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futech-373	doi.org	https://doi.org/10.1186/s40494-024-01502-z
futech-373	doi.org	https://doi.org/10.1080/13642987.2020.1822821
futech-373	doi.org	https://doi.org/10.1108/dlp-01-2024-0018
futech-373	doi.org	https://doi.org/10.34069/ai/2024.75.03.22
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futech-373	doi.org	https://doi.org/10.1016/j.patrec.2020.02.017
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futech-373	doi.org	https://doi.org/10.1038/s41598-025-93023-3
futech-373	doi.org	https://doi.org/10.1016/j.eswa.2023.120555
futech-373	doi.org	https://doi.org/10.1016/j.culher.2010.10.002
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futech-373	doi.org	https://doi.org/10.1515/pdtc-2024-0021
futech-373	doi.org	https://doi.org/10.1057/s41599-024-03314-9
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futech-373	doi.org	https://doi.org/10.70767/jmbe.v1i1.133
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futech-373	doi.org	https://doi.org/10.1016/j.inffus.2021.12.003
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futech-373	doi.org	https://doi.org/10.1145/3373509.3373515
futech-373	doi.org	https://doi.org/10.1101/2021.06.23.449176
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futech-373	doi.org	https://doi.org/10.1038/s41598-024-56706-x
futech-373	doi.org	https://doi.org/10.3390/electronics13183738
futech-373	doi.org	https://doi.org/10.1016/j.culher.2025.01.006
futech-373	doi.org	https://doi.org/10.1007/978-3030-37191-3_16
futech-373	doi.org	https://doi.org/10.1016/j.iheduc.2011.12.003
futech-373	doi.org	https://doi.org/10.1016/j.eswa.2019.113114
futech-373	doi.org	https://doi.org/10.1057/s41599-024-04331-4
futech-373	doi.org	https://doi.org/10.1016/j.patrec.2020.02.017
futech-373	doi.org	https://doi.org/10.3390/heritage7020038
futech-373	doi.org	https://doi.org/10.11648/j.hss.20241205.12
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