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futech-402	doi.org	https://doi.org/10.55670/fpll.futech.4.4.2
futech-402	fupubco.com	https://fupubco.com/futech
futech-402	doi.org	https://doi.org/10.55670/fpll.futech.4.4.2
futech-402	fupubco.com	https://fupubco.com/futech
futech-402	doi.org	https://doi.org/10.1186/s40537-020-00290-0
futech-402	doi.org	https://doi.org/10.1007/978-981-16-5188-5_16
futech-402	doi.org	https://doi.org/10.1007/978-981-155258-8_16
futech-402	dx.doi.org	http://dx.doi.org/10.18089/tms.20250103
futech-402	doi.org	https://doi.org/10.1080/24751839.2021.1981684
futech-402	doi.org	https://doi.org/10.1108/ijchm-08-2019-0740
futech-402	doi.org	https://doi.org/10.1080/08838151.2020.1834296
futech-402	doi.org	https://doi.org/10.1007/s00521-023-09339-6
futech-402	doi.org	https://doi.org/10.1016/j.procs.2018.10.326
futech-402	doi.org	https://doi.org/10.1007/978-3-030-29516-5_34
futech-402	doi.org	https://doi.org/10.1016/j.eswa.2023.123086
futech-402	doi.org	https://doi.org/10.1016/j.jksuci.2024.102048
futech-402	doi.org	https://doi.org/10.1016/j.ijinfomgt.2023.102642
futech-402	doi.org	https://doi.org/10.1155/2022/1761579
futech-402	doi.org	https://doi.org/10.1007/978-3-030-61705-9_64
futech-402	doi.org	https://doi.org/10.1016/j.neucom.2021.03.091
futech-402	doi.org	https://doi.org/10.1016/j.inffus.2023.02.028
futech-402	doi.org	https://doi.org/10.1016/j.elerap.2022.101174
futech-402	doi.org	https://doi.org/10.1016/j.compenvurbsys.2021.1016
futech-402	doi.org	https://doi.org/10.1016/j.ijinfomgt.2023.102642
futech-402	doi.org	https://doi.org/10.1155/2022/1761579
futech-402	ui.adsabs.harvard.edu	https://ui.adsabs.harvard.edu/link_gateway/2024ieeea..1250389h/doi:10.1109/access.2024.3381627
futech-402	doi.org	https://doi.org/10.1016/j.neucom.2021.03.091
futech-402	dx.doi.org	http://dx.doi.org/10.53106/160792642021072204018
futech-402	dx.doi.org	http://dx.doi.org/10.48550/arxiv.2103.10689
futech-402	dx.doi.org	http://dx.doi.org/10.2139/ssrn.3748268
futech-402	dx.doi.org	http://dx.doi.org/10.48550/arxiv.2409.14429
futech-402	doi.org	https://doi.org/10.1038/s41598-022-11012-2
futech-402	doi.org	https://doi.org/10.1016/j.inffus.2019.12.012
futech-402	doi.org	https://doi.org/10.31617/1.2024(153)04
futech-402	dx.doi.org	http://dx.doi.org/10.46827/ejmms.v10i1.1922
futech-402	creativecommons.org	https://creativecommons.org/licenses/by/4.0/)
futech-402	dx.doi.org	http://dx.doi.org/10.3390/electronics10050593
futech-402	doi.org	https://doi.org/10.1108/tr-03-2024-0169
futech-402	dx.doi.org	http://dx.doi.org/10.1007/s42044-024-00215-7
futech-402	dx.doi.org	http://dx.doi.org/10.1007/s42044-024-00215-7
futech-402	dx.doi.org	http://dx.doi.org/10.46827/ejmms.v10i1.1922
futech-402	creativecommons.org	https://creativecommons.org/licenses/by/4.0