NOUN
fcis-31255	59	166	of	of	ADP
fcis-31255	59	167	seconds	second	NOUN
fcis-31255	59	168	per	per	ADP
fcis-31255	59	169	hour	hour	NOUN
fcis-31255	59	170	divided	divide	VERB
fcis-31255	59	171	by	by	ADP
fcis-31255	59	172	the	the	DET
fcis-31255	59	173	complete	complete	ADJ
fcis-31255	59	174	time	time	NOUN
fcis-31255	59	175	of	of	ADP
fcis-31255	59	176	one	one	NUM
fcis-31255	59	177	test	test	NOUN
fcis-31255	59	178	(	(	PUNCT
fcis-31255	59	179	the	the	DET
fcis-31255	59	180	time	time	NOUN
fcis-31255	59	181	required	require	VERB
fcis-31255	59	182	for	for	ADP
fcis-31255	59	183	product	product	NOUN
fcis-31255	59	184	testing	testing	NOUN
fcis-31255	59	185	+	+	CCONJ
fcis-31255	59	186	the	the	DET
fcis-31255	59	187	interval	interval	NOUN
fcis-31255	59	188	from	from	ADP
fcis-31255	59	189	completing	complete	VERB
fcis-31255	59	190	one	one	NUM
fcis-31255	59	191	test	test	NOUN
fcis-31255	59	192	to	to	ADP
fcis-31255	59	193	starting	start	VERB
fcis-31255	59	194	the	the	DET
fcis-31255	59	195	next	next	ADJ
fcis-31255	59	196	test	test	NOUN
fcis-31255	59	197	)	)	PUNCT
fcis-31255	59	198	,	,	PUNCT
fcis-31255	59	199	and	and	CCONJ
fcis-31255	59	200	then	then	ADV
fcis-31255	59	201	multiplied	multiply	VERB
fcis-31255	59	202	by	by	ADP
fcis-31255	59	203	the	the	DET
fcis-31255	59	204	number	number	NOUN
fcis-31255	59	205	of	of	ADP
fcis-31255	59	206	tests	test	NOUN
fcis-31255	59	207	conducted	conduct	VERB
fcis-31255	59	208	simultaneously	simultaneously	ADV
fcis-31255	59	209	in	in	ADP
fcis-31255	59	210	each	each	DET
fcis-31255	59	211	test	test	NOUN
fcis-31255	59	212	.	.	PUNCT
fcis-31255	60	1	it	it	PRON
fcis-31255	60	2	can	can	AUX
fcis-31255	60	3	be	be	AUX
fcis-31255	60	4	seen	see	VERB
fcis-31255	60	5	that	that	SCONJ
fcis-31255	60	6	the	the	PRON
fcis-31255	60	7	more	more	ADV
fcis-31255	60	8	the	the	DET
fcis-31255	60	9	number	number	NOUN
fcis-31255	60	10	of	of	ADP
fcis-31255	60	11	simultaneous	simultaneous	ADJ
fcis-31255	60	12	tests	test	NOUN
fcis-31255	60	13	in	in	ADP
fcis-31255	60	14	each	each	DET
fcis-31255	60	15	test	test	NOUN
fcis-31255	60	16	,	,	PUNCT
fcis-31255	60	17	the	the	PRON
fcis-31255	60	18	more	more	ADV
fcis-31255	60	19	beneficial	beneficial	ADJ
fcis-31255	60	20	it	it	PRON
fcis-31255	60	21	is	be	AUX
fcis-31255	60	22	to	to	ADP
fcis-31255	60	23	the	the	DET
fcis-31255	60	24	number	number	NOUN
fcis-31255	60	25	of	of	ADP
fcis-31255	60	26	production	production	NOUN
fcis-31255	60	27	outputs	output	NOUN
fcis-31255	60	28	per	per	ADP
fcis-31255	60	29	hour	hour	NOUN
fcis-31255	60	30	.	.	PUNCT
fcis-31255	61	1	therefore	therefore	ADV
fcis-31255	61	2	,	,	PUNCT
fcis-31255	61	3	it	it	PRON
fcis-31255	61	4	is	be	AUX
fcis-31255	61	5	necessary	necessary	ADJ
fcis-31255	61	6	to	to	PART
fcis-31255	61	7	study	study	VERB
fcis-31255	61	8	the	the	DET
fcis-31255	61	9	methods	method	NOUN
fcis-31255	61	10	of	of	ADP
fcis-31255	61	11	prompt	prompt	ADJ
fcis-31255	61	12	test	test	NOUN
fcis-31255	61	13	outputs	output	NOUN
fcis-31255	61	14	in	in	ADP
fcis-31255	61	15	the	the	DET
fcis-31255	61	16	direction	direction	NOUN
fcis-31255	61	17	of	of	ADP
fcis-31255	61	18	increasing	increase	VERB
fcis-31255	61	19	the	the	DET
fcis-31255	61	20	number	number	NOUN
fcis-31255	61	21	of	of	ADP
fcis-31255	61	22	simultaneous	simultaneous	ADJ
fcis-31255	61	23	tests	test	NOUN
fcis-31255	61	24	.	.	PUNCT
fcis-31255	62	1	with	with	ADP
fcis-31255	62	2	the	the	DET
fcis-31255	62	3	definition	definition	NOUN
fcis-31255	62	4	of	of	ADP
fcis-31255	62	5	output	output	NOUN
fcis-31255	62	6	per	per	ADP
fcis-31255	62	7	hour	hour	NOUN
fcis-31255	62	8	,	,	PUNCT
fcis-31255	62	9	let	let	VERB
fcis-31255	62	10	's	us	PRON
fcis-31255	62	11	analyze	analyze	VERB
fcis-31255	62	12	the	the	DET
fcis-31255	62	13	output	output	NOUN
fcis-31255	62	14	per	per	ADP
fcis-31255	62	15	day	day	NOUN
fcis-31255	62	16	,	,	PUNCT
fcis-31255	62	17	which	which	PRON
fcis-31255	62	18	is	be	AUX
fcis-31255	62	19	defined	define	VERB
fcis-31255	62	20	as	as	ADP
fcis-31255	62	21	upd	upd	PROPN
fcis-31255	62	22	(	(	PUNCT
fcis-31255	62	23	units	unit	NOUN
fcis-31255	62	24	per	per	ADP
fcis-31255	62	25	day	day	NOUN
fcis-31255	62	26	)	)	PUNCT
fcis-31255	62	27	,	,	PUNCT
fcis-31255	62	28	that	that	ADV
fcis-31255	62	29	is	is	ADV
fcis-31255	62	30	,	,	PUNCT
fcis-31255	62	31	the	the	DET
fcis-31255	62	32	quantity	quantity	NOUN
fcis-31255	62	33	of	of	ADP
fcis-31255	62	34	products	product	NOUN
fcis-31255	62	35	that	that	PRON
fcis-31255	62	36	can	can	AUX
fcis-31255	62	37	be	be	AUX
fcis-31255	62	38	produced	produce	VERB
fcis-31255	62	39	each	each	DET
fcis-31255	62	40	day	day	NOUN
fcis-31255	62	41	.	.	PUNCT
fcis-31255	63	1	theoretical	theoretical	ADJ
fcis-31255	63	2	definition	definition	NOUN
fcis-31255	63	3	of	of	ADP
fcis-31255	63	4	upd	upd	PROPN
fcis-31255	63	5	:	:	PUNCT
fcis-31255	63	6	upd	upd	PROPN
fcis-31255	63	7	uph	uph	PROPN
fcis-31255	63	8	∗	∗	PROPN
fcis-31255	63	9	24	24	NUM
fcis-31255	63	10	2	2	NUM
fcis-31255	63	11	in	in	ADP
fcis-31255	63	12	the	the	DET
fcis-31255	63	13	formula	formula	NOUN
fcis-31255	63	14	:	:	PUNCT
fcis-31255	63	15	uph	uph	PROPN
fcis-31255	63	16	-throughput	-throughput	PROPN
fcis-31255	63	17	in	in	ADP
fcis-31255	63	18	units	unit	NOUN
fcis-31255	63	19	per	per	ADP
fcis-31255	63	20	;	;	PUNCT
fcis-31255	63	21	24	24	NUM
fcis-31255	63	22	-the	-the	DET
fcis-31255	63	23	number	number	NOUN
fcis-31255	63	24	of	of	ADP
fcis-31255	63	25	hours	hour	NOUN
fcis-31255	63	26	in	in	ADP
fcis-31255	63	27	a	a	DET
fcis-31255	63	28	day	day	NOUN
fcis-31255	63	29	;	;	PUNCT
fcis-31255	63	30	this	this	PRON
fcis-31255	63	31	is	be	AUX
fcis-31255	63	32	the	the	DET
fcis-31255	63	33	definition	definition	NOUN
fcis-31255	63	34	of	of	ADP
fcis-31255	63	35	the	the	DET
fcis-31255	63	36	daily	daily	ADJ
fcis-31255	63	37	production	production	NOUN
fcis-31255	63	38	quantity	quantity	NOUN
fcis-31255	63	39	under	under	ADP
fcis-31255	63	40	ideal	ideal	ADJ
fcis-31255	63	41	conditions	condition	NOUN
fcis-31255	63	42	.	.	PUNCT
fcis-31255	64	1	multiplying	multiply	VERB
fcis-31255	64	2	the	the	DET
fcis-31255	64	3	production	production	NOUN
fcis-31255	64	4	output	output	NOUN
fcis-31255	64	5	per	per	ADP
fcis-31255	64	6	hour	hour	NOUN
fcis-31255	64	7	by	by	ADP
fcis-31255	64	8	the	the	DET
fcis-31255	64	9	number	number	NOUN
fcis-31255	64	10	of	of	ADP
fcis-31255	64	11	hours	hour	NOUN
fcis-31255	64	12	in	in	ADP
fcis-31255	64	13	a	a	DET
fcis-31255	64	14	day	day	NOUN
fcis-31255	64	15	gives	give	VERB
fcis-31255	64	16	the	the	DET
fcis-31255	64	17	daily	daily	ADJ
fcis-31255	64	18	production	production	NOUN
fcis-31255	64	19	output	output	NOUN
fcis-31255	64	20	.	.	PUNCT
fcis-31255	65	1	however	however	ADV
fcis-31255	65	2	,	,	PUNCT
fcis-31255	65	3	in	in	ADP
fcis-31255	65	4	general	general	ADJ
fcis-31255	65	5	,	,	PUNCT
fcis-31255	65	6	each	each	DET
fcis-31255	65	7	factory	factory	NOUN
fcis-31255	65	8	has	have	VERB
