id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
iajs-1848	Khudayer, Iman Hameed; Hussein Ali, Bushra Hashem; Mustafa, Mohammed Hamid; Ibrahim, Ayser Jumah	Investigation of the Structural, Optical and Electrical Properties of AgInSe2 Thin Films	2018	13	.pdf	application/pdf	3323	216	61	Hall parameters10for AgInxe2 thin films at different Ta. Measurement temp. R(H) µH(cm2/V.S) n (cm-3) RT -22.32 16.85 2.8E+17 Ta(K) 450 -12.2549 14.96817 5.1E+17 550 -7.467145 24.79179 8.37E+17 650 -9.057971 Sci. Vol.31 (1) 2018 Figure (3): X -ray diffraction pattern10of AgInSe2 thin film with a thickness (t=300nm) annealed at different Ta. Figure (4): 3D Atomic10force microscopy (AFM) of AgInSe2 thin film with a thickness (t=300nm) annealed at different Ta.	cache/iajs-1848.pdf	txt/iajs-1848.txt