id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
iajs-4110	Mohammed Abdullah, Dhuha ; Hussein, Bushra H. 	Preparation and Study of Undoped and Al-Doped on The Structure and the Optical Properties of In₂S₃ Thin Film	2025	10	.pdf	application/pdf	3836	272	48	The structural characteristics of In2S3 thin films were studied by X-ray diffraction (XRD) and atomic force microscopy (AFM), revealing that the In2S3 film exhibits a polycrystalline structure and stable tetragonal β-In2S3, with a preferred orientation of (109) at 2θ = 27.3. Figure (1) displays the XRD pattern for In2S3 thin film with (Al = 0.0, 0.02, and 0.04) at RT and a thickness of 500 nanometers.	cache/iajs-4110.pdf	txt/iajs-4110.txt