Journal of large-scale research facilities, 2, A44 (2016) http://dx.doi.org/10.17815/jlsrf-2-70 Published: 04.02.2016 FEI Titan G2 60-300 HOLO Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C), Forschungszentrum Jülich and RWTH Aachen * Instrument O�cer: - Dr. Chris Boothroyd, Ernst Ruska-Centre, Jülich Research Centre, 52425 Jülich, Germany, phone: ++49.2461.61.9279, e-mail: c.boothroyd@fz-juelich.de Deputy Instrument O�cer: - Dr. András Kovács, Ernst Ruska-Centre, Jülich Research Centre, 52425 Jülich, Germany, phone: ++49.2461.61.9276, e-mail: a.kovacs@fz-juelich.de General Management: - Dr. Karsten Tillmann, Ernst Ruska-Centre, Jülich Research Centre, 52425 Jülich, Germany, phone: ++49.2461.61.1438, e-mail: k.tillmann@fz-juelich.de Abstract: The FEI Titan G2 60-300 HOLO is a unique fourth generation transmission electron micro- scope, which has been speci�cally designed for the investigation of electromagnetic �elds of materials using o�-axis electron holography. It has a Lorentz lens to allow magnetic �eld free imaging plus two electron biprisms, which in combination enable more uniform holographic fringes to be used. The in- strument also has an ultra-wide objective lens pole piece gap which is ideal for in situ experiments. For these purposes, the FEI Titan G2 60-300 HOLO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), an image Cs corrector (CEOS), a post-column energy �lter system (Gatan Tridiem 865 ER) as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP). Typical examples of use and technical speci�cations for the instrument are given below. *Cite article as: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons. (2016). FEI Titan G2 60-300 HOLO . Journal of large-scale research facilities, 2, A44. http://dx.doi.org/10.17815/jlsrf-2-70 1 http://jlsrf.org/ http://dx.doi.org/10.17815/jlsrf-2-70 http://dx.doi.org/10.17815/jlsrf-2-70 https://creativecommons.org/licenses/by/4.0/ Journal of large-scale research facilities, 2, A44 (2016) http://dx.doi.org/10.17815/jlsrf-2-70 1 System Overview Figure 1: FEI Titan G2 60-300 HOLO transmission electron microscope (photograph by courtesy of Christian Lüning (www.arbeitsblende.de)) . 2 Typical Applications and Limitations of Use The con�guration of the FEI Titan G2 60-300 HOLO allows a variety of advanced transmission electron microscopy techniques to be applied to a wide variety of solid-state materials. These techniques include high-resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), energy �ltered transmission electron microscopy (EFTEM), scanning transmission electron microscopy (HRSTEM) with high-angle annular dark �eld (HAADF) STEM imaging, o�-axis electron holography (EH), Lorentz microscopy, electron tomography (ET) and combinations of these techniques. Investigation of aqueous, contaminated, ferromagnetic or organic samples with the FEI Titan G2 60-300 HOLO is possible after discussion with both of the instruments o�cers. 3 Sample Environment Using dedicated cooling or heating stages, the FEI Titan G2 60-300 HOLO will allow samples to be in- vestigated either at room temperature or under liquid nitrogen cooling conditions at a vacuum level of 2 http://dx.doi.org/10.17815/jlsrf-2-70 https://creativecommons.org/licenses/by/4.0/ http://dx.doi.org/10.17815/jlsrf-2-70 Journal of large-scale research facilities, 2, A44 (2016) about 10−8 mbar. Besides this standard setup, the sample environment can be adapted to various con- ditions, e.g. the thermal treatment or the application of external electric or magnetic �elds to samples, making use of a wide portfolio of in situ TEM holders available through the ER-C user services. 4 Technical Speci�cations • electron acceleration voltage 60 kV ... 300 kV • electron source Schottky X-FEG • information limit (TEM) @ 300 kV < 120 pm • resolution (STEM) @ 300 kV < 180 pm • C-TWIN objective lens 11 mm • objective lens Cs (Lorentz mode) < 100 µ m 5 Detectors • Peltier cooled Gatan Ultrascan 1000 XP charge coupled device camera (CCD) with a readout speed of 4 M pixel sec−1 and a format of 4-megapixel of 14 microns in size. • Gatan Tridiem 865 ER image �lter (GIF) with fully 2nd and 3rd order and partially 4th order corrected prisms and a maximum �eld of view of 17 µm for imaging and 120 mR for di�raction analysis and with a 4-megapixel CCD. • Fischione Model 3000 HAADF detector. 6 Specimen Stages • double tilt low background holder ± 70 ° • single tilt holder ± 70 ° • dual-axis tomography holder ± 70 °, 360 ° • on axis rotation tomography holder 360 ° • liquid He holder 10 – 60 K • further in situ specimen stages available References Chang, S. L. Y., Dwyer, C., Boothroyd, C. B., & Dunin-Borkowski, R. E. (2015). Optimising electron holography in the presence of partial coherence and instrument instabilities. Ultramicroscopy, 151, 37-45. http://dx.doi.org/10.1016/j.ultramic.2014.11.019 Dwyer, C., Boothroyd, C. B., Chang, S. L. Y., & Dunin-Borkowski, R. E. (2015). Three- wave electron vortex lattices for measuring nano�elds. Ultramicroscopy, 148, 25-30. http://dx.doi.org/10.1016/j.ultramic.2014.08.011 Migunov, V., Ryll, H., Zhuge, X., Simson, M., Strueder, L., Batenburg, K. J., . . . Dunin-Borkowski, R. E. (2015). Rapid low dose electron tomography using a direct electron detection camera. Scienti�c Reports, 5, 14516. http://dx.doi.org/10.1038/srep14516 3 http://dx.doi.org/10.17815/jlsrf-2-70 http://dx.doi.org/{10.1016/j.ultramic.2014.11.019} http://dx.doi.org/{10.1016/j.ultramic.2014.08.011} http://dx.doi.org/{10.1038/srep14516} https://creativecommons.org/licenses/by/4.0/ Journal of large-scale research facilities, 2, A44 (2016) http://dx.doi.org/10.17815/jlsrf-2-70 Ozsoy-Keskinbora, C., Boothroyd, C. B., Dunin-Borkowski, R. E., van Aken, P. A., & Koch, C. T. (2014). Hybridization approach to in-line and o�-axis (electron) holography for superior resolution and phase sensitivity. Scienti�c Reports, 4. http://dx.doi.org/10.1038/srep07020 4 http://dx.doi.org/10.17815/jlsrf-2-70 http://dx.doi.org/{10.1038/srep07020} https://creativecommons.org/licenses/by/4.0/ System Overview Typical Applications and Limitations of Use Sample Environment Technical Specifications Detectors Specimen Stages