fcis-31255	65	9	its	its	PRON
fcis-31255	65	10	own	own	ADJ
fcis-31255	65	11	equipment	equipment	NOUN
fcis-31255	65	12	utilization	utilization	NOUN
fcis-31255	65	13	rate	rate	NOUN
fcis-31255	65	14	(	(	PUNCT
fcis-31255	65	15	utilization	utilization	NOUN
fcis-31255	65	16	)	)	PUNCT
fcis-31255	65	17	,	,	PUNCT
fcis-31255	65	18	that	that	ADV
fcis-31255	65	19	is	is	ADV
fcis-31255	65	20	,	,	PUNCT
fcis-31255	65	21	what	what	DET
fcis-31255	65	22	proportion	proportion	NOUN
fcis-31255	65	23	of	of	ADP
fcis-31255	65	24	the	the	DET
fcis-31255	65	25	time	time	NOUN
fcis-31255	65	26	each	each	DET
fcis-31255	65	27	piece	piece	NOUN
fcis-31255	65	28	of	of	ADP
fcis-31255	65	29	equipment	equipment	NOUN
fcis-31255	65	30	spends	spend	VERB
fcis-31255	65	31	on	on	ADP
fcis-31255	65	32	actual	actual	ADJ
fcis-31255	65	33	production	production	NOUN
fcis-31255	65	34	and	and	CCONJ
fcis-31255	65	35	what	what	DET
fcis-31255	65	36	proportion	proportion	NOUN
fcis-31255	65	37	of	of	ADP
fcis-31255	65	38	the	the	DET
fcis-31255	65	39	time	time	NOUN
fcis-31255	65	40	is	be	AUX
fcis-31255	65	41	spent	spend	VERB
fcis-31255	65	42	on	on	ADP
fcis-31255	65	43	maintenance	maintenance	NOUN
fcis-31255	65	44	,	,	PUNCT
fcis-31255	65	45	repair	repair	NOUN
fcis-31255	65	46	,	,	PUNCT
fcis-31255	65	47	etc	etc	X
fcis-31255	65	48	.	.	X
fcis-31255	66	1	the	the	PRON
fcis-31255	66	2	higher	high	ADJ
fcis-31255	66	3	the	the	DET
fcis-31255	66	4	utilization	utilization	NOUN
fcis-31255	66	5	rate	rate	NOUN
fcis-31255	66	6	,	,	PUNCT
fcis-31255	66	7	the	the	DET
fcis-31255	66	8	more	more	ADJ
fcis-31255	66	9	time	time	NOUN
fcis-31255	66	10	the	the	DET
fcis-31255	66	11	equipment	equipment	NOUN
fcis-31255	66	12	is	be	AUX
fcis-31255	66	13	used	use	VERB
fcis-31255	66	14	for	for	ADP
fcis-31255	66	15	product	product	NOUN
fcis-31255	66	16	production	production	NOUN
fcis-31255	66	17	.	.	PUNCT
fcis-31255	67	1	under	under	ADP
fcis-31255	67	2	normal	normal	ADJ
fcis-31255	67	3	circumstances	circumstance	NOUN
fcis-31255	67	4	,	,	PUNCT
fcis-31255	67	5	the	the	DET
fcis-31255	67	6	general	general	ADJ
fcis-31255	67	7	empirical	empirical	ADJ
fcis-31255	67	8	value	value	NOUN
fcis-31255	67	9	is	be	AUX
fcis-31255	67	10	85	85	NUM
fcis-31255	67	11	%	%	NOUN
fcis-31255	67	12	,	,	PUNCT
fcis-31255	67	13	that	that	ADV
fcis-31255	67	14	is	is	ADV
fcis-31255	67	15	,	,	PUNCT
fcis-31255	67	16	the	the	DET
fcis-31255	67	17	utilization	utilization	NOUN
fcis-31255	67	18	rate	rate	NOUN
fcis-31255	67	19	of	of	ADP
fcis-31255	67	20	the	the	DET
fcis-31255	67	21	equipment	equipment	NOUN
fcis-31255	67	22	=	=	NOUN
fcis-31255	67	23	85	85	NUM
fcis-31255	67	24	%	%	NOUN
fcis-31255	67	25	.	.	PUNCT
fcis-31255	68	1	it	it	PRON
fcis-31255	68	2	can	can	AUX
fcis-31255	68	3	be	be	AUX
fcis-31255	68	4	concluded	conclude	VERB
fcis-31255	68	5	from	from	ADP
fcis-31255	68	6	this	this	PRON
fcis-31255	68	7	that	that	SCONJ
fcis-31255	68	8	the	the	DET
fcis-31255	68	9	daily	daily	ADJ
fcis-31255	68	10	production	production	NOUN
fcis-31255	68	11	output	output	NOUN
fcis-31255	68	12	of	of	ADP
fcis-31255	68	13	the	the	DET
fcis-31255	68	14	actual	actual	ADJ
fcis-31255	68	15	factory	factory	NOUN
fcis-31255	68	16	is	be	AUX
fcis-31255	68	17	:	:	PUNCT
fcis-31255	68	18	upd	upd	PROPN
fcis-31255	68	19	3600	3600	NUM
fcis-31255	68	20	t	t	NOUN
fcis-31255	68	21	t	t	PROPN
fcis-31255	68	22	∗	∗	NOUN
fcis-31255	68	23	s	s	PROPN
fcis-31255	68	24	∗	∗	NOUN
fcis-31255	68	25	24	24	NUM
fcis-31255	68	26	∗	∗	NOUN
fcis-31255	68	27	85	85	NUM
fcis-31255	68	28	%	%	NOUN
fcis-31255	68	29	3	3	NUM
fcis-31255	68	30	from	from	ADP
fcis-31255	68	31	the	the	DET
fcis-31255	68	32	above	above	ADJ
fcis-31255	68	33	definition	definition	NOUN
fcis-31255	68	34	analysis	analysis	NOUN
fcis-31255	68	35	,	,	PUNCT
fcis-31255	68	36	it	it	PRON
fcis-31255	68	37	can	can	AUX
fcis-31255	68	38	be	be	AUX
fcis-31255	68	39	concluded	conclude	VERB
fcis-31255	68	40	that	that	SCONJ
fcis-31255	68	41	the	the	DET
fcis-31255	68	42	daily	daily	ADJ
fcis-31255	68	43	output	output	NOUN
fcis-31255	68	44	in	in	ADP
fcis-31255	68	45	the	the	DET
fcis-31255	68	46	actual	actual	ADJ
fcis-31255	68	47	production	production	NOUN
fcis-31255	68	48	environment	environment	NOUN
fcis-31255	68	49	is	be	AUX
fcis-31255	68	50	based	base	VERB
fcis-31255	68	51	on	on	ADP
fcis-31255	68	52	the	the	DET
fcis-31255	68	53	theoretical	theoretical	ADJ
fcis-31255	68	54	upd	upd	NOUN
fcis-31255	68	55	and	and	CCONJ
fcis-31255	68	56	takes	take	VERB
fcis-31255	68	57	into	into	ADP
fcis-31255	68	58	account	account	NOUN
fcis-31255	68	59	the	the	DET
fcis-31255	68	60	actual	actual	ADJ
fcis-31255	68	61	equipment	equipment	NOUN
fcis-31255	68	62	utilization	utilization	NOUN
fcis-31255	68	63	rate	rate	NOUN
fcis-31255	68	64	.	.	PUNCT
fcis-31255	69	1	how	how	SCONJ
fcis-31255	69	2	to	to	PART
fcis-31255	69	3	increase	increase	VERB
fcis-31255	69	4	the	the	DET
fcis-31255	69	5	quantity	quantity	NOUN
fcis-31255	69	6	of	of	ADP
fcis-31255	69	7	products	product	NOUN
fcis-31255	69	8	produced	produce	VERB
fcis-31255	69	9	every	every	DET
fcis-31255	69	10	day	day	NOUN
fcis-31255	69	11	is	be	AUX
fcis-31255	69	12	related	relate	VERB
fcis-31255	69	13	to	to	ADP
fcis-31255	69	14	the	the	DET
fcis-31255	69	15	following	follow	VERB
fcis-31255	69	16	factors	factor	NOUN
fcis-31255	69	17	:	:	PUNCT
fcis-31255	69	18	(	(	PUNCT
fcis-31255	69	19	1	1	X
fcis-31255	69	20	)	)	PUNCT
fcis-31255	69	21	test	test	NOUN
fcis-31255	69	22	time	time	NOUN
fcis-31255	69	23	,	,	PUNCT
fcis-31255	69	24	the	the	DET
fcis-31255	69	25	test	test	NOUN
fcis-31255	69	26	time	time	NOUN
fcis-31255	69	27	of	of	ADP
fcis-31255	69	28	the	the	DET
fcis-31255	69	29	product	product	NOUN
fcis-31255	69	30	is	be	AUX
fcis-31255	69	31	inversely	inversely	ADV
fcis-31255	69	32	proportional	proportional	ADJ
fcis-31255	69	33	to	to	ADP
fcis-31255	69	34	uph	uph	PROPN
fcis-31255	69	35	.	.	PUNCT
fcis-31255	70	1	the	the	PRON
fcis-31255	70	2	longer	long	ADJ
fcis-31255	70	3	the	the	DET
fcis-31255	70	4	test	test	NOUN
fcis-31255	70	5	time	time	NOUN
fcis-31255	70	6	,	,	PUNCT
fcis-31255	70	7	the	the	DET
fcis-31255	70	8	less	less	ADV
fcis-31255	70	9	uph	uph	PROPN
fcis-31255	70	10	,	,	PUNCT
fcis-31255	70	11	which	which	PRON
fcis-31255	70	12	directly	directly	ADV
fcis-31255	70	13	affects	affect	VERB
fcis-31255	70	14	uph	uph	PROPN
fcis-31255	70	15	.	.	PUNCT
fcis-31255	71	1	(	(	PUNCT
fcis-31255	71	2	2	2	NUM
fcis-31255	71	3	)	)	PUNCT
fcis-31255	71	4	index	index	NOUN
fcis-31255	71	5	time	time	NOUN
fcis-31255	71	6	,	,	PUNCT
fcis-31255	71	7	the	the	DET
fcis-31255	71	8	waiting	waiting	NOUN
fcis-31255	71	9	time	time	NOUN
fcis-31255	71	10	between	between	ADP
fcis-31255	71	11	each	each	DET
fcis-31255	71	12	test	test	NOUN
fcis-31255	71	13	of	of	ADP
fcis-31255	71	14	one	one	NUM
fcis-31255	71	15	product	product	NOUN
fcis-31255	71	16	and	and	CCONJ
fcis-31255	71	17	the	the	DET
