id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
iajs-1946	A. maki, Samir; H. shaban, Auday; A. hussain, Shahd	Thickness Influence on Structural and Optical Properties of ZnO Thin Films Prepared by Thermal Evaporation	2018	7	.pdf	application/pdf	2040	94	62	Thickness (nm) D (nm) FWHM (deg) 100 23.1 0.35 200 29.1 0.27 300 29.9 0.28 Atomic force microscopy (AFM) describes the surface morphology of ZnO thin films analyzed by AFM the surface of ZnO films observed that the grain is uniformly distributed within the scanning area. Abstract A thermal evaporation technique was used to prepare ZnO thin films.	cache/iajs-1946.pdf	txt/iajs-1946.txt