Journal of large-scale research facilities, 3, A124 (2017) http://dx.doi.org/10.17815/jlsrf-3-91 Published: 30.11.2017 Solid �exRIXS: A RIXS endstation for solid systems at BESSY II Helmholtz-Zentrum Berlin für Materialien und Energie * Instrument Scientists: - Dr. Martin Beye, Helmholtz-Zentrum Berlin für Materialien und Energie, phone: +49 30 8062-14677, email: martin.beye@helmholtz-berlin.de - Dr. Pieter Sybren Miedema, Helmholtz-Zentrum Berlin für Materialien und Energie, phone: +49 30 8062-14821, email: pieter.miedema@helmholtz-berlin.de Abstract: The solid �exRIXS endstation combines an X-ray emission spectrometer with resolving pow- ers above 1000 with a di�ractometer setup for solid sample systems. It is �exible in its use at di�erent beam lines and facilities. 1 Introduction The solid �exRIXS is an endstation for complementary application of RIXS, di�raction (resonant scat- tering) and absorption measurements both at BESSY II and free-electron lasers. This endstation is equipped with a two-axis rotatable sample holding manipulator (one axis motorized). The sample stage can be cooled with liquid Helium and in a di�erent con�guration also heated by electron bombardment heating to more than 1000°C. Sample drain current can be measured for total electron yield absorption measurements and a photodiode (optionally with a biased mesh to repel electrons) can be used for di�raction / resonant scattering experiments as well as �uorescence yield detection. Furthermore, the endstation is equipped with a modi�ed Grace IV / XES 350 spectrometer that can cover a photon energy range from 50 to above 900 eV. Resolving powers above 1000 have been shown to be easily achievable and can be furthered at the expense of count rate. The emission is dispersed from three di�erent gratings to cover the full energy range with optimal count rate. The dispersed light is detected by an MCP, phosphor screen, CCD combination. The system is completely software- controlled so that long macros can be used for extended measurement plans. The detectors can be made blind to optical radiation so that it can be used in pump-probe setups to study dynamics at BESSY II and FELs. Non-linear X-ray spectroscopy can be conducted with this setup as well. The chamber is open for collaborative research at BESSY II and FELs. *Cite article as: Helmholtz-Zentrum Berlin für Materialien und Energie. (2017). Solid �exRIXS: A RIXS endstation for solid systems at BESSY II. Journal of large-scale research facilities, 3, A124. http://dx.doi.org/10.17815/jlsrf-3-91 1 http://jlsrf.org/ http://dx.doi.org/10.17815/jlsrf-3-91 http://dx.doi.org/10.17815/jlsrf-3-91 https://creativecommons.org/licenses/by/4.0/ Journal of large-scale research facilities, 3, A124 (2017) http://dx.doi.org/10.17815/jlsrf-3-91 Figure 1: View of the Solid �exRIXS endstation. 2 Instrument application Typical applications are: • RIXS of correlated materials across phase transitions • RIXS of catalyst materials • Angle dependent �uorescence yield studies • Soft X-ray resonant re�ectivity measurements • Pump-Probe RIXS experiments • Pump-Probe �uorescence yield and scattering studies • Non-linear X-ray spectroscopy Methods: • Time-resolved studies • NEXAFS • RIXS 3 Technical Data Monochromator �exible Experiment in vacuum yes Temperature Range 20-550 K Detectors Photodiode, MCP Manipulators Four axes motorized + one by hand Table 1: Technical parameters of the Solid �exRIXS endstation. 2 http://dx.doi.org/10.17815/jlsrf-3-91 https://creativecommons.org/licenses/by/4.0/ http://dx.doi.org/10.17815/jlsrf-3-91 Journal of large-scale research facilities, 3, A124 (2017) References Beye, M., Hennies, F., Deppe, M., Suljoti, E., Nagasono, M., Wurth, W., & Föhlisch, A. (2009). Dynamics of Electron-Phonon Scattering: Crystal- and Angular-Momentum Trans- fer Probed by Resonant Inelastic X-Ray Scattering. Physical Review Letters, 103, 237401. http://dx.doi.org/10.1103/PhysRevLett.103.237401 Beye, M., Hennies, F., Deppe, M., Suljoti, E., Nagasono, M., Wurth, W., & Föhlisch, A. (2010). Measure- ment of the predicted asymmetric closing behaviour of the band gap of silicon using x-ray absorption and emission spectroscopy. New Journal of Physics, 12(4), 043011. http://dx.doi.org/10.1088/1367- 2630/12/4/043011 Beye, M., Schreck, S., Sorgenfrei, F., Trabant, C., Pontius, N., Schuszler-Langeheine, C., . . . Föh- lisch, A. (2013). Stimulated X-ray emission for materials science. Nature, 501(7466), 191-194. http://dx.doi.org/10.1038/nature12449 Beye, M., Sorgenfrei, F., Schlotter, W. F., Wurth, W., & Föhlisch, A. (2010). The liquid-liquid phase transition in silicon revealed by snapshots of valence electrons. Proceedings of the National Academy of Sciences, 107, 16772-16776. http://dx.doi.org/10.1073/pnas.1006499107 3 http://dx.doi.org/10.17815/jlsrf-3-91 http://dx.doi.org/10.1103/PhysRevLett.103.237401 http://dx.doi.org/10.1088/1367-2630/12/4/043011 http://dx.doi.org/10.1088/1367-2630/12/4/043011 http://dx.doi.org/10.1038/nature12449 http://dx.doi.org/10.1073/pnas.1006499107 https://creativecommons.org/licenses/by/4.0/ Introduction Instrument application Technical Data