id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
iajs-364	Al-Dhahir, Tarq A.; Khodair, Ziad T.	Characterization of CdO film AFM and XRD Diffraction Using Rietveld Refinement	2017	10	.pdf	application/pdf	3310	191	65	CdO thin films are characterized by different authors. So, in this work, we presented synthesis a nano particles CdO thin films with (200) plane of prefer orientation.	cache/iajs-364.pdf	txt/iajs-364.txt