fcis-31255	71	18	next	next	ADJ
fcis-31255	71	19	product	product	NOUN
fcis-31255	71	20	is	be	AUX
fcis-31255	71	21	inversely	inversely	ADV
fcis-31255	71	22	proportional	proportional	ADJ
fcis-31255	71	23	to	to	ADP
fcis-31255	71	24	uph	uph	PROPN
fcis-31255	71	25	.	.	PUNCT
fcis-31255	72	1	the	the	PRON
fcis-31255	72	2	longer	long	ADJ
fcis-31255	72	3	the	the	DET
fcis-31255	72	4	index	index	NOUN
fcis-31255	72	5	time	time	NOUN
fcis-31255	72	6	,	,	PUNCT
fcis-31255	72	7	the	the	PRON
fcis-31255	72	8	less	less	ADV
fcis-31255	72	9	uph	uph	PROPN
fcis-31255	72	10	.	.	PUNCT
fcis-31255	73	1	(	(	PUNCT
fcis-31255	73	2	3	3	X
fcis-31255	73	3	)	)	PUNCT
fcis-31255	73	4	site	site	NOUN
fcis-31255	73	5	,	,	PUNCT
fcis-31255	73	6	the	the	DET
fcis-31255	73	7	number	number	NOUN
fcis-31255	73	8	of	of	ADP
fcis-31255	73	9	products	product	NOUN
fcis-31255	73	10	tested	test	VERB
fcis-31255	73	11	simultaneously	simultaneously	ADV
fcis-31255	73	12	each	each	DET
fcis-31255	73	13	time	time	NOUN
fcis-31255	73	14	touchdown	touchdown	ADV
fcis-31255	73	15	,	,	PUNCT
fcis-31255	73	16	is	be	AUX
fcis-31255	73	17	directly	directly	ADV
fcis-31255	73	18	proportional	proportional	ADJ
fcis-31255	73	19	to	to	ADP
fcis-31255	73	20	uph	uph	PROPN
fcis-31255	73	21	.	.	PUNCT
fcis-31255	74	1	the	the	DET
fcis-31255	74	2	more	more	ADJ
fcis-31255	74	3	products	product	NOUN
fcis-31255	74	4	tested	test	VERB
fcis-31255	74	5	simultaneously	simultaneously	ADV
fcis-31255	74	6	,	,	PUNCT
fcis-31255	74	7	the	the	PRON
fcis-31255	74	8	more	more	ADV
fcis-31255	74	9	uph	uph	PROPN
fcis-31255	74	10	.	.	PUNCT
fcis-31255	75	1	(	(	PUNCT
fcis-31255	75	2	4	4	X
fcis-31255	75	3	)	)	PUNCT
fcis-31255	75	4	utilization	utilization	NOUN
fcis-31255	75	5	,	,	PUNCT
fcis-31255	75	6	which	which	PRON
fcis-31255	75	7	determines	determine	VERB
fcis-31255	75	8	the	the	DET
fcis-31255	75	9	actual	actual	ADJ
fcis-31255	75	10	time	time	NOUN
fcis-31255	75	11	that	that	PRON
fcis-31255	75	12	production	production	NOUN
fcis-31255	75	13	equipment	equipment	NOUN
fcis-31255	75	14	is	be	AUX
fcis-31255	75	15	used	use	VERB
fcis-31255	75	16	for	for	ADP
fcis-31255	75	17	output	output	NOUN
fcis-31255	75	18	,	,	PUNCT
fcis-31255	75	19	is	be	AUX
fcis-31255	75	20	proportional	proportional	ADJ
fcis-31255	75	21	to	to	ADP
fcis-31255	75	22	upd	upd	PROPN
fcis-31255	75	23	.	.	PUNCT
fcis-31255	76	1	the	the	PRON
fcis-31255	76	2	higher	high	ADJ
fcis-31255	76	3	the	the	DET
fcis-31255	76	4	utilization	utilization	NOUN
fcis-31255	76	5	rate	rate	NOUN
fcis-31255	76	6	,	,	PUNCT
fcis-31255	76	7	the	the	PRON
fcis-31255	76	8	higher	high	ADJ
fcis-31255	76	9	the	the	DET
fcis-31255	76	10	upd	upd	PROPN
fcis-31255	76	11	.	.	PROPN
fcis-31255	76	12	based	base	VERB
fcis-31255	76	13	on	on	ADP
fcis-31255	76	14	the	the	DET
fcis-31255	76	15	above	above	ADJ
fcis-31255	76	16	analysis	analysis	NOUN
fcis-31255	76	17	,	,	PUNCT
fcis-31255	76	18	if	if	SCONJ
fcis-31255	76	19	more	more	ADJ
fcis-31255	76	20	products	product	NOUN
fcis-31255	76	21	are	be	AUX
fcis-31255	76	22	to	to	PART
fcis-31255	76	23	be	be	AUX
fcis-31255	76	24	produced	produce	VERB
fcis-31255	76	25	within	within	ADP
fcis-31255	76	26	a	a	DET
fcis-31255	76	27	unit	unit	NOUN
fcis-31255	76	28	of	of	ADP
fcis-31255	76	29	time	time	NOUN
fcis-31255	76	30	,	,	PUNCT
fcis-31255	76	31	it	it	PRON
fcis-31255	76	32	is	be	AUX
fcis-31255	76	33	necessary	necessary	ADJ
fcis-31255	76	34	to	to	PART
fcis-31255	76	35	optimize	optimize	VERB
fcis-31255	76	36	the	the	DET
fcis-31255	76	37	above	above	ADJ
fcis-31255	76	38	factors	factor	NOUN
fcis-31255	76	39	and	and	CCONJ
fcis-31255	76	40	adjust	adjust	VERB
fcis-31255	76	41	each	each	DET
fcis-31255	76	42	factor	factor	NOUN
fcis-31255	76	43	to	to	ADP
fcis-31255	76	44	the	the	DET
fcis-31255	76	45	output	output	NOUN
fcis-31255	76	46	that	that	PRON
fcis-31255	76	47	is	be	AUX
fcis-31255	76	48	most	most	ADV
fcis-31255	76	49	conducive	conducive	ADJ
fcis-31255	76	50	to	to	ADP
fcis-31255	76	51	production	production	NOUN
fcis-31255	76	52	.	.	PUNCT
fcis-31255	77	1	thereby	thereby	ADV
fcis-31255	77	2	improving	improve	VERB
fcis-31255	77	3	the	the	DET
fcis-31255	77	4	efficiency	efficiency	NOUN
fcis-31255	77	5	of	of	ADP
fcis-31255	77	6	test	test	NOUN
fcis-31255	77	7	production	production	NOUN
fcis-31255	77	8	.	.	PUNCT
fcis-31255	78	1	fig	fig	NOUN
fcis-31255	78	2	6	6	NUM
fcis-31255	78	3	.	.	PUNCT
fcis-31255	79	1	dd64	dd64	PROPN
fcis-31255	79	2	interface	interface	NOUN
fcis-31255	79	3	definition	definition	NOUN
fcis-31255	79	4	if	if	SCONJ
fcis-31255	79	5	the	the	DET
fcis-31255	79	6	test	test	NOUN
fcis-31255	79	7	time	time	NOUN
fcis-31255	79	8	for	for	ADP
fcis-31255	79	9	each	each	DET
fcis-31255	79	10	single	single	ADJ
fcis-31255	79	11	chip	chip	NOUN
fcis-31255	79	12	is	be	AUX
fcis-31255	79	13	1.6	1.6	NUM
fcis-31255	79	14	seconds	second	NOUN
fcis-31255	79	15	,	,	PUNCT
fcis-31255	79	16	the	the	DET
fcis-31255	79	17	uph	uph	NOUN
fcis-31255	79	18	of	of	ADP
fcis-31255	79	19	the	the	DET
fcis-31255	79	20	single	single	ADJ
fcis-31255	79	21	site	site	NOUN
fcis-31255	79	22	test	test	NOUN
fcis-31255	79	23	is	be	AUX
fcis-31255	79	24	1900	1900	NUM
fcis-31255	79	25	and	and	CCONJ
fcis-31255	79	26	the	the	DET
fcis-31255	79	27	upd	upd	NOUN
fcis-31255	79	28	is	be	AUX
fcis-31255	79	29	38760	38760	NUM
fcis-31255	79	30	.	.	PUNCT
fcis-31255	80	1	since	since	SCONJ
fcis-31255	80	2	some	some	DET
fcis-31255	80	3	test	test	NOUN
fcis-31255	80	4	items	item	NOUN
fcis-31255	80	5	can	can	AUX
fcis-31255	80	6	only	only	ADV
fcis-31255	80	7	be	be	AUX
fcis-31255	80	8	tested	test	VERB
fcis-31255	80	9	serially	serially	ADV
fcis-31255	80	10	and	and	CCONJ
fcis-31255	80	11	when	when	SCONJ
fcis-31255	80	12	using	use	VERB
fcis-31255	80	13	multi	multi	ADJ
fcis-31255	80	14	-	-	ADJ
fcis-31255	80	15	site	site	ADJ
fcis-31255	80	16	testing	testing	NOUN
fcis-31255	80	17	,	,	PUNCT
fcis-31255	80	18	the	the	DET
fcis-31255	80	19	index	index	NOUN
fcis-31255	80	20	time	time	NOUN
fcis-31255	80	21	of	of	ADP
fcis-31255	80	22	the	the	DET
fcis-31255	80	23	sorter	sorter	NOUN
fcis-31255	80	24	will	will	AUX
fcis-31255	80	25	increase	increase	VERB
fcis-31255	80	26	.	.	PUNCT
fcis-31255	81	1	so	so	ADV
fcis-31255	81	2	during	during	ADP
fcis-31255	81	3	the	the	DET
fcis-31255	81	4	2site	2site	NUM
fcis-31255	81	5	test	test	NOUN
fcis-31255	81	6	,	,	PUNCT
fcis-31255	81	7	the	the	DET
fcis-31255	81	8	test	test	NOUN
fcis-31255	81	9	time	time	NOUN
fcis-31255	81	10	was	be	AUX
fcis-31255	81	11	1.8	1.8	NUM
fcis-31255	81	12	seconds	second	NOUN
fcis-31255	81	13	,	,	PUNCT
fcis-31255	81	14	uph=3500	uph=3500	PROPN
fcis-31255	81	15	,	,	PUNCT
fcis-31255	81	16	and	and	CCONJ
fcis-31255	81	17	upd=71400	upd=71400	NOUN
fcis-31255	81	18	.	.	PUNCT
fcis-31255	82	1	during	during	ADP
fcis-31255	82	2	the	the	DET
fcis-31255	82	3	4site	4site	NUM
fcis-31255	82	4	test	test	NOUN
fcis-31255	82	5	,	,	PUNCT
fcis-31255	82	6	the	the	DET
fcis-31255	82	7	test	test	NOUN
fcis-31255	82	8	duration	duration	NOUN
fcis-31255	82	9	was	be	AUX
fcis-31255	82	10	2.1	2.1	NUM
fcis-31255	82	11	seconds	second	NOUN
fcis-31255	82	12	,	,	PUNCT
fcis-31255	82	13	with	with	ADP
fcis-31255	82	14	uph=5200	uph=5200	PRON
fcis-31255	82	15	and	and	CCONJ
fcis-31255	82	16	upd=106080	upd=106080	ADV
fcis-31255	82	17	.	.	PUNCT
fcis-31255	83	1	it	it	PRON
fcis-31255	83	2	can	can	AUX
fcis-31255	83	3	be	be	AUX
fcis-31255	83	4	known	know	VERB
fcis-31255	83	5	from	from	ADP
fcis-31255	83	6	this	this	PRON
fcis-31255	83	7	that	that	SCONJ
fcis-31255	83	8	by	by	ADP
fcis-31255	83	9	developing	develop	VERB
fcis-31255	83	10	the	the	DET
fcis-31255	83	11	test	test	NOUN
fcis-31255	83	12	86	86	NUM
fcis-31255	83	13	scheme	scheme	NOUN
fcis-31255	83	14	of	of	ADP
fcis-31255	83	15	four	four	NUM
fcis-31255	83	16	sites	site	NOUN
fcis-31255	83	17	with	with	ADP
fcis-31255	83	18	the	the	DET
fcis-31255	83	19	same	same	ADJ
fcis-31255	83	20	resource	resource	NOUN
fcis-31255	83	21	allocation	allocation	NOUN
fcis-31255	83	22	,	,	PUNCT
fcis-31255	83	23	the	the	DET
fcis-31255	83	24	daily	daily	ADJ
fcis-31255	83	25	production	production	NOUN
fcis-31255	83	26	capacity	capacity	NOUN
fcis-31255	83	27	can	can	AUX
fcis-31255	83	28	be	be	AUX
fcis-31255	83	29	increased	increase	VERB
fcis-31255	83	30	by	by	ADP
fcis-31255	83	31	48.57	48.57	NUM
fcis-31255	83	32	%	%	NOUN
fcis-31255	83	33	.	.	PUNCT
fcis-31255	84	1	in	in	ADP
fcis-31255	84	2	the	the	DET
fcis-31255	84	3	case	case	NOUN
fcis-31255	84	4	of	of	ADP
fcis-31255	84	5	full	full	ADJ
fcis-31255	84	6	order	order	NOUN
fcis-31255	84	7	load	load	NOUN
fcis-31255	84	8	,	,	PUNCT
fcis-31255	84	9	the	the	DET
fcis-31255	84	10	time	time	NOUN
fcis-31255	84	11	occupied	occupy	VERB
fcis-31255	84	12	by	by	ADP
fcis-31255	84	13	this	this	DET
fcis-31255	84	14	product	product	NOUN
fcis-31255	84	15	on	on	ADP
fcis-31255	84	16	the	the	DET
fcis-31255	84	17	machine	machine	NOUN
fcis-31255	84	18	can	can	AUX
fcis-31255	84	19	be	be	AUX
fcis-31255	84	20	saved	save	VERB
fcis-31255	84	21	.	.	PUNCT
fcis-31255	85	1	meanwhile	meanwhile	ADV
fcis-31255	85	2	,	,	PUNCT
fcis-31255	85	3	the	the	DET
fcis-31255	85	4	adapter	adapter	NOUN
fcis-31255	85	5	board	board	NOUN
fcis-31255	85	6	developed	develop	VERB
fcis-31255	85	7	by	by	ADP
fcis-31255	85	8	this	this	DET
fcis-31255	85	9	solution	solution	NOUN
fcis-31255	85	10	can	can	AUX
fcis-31255	85	11	be	be	AUX
fcis-31255	85	12	used	use	VERB
fcis-31255	85	13	for	for	ADP
fcis-31255	85	14	the	the	DET
fcis-31255	85	15	development	development	NOUN
fcis-31255	85	16	and	and	CCONJ
fcis-31255	85	17	optimization	optimization	NOUN
fcis-31255	85	18	of	of	ADP
fcis-31255	85	19	other	other	ADJ
fcis-31255	85	20	products	product	NOUN
fcis-31255	85	21	.	.	PUNCT
fcis-31255	86	1	3.4	3.4	NUM
fcis-31255	86	2	.	.	PUNCT
fcis-31255	86	3	test	test	NOUN
fcis-31255	86	4	data	datum	NOUN
fcis-31255	86	5	processing	processing	NOUN
fcis-31255	86	6	and	and	CCONJ
fcis-31255	86	7	analysis	analysis	NOUN
fcis-31255	86	8	(	(	PUNCT
fcis-31255	86	9	1	1	NUM
fcis-31255	86	10	)	)	PUNCT
fcis-31255	86	11	real	real	ADJ
fcis-31255	86	12	-	-	PUNCT
fcis-31255	86	13	time	time	NOUN
fcis-31255	86	14	data	datum	NOUN
fcis-31255	86	15	acquisition	acquisition	NOUN
fcis-31255	86	16	and	and	CCONJ
fcis-31255	86	17	monitoring	monitoring	NOUN
fcis-31255	86	18	:	:	PUNCT
fcis-31255	86	19	ate	ate	NOUN
fcis-31255	86	20	devices	device	NOUN
fcis-31255	86	21	can	can	AUX
fcis-31255	86	22	simultaneously	simultaneously	ADV
fcis-31255	86	23	send	send	VERB
fcis-31255	86	24	test	test	NOUN
fcis-31255	86	25	instructions	instruction	NOUN
fcis-31255	86	26	to	to	ADP
fcis-31255	86	27	multiple	multiple	ADJ
fcis-31255	86	28	mcu	mcu	NOUN
fcis-31255	86	29	chips	chip	NOUN
fcis-31255	86	30	and	and	CCONJ
fcis-31255	86	31	receive	receive	VERB
fcis-31255	86	32	the	the	DET
fcis-31255	86	33	returned	return	VERB
fcis-31255	86	34	test	test	NOUN
fcis-31255	86	35	responses	response	NOUN
fcis-31255	86	36	.	.	PUNCT
fcis-31255	87	1	the	the	DET
fcis-31255	87	2	response	response	NOUN
fcis-31255	87	3	data	data	NOUN
fcis-31255	87	4	contains	contain	VERB
fcis-31255	87	5	key	key	ADJ
fcis-31255	87	6	information	information	NOUN
fcis-31255	87	7	such	such	ADJ
fcis-31255	87	8	as	as	ADP
fcis-31255	87	9	the	the	DET
fcis-31255	87	10	working	work	VERB
fcis-31255	87	11	status	status	NOUN
fcis-31255	87	12	and	and	CCONJ
fcis-31255	87	13	performance	performance	NOUN
fcis-31255	87	14	parameters	parameter	NOUN
fcis-31255	87	15	of	of	ADP
fcis-31255	87	16	the	the	DET
fcis-31255	87	17	chip	chip	NOUN
fcis-31255	87	18	.	.	PUNCT
fcis-31255	88	1	for	for	ADP
fcis-31255	88	2	example	example	NOUN
fcis-31255	88	3	,	,	PUNCT
fcis-31255	88	4	data	datum	NOUN
fcis-31255	88	5	collection	collection	NOUN
fcis-31255	88	6	points	point	NOUN
fcis-31255	88	7	are	be	AUX
fcis-31255	88	8	set	set	VERB
fcis-31255	88	9	in	in	ADP
fcis-31255	88	10	the	the	DET
fcis-31255	88	11	test	test	NOUN
fcis-31255	88	12	program	program	NOUN
fcis-31255	88	13	to	to	PART
fcis-31255	88	14	ensure	ensure	VERB
fcis-31255	88	15	that	that	SCONJ
fcis-31255	88	16	the	the	DET
fcis-31255	88	17	corresponding	corresponding	ADJ
fcis-31255	88	18	data	datum	NOUN
fcis-31255	88	19	is	be	AUX
fcis-31255	88	20	obtained	obtain	VERB
fcis-31255	88	21	in	in	ADP
fcis-31255	88	22	a	a	DET
fcis-31255	88	23	timely	timely	ADJ
fcis-31255	88	24	manner	manner	NOUN
fcis-31255	88	25	after	after	ADP
fcis-31255	88	26	each	each	DET
fcis-31255	88	27	test	test	NOUN
fcis-31255	88	28	operation	operation	NOUN
fcis-31255	88	29	.	.	PUNCT
fcis-31255	89	1	ensure	ensure	VERB
fcis-31255	89	2	the	the	DET
fcis-31255	89	3	stability	stability	NOUN
fcis-31255	89	4	of	of	ADP
fcis-31255	89	5	the	the	DET
fcis-31255	89	6	monitoring	monitoring	NOUN
fcis-31255	89	7	and	and	CCONJ
fcis-31255	89	8	testing	testing	NOUN
fcis-31255	89	9	process	process	NOUN
fcis-31255	89	10	,	,	PUNCT
fcis-31255	89	11	and	and	CCONJ
fcis-31255	89	12	conduct	conduct	VERB
fcis-31255	89	13	real	real	ADJ
fcis-31255	89	14	-	-	PUNCT
fcis-31255	89	15	time	time	NOUN
fcis-31255	89	16	monitoring	monitoring	NOUN
fcis-31255	89	17	of	of	ADP
fcis-31255	89	18	key	key	ADJ
fcis-31255	89	19	indicators	indicator	NOUN
fcis-31255	89	20	such	such	ADJ
fcis-31255	89	21	as	as	ADP
fcis-31255	89	22	the	the	DET
fcis-31255	89	23	test	test	NOUN
fcis-31255	89	24	pass	pass	NOUN
fcis-31255	89	25	rate	rate	NOUN
fcis-31255	89	26	,	,	PUNCT
fcis-31255	89	27	test	test	NOUN
fcis-31255	89	28	time	time	NOUN
fcis-31255	89	29	,	,	PUNCT
fcis-31255	89	30	and	and	CCONJ
fcis-31255	89	31	error	error	NOUN
fcis-31255	89	32	rate	rate	NOUN
fcis-31255	89	33	.	.	PUNCT
fcis-31255	90	1	once	once	ADV
fcis-31255	90	2	abnormal	abnormal	ADJ
fcis-31255	90	3	fluctuations	fluctuation	NOUN
fcis-31255	90	4	are	be	AUX
fcis-31255	90	5	detected	detect	VERB
fcis-31255	90	6	,	,	PUNCT
fcis-31255	90	7	the	the	DET
fcis-31255	90	8	alarm	alarm	NOUN
fcis-31255	90	9	mechanism	mechanism	NOUN
fcis-31255	90	10	will	will	AUX
fcis-31255	90	11	be	be	AUX
fcis-31255	90	12	triggered	trigger	VERB
fcis-31255	90	13	immediately	immediately	ADV
fcis-31255	90	14	to	to	PART
fcis-31255	90	15	promptly	promptly	ADV
fcis-31255	90	16	investigate	investigate	VERB
fcis-31255	90	17	the	the	DET
fcis-31255	90	18	problem	problem	NOUN
fcis-31255	90	19	.	.	PUNCT
fcis-31255	91	1	(	(	PUNCT
fcis-31255	91	2	2	2	X
fcis-31255	91	3	)	)	PUNCT
fcis-31255	91	4	data	datum	NOUN
fcis-31255	91	5	preprocessing	preprocessing	NOUN
fcis-31255	91	6	and	and	CCONJ
fcis-31255	91	7	cleaning	cleaning	NOUN
fcis-31255	91	8	:	:	PUNCT
fcis-31255	91	9	the	the	DET
fcis-31255	91	10	collected	collect	VERB
fcis-31255	91	11	raw	raw	ADJ
fcis-31255	91	12	test	test	NOUN
fcis-31255	91	13	data	datum	NOUN
fcis-31255	91	14	contains	contain	VERB
fcis-31255	91	15	noise	noise	NOUN
fcis-31255	91	16	,	,	PUNCT
fcis-31255	91	17	outliers	outlier	NOUN
fcis-31255	91	18	or	or	CCONJ
fcis-31255	91	19	missing	miss	VERB
fcis-31255	91	20	values	value	NOUN
fcis-31255	91	21	,	,	PUNCT
fcis-31255	91	22	which	which	PRON
fcis-31255	91	23	need	need	VERB
fcis-31255	91	24	to	to	PART
fcis-31255	91	25	be	be	AUX
fcis-31255	91	26	preprocessed	preprocesse	VERB
fcis-31255	91	27	for	for	ADP
fcis-31255	91	28	subsequent	subsequent	ADJ
fcis-31255	91	29	analysis	analysis	NOUN
fcis-31255	91	30	.	.	PUNCT
fcis-31255	92	1	data	datum	NOUN
fcis-31255	92	2	preprocessing	preprocessing	NOUN
fcis-31255	92	3	includes	include	VERB
fcis-31255	92	4	steps	step	NOUN
fcis-31255	92	5	such	such	ADJ
fcis-31255	92	6	as	as	ADP
fcis-31255	92	7	removing	remove	VERB
fcis-31255	92	8	duplicate	duplicate	ADJ
fcis-31255	92	9	data	datum	NOUN
fcis-31255	92	10	,	,	PUNCT
fcis-31255	92	11	filling	fill	VERB
fcis-31255	92	12	in	in	ADP
fcis-31255	92	13	missing	miss	VERB
fcis-31255	92	14	values	value	NOUN
fcis-31255	92	15	,	,	PUNCT
fcis-31255	92	16	and	and	CCONJ
fcis-31255	92	17	smoothing	smooth	VERB
fcis-31255	92	18	noise	noise	NOUN
fcis-31255	92	19	.	.	PUNCT
fcis-31255	93	1	after	after	ADP
fcis-31255	93	2	cleaning	clean	VERB
fcis-31255	93	3	,	,	PUNCT
fcis-31255	93	4	the	the	DET
fcis-31255	93	5	data	data	NOUN
fcis-31255	93	6	is	be	AUX
fcis-31255	93	7	more	more	ADV
fcis-31255	93	8	accurate	accurate	ADJ
fcis-31255	93	9	and	and	CCONJ
fcis-31255	93	10	reliable	reliable	ADJ
fcis-31255	93	11	,	,	PUNCT
fcis-31255	93	12	providing	provide	VERB
fcis-31255	93	13	a	a	DET
fcis-31255	93	14	solid	solid	ADJ
fcis-31255	93	15	foundation	foundation	NOUN
fcis-31255	93	16	for	for	ADP
fcis-31255	93	17	subsequent	subsequent	ADJ
fcis-31255	93	18	analysis	analysis	NOUN
fcis-31255	93	19	.	.	PUNCT
fcis-31255	94	1	in	in	ADP
fcis-31255	94	2	the	the	DET
fcis-31255	94	3	parallel	parallel	ADJ
fcis-31255	94	4	testing	testing	NOUN
fcis-31255	94	5	environment	environment	NOUN
fcis-31255	94	6	,	,	PUNCT
fcis-31255	94	7	the	the	DET
fcis-31255	94	8	complexity	complexity	NOUN
fcis-31255	94	9	of	of	ADP
fcis-31255	94	10	data	datum	NOUN
fcis-31255	94	11	preprocessing	preprocessing	NOUN
fcis-31255	94	12	and	and	CCONJ
fcis-31255	94	13	cleaning	cleaning	NOUN
fcis-31255	94	14	increases	increase	NOUN
fcis-31255	94	15	significantly	significantly	ADV
fcis-31255	94	16	.	.	PUNCT
fcis-31255	95	1	processing	process	VERB
fcis-31255	95	2	data	datum	NOUN
fcis-31255	95	3	from	from	ADP
fcis-31255	95	4	multiple	multiple	ADJ
fcis-31255	95	5	chips	chip	NOUN
fcis-31255	95	6	simultaneously	simultaneously	ADV
fcis-31255	95	7	requires	require	VERB
fcis-31255	95	8	the	the	DET
fcis-31255	95	9	design	design	NOUN
fcis-31255	95	10	of	of	ADP
fcis-31255	95	11	efficient	efficient	ADJ
fcis-31255	95	12	data	datum	NOUN
fcis-31255	95	13	processing	processing	NOUN
fcis-31255	95	14	algorithms	algorithm	NOUN
fcis-31255	95	15	to	to	PART
fcis-31255	95	16	ensure	ensure	VERB
fcis-31255	95	17	the	the	DET
fcis-31255	95	18	completion	completion	NOUN
fcis-31255	95	19	of	of	ADP
fcis-31255	95	20	data	datum	NOUN
fcis-31255	95	21	preprocessing	preprocesse	VERB
fcis-31255	95	22	within	within	ADP
fcis-31255	95	23	a	a	DET
fcis-31255	95	24	limited	limited	ADJ
fcis-31255	95	25	time	time	NOUN
fcis-31255	95	26	.	.	PUNCT
fcis-31255	96	1	(	(	PUNCT
fcis-31255	96	2	3	3	X
fcis-31255	96	3	)	)	PUNCT
fcis-31255	96	4	data	datum	NOUN
fcis-31255	96	5	visualization	visualization	NOUN
fcis-31255	96	6	and	and	CCONJ
fcis-31255	96	7	preliminary	preliminary	ADJ
fcis-31255	96	8	analysis	analysis	NOUN
fcis-31255	96	9	:	:	PUNCT
fcis-31255	96	10	after	after	ADP
fcis-31255	96	11	preprocessing	preprocesse	VERB
fcis-31255	96	12	and	and	CCONJ
fcis-31255	96	13	cleaning	cleaning	NOUN
fcis-31255	96	14	,	,	PUNCT
fcis-31255	96	15	the	the	DET
fcis-31255	96	16	test	test	NOUN
fcis-31255	96	17	data	datum	NOUN
fcis-31255	96	18	needs	need	VERB
fcis-31255	96	19	to	to	PART
fcis-31255	96	20	be	be	AUX
fcis-31255	96	21	preliminarily	preliminarily	ADV
fcis-31255	96	22	analyzed	analyze	VERB
fcis-31255	96	23	through	through	ADP
fcis-31255	96	24	visualization	visualization	NOUN
fcis-31255	96	25	.	.	PUNCT
fcis-31255	97	1	data	datum	NOUN
fcis-31255	97	2	visualization	visualization	NOUN
fcis-31255	97	3	visually	visually	ADV
fcis-31255	97	4	presents	present	VERB
fcis-31255	97	5	the	the	DET
fcis-31255	97	6	distribution	distribution	NOUN
fcis-31255	97	7	,	,	PUNCT
fcis-31255	97	8	trends	trend	NOUN
fcis-31255	97	9	and	and	CCONJ
fcis-31255	97	10	outliers	outlier	NOUN
fcis-31255	97	11	of	of	ADP
fcis-31255	97	12	data	datum	NOUN
fcis-31255	97	13	,	,	PUNCT
fcis-31255	97	14	providing	provide	VERB
fcis-31255	97	15	clues	clue	NOUN
fcis-31255	97	16	for	for	ADP
fcis-31255	97	17	subsequent	subsequent	ADJ
fcis-31255	97	18	in	in	ADP
fcis-31255	97	19	-	-	PUNCT
fcis-31255	97	20	depth	depth	NOUN
fcis-31255	97	21	analysis	analysis	NOUN
fcis-31255	97	22	.	.	PUNCT
fcis-31255	98	1	in	in	ADP
fcis-31255	98	2	parallel	parallel	ADJ
fcis-31255	98	3	testing	testing	NOUN
fcis-31255	98	4	,	,	PUNCT
fcis-31255	98	5	various	various	ADJ
fcis-31255	98	6	forms	form	NOUN
fcis-31255	98	7	such	such	ADJ
fcis-31255	98	8	as	as	ADP
fcis-31255	98	9	charts	chart	NOUN
fcis-31255	98	10	,	,	PUNCT
fcis-31255	98	11	curves	curve	NOUN
fcis-31255	98	12	,	,	PUNCT
fcis-31255	98	13	and	and	CCONJ
fcis-31255	98	14	scatter	scatter	NOUN
fcis-31255	98	15	plots	plot	NOUN
fcis-31255	98	16	are	be	AUX
fcis-31255	98	17	used	use	VERB
fcis-31255	98	18	to	to	PART
fcis-31255	98	19	present	present	VERB
fcis-31255	98	20	test	test	NOUN
fcis-31255	98	21	data	datum	NOUN
fcis-31255	98	22	.	.	PUNCT
fcis-31255	99	1	for	for	ADP
fcis-31255	99	2	instance	instance	NOUN
fcis-31255	99	3	,	,	PUNCT
fcis-31255	99	4	bar	bar	NOUN
fcis-31255	99	5	charts	chart	NOUN
fcis-31255	99	6	are	be	AUX
fcis-31255	99	7	used	use	VERB
fcis-31255	99	8	to	to	PART
fcis-31255	99	9	compare	compare	VERB
fcis-31255	99	10	the	the	DET
fcis-31255	99	11	test	test	NOUN
fcis-31255	99	12	pass	pass	NOUN
fcis-31255	99	13	rates	rate	NOUN
fcis-31255	99	14	of	of	ADP
fcis-31255	99	15	different	different	ADJ
fcis-31255	99	16	chips	chip	NOUN
fcis-31255	99	17	,	,	PUNCT
fcis-31255	99	18	line	line	NOUN
fcis-31255	99	19	graphs	graph	NOUN
fcis-31255	99	20	are	be	AUX
fcis-31255	99	21	used	use	VERB
fcis-31255	99	22	to	to	PART
fcis-31255	99	23	show	show	VERB
fcis-31255	99	24	the	the	DET
fcis-31255	99	25	changing	change	VERB
fcis-31255	99	26	trend	trend	NOUN
fcis-31255	99	27	of	of	ADP
fcis-31255	99	28	test	test	NOUN
fcis-31255	99	29	time	time	NOUN
fcis-31255	99	30	with	with	ADP
fcis-31255	99	31	test	test	NOUN
fcis-31255	99	32	batches	batch	NOUN
fcis-31255	99	33	,	,	PUNCT
fcis-31255	99	34	and	and	CCONJ
fcis-31255	99	35	scatter	scatter	NOUN
fcis-31255	99	36	plots	plot	NOUN
fcis-31255	99	37	are	be	AUX
fcis-31255	99	38	used	use	VERB
fcis-31255	99	39	to	to	PART
fcis-31255	99	40	analyze	analyze	VERB
fcis-31255	99	41	the	the	DET
fcis-31255	99	42	correlation	correlation	NOUN
fcis-31255	99	43	between	between	ADP
fcis-31255	99	44	performance	performance	NOUN
fcis-31255	99	45	parameters	parameter	NOUN
fcis-31255	99	46	.	.	PUNCT
fcis-31255	100	1	(	(	PUNCT
fcis-31255	100	2	4	4	X
fcis-31255	100	3	)	)	PUNCT
fcis-31255	100	4	in	in	ADP
fcis-31255	100	5	-	-	PUNCT
fcis-31255	100	6	depth	depth	NOUN
fcis-31255	100	7	data	datum	NOUN
fcis-31255	100	8	analysis	analysis	NOUN
fcis-31255	100	9	and	and	CCONJ
fcis-31255	100	10	mining	mining	NOUN
fcis-31255	100	11	:	:	PUNCT
fcis-31255	100	12	conduct	conduct	NOUN
fcis-31255	100	13	in	in	ADP
fcis-31255	100	14	-	-	PUNCT
fcis-31255	100	15	depth	depth	NOUN
fcis-31255	100	16	analysis	analysis	NOUN
fcis-31255	100	17	of	of	ADP
fcis-31255	100	18	test	test	NOUN
fcis-31255	100	19	data	datum	NOUN
fcis-31255	100	20	to	to	PART
fcis-31255	100	21	extract	extract	VERB
fcis-31255	100	22	more	more	ADV
fcis-31255	100	23	valuable	valuable	ADJ
fcis-31255	100	24	information	information	NOUN
fcis-31255	100	25	.	.	PUNCT
fcis-31255	101	1	in	in	ADP
fcis-31255	101	2	statistical	statistical	ADJ
fcis-31255	101	3	analysis	analysis	NOUN
fcis-31255	101	4	,	,	PUNCT
fcis-31255	101	5	calculate	calculate	VERB
fcis-31255	101	6	the	the	DET
fcis-31255	101	7	mean	mean	ADJ
fcis-31255	101	8	,	,	PUNCT
fcis-31255	101	9	variance	variance	NOUN
fcis-31255	101	10	,	,	PUNCT
fcis-31255	101	11	maximum	maximum	ADJ
fcis-31255	101	12	value	value	NOUN
fcis-31255	101	13	,	,	PUNCT
fcis-31255	101	14	minimum	minimum	ADJ
fcis-31255	101	15	value	value	NOUN
fcis-31255	101	16	and	and	CCONJ
fcis-31255	101	17	other	other	ADJ
fcis-31255	101	18	statistical	statistical	ADJ
fcis-31255	101	19	indicators	indicator	NOUN
fcis-31255	101	20	of	of	ADP
fcis-31255	101	21	the	the	DET
fcis-31255	101	22	test	test	NOUN
fcis-31255	101	23	data	datum	NOUN
fcis-31255	101	24	to	to	PART
fcis-31255	101	25	understand	understand	VERB
fcis-31255	101	26	the	the	DET
fcis-31255	101	27	overall	overall	ADJ
fcis-31255	101	28	distribution	distribution	NOUN
fcis-31255	101	29	of	of	ADP
fcis-31255	101	30	the	the	DET
fcis-31255	101	31	data	datum	NOUN
fcis-31255	101	32	.	.	PUNCT
fcis-31255	102	1	in	in	ADP
fcis-31255	102	2	the	the	DET
fcis-31255	102	3	correlation	correlation	NOUN
fcis-31255	102	4	analysis	analysis	NOUN
fcis-31255	102	5	,	,	PUNCT
fcis-31255	102	6	the	the	DET
fcis-31255	102	7	correlations	correlation	NOUN
fcis-31255	102	8	among	among	ADP
fcis-31255	102	9	different	different	ADJ
fcis-31255	102	10	performance	performance	NOUN
fcis-31255	102	11	parameters	parameter	NOUN
fcis-31255	102	12	are	be	AUX
fcis-31255	102	13	explored	explore	VERB
fcis-31255	102	14	to	to	PART
fcis-31255	102	15	provide	provide	VERB
fcis-31255	102	16	a	a	DET
fcis-31255	102	17	basis	basis	NOUN
fcis-31255	102	18	for	for	ADP
fcis-31255	102	19	the	the	DET
fcis-31255	102	20	optimal	optimal	ADJ
fcis-31255	102	21	design	design	NOUN
fcis-31255	102	22	of	of	ADP
fcis-31255	102	23	the	the	DET
fcis-31255	102	24	chip	chip	NOUN
fcis-31255	102	25	.	.	PUNCT
fcis-31255	103	1	in	in	ADP
fcis-31255	103	2	cluster	cluster	NOUN
fcis-31255	103	3	analysis	analysis	NOUN
fcis-31255	103	4	,	,	PUNCT
fcis-31255	103	5	similar	similar	ADJ
fcis-31255	103	6	test	test	NOUN
fcis-31255	103	7	data	datum	NOUN
fcis-31255	103	8	are	be	AUX
fcis-31255	103	9	grouped	group	VERB
fcis-31255	103	10	into	into	ADP
fcis-31255	103	11	one	one	NUM
fcis-31255	103	12	category	category	NOUN
fcis-31255	103	13	to	to	PART
fcis-31255	103	14	discover	discover	VERB
fcis-31255	103	15	potential	potential	ADJ
fcis-31255	103	16	types	type	NOUN
fcis-31255	103	17	of	of	ADP
fcis-31255	103	18	test	test	NOUN
fcis-31255	103	19	patterns	pattern	NOUN
fcis-31255	103	20	.	.	PUNCT
fcis-31255	104	1	fig	fig	NOUN
fcis-31255	104	2	7	7	NUM
fcis-31255	104	3	.	.	PUNCT
fcis-31255	105	1	the	the	DET
fcis-31255	105	2	failure	failure	NOUN
fcis-31255	105	3	rate	rate	NOUN
fcis-31255	105	4	presents	present	VERB
fcis-31255	105	5	a	a	DET
fcis-31255	105	6	typical	typical	ADJ
fcis-31255	105	7	"	"	PUNCT
fcis-31255	105	8	bathtub	bathtub	ADJ
fcis-31255	105	9	curve	curve	NOUN
fcis-31255	105	10	"	"	PUNCT
fcis-31255	105	11	feature	feature	NOUN
fcis-31255	105	12	(	(	PUNCT
fcis-31255	105	13	5	5	NUM
fcis-31255	105	14	)	)	PUNCT
fcis-31255	105	15	intelligent	intelligent	ADJ
fcis-31255	105	16	data	datum	NOUN
fcis-31255	105	17	processing	processing	NOUN
fcis-31255	105	18	and	and	CCONJ
fcis-31255	105	19	analysis	analysis	NOUN
fcis-31255	105	20	technology	technology	NOUN
fcis-31255	105	21	:	:	PUNCT
fcis-31255	105	22	with	with	ADP
fcis-31255	105	23	the	the	DET
fcis-31255	105	24	continuous	continuous	ADJ
fcis-31255	105	25	development	development	NOUN
fcis-31255	105	26	of	of	ADP
fcis-31255	105	27	artificial	artificial	ADJ
fcis-31255	105	28	intelligence	intelligence	NOUN
fcis-31255	105	29	technology	technology	NOUN
fcis-31255	105	30	,	,	PUNCT
fcis-31255	105	31	intelligent	intelligent	ADJ
fcis-31255	105	32	data	datum	NOUN
fcis-31255	105	33	processing	processing	NOUN
fcis-31255	105	34	and	and	CCONJ
fcis-31255	105	35	analysis	analysis	NOUN
fcis-31255	105	36	technology	technology	NOUN
fcis-31255	105	37	has	have	AUX
fcis-31255	105	38	been	be	AUX
fcis-31255	105	39	widely	widely	ADV
fcis-31255	105	40	applied	apply	VERB
fcis-31255	105	41	in	in	ADP
fcis-31255	105	42	the	the	DET
fcis-31255	105	43	testing	testing	NOUN
fcis-31255	105	44	of	of	ADP
fcis-31255	105	45	mcu	mcu	PROPN
fcis-31255	105	46	chips	chip	NOUN
fcis-31255	105	47	.	.	PUNCT
fcis-31255	106	1	introduce	introduce	VERB
fcis-31255	106	2	algorithms	algorithm	NOUN
fcis-31255	106	3	such	such	ADJ
fcis-31255	106	4	as	as	ADP
fcis-31255	106	5	machine	machine	NOUN
fcis-31255	106	6	learning	learning	NOUN
fcis-31255	106	7	and	and	CCONJ
fcis-31255	106	8	deep	deep	ADJ
fcis-31255	106	9	learning	learning	NOUN
fcis-31255	106	10	to	to	PART
fcis-31255	106	11	conduct	conduct	VERB
fcis-31255	106	12	high	high	ADJ
fcis-31255	106	13	-	-	PUNCT
fcis-31255	106	14	level	level	NOUN
fcis-31255	106	15	analysis	analysis	NOUN
fcis-31255	106	16	and	and	CCONJ
fcis-31255	106	17	mining	mining	NOUN
fcis-31255	106	18	of	of	ADP
fcis-31255	106	19	test	test	NOUN
fcis-31255	106	20	data	datum	NOUN
fcis-31255	106	21	.	.	PUNCT
fcis-31255	107	1	for	for	ADP
fcis-31255	107	2	example	example	NOUN
fcis-31255	107	3	,	,	PUNCT
fcis-31255	107	4	machine	machine	NOUN
fcis-31255	107	5	learning	learning	NOUN
fcis-31255	107	6	algorithms	algorithm	NOUN
fcis-31255	107	7	are	be	AUX
fcis-31255	107	8	used	use	VERB
fcis-31255	107	9	to	to	PART
fcis-31255	107	10	classify	classify	VERB
fcis-31255	107	11	and	and	CCONJ
fcis-31255	107	12	predict	predict	VERB
fcis-31255	107	13	test	test	NOUN
fcis-31255	107	14	data	datum	NOUN
fcis-31255	107	15	to	to	PART
fcis-31255	107	16	identify	identify	VERB
fcis-31255	107	17	potential	potential	ADJ
fcis-31255	107	18	defects	defect	NOUN
fcis-31255	107	19	.	.	PUNCT
fcis-31255	108	1	use	use	VERB
fcis-31255	108	2	deep	deep	ADJ
fcis-31255	108	3	learning	learning	NOUN
fcis-31255	108	4	technology	technology	NOUN
fcis-31255	108	5	to	to	PART
fcis-31255	108	6	complete	complete	VERB
fcis-31255	108	7	feature	feature	NOUN
fcis-31255	108	8	extraction	extraction	NOUN
fcis-31255	108	9	of	of	ADP
fcis-31255	108	10	test	test	NOUN
fcis-31255	108	11	data	datum	NOUN
fcis-31255	108	12	and	and	CCONJ
fcis-31255	108	13	discover	discover	VERB
fcis-31255	108	14	hidden	hidden	ADJ
fcis-31255	108	15	test	test	NOUN
fcis-31255	108	16	patterns	pattern	NOUN
fcis-31255	108	17	.	.	PUNCT
fcis-31255	109	1	(	(	PUNCT
fcis-31255	109	2	6	6	NUM
fcis-31255	109	3	)	)	PUNCT
fcis-31255	109	4	test	test	NOUN
fcis-31255	109	5	report	report	NOUN
fcis-31255	109	6	generation	generation	NOUN
fcis-31255	109	7	and	and	CCONJ
fcis-31255	109	8	data	datum	NOUN
fcis-31255	109	9	visualization	visualization	NOUN
fcis-31255	109	10	display	display	NOUN
fcis-31255	109	11	:	:	PUNCT
fcis-31255	109	12	the	the	DET
fcis-31255	109	13	processing	processing	NOUN
fcis-31255	109	14	and	and	CCONJ
fcis-31255	109	15	analysis	analysis	NOUN
fcis-31255	109	16	results	result	NOUN
fcis-31255	109	17	of	of	ADP
fcis-31255	109	18	test	test	NOUN
fcis-31255	109	19	data	datum	NOUN
fcis-31255	109	20	need	need	VERB
fcis-31255	109	21	to	to	PART
fcis-31255	109	22	be	be	AUX
fcis-31255	109	23	output	output	NOUN
fcis-31255	109	24	and	and	CCONJ
fcis-31255	109	25	displayed	display	VERB
fcis-31255	109	26	in	in	ADP
fcis-31255	109	27	the	the	DET
fcis-31255	109	28	form	form	NOUN
fcis-31255	109	29	of	of	ADP
fcis-31255	109	30	a	a	DET
fcis-31255	109	31	report	report	NOUN
fcis-31255	109	32	.	.	PUNCT
fcis-31255	110	1	the	the	DET
fcis-31255	110	2	test	test	NOUN
fcis-31255	110	3	report	report	NOUN
fcis-31255	110	4	should	should	AUX
fcis-31255	110	5	include	include	VERB
fcis-31255	110	6	detailed	detailed	ADJ
fcis-31255	110	7	test	test	NOUN
fcis-31255	110	8	data	datum	NOUN
fcis-31255	110	9	,	,	PUNCT
fcis-31255	110	10	analysis	analysis	NOUN
fcis-31255	110	11	results	result	NOUN
fcis-31255	110	12	,	,	PUNCT
fcis-31255	110	13	conclusions	conclusion	NOUN
fcis-31255	110	14	,	,	PUNCT
fcis-31255	110	15	and	and	CCONJ
fcis-31255	110	16	suggestions	suggestion	NOUN
fcis-31255	110	17	,	,	PUNCT
fcis-31255	110	18	etc	etc	X
fcis-31255	110	19	.	.	X
fcis-31255	110	20	,	,	PUNCT
fcis-31255	110	21	to	to	PART
fcis-31255	110	22	facilitate	facilitate	VERB
fcis-31255	110	23	the	the	DET
fcis-31255	110	24	understanding	understanding	NOUN
fcis-31255	110	25	of	of	ADP
fcis-31255	110	26	the	the	DET
fcis-31255	110	27	test	test	NOUN
fcis-31255	110	28	situation	situation	NOUN
fcis-31255	110	29	by	by	ADP
fcis-31255	110	30	testers	tester	NOUN
fcis-31255	110	31	,	,	PUNCT
fcis-31255	110	32	designers	designer	NOUN
fcis-31255	110	33	,	,	PUNCT
fcis-31255	110	34	and	and	CCONJ
fcis-31255	110	35	managers	manager	NOUN
fcis-31255	110	36	.	.	PUNCT
fcis-31255	111	1	visually	visually	ADV
fcis-31255	111	2	display	display	VERB
fcis-31255	111	3	the	the	DET
fcis-31255	111	4	test	test	NOUN
fcis-31255	111	5	data	datum	NOUN
fcis-31255	111	6	results	result	NOUN
fcis-31255	111	7	and	and	CCONJ
fcis-31255	111	8	generate	generate	VERB
fcis-31255	111	9	various	various	ADJ
fcis-31255	111	10	charts	chart	NOUN
fcis-31255	111	11	and	and	CCONJ
fcis-31255	111	12	graphs	graph	NOUN
fcis-31255	111	13	using	use	VERB
fcis-31255	111	14	data	datum	NOUN
fcis-31255	111	15	visualization	visualization	NOUN
fcis-31255	111	16	technology	technology	NOUN
fcis-31255	111	17	.	.	PUNCT
fcis-31255	112	1	4	4	X
fcis-31255	112	2	.	.	X
fcis-31255	112	3	summary	summary	NOUN
fcis-31255	112	4	to	to	PART
fcis-31255	112	5	sum	sum	VERB
fcis-31255	112	6	up	up	ADP
fcis-31255	112	7	,	,	PUNCT
fcis-31255	112	8	this	this	DET
fcis-31255	112	9	paper	paper	NOUN
fcis-31255	112	10	studies	study	VERB
fcis-31255	112	11	the	the	DET
fcis-31255	112	12	parallel	parallel	ADJ
fcis-31255	112	13	testing	testing	NOUN
fcis-31255	112	14	technology	technology	NOUN
fcis-31255	112	15	of	of	ADP
fcis-31255	112	16	mcu	mcu	PROPN
fcis-31255	112	17	chips	chip	NOUN
fcis-31255	112	18	based	base	VERB
fcis-31255	112	19	on	on	ADP
fcis-31255	112	20	ate	ate	NOUN
fcis-31255	112	21	.	.	PUNCT
fcis-31255	113	1	the	the	DET
fcis-31255	113	2	key	key	ADJ
fcis-31255	113	3	points	point	NOUN
fcis-31255	113	4	are	be	AUX
fcis-31255	113	5	measures	measure	NOUN
fcis-31255	113	6	such	such	ADJ
fcis-31255	113	7	as	as	ADP
fcis-31255	113	8	optimizing	optimize	VERB
fcis-31255	113	9	the	the	DET
fcis-31255	113	10	test	test	NOUN
fcis-31255	113	11	plan	plan	NOUN
fcis-31255	113	12	,	,	PUNCT
fcis-31255	113	13	improving	improve	VERB
fcis-31255	113	14	the	the	DET
fcis-31255	113	15	hardware	hardware	NOUN
fcis-31255	113	16	87	87	NUM
fcis-31255	113	17	design	design	NOUN
fcis-31255	113	18	of	of	ADP
fcis-31255	113	19	the	the	DET
fcis-31255	113	20	test	test	NOUN
fcis-31255	113	21	system	system	NOUN
fcis-31255	113	22	,	,	PUNCT
fcis-31255	113	23	optimizing	optimize	VERB
fcis-31255	113	24	the	the	DET
fcis-31255	113	25	test	test	NOUN
fcis-31255	113	26	process	process	NOUN
fcis-31255	113	27	,	,	PUNCT
fcis-31255	113	28	and	and	CCONJ
fcis-31255	113	29	strengthening	strengthen	VERB
fcis-31255	113	30	the	the	DET
fcis-31255	113	31	processing	processing	NOUN
fcis-31255	113	32	and	and	CCONJ
fcis-31255	113	33	analysis	analysis	NOUN
fcis-31255	113	34	of	of	ADP
fcis-31255	113	35	test	test	NOUN
fcis-31255	113	36	data	datum	NOUN
fcis-31255	113	37	,	,	PUNCT
fcis-31255	113	38	to	to	PART
fcis-31255	113	39	achieve	achieve	VERB
fcis-31255	113	40	efficient	efficient	ADJ
fcis-31255	113	41	parallel	parallel	ADJ
fcis-31255	113	42	testing	testing	NOUN
fcis-31255	113	43	of	of	ADP
fcis-31255	113	44	mcu	mcu	PROPN
fcis-31255	113	45	chips	chip	NOUN
fcis-31255	113	46	.	.	PUNCT
fcis-31255	114	1	this	this	DET
fcis-31255	114	2	technology	technology	NOUN
fcis-31255	114	3	improves	improve	VERB
fcis-31255	114	4	the	the	DET
fcis-31255	114	5	testing	testing	NOUN
fcis-31255	114	6	efficiency	efficiency	NOUN
fcis-31255	114	7	,	,	PUNCT
fcis-31255	114	8	reduces	reduce	VERB
fcis-31255	114	9	the	the	DET
fcis-31255	114	10	testing	testing	NOUN
fcis-31255	114	11	cost	cost	NOUN
fcis-31255	114	12	,	,	PUNCT
fcis-31255	114	13	and	and	CCONJ
fcis-31255	114	14	provides	provide	VERB
fcis-31255	114	15	support	support	NOUN
fcis-31255	114	16	for	for	ADP
fcis-31255	114	17	the	the	DET
fcis-31255	114	18	quality	quality	NOUN
fcis-31255	114	19	control	control	NOUN
fcis-31255	114	20	and	and	CCONJ
fcis-31255	114	21	performance	performance	NOUN
fcis-31255	114	22	optimization	optimization	NOUN
fcis-31255	114	23	of	of	ADP
fcis-31255	114	24	mcu	mcu	PROPN
fcis-31255	114	25	chips	chip	NOUN
fcis-31255	114	26	.	.	PUNCT
fcis-31255	115	1	references	reference	NOUN
fcis-31255	115	2	[	[	X
fcis-31255	115	3	1	1	NUM
fcis-31255	115	4	]	]	PUNCT
fcis-31255	115	5	optimizing	optimize	VERB
fcis-31255	115	6	integrated	integrate	VERB
fcis-31255	115	7	circuit	circuit	NOUN
fcis-31255	115	8	testing	testing	NOUN
fcis-31255	115	9	:	:	PUNCT
fcis-31255	115	10	a	a	DET
fcis-31255	115	11	comprehensive	comprehensive	ADJ
fcis-31255	115	12	approach	approach	NOUN
fcis-31255	115	13	to	to	ADP
fcis-31255	115	14	testability	testability	NOUN
fcis-31255	115	15	and	and	CCONJ
fcis-31255	115	16	efficiency[j].international	efficiency[j].international	ADJ
fcis-31255	115	17	journal	journal	NOUN
fcis-31255	115	18	of	of	ADP
fcis-31255	115	19	advanced	advanced	ADJ
fcis-31255	115	20	technology	technology	NOUN
fcis-31255	115	21	and	and	CCONJ
fcis-31255	115	22	engineering	engineering	NOUN
fcis-31255	115	23	exploration	exploration	NOUN
fcis-31255	115	24	(	(	PUNCT
fcis-31255	115	25	ijatee	ijatee	NOUN
fcis-31255	115	26	)	)	PUNCT
fcis-31255	115	27	,	,	PUNCT
fcis-31255	115	28	2025,12(123	2025,12(123	PROPN
fcis-31255	115	29	)	)	PUNCT
fcis-31255	115	30	.	.	PUNCT
fcis-31255	116	1	[	[	X
fcis-31255	116	2	2	2	NUM
fcis-31255	116	3	]	]	PUNCT
fcis-31255	116	4	stmircoelectronics	stmircoelectronic	NOUN
fcis-31255	116	5	;	;	PUNCT
fcis-31255	116	6	patent	patent	NOUN
fcis-31255	116	7	issued	issue	VERB
fcis-31255	116	8	for	for	ADP
fcis-31255	116	9	testing	testing	NOUN
fcis-31255	116	10	method	method	NOUN
fcis-31255	116	11	for	for	ADP
fcis-31255	116	12	semiconductor	semiconductor	NOUN
fcis-31255	116	13	integrated	integrate	VERB
fcis-31255	116	14	electronic	electronic	ADJ
fcis-31255	116	15	devices	device	NOUN
fcis-31255	116	16	and	and	CCONJ
fcis-31255	116	17	corresponding	corresponding	ADJ
fcis-31255	116	18	test	test	NOUN
fcis-31255	116	19	architecture[j].electronics	architecture[j].electronic	NOUN
fcis-31255	116	20	newsweekly	newsweekly	NOUN
fcis-31255	116	21	,	,	PUNCT
fcis-31255	116	22	2014	2014	NUM
fcis-31255	116	23	.	.	PUNCT
fcis-31255	117	1	[	[	X
fcis-31255	117	2	3	3	X
fcis-31255	117	3	]	]	X
fcis-31255	117	4	zhou	zhou	PROPN
fcis-31255	117	5	l	l	PROPN
fcis-31255	117	6	,	,	PUNCT
fcis-31255	117	7	yang	yang	PROPN
fcis-31255	117	8	d	d	PROPN
fcis-31255	117	9	,	,	PUNCT
fcis-31255	117	10	chen	chen	PROPN
fcis-31255	117	11	l	l	PROPN
fcis-31255	117	12	,	,	PUNCT
fcis-31255	117	13	et	et	NOUN
fcis-31255	117	14	al.a	al.a	NOUN
fcis-31255	117	15	review	review	NOUN
fcis-31255	117	16	of	of	ADP
fcis-31255	117	17	test	test	NOUN
fcis-31255	117	18	stimulus	stimulus	NOUN
fcis-31255	117	19	compression	compression	NOUN
fcis-31255	117	20	methods	method	NOUN
fcis-31255	117	21	for	for	ADP
fcis-31255	117	22	ultra	ultra	ADJ
fcis-31255	117	23	-	-	ADJ
fcis-31255	117	24	large	large	ADJ
fcis-31255	117	25	-	-	PUNCT
fcis-31255	117	26	scale	scale	NOUN
fcis-31255	117	27	integrated	integrate	VERB
fcis-31255	117	28	circuits[j].applied	circuits[j].applied	ADJ
fcis-31255	117	29	sciences,2024,14(23):10769	sciences,2024,14(23):10769	NOUN
fcis-31255	117	30	-	-	PUNCT
fcis-31255	117	31	10769	10769	NUM
fcis-31255	117	32	.	.	PUNCT
fcis-31255	118	1	[	[	X
fcis-31255	118	2	4	4	X
fcis-31255	118	3	]	]	X
fcis-31255	118	4	ali	ali	PROPN
fcis-31255	118	5	l	l	PROPN
fcis-31255	118	6	,	,	PUNCT
fcis-31255	118	7	sidek	sidek	ADJ
fcis-31255	118	8	r	r	NOUN
fcis-31255	118	9	,	,	PUNCT
fcis-31255	118	10	aris	aris	PROPN
fcis-31255	118	11	i	i	PROPN
fcis-31255	118	12	,	,	PUNCT
fcis-31255	118	13	et	et	PROPN
fcis-31255	118	14	al	al	PROPN
fcis-31255	118	15	.	.	PUNCT
fcis-31255	118	16	design	design	NOUN
fcis-31255	118	17	of	of	ADP
fcis-31255	118	18	a	a	DET
fcis-31255	118	19	testchip	testchip	NOUN
fcis-31255	118	20	for	for	ADP
fcis-31255	118	21	low	low	ADJ
fcis-31255	118	22	cost	cost	NOUN
fcis-31255	118	23	ic	ic	PROPN
fcis-31255	118	24	testing[j].intelligent	testing[j].intelligent	ADJ
fcis-31255	118	25	automation	automation	NOUN
fcis-31255	118	26	&	&	CCONJ
fcis-31255	118	27	soft	soft	ADJ
fcis-31255	118	28	computing	computing	NOUN
fcis-31255	118	29	,	,	PUNCT
fcis-31255	118	30	2009	2009	NUM
fcis-31255	118	31	,	,	PUNCT
fcis-31255	118	32	15	15	NUM
fcis-31255	118	33	(	(	PUNCT
fcis-31255	118	34	1):63	1):63	NUM
fcis-31255	118	35	-	-	SYM
fcis-31255	118	36	72	72	NUM
fcis-31255	118	37	.	.	PUNCT
fcis-31255	119	1	[	[	X
fcis-31255	119	2	5	5	NUM
fcis-31255	119	3	]	]	PUNCT
fcis-31255	119	4	a.	a.	NOUN
fcis-31255	119	5	i	i	NOUN
fcis-31255	119	6	s	s	PROPN
fcis-31255	119	7	,	,	PUNCT
fcis-31255	119	8	mohammad	mohammad	PROPN
fcis-31255	119	9	s	s	PART
fcis-31255	119	10	,	,	PUNCT
fcis-31255	119	11	k.	k.	PROPN
fcis-31255	120	1	i	i	PRON
fcis-31255	120	2	j	j	PROPN
fcis-31255	120	3	.test	.t	ADJ
fcis-31255	120	4	time	time	NOUN
fcis-31255	120	5	reduction	reduction	NOUN
fcis-31255	120	6	of	of	ADP
fcis-31255	120	7	3d	3d	PROPN
fcis-31255	120	8	stacked	stack	VERB
fcis-31255	120	9	ics	ic	NOUN
fcis-31255	120	10	using	use	VERB
fcis-31255	120	11	ternary	ternary	ADJ
fcis-31255	120	12	coded	code	VERB
fcis-31255	120	13	simultaneous	simultaneous	ADJ
fcis-31255	120	14	bi	bi	ADJ
fcis-31255	120	15	-	-	ADJ
fcis-31255	120	16	directional	directional	ADJ
fcis-31255	120	17	signaling	signaling	NOUN
fcis-31255	120	18	in	in	ADP
fcis-31255	120	19	parallel	parallel	ADJ
fcis-31255	120	20	test	test	NOUN
fcis-31255	120	21	ports[j].ieee	ports[j].ieee	NOUN
fcis-31255	120	22	transactions	transaction	NOUN
fcis-31255	120	23	on	on	ADP
fcis-31255	120	24	computer	computer	NOUN
fcis-31255	120	25	-	-	PUNCT
fcis-31255	120	26	aided	aid	VERB
fcis-31255	120	27	design	design	NOUN
fcis-31255	120	28	of	of	ADP
fcis-31255	120	29	integrated	integrated	ADJ
fcis-31255	120	30	circuits	circuit	NOUN
fcis-31255	120	31	and	and	CCONJ
fcis-31255	120	32	systems	system	NOUN
fcis-31255	120	33	,	,	PUNCT
fcis-31255	120	34	2020	2020	NUM
fcis-31255	120	35	,	,	PUNCT
fcis-31255	120	36	1	1	NUM
fcis-31255	120	37	-	-	SYM
fcis-31255	120	38	1	1	NUM
fcis-31255	120	39	.	.	PUNCT